JPH01104569U - - Google Patents

Info

Publication number
JPH01104569U
JPH01104569U JP20008387U JP20008387U JPH01104569U JP H01104569 U JPH01104569 U JP H01104569U JP 20008387 U JP20008387 U JP 20008387U JP 20008387 U JP20008387 U JP 20008387U JP H01104569 U JPH01104569 U JP H01104569U
Authority
JP
Japan
Prior art keywords
pixel
circuit board
voltage
operating state
detection means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20008387U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP20008387U priority Critical patent/JPH01104569U/ja
Publication of JPH01104569U publication Critical patent/JPH01104569U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例である回路基板の検
査装置の構成を示すブロツク図である。 1……I/V変換回路、2……増幅回路、3…
…サンプルホールド回路、4……A/Dコンバー
タ、5……検知部、6……表示部。
FIG. 1 is a block diagram showing the configuration of a circuit board inspection apparatus which is an embodiment of the present invention. 1...I/V conversion circuit, 2...Amplification circuit, 3...
...sample hold circuit, 4...A/D converter, 5...detection section, 6...display section.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体薄膜によつて形成された複数の画素を有
する回路基板を検査する装置において、前記各画
素の各所定の動作状態における出力電流を検出し
、この検出した電流を電圧に変換する第一の変換
手段と、前記電圧をデイジタル信号に変換する第
二の変換手段と、前記各画素の各動作状態を検出
する検知手段と、この検知手段により検知された
結果を表示する表示手段とを備えたことを特徴と
する回路基板の検査装置。
In an apparatus for inspecting a circuit board having a plurality of pixels formed of a semiconductor thin film, a first conversion step detects an output current of each pixel in each predetermined operating state and converts the detected current into a voltage. a second conversion means for converting the voltage into a digital signal; a detection means for detecting each operating state of each pixel; and a display means for displaying the results detected by the detection means. A circuit board inspection device featuring:
JP20008387U 1987-12-30 1987-12-30 Pending JPH01104569U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20008387U JPH01104569U (en) 1987-12-30 1987-12-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20008387U JPH01104569U (en) 1987-12-30 1987-12-30

Publications (1)

Publication Number Publication Date
JPH01104569U true JPH01104569U (en) 1989-07-14

Family

ID=31490509

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20008387U Pending JPH01104569U (en) 1987-12-30 1987-12-30

Country Status (1)

Country Link
JP (1) JPH01104569U (en)

Similar Documents

Publication Publication Date Title
JPH01104569U (en)
JPH0230061U (en)
JPS6175674U (en)
JPH0335459U (en)
JPH07946Y2 (en) AC voltmeter
JPH01113293U (en)
JPS63530U (en)
JPS6214323U (en)
JPH01142249U (en)
JPS62174272U (en)
JPS6285029U (en)
JPS61197564U (en)
JPS62152559U (en)
JPS6399460U (en)
JPH0357688U (en)
JPS631041A (en) Semiconductor leg bending inspection device
JPH0340577U (en)
JPH0257688U (en)
JPS59131007U (en) Digital display type displacement measuring device
JPH0487409U (en)
JPH01172251U (en)
JPH0336232U (en)
JPS6439505U (en)
JPS6220305U (en)
JPH0224370U (en)