JPH02242525A - Dielectric porcelain composition - Google Patents

Dielectric porcelain composition

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Publication number
JPH02242525A
JPH02242525A JP1062477A JP6247789A JPH02242525A JP H02242525 A JPH02242525 A JP H02242525A JP 1062477 A JP1062477 A JP 1062477A JP 6247789 A JP6247789 A JP 6247789A JP H02242525 A JPH02242525 A JP H02242525A
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Japan
Prior art keywords
dielectric
capacitance
weight
parts
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1062477A
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Japanese (ja)
Other versions
JP2933635B2 (en
Inventor
Hidenori Kuramitsu
秀紀 倉光
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Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 産業上の利用分野 3へ−7 本発明は誘電率、絶縁抵抗、絶縁破壊電圧が高く良好度
QKすぐれ、容量温度係数が小さく、かつ積層セラミッ
クコンデンサへの利用においては、内部電極の厚みを薄
くしたときの静電容量と良好度Qの低下を防ぎ、静電容
量と良好度Qのバラツキを小さくできる誘電体磁器組成
物に関するものである。
[Detailed Description of the Invention] To Industrial Application Field 3-7 The present invention has high dielectric constant, insulation resistance, and dielectric breakdown voltage, excellent quality QK, and small capacitance temperature coefficient, and is suitable for use in multilayer ceramic capacitors. This invention relates to a dielectric ceramic composition that can prevent a decrease in capacitance and quality Q when the thickness of an internal electrode is reduced, and can reduce variations in capacitance and quality Q.

従来の技術 従来から誘電率、絶縁抵抗が高く、良好度Qにすぐれ、
容量温度係数が小さい誘電体磁器組成物として下記のよ
うな系が知られている。
Conventional technology Conventionally, the dielectric constant and insulation resistance are high, and the quality Q is excellent.
The following systems are known as dielectric ceramic compositions with small capacitance temperature coefficients.

−Ba0−TiO2−Nd203系 −BaO−Ti02− Sm 203系発明が解決しよ
うとする課題 しかし、これらの組成、例えば0.11 BuOO,6
8TiO2−0,21Nd203の組成比からなる誘電
体材料を使用し、パラジウムの内部電極厚み4/Zm、
誘電体厚み1271m、内部電極の重なジオ法1.2m
+nX0.γ団、誘電体層数19の積層構造をもつ積層
セラミックコンデンザを作製すると、静電容量の平均値
ニア42pF、良好度Qの平均値二8700、容量温度
係数の平均値: NN35pp/’C。
-Ba0-TiO2-Nd203 system -BaO-Ti02- Sm203 system Problems to be solved by the invention However, these compositions, for example, 0.11 BuOO, 6
Using a dielectric material with a composition ratio of 8TiO2-0, 21Nd203, the internal electrode thickness of palladium was 4/Zm,
Dielectric thickness 1271m, geo method with overlapping internal electrodes 1.2m
+nX0. When a multilayer ceramic capacitor with a laminated structure of γ groups and 19 dielectric layers is manufactured, the average value of capacitance is 42 pF, the average value of quality Q is 28,700, and the average value of capacitance temperature coefficient is NN35 pp/'C. .

絶縁抵抗の平均値: 6.OX 1012Ω、絶縁破壊
強度の平均値: 117 KV/、  であり、絶縁抵
抗と絶縁破壊強度において満足できる値で々い。
Average value of insulation resistance: 6. OX 1012Ω, average value of dielectric breakdown strength: 117 KV/, which is a satisfactory value in terms of insulation resistance and dielectric breakdown strength.

また、積層セラミックコンデンサのコスI−タウンを行
うため、及び素体内部の構造欠陥であるデラミネーショ
ンの発生を防ぐため、パラジウムの内部電極厚みを4μ
mから2μm に薄くすると、上記の組成比の誘電体拐
料を使用し、上記の誘電体厚み、内部電極重なシ寸法、
誘電体層数の積層構造をもつ積層セラミックコンデンサ
の静電容量の平均値が、610pFと小さくなるととも
に静電容量のバラツキが256〜713pFと大きくな
る。さらに、良好度Qの平均値も4000と低くなると
ともに良好度Qのバラツキが6o○〜8800と大きく
なるという課題があった。
In addition, in order to perform cost I-town of the multilayer ceramic capacitor and to prevent the occurrence of delamination, which is a structural defect inside the element body, the thickness of the palladium internal electrode was increased to 4 μm.
When thinning from m to 2 μm, a dielectric thinning material with the above composition ratio is used, the dielectric thickness is the above, the internal electrode thickness is reduced,
The average value of capacitance of a multilayer ceramic capacitor having a laminated structure with a number of dielectric layers is as small as 610 pF, and the variation in capacitance is large as 256 to 713 pF. Furthermore, there was a problem in that the average value of the quality level Q was as low as 4,000, and the variation in the quality level Q was large, ranging from 6° to 8,800.

課題を解決するための手段 これらの課題を解決するために本発明は、一般式 %式% と表わした時(ただし、X+7+Z=1.O○。Means to solve problems In order to solve these problems, the present invention develops the general formula %formula% When expressed as (however, X+7+Z=1.O○.

Re OばLa2O3,Pr201./3. Nd2O
3,Sm、、03の中から選ばれる少なくとも1種以上
の希土類元素の酸化物。)、x+ V r zが以下に
表わす各点色。
ReObaLa2O3, Pr201. /3. Nd2O
An oxide of at least one rare earth element selected from 3, Sm, and 03. ), x+ V r z represents each point color below.

b、c、d、e、fで囲まれるモル比の範囲からなる主
成分100重量部に対して、副成分としてニオブ酸化物
をNb2o5に換算して0.3〜8.0重量部含有した
ことを特徴とする誘電体磁器組成物を提案するものであ
る。
0.3 to 8.0 parts by weight of niobium oxide, calculated as Nb2O5, was contained as a subcomponent to 100 parts by weight of the main component having a molar ratio range surrounded by b, c, d, e, and f. This paper proposes a dielectric ceramic composition characterized by the following.

t1 作用 第1図は本発明にかかる組成物の主成分の組成範囲を示
す三元図でちゃ、主成分の組成範囲を限定した理由を第
1図を参照しながら説明する。すなわち、人領域では焼
結が著しく困難である。甘だ、B領域では良好度Qが低
下し実用的でなくなる。さらに、C,D領域では温度係
数がマイナス側に犬きくなり過ぎて実用的でなくなる。
t1 Effect FIG. 1 is a ternary diagram showing the composition range of the main components of the composition according to the present invention.The reason for limiting the composition range of the main components will be explained with reference to FIG. That is, sintering is extremely difficult in the human region. That's naive. In area B, the quality Q decreases and it becomes impractical. Furthermore, in regions C and D, the temperature coefficient becomes too steep on the negative side, making it impractical.

そして、E領域では容量温度係数がプラス方向に移行す
るが誘電率が小さく実用的でなくなる。また、Re20
゜f La205. Pr20.、/3. Nd2O3
,Sm2O3から選ぶこトに、lI: り、La、、0
5. Pr20.、/3. Nd2O3,Sm203(
7)順で誘電率を大きく下げることなく温度係数全プラ
ス方向に移行することが可能であり、La2O3゜Pr
2011/3.Nd2o6,5m2o5ノ1種あるいは
組合せにより容量温度係数の調節が可能である。
In region E, the capacitance temperature coefficient shifts to a positive direction, but the dielectric constant is too small to be practical. Also, Re20
゜f La205. Pr20. , /3. Nd2O3
, Sm2O3, lI: ri, La, , 0
5. Pr20. , /3. Nd2O3, Sm203(
7) It is possible to shift the temperature coefficient to the positive direction without significantly lowering the dielectric constant, and La2O3゜Pr
2011/3. The capacity temperature coefficient can be adjusted by using one or a combination of Nd2o6 and 5m2o5.

第2図は本発明にかかる組成物の主成分に対し、副成分
Nb2O5の含有効果を積層セラミックコンデンサの特
性で示すグラフであり、Nb2O5の含有範囲を限定し
た理由をグラフを参照しながら説明7 △ する。第2図に示すようにNb2O5を含有することに
より、絶縁抵抗、絶縁破壊強度、良好度Qが向上し、捷
た静電容量を高め、静電容量のバラツキを小さくする効
果を有する。このNb2O5の含有により、絶縁抵抗、
絶縁破壊強度は向上するが、Nb2O5の含有量が主成
分100重量部に対し、0.3重量部未満ではそれほど
絶縁破壊強度が大きくなく、静電容量と良好度Qが低く
、また静電容量と良好度Qのバラツキが太きいため、こ
の発明の範囲から除外した。一方、Nb2o5の含有量
が主成分に対し、8,0重量部を超えると良好度Q、絶
縁抵抗が低下し、容量温度係数がマイナス側に太きくな
り、さらに静電容量の温度変化の直線性が失なわれ実用
的でなくなる。
FIG. 2 is a graph showing the effect of the inclusion of the subcomponent Nb2O5 on the characteristics of a multilayer ceramic capacitor with respect to the main component of the composition according to the present invention, and the reason for limiting the content range of Nb2O5 will be explained with reference to the graph. △ Yes. As shown in FIG. 2, the inclusion of Nb2O5 has the effect of improving insulation resistance, dielectric breakdown strength, and quality Q, increasing the capacitance caused by the capacitance, and reducing variations in the capacitance. Due to the inclusion of Nb2O5, insulation resistance,
The dielectric breakdown strength improves, but if the content of Nb2O5 is less than 0.3 parts by weight based on 100 parts by weight of the main component, the dielectric breakdown strength is not so great, the capacitance and goodness Q are low, and the capacitance Since the variation in quality Q was large, it was excluded from the scope of this invention. On the other hand, if the content of Nb2o5 exceeds 8.0 parts by weight based on the main component, the quality Q and insulation resistance will decrease, the temperature coefficient of capacitance will become thicker on the negative side, and the temperature coefficient of capacitance will change linearly. It loses its character and becomes impractical.

本発明はさらに、上記組成物に、マンガン、亜鉛、鉄及
びケイ素の酸化物から選ばれる少なくとも1種以上を、
それぞれMnO2,ZnO、Fe2O3及びSiO2に
換算して主成分と副成分を合わせた100重量部に対し
、0.05〜1.00玉量部添加せしめた構成とするこ
とができる。これらの添加物は磁器の焼結性を向上させ
る効果を有し、その添加量が0.05重量部未満では添
加効果はなく、1.00重量部を超えると誘電率が低下
し実用的でなくなる。
The present invention further provides the above composition with at least one selected from oxides of manganese, zinc, iron, and silicon.
It can be configured such that 0.05 to 1.00 parts by weight are added to 100 parts by weight of the main component and subcomponent in terms of MnO2, ZnO, Fe2O3 and SiO2, respectively. These additives have the effect of improving the sinterability of porcelain, but if the amount added is less than 0.05 parts by weight, there is no effect, and if it exceeds 1.00 parts by weight, the dielectric constant decreases and it is not practical. It disappears.

実施例 以下に、本発明を具体的実施例によυ説明する。Example The present invention will be explained below using specific examples.

(実施例1) 出発原料には化学的に高純度のBaCO2,TiO2゜
La205. Pr60.1. N4205. Sm2
05及びNb2O5粉末を下記の第1表に示す組成比に
なるように秤量し、めのうボールを備えたゴム内張ジの
ボールミルに純水とともに入れ、湿式混合後、脱水乾燥
した。この乾燥粉末を高アルミナ質のルツボに入れ、空
気中で1100℃にて2時間仮焼した。この仮焼粉末を
、めのうボールを備えたゴム内張りのポルミルに純水と
ともに入れ、湿式粉砕後、脱水乾燥した。この粉砕粉末
に、有機バインダーを加え、均質とした後、32メツシ
ユのふるいを通して整粒し、金型と油圧プレスを用いて
成型圧力1ton/iで直径15鮒、厚み0.4圏に成
型した。
(Example 1) Starting materials include chemically high-purity BaCO2, TiO2°La205. Pr60.1. N4205. Sm2
05 and Nb2O5 powders were weighed so as to have the composition ratios shown in Table 1 below, and put into a ball mill with a rubber-lined jig equipped with agate balls together with pure water, and after wet mixing, they were dehydrated and dried. This dry powder was placed in a high alumina crucible and calcined in air at 1100°C for 2 hours. This calcined powder was placed together with pure water in a rubber-lined Polmill equipped with an agate ball, wet-pulverized, and then dehydrated and dried. An organic binder was added to this pulverized powder to make it homogeneous, and then the granules were sized through a 32-mesh sieve, and molded using a mold and hydraulic press at a molding pressure of 1 ton/i to a diameter of 15 pieces and a thickness of about 0.4 mm. .

9 、、−、。9,,-,.

次いで、この成型円板をジルコニア粉末を敷いたアルミ
ナ質のザヤに入れ、空気中において第1表に示す温度で
2時間焼成し、第り表に示す組成比の誘電体磁器を得た
Next, this molded disk was placed in an alumina sheath covered with zirconia powder and fired in air at the temperature shown in Table 1 for 2 hours to obtain dielectric porcelain having the composition ratio shown in Table 1.

このようにして得られた誘電体磁器円板は、素子厚みと
直径を測定し、誘電率、良好度Q、容量温度係数測定用
試料は、誘電体磁器円板の両面全体に銀電極を焼き付け
、絶縁抵抗、絶縁破壊強度測定用試料は、誘電体磁器円
板の外周より内側に19の1〕で銀電極の無い部分を設
け、銀電極を焼き付けた。そして、誘電率、良好度Q、
温度係数はYHP社製デジタルLCFLメータのモデル
4276Aを使用し、測定温度20℃、測定電圧1、○
Vrms 、測定周波数1MHzでの測定により求めた
。なお、静電容量の温度変化は、−65℃。
The element thickness and diameter of the dielectric ceramic disk obtained in this way were measured, and the sample for measuring the dielectric constant, goodness Q, and capacitance temperature coefficient was prepared by baking silver electrodes on the entire both sides of the dielectric ceramic disk. , insulation resistance, and dielectric breakdown strength measurements were prepared by providing a portion without a silver electrode at 19/1] inside the outer periphery of a dielectric ceramic disk, and baking the silver electrode. Then, the dielectric constant, goodness Q,
The temperature coefficient was measured using YHP digital LCFL meter model 4276A, measuring temperature 20°C, measuring voltage 1, ○
Vrms was determined by measurement at a measurement frequency of 1 MHz. Note that the temperature change in capacitance is -65°C.

−26℃、20’C、86℃、125℃の静電容量を測
定し、直線性を確認するとともに、容量温度係数は、2
0℃と86℃の静電容量を用い、次式により求めた。
The capacitance was measured at -26°C, 20'C, 86°C, and 125°C, and the linearity was confirmed, and the capacitance temperature coefficient was 2.
It was calculated using the following formula using capacitances at 0°C and 86°C.

10へ co=20℃での静電容量(pF ) C,:a6℃での静電容量(pF’) また、誘電率は次式により求めた。Go to 10 capacitance at co=20℃ (pF) C,:a Capacitance at 6℃ (pF') In addition, the dielectric constant was determined using the following formula.

を 誘電率−°°3°axe・x  o・ Co:20℃での静電容量(pF) D :誘電体磁器の直径(顛) t :誘電体磁器の厚み(調) さらに、絶縁抵抗は、YHP社製HRメータのモデル4
329Aを使用し、測定電圧60V、D、C,。
Dielectric constant -°°3°axe・xo・Co: Capacitance at 20°C (pF) D: Diameter of dielectric porcelain (size) t: Thickness of dielectric porcelain (tone) Furthermore, the insulation resistance is , YHP HR meter model 4
329A, measuring voltage 60V, D, C,.

測定時間1分間による測定より求めた。It was determined by measurement with a measurement time of 1 minute.

そして、絶縁破壊強度は、菊水電子工業(株)型窩電圧
電源PH836に一3形を使用し、試料をシリコンオイ
ル中に入れ、昇圧速度sob/seaによジ求めた絶縁
破壊電圧を誘電体厚みで除算し、1胡当た9の絶縁破壊
強度とした。
The dielectric breakdown strength was determined by using a type 13 voltage power supply PH836 manufactured by Kikusui Electronics Co., Ltd., placing the sample in silicone oil, and calculating the dielectric breakdown voltage using the boost rate sob/sea. Divided by the thickness, the dielectric breakdown strength was determined to be 1/9.

試験条件及び結果を第1表に併せて示す。Test conditions and results are also shown in Table 1.

13 ・\−・ (実施例2) 出発原料には化学的に高純度のBaCO3,TiO2゜
L2L203.Pr6O11.Nd205.Sm203
1NSm2O31Nb2051 、 Fe2O3及びS
in、、粉末を下記の第2表に示す組成比になるように
秤量し、それ以後は、実施例1の場合と同様に処理して
第2表に示す組成比の誘電体磁器を得た。
13 ・\−・ (Example 2) Chemically high purity BaCO3, TiO2゜L2L203. Pr6O11. Nd205. Sm203
1NSm2O31Nb2051, Fe2O3 and S
The powder was weighed to have the composition ratio shown in Table 2 below, and then treated in the same manner as in Example 1 to obtain dielectric porcelain having the composition ratio shown in Table 2. .

これらの試料の試験方法は実施例1と同様であυ、試験
条件及び結果全第2表に併せて示す。
The test methods for these samples were the same as in Example 1, and the test conditions and results are also shown in Table 2.

(以 下金 白) 16へ (実施例3) 出発原料には化学的に高純度のBaCO3,TiO2゜
Nd2O5,Sm2O3及びNb2o5  粉末を使用
し、主成分0.11BaO−0,68TiO2−0,2
1Nd2O3に対し、Nb205i 0 、0.1  
、0.3 、0.5 、1.0 。
(Hereinafter referred to as gold and white) Go to 16 (Example 3) Chemically high-purity BaCO3, TiO2゜Nd2O5, Sm2O3 and Nb2O5 powders were used as starting materials, and the main components were 0.11BaO-0,68TiO2-0,2.
Nb205i 0 , 0.1 for 1Nd2O3
, 0.3, 0.5, 1.0.

6.0 、8.0 、10.Owt%含有した仮焼粉砕
粉を実施例1と同様の方法で作製する。但し、Nb2O
5含有量0,0.1.10.Owt%はこの発明の範囲
外であり、0.3 、0.5 、1.0 、5.○、s
、owt%ば、この発明の範囲内である。
6.0, 8.0, 10. A calcined and pulverized powder containing Owt% is prepared in the same manner as in Example 1. However, Nb2O
5 content 0, 0.1.10. Owt% is outside the scope of this invention and is 0.3, 0.5, 1.0, 5. ○、s
, owt% is within the scope of this invention.

との仮焼粉砕粉末に、有機バインダー、可塑剤。Calcined and ground powder with organic binder and plasticizer.

分散剤、有機溶剤を加え、アルミナボールを備えたポリ
エチレン製ポットで混合し、スラリーを作製した。混合
後、300メツシユのナイロン布を使用し、沢過した。
A dispersant and an organic solvent were added and mixed in a polyethylene pot equipped with an alumina ball to prepare a slurry. After mixing, the mixture was thoroughly filtered using a 300 mesh nylon cloth.

沢通抜のスラリーはドクターブレードにより、焼結後の
誘電体厚が約12μmとなるように、離型処理をしたポ
リエステルフィルム上にンートヲ成形した。次に、ポリ
エステルフィルムから剥したシート10枚を支持台の上
に積層した。この上に、昭栄化学(株)製陶部電極パラ
ジウムベース)ML−3724を、焼結後の内部電極厚
みが2μmとなるように、スクリーン印刷し、乾燥した
。この上にポリエステルフィルムから剥したシート1枚
を積層した。この上に、焼結後の内部電極重なり寸法が
約1.2mmX約0.7門となるように印刷位置をずら
して内部電極パラジウムペーストラ印刷し、乾燥後ポリ
エステルフィルムから剥したシート1枚を積層した。こ
れらの操作を、誘電体層数が19となるまで繰返した。
The slurry from Sawadori was molded using a doctor blade onto a polyester film that had been subjected to mold release treatment so that the dielectric thickness after sintering was approximately 12 μm. Next, 10 sheets peeled from the polyester film were laminated on a support base. On top of this, ML-3724 (electrode palladium base, manufactured by Shoei Kagaku Co., Ltd.) was screen printed so that the internal electrode thickness after sintering would be 2 μm, and then dried. A sheet peeled from a polyester film was laminated on top of this. On top of this, internal electrode palladium paste was printed by shifting the printing position so that the internal electrode overlap dimensions after sintering were approximately 1.2 mm x approximately 0.7 gates, and after drying, one sheet was peeled off from the polyester film. Laminated. These operations were repeated until the number of dielectric layers was 19.

この上に、ポリエステルフィルムから剥したシー)10
枚を積層した。この積層体を焼結後、内部電極重なり寸
法が約1.2mX約0.7 m 、誘電体厚が約127
zm、誘電体層数が19の積層構造をもつ積層セラミッ
クコンデンサとなるように切断した。この切断した試料
は、ジルコニア粉末を敷いたアルミナ質のサヤに入れ、
空気中において、室温から350′C,までを5℃/h
rで昇温し、360℃よジ100℃/hrで昇温し、1
270℃で2時間焼成後、100℃/hrで室温まで降
温した。
On top of this, add 10 pieces of paper peeled from the polyester film.
The sheets were stacked. After sintering this laminate, the internal electrode overlap dimensions are approximately 1.2 m x approximately 0.7 m, and the dielectric thickness is approximately 127 m.
The capacitor was cut into a multilayer ceramic capacitor having a multilayer structure with zm and 19 dielectric layers. This cut sample was placed in an alumina pod covered with zirconia powder.
In air, from room temperature to 350'C, 5°C/h
The temperature was raised at 360°C and 100°C/hr.
After baking at 270°C for 2 hours, the temperature was lowered to room temperature at 100°C/hr.

そして、焼結後の試料は、耐水サンドベーパーを1 7
 1、−7 内側に貼ったポリエチレンポットに純水とともに入れ、
ポリエチレンポットヲ回転させ焼結後の試料面を研磨し
、外部電極と接合する内部電極部分を充分露出させた。
Then, the sample after sintering was coated with water-resistant sand vapor 1 7
1.-7 Put it in a polyethylene pot with pure water attached to the inside,
The polyethylene pot was rotated to polish the surface of the sintered sample to fully expose the internal electrode portion that would be connected to the external electrode.

次いで、試料はポリエチレンポットより取り出し乾燥後
、内部電極露出部分に銀の外部電極を焼き付け、内部電
極と導通させ、積層セラミックコンデンサ全作製した。
Next, the sample was taken out of the polyethylene pot and dried, and then a silver external electrode was baked onto the exposed part of the internal electrode to make it electrically conductive with the internal electrode, thereby completing the entire multilayer ceramic capacitor.

これらの試料の静電容量、良好度Q、容量温度係数、絶
縁抵抗、絶縁破壊強度は実施例1と同様の条件での測定
により求めた。また、積層構造の確認は、積層セラミッ
クコンデンサの長さ方向及び幅方向の約1/2の研磨断
面を、内部電極重な夛寸法は倍率100.誘電体厚みと
内部電極厚みは倍率400での観察より求めた。
The capacitance, quality Q, temperature coefficient of capacitance, insulation resistance, and dielectric breakdown strength of these samples were determined by measurement under the same conditions as in Example 1. In addition, to confirm the laminated structure, a polished cross section of about 1/2 in the length and width directions of the laminated ceramic capacitor was examined, and the dimensions of the internal electrodes were measured at a magnification of 100. The dielectric thickness and the internal electrode thickness were determined by observation at a magnification of 400.

その測定結果を第2図に示す。The measurement results are shown in FIG.

なお、実施例における誘電体磁器の作製方法ではBaC
O3,TiO2,La2O3,Pr60. 、 、 N
d2O3゜Sm、、03. Nb2O5,MnO2,Z
nO、Fe2O2及び5102を使用したが、この方法
に限定されるものではなく、所望の組成比になるように
、B a T 103などの18へ−7 化合物、あるいは炭酸塩、水酸化物など空気中での加熱
により、Ba0ITi02.La2o5.Pr6O11
゜Nd2O3,Sm2o51Nb205.MnO□1Z
nO9Fe203及びSiO2となる化合物を使用して
も実施例と同程度の特性を得ることができる。また、主
成分をあらかじめ仮焼し、副成分を添加しても実施例と
同程度の特性を得ることができる。
In addition, in the method for manufacturing dielectric ceramic in the example, BaC
O3, TiO2, La2O3, Pr60. , , N
d2O3°Sm, 03. Nb2O5, MnO2, Z
Although nO, Fe2O2, and 5102 were used, the method is not limited to this method, and 18 to -7 compounds such as B a T 103, or carbonates, hydroxides, etc., may be used to obtain the desired composition ratio. By heating in the Ba0ITi02. La2o5. Pr6O11
°Nd2O3, Sm2o51Nb205. MnO□1Z
Characteristics comparable to those of the examples can be obtained even when compounds forming nO9Fe203 and SiO2 are used. Further, even if the main component is calcined in advance and the subcomponents are added, properties comparable to those of the examples can be obtained.

1だ、銹電体磁器用として一般に使用される工業用原料
の酸化チタン、例えばチタン工業(株)膜酸化チタンK
A−10.古河鉱業(株)膜酸化チタンFA−56Wに
は最大0.46重量%のNb2O5が含まれるが、これ
らの酸化チタンを使用して主成分の誘電体磁器を作製し
ても主成分100重量部に対して、Nb2O5の含有量
は最大でo、23重量部であり、この発明の範囲外であ
るが、工業用原料の酸化チタン中のNb2O5量を考慮
し、不足分のWb205全含有させることにより、実施
例と同程度の特性を得ることができる。
1. Titanium oxide, an industrial raw material commonly used for electric porcelain, such as titanium oxide K manufactured by Titan Kogyo Co., Ltd.
A-10. Furukawa Mining Co., Ltd. Membrane titanium oxide FA-56W contains up to 0.46% by weight of Nb2O5, but even if these titanium oxides are used to create dielectric ceramics as the main component, only 100 parts by weight of the main component. On the other hand, the maximum content of Nb2O5 is 0.23 parts by weight, which is outside the scope of this invention, but considering the amount of Nb2O5 in titanium oxide, which is an industrial raw material, it is possible to contain all the Wb205 that is insufficient. Accordingly, characteristics comparable to those of the example can be obtained.

発明の効果 以上のように本発明によれば、誘電率、絶縁抵19 /
、 抗、絶縁破壊電圧が高く、良好塵Qにすぐれ、容量温度
係数が小さく、かつ積層セラミックコンデンサへの利用
においては、内部電極の厚みを薄くしたときの静電容量
と良好塵Qの低下を防ぎ、静電容量と良好塵Qのバラツ
キを小さくできるため、内部電極の厚みを薄くして、積
層セラミックコンデンサのコストダウンが行えるととも
に内部構造欠陥であるデラミネーションの発生を防ぐこ
とができる。捷た、絶縁破壊電圧が高いため、誘電体層
の厚みを薄くし、素体の小形化、大容量化が可能である
Effects of the Invention As described above, according to the present invention, the dielectric constant, insulation resistance 19/
, has high dielectric breakdown voltage, excellent dust Q, and small temperature coefficient of capacitance, and when used in multilayer ceramic capacitors, reduces capacitance and dust Q when thinner internal electrodes are used. Since the variation in capacitance and good dust Q can be reduced, the thickness of the internal electrodes can be reduced to reduce the cost of multilayer ceramic capacitors, and the occurrence of delamination, which is an internal structural defect, can be prevented. Since the dielectric breakdown voltage is high, it is possible to reduce the thickness of the dielectric layer and make the element smaller and increase the capacity.

さらに、マンガン、亜鉛、鉄及びケイ素の酸化物の添加
により、焼成温度を低下させることができる。
Furthermore, the addition of oxides of manganese, zinc, iron and silicon allows the firing temperature to be lowered.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明にかかる主成分の組成範囲を説明する三
元図、第2図は本発明にかかる主成分o、11BaO−
o、6 s TiO2−0,21Nd203VC対−f
る副成分Nb2O5の含有効果を、誘電体厚:12μm
。 内部電極型なり寸法:1.2mmX0.7m+誘電体層
数二19の積層構造をもつ積層セラミックコンデンサの
電気特性で示すグラフである。
FIG. 1 is a ternary diagram explaining the composition range of the main components according to the present invention, and FIG. 2 is a ternary diagram explaining the composition range of the main components according to the present invention.
o, 6s TiO2-0,21Nd203VC vs.-f
dielectric thickness: 12 μm
. This is a graph showing the electrical characteristics of a multilayer ceramic capacitor having a multilayer structure of internal electrode type dimensions: 1.2 mm x 0.7 m + 219 dielectric layers.

Claims (2)

【特許請求の範囲】[Claims] (1)一般式 xBaO−yTiO_2−zRe_2O_3と表わした
時(ただし、x+y+z=1.00。 Re_2O_3は、La_2O_3,Pr_2O_1_
1_/_3,Nd_2O_3,Sm_2O_3から選ば
れる少なくとも1種以上の希土類元素の酸化物。)、x
,y,zが以下に表わす各点a,b,c,d,e,fで
囲まれるモル比の範囲からなる主成分100重量部に対
し、副成分としてニオブ酸化物をNb_2O_5に換算
して0.3〜8.0重量部含有したことを特徴とする誘
電体磁器組成物。 ▲数式、化学式、表等があります▼
(1) When expressed as the general formula xBaO-yTiO_2-zRe_2O_3 (where x+y+z=1.00. Re_2O_3 is La_2O_3, Pr_2O_1_
An oxide of at least one rare earth element selected from 1_/_3, Nd_2O_3, and Sm_2O_3. ), x
, y, z are in the range of molar ratios surrounded by points a, b, c, d, e, f shown below, and niobium oxide is added as a subcomponent in terms of Nb_2O_5. A dielectric ceramic composition characterized in that it contains 0.3 to 8.0 parts by weight. ▲Contains mathematical formulas, chemical formulas, tables, etc.▼
(2)主成分と副成分を合わせた100重量部に対して
、マンガン,亜鉛,鉄及びケイ素の酸化物から選ばれる
少なくとも1種以上を、それぞれMnO_2,ZnO,
Fe_2O_3及びSiO_2に換算して0.05〜1
.00重量部添加したことを特徴とする特許請求の範囲
第1項記載の誘電体磁器組成物。
(2) For 100 parts by weight of the main component and subcomponents combined, at least one selected from oxides of manganese, zinc, iron, and silicon are added to MnO_2, ZnO, and
0.05 to 1 in terms of Fe_2O_3 and SiO_2
.. 2. The dielectric ceramic composition according to claim 1, wherein 00 parts by weight are added.
JP1062477A 1989-03-15 1989-03-15 Multilayer ceramic capacitors Expired - Lifetime JP2933635B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1062477A JP2933635B2 (en) 1989-03-15 1989-03-15 Multilayer ceramic capacitors

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1062477A JP2933635B2 (en) 1989-03-15 1989-03-15 Multilayer ceramic capacitors

Publications (2)

Publication Number Publication Date
JPH02242525A true JPH02242525A (en) 1990-09-26
JP2933635B2 JP2933635B2 (en) 1999-08-16

Family

ID=13201308

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1062477A Expired - Lifetime JP2933635B2 (en) 1989-03-15 1989-03-15 Multilayer ceramic capacitors

Country Status (1)

Country Link
JP (1) JP2933635B2 (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5790808A (en) * 1980-11-28 1982-06-05 Fujitsu Ltd Porcelain composition having high permittivity
JPS61291457A (en) * 1985-06-14 1986-12-22 タム・セラミックス・インコーポレイテッド Dielectric composition
JPS6217069A (en) * 1985-07-15 1987-01-26 三菱電機株式会社 Dielectric ceramic material
JPS6256361A (en) * 1985-09-05 1987-03-12 富士チタン工業株式会社 Dielectric ceramic composition

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5790808A (en) * 1980-11-28 1982-06-05 Fujitsu Ltd Porcelain composition having high permittivity
JPS61291457A (en) * 1985-06-14 1986-12-22 タム・セラミックス・インコーポレイテッド Dielectric composition
JPS6217069A (en) * 1985-07-15 1987-01-26 三菱電機株式会社 Dielectric ceramic material
JPS6256361A (en) * 1985-09-05 1987-03-12 富士チタン工業株式会社 Dielectric ceramic composition

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