JPH0224370U - - Google Patents

Info

Publication number
JPH0224370U
JPH0224370U JP10249788U JP10249788U JPH0224370U JP H0224370 U JPH0224370 U JP H0224370U JP 10249788 U JP10249788 U JP 10249788U JP 10249788 U JP10249788 U JP 10249788U JP H0224370 U JPH0224370 U JP H0224370U
Authority
JP
Japan
Prior art keywords
defect
level
light reception
pixel
reception level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10249788U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10249788U priority Critical patent/JPH0224370U/ja
Publication of JPH0224370U publication Critical patent/JPH0224370U/ja
Pending legal-status Critical Current

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Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示すブロツク図、
第2図は第1図の動作を説明する波形図、第3図
a〜cは曲面形状におけるカメラより得られた表
面受光レベルの波形図、第4図、第5図は従来未
検出となる表面受光レベルの波形図である。 1…CCDカメラ、2…A/D変換器、3…画
素シフトレジスタ、4…符号判別付減算回路、5
,12…比較器、6…欠陥開始設定部、7…画素
シフト(N)設定部、8…画素アドレスカウンタ
、9,14…減算器、10…終了点検出レベル回
路部、11,13…レジスタ。
FIG. 1 is a block diagram showing one embodiment of the present invention;
Figure 2 is a waveform diagram explaining the operation of Figure 1, Figures 3 a to c are waveform diagrams of the surface light reception level obtained by the camera in a curved surface shape, and Figures 4 and 5 are conventionally undetected. FIG. 3 is a waveform diagram of the surface light reception level. 1... CCD camera, 2... A/D converter, 3... Pixel shift register, 4... Subtraction circuit with sign discrimination, 5
, 12... Comparator, 6... Defect start setting section, 7... Pixel shift (N) setting section, 8... Pixel address counter, 9, 14... Subtractor, 10... End point detection level circuit section, 11, 13... Register .

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 曲面形状を有する被測定物の欠陥検出において
、CCDイメージセンサの1走査受光レベルにお
ける現画像の受光レベルと規定画素前の受光レベ
ルの差がある設定値以上の場合規定画素前を欠陥
の開始とし、再び現画素レベルと欠陥開始レベル
の中間レベルが検出された画素位置を欠陥の終了
点とし、この間の画素数を欠陥巾とする事により
欠陥の有無及び欠陥の大小を検出する検出部とを
含む事を特徴とする欠陥検出装置。
When detecting a defect in a workpiece having a curved surface shape, if the difference between the light reception level of the current image and the light reception level before a specified pixel in one scanning light reception level of the CCD image sensor is greater than a set value, the point before the specified pixel is considered to be the start of a defect. , again the pixel position where the intermediate level between the current pixel level and the defect start level is detected is defined as the end point of the defect, and the number of pixels between this point is defined as the defect width, thereby detecting the presence or absence of a defect and the size of the defect. A defect detection device characterized by comprising:
JP10249788U 1988-08-01 1988-08-01 Pending JPH0224370U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10249788U JPH0224370U (en) 1988-08-01 1988-08-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10249788U JPH0224370U (en) 1988-08-01 1988-08-01

Publications (1)

Publication Number Publication Date
JPH0224370U true JPH0224370U (en) 1990-02-19

Family

ID=31332459

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10249788U Pending JPH0224370U (en) 1988-08-01 1988-08-01

Country Status (1)

Country Link
JP (1) JPH0224370U (en)

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