JPH02267105A - Formation of oxide superconductor thin film - Google Patents

Formation of oxide superconductor thin film

Info

Publication number
JPH02267105A
JPH02267105A JP1090238A JP9023889A JPH02267105A JP H02267105 A JPH02267105 A JP H02267105A JP 1090238 A JP1090238 A JP 1090238A JP 9023889 A JP9023889 A JP 9023889A JP H02267105 A JPH02267105 A JP H02267105A
Authority
JP
Japan
Prior art keywords
thin film
oxide superconductor
substrate
atmosphere
ozone
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1090238A
Other languages
Japanese (ja)
Inventor
Masakazu Matsui
正和 松井
Isanori Sato
功紀 佐藤
Nakahiro Harada
原田 中裕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd filed Critical Furukawa Electric Co Ltd
Priority to JP1090238A priority Critical patent/JPH02267105A/en
Publication of JPH02267105A publication Critical patent/JPH02267105A/en
Pending legal-status Critical Current

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  • Oxygen, Ozone, And Oxides In General (AREA)
  • Inorganic Compounds Of Heavy Metals (AREA)
  • Physical Vapour Deposition (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
  • Superconductors And Manufacturing Methods Therefor (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、マグネットワイヤ、電カケープル、電力貯蔵
リンク、磁気シールド、マイスナー効果応用機器、ジョ
セフソン素子、5QUID素子等に用いられる酸化物超
電導体薄膜の形成方法に関する。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to oxide superconductors used in magnet wires, power cables, power storage links, magnetic shields, Meissner effect application devices, Josephson devices, 5QUID devices, etc. This invention relates to a method for forming a thin film.

〔従来の技術とその課題〕[Conventional technology and its issues]

近年、液体N2温度以上で超電導を示す例えば希土類元
素、アルカリ土金属及びCu等からなる酸化物超電導体
が見出されている。
In recent years, oxide superconductors made of rare earth elements, alkaline earth metals, Cu, etc., which exhibit superconductivity above the liquid N2 temperature, have been discovered.

これらの酸化物超電導体は、従来の液体He温度で超電
導を示す金属超電導体に較べて格段に経済的であり、各
分野での利用が検討されている。
These oxide superconductors are much more economical than conventional metal superconductors that exhibit superconductivity at liquid He temperatures, and their use in various fields is being considered.

ところで上記の酸化物超電導体は脆いため金属材料のよ
うに塑性加工ができず、これらを線、条等に加工するに
は、PVD法等の気相成長法により酸素含有雰囲気中に
てSUSやハステロイ合金製テープ等の基体上に酸化物
超電導体を薄膜状に直接析出させる方法がとられている
By the way, the above-mentioned oxide superconductors are brittle and cannot be plastically worked like metal materials, and in order to process them into wires, strips, etc., SUS or A method has been adopted in which an oxide superconductor is directly deposited in a thin film on a substrate such as a Hastelloy alloy tape.

しかしながら上記薄膜は、成膜上りのままではその結晶
中における酸素原子の配列や欠損状態が液体窒素温度以
上の温度では超電導を示す状態にない為所望の超電導特
性が得られず、成膜後別途、酸素含有雰囲気中にて所定
の加熱処理を施して、上記結晶中に酸素を補給し又結晶
構造の調整を行う必要があって、生産性に劣るという問
題があった。
However, the above thin film cannot obtain the desired superconducting properties because the arrangement and defect state of oxygen atoms in the crystal do not exhibit superconductivity at temperatures higher than the liquid nitrogen temperature, and the thin film cannot be obtained separately after the film has been formed. However, it is necessary to perform a predetermined heat treatment in an oxygen-containing atmosphere to replenish oxygen into the crystal and adjust the crystal structure, resulting in a problem of poor productivity.

このようなことから、薄膜を成膜上りのままで液体N2
/IA度以上の温度で超電導体となす方法が種々検討さ
れており、例えば基体を7000℃を超える高温に加熱
しつつ成膜する方法が提案されているが、この方法によ
ると基体の構成元素が酸化物超電導体に拡散して、得ら
れる酸化物超電導体薄膜の超電導特性が低下するという
問題があった。
For this reason, it is necessary to use liquid N2 while the thin film is being deposited.
Various methods have been studied to form a superconductor at a temperature of /IA degrees or higher; for example, a method has been proposed in which a film is formed while heating the substrate to a high temperature exceeding 7000 degrees Celsius, but according to this method, the constituent elements of the substrate There was a problem in that the superconducting properties of the obtained oxide superconductor thin film deteriorated due to diffusion of the oxide superconductor into the oxide superconductor.

又別の方法として、気相成長法とDC又はRF放電によ
る酸素プラズマとを併用して反応性を高め、基体温度を
低くしても成膜上りで超電導体となし得る方法が提案さ
れているが、この方法では得られた成膜体にプラズマダ
メージが生じて超電導特性が低下し、やはり後工程で加
熱処理工程が必要になるという問題があった。
Another method has been proposed that uses a combination of vapor phase growth and oxygen plasma generated by DC or RF discharge to increase reactivity and make the film a superconductor even if the substrate temperature is lowered. However, this method has the problem that plasma damage occurs in the obtained film-formed body, resulting in deterioration of superconducting properties, and that a heat treatment step is also required in the post-process.

〔課題を解決するための手段〕[Means to solve the problem]

本発明はかかる状況に鑑み鋭意研究を行い、気相成長法
における成膜時又は/及び冷却時の雰囲気中にオゾンを
含有せしめることにより、基体温度を7000℃を超え
る高温に加熱することなくT。
In view of this situation, the present invention has conducted extensive research, and by incorporating ozone into the atmosphere during film formation and/or cooling in the vapor phase growth method, T .

等の超電導特性に優れた薄膜体が得られることを知見し
、更に研究を重ねて本発明を完成させるに到ったもので
ある。
It was discovered that a thin film body with excellent superconducting properties could be obtained, and through further research, the present invention was completed.

即ち本発明は、酸化物超電導体の焼結体、酸化物超電導
体の構成元素を含有する物質或いは化合物等をターゲッ
トに用いて気相成長法により基体上に所望厚さコーティ
ングし、次いでこれを冷却して基体上に酸化物超電導体
薄膜を形成する方法において、基体温度を400〜70
00℃とし、コーティング工程又は/及び冷却工程をオ
ゾン含有雰囲気中にて行うことを特徴とする酸化物超電
導体薄膜の形成方法である。
That is, the present invention uses a sintered body of an oxide superconductor, a substance or a compound containing constituent elements of the oxide superconductor as a target, and coats the substrate to a desired thickness by vapor phase growth, and then coats the substrate with a desired thickness. In the method of forming an oxide superconductor thin film on a substrate by cooling, the substrate temperature is set at 400 to 70°C.
This is a method for forming an oxide superconductor thin film, characterized in that the coating step and/or cooling step are performed at 00° C. in an ozone-containing atmosphere.

本発明方法は、気相成長法により、酸化物超電導体薄膜
を形成し、次いでこれを冷却するに際し、上記成膜時又
は/及び冷却時の雰囲気中に強い酸化力を有する活性な
オゾンを含有させて反応を促進せしめることにより基体
温度を400〜7000℃の比較的低い温度に抑えて、
得られる薄膜体を薄膜上りの状態で液体N2温度以上の
温度で超電導性能を示す結晶構造となして超電導体薄膜
中への基体構成元素の拡散防止と別途行っていた酸素含
有雰囲気中での加熱処理を省略するようにしたものであ
る。
In the method of the present invention, when forming an oxide superconductor thin film by a vapor phase growth method and then cooling it, active ozone having strong oxidizing power is contained in the atmosphere during film formation and/or cooling. By accelerating the reaction, the substrate temperature is kept at a relatively low temperature of 400 to 7000°C,
The obtained thin film body is formed into a crystal structure that exhibits superconducting performance at a temperature higher than the liquid N2 temperature in the thin film state, and is heated in an oxygen-containing atmosphere to prevent diffusion of the base constituent elements into the superconductor thin film. This is to omit the processing.

本発明方法において基体温度を400〜7000℃に限
定した理由は、400°C未満では得られる薄膜体結晶
中の酸素原子の配列が適正になされず、又7000℃を
超えると基体の構成元素が酸化物超電導体薄膜中に拡散
して、いずれの場合も超電導特性の低い値のものとなる
為である。
The reason why the substrate temperature is limited to 400 to 7000°C in the method of the present invention is that if it is less than 400°C, the oxygen atoms in the obtained thin film crystal will not be properly arranged, and if it exceeds 7000°C, the constituent elements of the substrate will be This is because it diffuses into the oxide superconductor thin film, resulting in low superconducting properties in either case.

本発明方法において、気相成長法による成膜及び上記薄
膜体の冷却は、気相成長装置の同一チャンバ内でなされ
るもので、上記チャンバ内はオゾンを含有する減圧雰囲
気とし、上記減圧雰囲気中にオゾンの他にHe、Ne、
、Ar、Xe等の不活性ガスやNx、F等のガスが混在
していても差支えない。
In the method of the present invention, film formation by the vapor phase growth method and cooling of the thin film body are performed in the same chamber of a vapor phase growth apparatus, and the inside of the chamber is a reduced pressure atmosphere containing ozone. In addition to ozone, He, Ne,
There is no problem even if inert gases such as , Ar, and Xe, and gases such as Nx and F are mixed.

上記においてオゾン含有量は全ガス量の10容量%以上
とするのが、反応が活性になされ、高い超電導特性が得
られて好ましいものである。
In the above, it is preferable that the ozone content is 10% by volume or more based on the total amount of gas because the reaction is activated and high superconducting properties are obtained.

本発明方法において、気相成長法としては、スパッタリ
ング法、真空蒸着法、レーザ蒸着法、イオンビームスパ
ッタ法、分子線エピタキシ法、イオンブレーティング法
、MOCVD法等があり、そのターゲツト材には、超電
導体物質と同一の物質又は上記物質を構成する金属・元
素、又は上記元素を含有する物質、例えば酸化物、酢酸
塩、硝酸塩、ハロゲン化物、有機金属化合物等が用いら
れる。
In the method of the present invention, the vapor phase growth method includes sputtering method, vacuum evaporation method, laser evaporation method, ion beam sputtering method, molecular beam epitaxy method, ion blating method, MOCVD method, etc., and the target material includes: The same substance as the superconductor substance, the metal/element constituting the above substance, or a substance containing the above element, such as oxides, acetates, nitrates, halides, organometallic compounds, etc., are used.

本発明方法において、気相成長法により成膜する酸化物
超電導体とは、例えばYBazcu30.+δ(δζ0
,1〜0.5)の分子式からなる酸化物超電導体であっ
て、その結晶構造が超電導を示す層状ペロブスカイト型
の酸素欠損性斜方晶からなるものである。
In the method of the present invention, the oxide superconductor to be formed by vapor phase growth is, for example, YBazcu30. +δ(δζ0
, 1 to 0.5), and its crystal structure is a layered perovskite-type oxygen-deficient orthorhombic crystal structure exhibiting superconductivity.

〔作用〕[Effect]

本発明方法、において、気相成長法による酸化物超電導
体の成膜時又は/及び形成させた薄膜の冷却時の雰囲気
中にオゾンを含有せしめ、且つ上記酸化物超電導体を堆
積させる基体温度を400〜7000℃に保持するので
、成膜時にあっては、ターゲットからの蒸発元素等がオ
ゾン原子と活性に反応して酸化物超電導体となって基体
上に酸素原子が適正に配列した超電導を示す結晶構造の
薄膜が形成され、且つ成膜中基体の構成元素が得られる
薄膜体中へ拡散するようなこともない。
In the method of the present invention, ozone is contained in the atmosphere during film formation of the oxide superconductor by vapor phase growth and/or cooling of the formed thin film, and the temperature of the substrate at which the oxide superconductor is deposited is adjusted. Since the temperature is maintained at 400 to 7000°C, during film formation, evaporated elements from the target actively react with ozone atoms to form an oxide superconductor, which creates superconductivity with properly arranged oxygen atoms on the substrate. A thin film having the crystal structure shown is formed, and constituent elements of the substrate do not diffuse into the obtained thin film during film formation.

又冷却時にあっては、薄膜体が雰囲気中のオゾンと活性
に反応し又酸素が所定量補給されて、上記薄膜体は超電
導を示す結晶構造に調整される。
During cooling, the thin film body actively reacts with ozone in the atmosphere, and a predetermined amount of oxygen is supplied, so that the thin film body is adjusted to have a crystal structure exhibiting superconductivity.

〔実施例〕〔Example〕

以下に本発明を実施例により詳細に説明する。 The present invention will be explained in detail below using examples.

実施例1 第1図は本発明方法を実施する装置の一例を示す真空蒸
着装置の要部説明図である。回において1はチャンバ、
2は基体を加熱する為のブロックヒータ、3.4はター
ゲットを蒸発させる為のそれぞれe−gun及び抵抗発
熱器、5はオゾン発生機でマスフローコントローラ(M
FC)6を通し、SUSパイプ7によりチャンバ1と気
密に連結されている。
Embodiment 1 FIG. 1 is an explanatory view of the main parts of a vacuum evaporation apparatus showing an example of an apparatus for carrying out the method of the present invention. In times 1 is the chamber,
2 is a block heater for heating the substrate, 3.4 is an e-gun and a resistance heater for vaporizing the target, and 5 is an ozone generator with a mass flow controller (M
FC) 6 and is airtightly connected to the chamber 1 by a SUS pipe 7.

チャンバ1内のブロックヒータ2にMgO単結晶製の基
体8を(100)面が蒸着面となるようにセントし、2
基のe−gunにBaとYを、又抵抗発熱器4にCuを
それぞれ金属単体として取付け、次いでチャンバ1内を
オゾン発生機5がらオゾンをMFC6により流量制御し
て503CCM供給しつつ、これを吸引して0.5 m
Torrの減圧雰囲気となし、しかるのちブロックヒー
タ2を加熱して基体8を650°Cに保持し、e−gu
n3又は抵抗発熱器4によりY、 Cu 、 B aを
Y:Cu:Baの原子比でそれぞれl・2;3の割合で
蒸発させて上記基体8上にY−Ba−Cu−0系酸化物
超電導体(以下Y系酸化物超電導体と略記)を1000
人の厚さに形成した。
A MgO single crystal substrate 8 is placed in the block heater 2 in the chamber 1 so that the (100) plane is the evaporation surface.
Ba and Y were attached to the base e-gun, and Cu was attached as a single metal to the resistance heating element 4, and then 503 CCM of ozone was supplied from the ozone generator 5 into the chamber 1 with the flow rate controlled by the MFC 6. 0.5 m by suction
A reduced pressure atmosphere of Torr is created, and then the block heater 2 is heated to maintain the substrate 8 at 650°C, and the e-gu
A Y-Ba-Cu-0 based oxide is formed on the substrate 8 by evaporating Y, Cu, and Ba at an atomic ratio of Y:Cu:Ba of 1.2:3 using the n3 or the resistance heater 4. 1000 superconductors (hereinafter abbreviated as Y-based oxide superconductors)
Formed to the thickness of a person.

上記において組成及び膜厚は水晶振動子膜厚計9及びシ
ャンク−を用いて制御した。
In the above, the composition and film thickness were controlled using a crystal resonator film thickness meter 9 and a shank.

而してチャンバ1内を上記雰囲気に保持したまま、ブロ
ックヒータ2を降温させて、基体8上の薄膜体を2°(
:/minの速度で室温にまで冷却した。
Then, while maintaining the inside of the chamber 1 in the above atmosphere, the temperature of the block heater 2 is lowered, and the thin film body on the base 8 is heated at 2° (
The mixture was cooled to room temperature at a rate of :/min.

実施例2 実施例1において、チャンバ内の雰囲気を成膜時及び形
成した薄膜の冷却時ともオゾンIO%とArの混合ガス
0.5 mTorrの減圧雰囲気とした他は実施例1と
同じ方法によりMgO単結晶製基体上にY系酸化物超電
導体薄膜を形成した。
Example 2 The same method as in Example 1 was used except that the atmosphere in the chamber was a reduced pressure atmosphere of 0.5 mTorr of a mixed gas of ozone IO% and Ar during film formation and during cooling of the formed thin film. A Y-based oxide superconductor thin film was formed on a MgO single crystal substrate.

実施例3 実施例1において、チャンバ内の成膜時の雰囲気を酸素
ガス0.5 mTorrの減圧雰囲気とした他は実施例
1と同じ方法によりMgO単結晶製基体上にY系酸化物
超電導体薄膜を形成した。
Example 3 A Y-based oxide superconductor was deposited on an MgO single crystal substrate in the same manner as in Example 1, except that the atmosphere in the chamber during film formation was a reduced pressure atmosphere of 0.5 mTorr of oxygen gas. A thin film was formed.

実施例4 実施例1において基体温度を450°Cとした他は実施
例1と同じ方法によりMgO単結晶製基体上にY系酸化
物超電導体薄膜を形成した。
Example 4 A Y-based oxide superconductor thin film was formed on an MgO single crystal substrate by the same method as in Example 1 except that the substrate temperature was changed to 450°C.

実施例5 実施例1において、チャンバ内の成膜時の雰囲気をオゾ
ンQ、 5 mTorrの減圧雰囲気とし、形成した薄
膜の冷却時の雰囲気を酸素0.5 mTorrの減圧雰
囲気とした他は実施例1と同し方法によりMgO単結晶
製基体上にY系酸化物超電導体薄膜を形成した。
Example 5 In Example 1, the atmosphere in the chamber during film formation was ozone Q and a reduced pressure atmosphere of 5 mTorr, and the atmosphere during cooling of the formed thin film was a reduced pressure atmosphere of oxygen 0.5 mTorr. A Y-based oxide superconductor thin film was formed on an MgO single crystal substrate by the same method as in Example 1.

実施例6 RFマグネトロンスパッタリング装置を用いて、厚さ5
000人のY系酸化物超電導体薄膜をMgO単結晶製基
体(100)面」二に形成した。
Example 6 Using RF magnetron sputtering equipment, thickness 5
A Y-based oxide superconductor thin film of 0.00000000000000000000000000000000000000000000000000000000000000000000000000001 to 1000000000000000000000000000000 to type form to glory, a Y-based oxide superconductor thin film was formed on the (100) plane of MgO single crystal substrate.

上記において成膜は、ターゲットにY、Ba2Cu30
X仮焼成粉の焼結体を用い、50%0゜→−Arの混合
ガス100mTorrの減圧雰囲気中で基体を650°
Cに加熱して、RF出力100wをか番ノて行った。
In the above film formation, the target is Y, Ba2Cu30
Using a sintered body of X pre-sintered powder, the substrate was heated at 650° in a reduced pressure atmosphere of 100 mTorr mixed gas of 50% 0° → -Ar.
The sample was heated to 40°C and an RF output of 100 W was applied.

成膜後置囲気をオゾン100 mTorrにかえ、形成
した薄膜体は2°C/minの速度で室温まで冷却した
After film formation, the surrounding atmosphere was changed to ozone at 100 mTorr, and the formed thin film body was cooled to room temperature at a rate of 2°C/min.

比較例1 実施例1において、チャンバ内の雰囲気を成膜時及び形
成した薄膜の冷却時とも酸素0.5 mTorrの減圧
雰囲気とした他は実施例1と同し方法によりMgO単結
晶製基体」二にY系酸化物超電導体薄膜を形成した。
Comparative Example 1 An MgO single crystal substrate was prepared in the same manner as in Example 1, except that the atmosphere in the chamber was a reduced pressure atmosphere of 0.5 mTorr of oxygen both during film formation and during cooling of the formed thin film. Second, a Y-based oxide superconductor thin film was formed.

比較例2 実施例4において、チャンバ内の雰囲気を成膜時及び形
成した薄膜の冷却時とも酸素0.5 mTorrの減圧
雰囲気とした他は実施例4と同じ方法によりMgO単結
晶製基体上にY系酸化物超電導体薄膜を形成した。
Comparative Example 2 A film was deposited on an MgO single crystal substrate by the same method as in Example 4, except that the atmosphere in the chamber was a reduced pressure atmosphere of 0.5 mTorr of oxygen during film formation and during cooling of the formed thin film. A Y-based oxide superconductor thin film was formed.

比較例3 実施例6において、チャンバ内を形成した薄膜の冷却時
に酸素100 mTorrの減圧雰囲気とした他は実施
例6と同じ方法によりMgO単結晶製基体上にY系酸化
物超電導体薄膜を形成した。
Comparative Example 3 A Y-based oxide superconductor thin film was formed on an MgO single crystal substrate by the same method as in Example 6, except that a reduced pressure atmosphere of 100 mTorr of oxygen was used when cooling the thin film formed inside the chamber. did.

比較例4 実施例1において基体温度を350℃とした他は実施例
1と同じ方法によりMgO単結晶製基体上にY系酸化物
超電導体薄膜を形成した。
Comparative Example 4 A Y-based oxide superconductor thin film was formed on an MgO single crystal substrate by the same method as in Example 1 except that the substrate temperature was changed to 350°C.

比較例5 実施例1において基体温度を750°Cとした他は実施
例1と同じ方法によりMgO単結晶製基体上にY系酸化
物超電導体薄膜を形成した。
Comparative Example 5 A Y-based oxide superconductor thin film was formed on an MgO single crystal substrate by the same method as in Example 1 except that the substrate temperature was changed to 750°C.

比較例6 比較例3において得られたY系酸化物超電導体薄膜を更
に大気中にて900°C2H加熱処理した。
Comparative Example 6 The Y-based oxide superconductor thin film obtained in Comparative Example 3 was further heat-treated at 900°C2H in the atmosphere.

斯くの如くして得られた各々の酸化物超電導体薄膜につ
いてTcを測定した。結果は第1表に示した。
Tc was measured for each oxide superconductor thin film thus obtained. The results are shown in Table 1.

第1表より明らかなように本発明方法品(実施例1〜6
)は、Tcが79に以上の高い値のものであった。
As is clear from Table 1, the method of the present invention (Examples 1 to 6)
) had a high Tc value of 79 or more.

これに対し比較例1〜3は成膜時及び形成した薄膜の冷
却時の雰囲気中にオゾンが含有されていない為、又比較
例4.5は基体温度が本発明の限定値外であった為に得
られた薄膜はいずれもT。
On the other hand, in Comparative Examples 1 to 3, ozone was not contained in the atmosphere during film formation and cooling of the formed thin film, and in Comparative Examples 4 and 5, the substrate temperature was outside the limit value of the present invention. All of the thin films obtained for this purpose were T.

が67に以下の低い値のものとなった。上記の比較方法
品のT、を液体窒素温度(77K)以上となすには、例
えば比較例6に示したように。得られた薄膜体を更に酸
素含有雰囲気中で加熱処理する必要があった。
However, the value was as low as 67. In order to make T of the above-mentioned comparison method product equal to or higher than the liquid nitrogen temperature (77K), for example, as shown in Comparative Example 6. It was necessary to further heat-treat the obtained thin film body in an oxygen-containing atmosphere.

上記実施例においてはY系酸化物超電導体について説明
したが、本発明方法はB1−3r−Ca−Cu−0系又
はTl−Ba−Ca−Cu−0系等他の酸化物超電導体
にも適用できるものである。
In the above embodiments, the Y-based oxide superconductor was explained, but the method of the present invention can also be applied to other oxide superconductors such as the B1-3r-Ca-Cu-0 system or the Tl-Ba-Ca-Cu-0 system. It is applicable.

〔効果〕〔effect〕

以上述べたように本発明方法によれば、基体上にT、が
液体窒素温度以上の酸化物超電導体薄膜を効率よく形成
できるので、工業上顕著な効果を奏する。
As described above, according to the method of the present invention, it is possible to efficiently form an oxide superconductor thin film on a substrate with a temperature of T equal to or higher than the temperature of liquid nitrogen, so that it has a significant industrial effect.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明方法を実施する装置の一例を示す真空蒸
着装置の要部説明図である。 l・・・チャンバー  2・・・ブロックヒーター3・
・・e  gun、 4・・・抵抗加熱器、 5・・・
オゾン発生機、 8・・・基体。
FIG. 1 is an explanatory view of the main parts of a vacuum evaporation apparatus showing an example of an apparatus for carrying out the method of the present invention. l...Chamber 2...Block heater 3.
...e gun, 4...resistance heater, 5...
Ozone generator, 8...substrate.

Claims (1)

【特許請求の範囲】[Claims] 酸化物超電導体の焼結体、酸化物超電導体の構成元素を
含有する物質或いは化合物等をターゲットに用いて気相
成長法により基体上に所望厚さコーティングし、次いで
これを冷却して基体上に酸化物超電導体薄膜を形成する
方法において、基体温度を400〜7000℃とし、コ
ーティング工程又は/及び冷却工程をオゾン含有雰囲気
中にて行うことを特徴とする酸化物超電導体薄膜の形成
方法。
A sintered body of an oxide superconductor, a substance or a compound containing the constituent elements of an oxide superconductor, etc. is used as a target to coat a substrate to a desired thickness by vapor phase growth, and then it is cooled and coated on the substrate. A method for forming an oxide superconductor thin film, characterized in that the substrate temperature is 400 to 7000°C, and the coating step and/or cooling step are performed in an ozone-containing atmosphere.
JP1090238A 1989-04-10 1989-04-10 Formation of oxide superconductor thin film Pending JPH02267105A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1090238A JPH02267105A (en) 1989-04-10 1989-04-10 Formation of oxide superconductor thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1090238A JPH02267105A (en) 1989-04-10 1989-04-10 Formation of oxide superconductor thin film

Publications (1)

Publication Number Publication Date
JPH02267105A true JPH02267105A (en) 1990-10-31

Family

ID=13992914

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1090238A Pending JPH02267105A (en) 1989-04-10 1989-04-10 Formation of oxide superconductor thin film

Country Status (1)

Country Link
JP (1) JPH02267105A (en)

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