JPH02267268A - Production of diamond coated member - Google Patents
Production of diamond coated memberInfo
- Publication number
- JPH02267268A JPH02267268A JP8609289A JP8609289A JPH02267268A JP H02267268 A JPH02267268 A JP H02267268A JP 8609289 A JP8609289 A JP 8609289A JP 8609289 A JP8609289 A JP 8609289A JP H02267268 A JPH02267268 A JP H02267268A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- diamond
- intermediate layer
- base body
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010432 diamond Substances 0.000 title claims abstract description 80
- 229910003460 diamond Inorganic materials 0.000 title claims abstract description 79
- 238000004519 manufacturing process Methods 0.000 title claims description 12
- 239000007789 gas Substances 0.000 claims abstract description 75
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 claims abstract description 18
- 229910002091 carbon monoxide Inorganic materials 0.000 claims abstract description 18
- 239000002994 raw material Substances 0.000 claims abstract description 16
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 15
- 239000000758 substrate Substances 0.000 claims description 40
- 239000010410 layer Substances 0.000 abstract description 81
- 238000006243 chemical reaction Methods 0.000 abstract description 27
- 239000001257 hydrogen Substances 0.000 abstract description 6
- 229910052739 hydrogen Inorganic materials 0.000 abstract description 6
- 239000011247 coating layer Substances 0.000 abstract description 4
- 230000035484 reaction time Effects 0.000 abstract description 3
- 230000001070 adhesive effect Effects 0.000 abstract 2
- 230000001105 regulatory effect Effects 0.000 abstract 2
- 238000000034 method Methods 0.000 description 16
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 15
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 12
- 239000000463 material Substances 0.000 description 12
- 229910052799 carbon Inorganic materials 0.000 description 11
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 9
- 239000010408 film Substances 0.000 description 9
- 230000015572 biosynthetic process Effects 0.000 description 8
- 239000010409 thin film Substances 0.000 description 8
- 229930195733 hydrocarbon Natural products 0.000 description 7
- 150000002430 hydrocarbons Chemical class 0.000 description 7
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 6
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- 229910045601 alloy Inorganic materials 0.000 description 6
- 239000000956 alloy Substances 0.000 description 6
- 238000009832 plasma treatment Methods 0.000 description 6
- 150000001875 compounds Chemical class 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- -1 ethylene, propylene Chemical group 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 239000003208 petroleum Substances 0.000 description 5
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 4
- 238000001556 precipitation Methods 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 3
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 150000001298 alcohols Chemical class 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 3
- 238000000354 decomposition reaction Methods 0.000 description 3
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 3
- 150000002576 ketones Chemical class 0.000 description 3
- 150000001247 metal acetylides Chemical class 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Chemical compound CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 description 2
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 2
- ZTQSAGDEMFDKMZ-UHFFFAOYSA-N Butyraldehyde Chemical compound CCCC=O ZTQSAGDEMFDKMZ-UHFFFAOYSA-N 0.000 description 2
- 229910000531 Co alloy Inorganic materials 0.000 description 2
- RGSFGYAAUTVSQA-UHFFFAOYSA-N Cyclopentane Chemical compound C1CCCC1 RGSFGYAAUTVSQA-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- LCGLNKUTAGEVQW-UHFFFAOYSA-N Dimethyl ether Chemical compound COC LCGLNKUTAGEVQW-UHFFFAOYSA-N 0.000 description 2
- YZCKVEUIGOORGS-UHFFFAOYSA-N Hydrogen atom Chemical compound [H] YZCKVEUIGOORGS-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000003082 abrasive agent Substances 0.000 description 2
- 235000011054 acetic acid Nutrition 0.000 description 2
- HUMNYLRZRPPJDN-UHFFFAOYSA-N benzaldehyde Chemical compound O=CC1=CC=CC=C1 HUMNYLRZRPPJDN-UHFFFAOYSA-N 0.000 description 2
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 2
- 239000012965 benzophenone Substances 0.000 description 2
- GZUXJHMPEANEGY-UHFFFAOYSA-N bromomethane Chemical compound BrC GZUXJHMPEANEGY-UHFFFAOYSA-N 0.000 description 2
- 229910002092 carbon dioxide Inorganic materials 0.000 description 2
- 239000003245 coal Substances 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 description 2
- 238000005868 electrolysis reaction Methods 0.000 description 2
- 239000012776 electronic material Substances 0.000 description 2
- 238000002309 gasification Methods 0.000 description 2
- 150000008282 halocarbons Chemical class 0.000 description 2
- 229910052736 halogen Inorganic materials 0.000 description 2
- 150000002367 halogens Chemical class 0.000 description 2
- 150000002431 hydrogen Chemical class 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000003921 oil Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- FDPIMTJIUBPUKL-UHFFFAOYSA-N pentan-3-one Chemical compound CCC(=O)CC FDPIMTJIUBPUKL-UHFFFAOYSA-N 0.000 description 2
- 239000001294 propane Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000012808 vapor phase Substances 0.000 description 2
- KNKRKFALVUDBJE-UHFFFAOYSA-N 1,2-dichloropropane Chemical compound CC(Cl)CCl KNKRKFALVUDBJE-UHFFFAOYSA-N 0.000 description 1
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- NVJUHMXYKCUMQA-UHFFFAOYSA-N 1-ethoxypropane Chemical compound CCCOCC NVJUHMXYKCUMQA-UHFFFAOYSA-N 0.000 description 1
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- PMPVIKIVABFJJI-UHFFFAOYSA-N Cyclobutane Chemical compound C1CCC1 PMPVIKIVABFJJI-UHFFFAOYSA-N 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- FEWJPZIEWOKRBE-JCYAYHJZSA-N Dextrotartaric acid Chemical compound OC(=O)[C@H](O)[C@@H](O)C(O)=O FEWJPZIEWOKRBE-JCYAYHJZSA-N 0.000 description 1
- IAYPIBMASNFSPL-UHFFFAOYSA-N Ethylene oxide Chemical compound C1CO1 IAYPIBMASNFSPL-UHFFFAOYSA-N 0.000 description 1
- XOBKSJJDNFUZPF-UHFFFAOYSA-N Methoxyethane Chemical compound CCOC XOBKSJJDNFUZPF-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 description 1
- 238000001069 Raman spectroscopy Methods 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 235000021355 Stearic acid Nutrition 0.000 description 1
- KDYFGRWQOYBRFD-UHFFFAOYSA-N Succinic acid Natural products OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 description 1
- 241000779819 Syncarpia glomulifera Species 0.000 description 1
- FEWJPZIEWOKRBE-UHFFFAOYSA-N Tartaric acid Natural products [H+].[H+].[O-]C(=O)C(O)C(O)C([O-])=O FEWJPZIEWOKRBE-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910009043 WC-Co Inorganic materials 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- IKHGUXGNUITLKF-XPULMUKRSA-N acetaldehyde Chemical compound [14CH]([14CH3])=O IKHGUXGNUITLKF-XPULMUKRSA-N 0.000 description 1
- 150000001241 acetals Chemical class 0.000 description 1
- KXKVLQRXCPHEJC-UHFFFAOYSA-N acetic acid trimethyl ester Natural products COC(C)=O KXKVLQRXCPHEJC-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 150000001299 aldehydes Chemical class 0.000 description 1
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 229910003481 amorphous carbon Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 150000008365 aromatic ketones Chemical class 0.000 description 1
- 125000000732 arylene group Chemical group 0.000 description 1
- 150000001555 benzenes Chemical class 0.000 description 1
- 239000001273 butane Substances 0.000 description 1
- KDYFGRWQOYBRFD-NUQCWPJISA-N butanedioic acid Chemical compound O[14C](=O)CC[14C](O)=O KDYFGRWQOYBRFD-NUQCWPJISA-N 0.000 description 1
- 150000001722 carbon compounds Chemical class 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 229950005499 carbon tetrachloride Drugs 0.000 description 1
- 238000003763 carbonization Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- NEHMKBQYUWJMIP-NJFSPNSNSA-N chloro(114C)methane Chemical compound [14CH3]Cl NEHMKBQYUWJMIP-NJFSPNSNSA-N 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 239000000571 coke Substances 0.000 description 1
- 238000002485 combustion reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000875 corresponding effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 150000004292 cyclic ethers Chemical class 0.000 description 1
- 150000003997 cyclic ketones Chemical class 0.000 description 1
- HWEQKSVYKBUIIK-UHFFFAOYSA-N cyclobuta-1,3-diene Chemical compound C1=CC=C1 HWEQKSVYKBUIIK-UHFFFAOYSA-N 0.000 description 1
- 239000010727 cylinder oil Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 125000005594 diketone group Chemical group 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 239000000295 fuel oil Substances 0.000 description 1
- 239000012208 gear oil Substances 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 239000010649 ginger oil Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- 239000000383 hazardous chemical Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- DMEGYFMYUHOHGS-UHFFFAOYSA-N heptamethylene Natural products C1CCCCCC1 DMEGYFMYUHOHGS-UHFFFAOYSA-N 0.000 description 1
- 150000004678 hydrides Chemical class 0.000 description 1
- 238000000761 in situ micro-X-ray diffraction Methods 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000003350 kerosene Substances 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000029052 metamorphosis Effects 0.000 description 1
- WSFSSNUMVMOOMR-NJFSPNSNSA-N methanone Chemical compound O=[14CH2] WSFSSNUMVMOOMR-NJFSPNSNSA-N 0.000 description 1
- VNKYTQGIUYNRMY-UHFFFAOYSA-N methoxypropane Chemical compound CCCOC VNKYTQGIUYNRMY-UHFFFAOYSA-N 0.000 description 1
- 229940102396 methyl bromide Drugs 0.000 description 1
- 229940073584 methylene chloride Drugs 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- IJDNQMDRQITEOD-UHFFFAOYSA-N n-butane Chemical compound CCCC IJDNQMDRQITEOD-UHFFFAOYSA-N 0.000 description 1
- OFBQJSOFQDEBGM-UHFFFAOYSA-N n-pentane Natural products CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 1
- 239000003345 natural gas Substances 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 1
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 235000005985 organic acids Nutrition 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- QNGNSVIICDLXHT-UHFFFAOYSA-N para-ethylbenzaldehyde Natural products CCC1=CC=C(C=O)C=C1 QNGNSVIICDLXHT-UHFFFAOYSA-N 0.000 description 1
- 239000012188 paraffin wax Substances 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 150000008379 phenol ethers Chemical class 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 239000010665 pine oil Substances 0.000 description 1
- 239000001739 pinus spp. Substances 0.000 description 1
- 235000019260 propionic acid Nutrition 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000006104 solid solution Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000008117 stearic acid Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 239000011975 tartaric acid Substances 0.000 description 1
- 235000002906 tartaric acid Nutrition 0.000 description 1
- 125000000383 tetramethylene group Chemical group [H]C([H])([*:1])C([H])([H])C([H])([H])C([H])([H])[*:2] 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229940036248 turpentine Drugs 0.000 description 1
- HGBOYTHUEUWSSQ-UHFFFAOYSA-N valeric aldehyde Natural products CCCCC=O HGBOYTHUEUWSSQ-UHFFFAOYSA-N 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Landscapes
- Chemical Vapour Deposition (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
この発明は積層構造を有するダイヤモンド被覆部材の製
造方法に関し、さらに詳しくは、、S体に対して高い密
着性を有するダイヤモンド被覆層を高い成膜速度で形成
することのできるダイヤモンド被覆部材の製造方法に関
する。Detailed Description of the Invention [Industrial Application Field] The present invention relates to a method for manufacturing a diamond-coated member having a laminated structure, and more specifically, to a method for producing a diamond-coated member having a high adhesion to an S body. The present invention relates to a method of manufacturing a diamond-coated member that can be formed at film speeds.
[従来の技術と発明か解決しようとする課題]ダイヤモ
ンドの薄膜は、硬度、耐摩耗性、電気絶縁性、熱伝導性
、赤外線透過性および固体潤滑性などに優れていること
から、たとえば切削工具類、研磨材、耐痒耗性機械部品
、光学部品等の各種部材のハートコート材や電気、電子
材料などに利用されている。[Prior Art and Problems to be Solved by the Invention] Diamond thin films have excellent hardness, wear resistance, electrical insulation, thermal conductivity, infrared transparency, solid lubricity, etc., and are therefore used, for example, in cutting tools. It is used as a heart coat material for various parts such as abrasives, abrasion-resistant mechanical parts, and optical parts, as well as electrical and electronic materials.
ところて、このダイヤモンドの薄膜で被覆してなるダイ
ヤモンド被覆部材が所期の性箋を発揮するためには、薄
膜と、金属、合金、セラミック等の基体との密着性が優
れていなければならない。However, in order for a diamond-coated member coated with this diamond thin film to exhibit the desired properties, the thin film must have excellent adhesion to a substrate such as metal, alloy, or ceramic.
しかしながら、従来のダイヤモンド被覆部材はその点で
未だ改善の余地が残されている。However, conventional diamond-coated members still have room for improvement in this respect.
そこで、ダイヤモンドの9膜と基体との密着性を向上さ
せる目的て、薄膜と基体との間に金属炭化物や金属窒化
物等の中間層を介在させる提案か種々なされているか、
必ずしも十分な効果を挙げるに至っていないうえ、製造
が困難であるという問題も生じている。Therefore, in order to improve the adhesion between the diamond film and the substrate, various proposals have been made to interpose an intermediate layer such as metal carbide or metal nitride between the thin film and the substrate.
In addition to not necessarily achieving sufficient effects, there is also the problem that manufacturing is difficult.
一方、特開昭61−106494号公報には、基体上に
基体成分および炭素成分を有する中間層を介してダイヤ
モンド薄膜を形成した被覆部材およびその製造方法が開
示されている。さらにこの公報によると、ダイヤモンド
層と基体との密着性を高めるために、周期律表48.5
a、6a族金属もしくはSi、またはこれらの炭化物、
窒化物、もしくは固溶体である中間層を設けることが記
載されている。On the other hand, JP-A-61-106494 discloses a coating member in which a diamond thin film is formed on a substrate via an intermediate layer having a substrate component and a carbon component, and a method for manufacturing the same. Furthermore, according to this publication, in order to improve the adhesion between the diamond layer and the substrate,
a, group 6a metal or Si, or carbide thereof,
It is described that an intermediate layer of nitride or solid solution is provided.
また、特開昭61−163273号公報には基体表面の
被覆層の少くとも一層がSiを含むダイヤモンド層であ
る部材か開示されている。Furthermore, Japanese Patent Application Laid-Open No. 61-163273 discloses a member in which at least one of the coating layers on the surface of the substrate is a diamond layer containing Si.
しかしながら、上に挙げた各公報の技術では一般に中間
層形成用の炭素源ガスとしてメタンガスなどを用いてお
り、その濃度が非常に小さいため、成膜速度が遅く、ま
た、Siの炭化反応も生じ難く密着性の向上効果が十分
でないと言う問題点がある。そこで、成膜速度を高める
ために、前記メタンガスの濃度を高めると、中間層のダ
イヤモンドの混晶か困難になり、密着性の高いダイヤモ
ンド層を得ることかできないと言う別の問題点を生じる
。However, the techniques disclosed in the above-mentioned publications generally use methane gas or the like as a carbon source gas for forming the intermediate layer, and the concentration of the gas is very low, resulting in a slow film formation rate and also causing the carbonization reaction of Si. There is a problem that the effect of improving adhesion is not sufficient. Therefore, if the concentration of the methane gas is increased in order to increase the film-forming rate, it becomes difficult to form a mixed crystal of diamond in the intermediate layer, causing another problem in that it is impossible to obtain a diamond layer with high adhesion.
この発明の目的は、基体との密着性に優れ、所期の性能
を備えたダイヤモンドの被覆層を高い成膜速度で得るこ
とのできるダイヤモンド被覆部材の製造方法を提供する
ことにある。An object of the present invention is to provide a method for manufacturing a diamond-coated member that can obtain a diamond coating layer having excellent adhesion to a substrate and having desired performance at a high deposition rate.
[X1題を解決するための手段]
前記課題を解決するためのこの発明は、一酸化炭素ガス
と水素ガスと基体を構成する元素を含有するガスとを含
む原料ガスを励起して得られる活性ガスを基体に接触さ
せて中間層を形成し、この中間層上に、ダイヤモンド膜
を形成することを特徴とするダイヤモンド被覆部材の製
造方法である。[Means for Solving Problem This method of manufacturing a diamond-coated member is characterized in that an intermediate layer is formed by bringing gas into contact with a substrate, and a diamond film is formed on the intermediate layer.
以下、この発明をさらに詳しく説明する。This invention will be explained in more detail below.
−基体−
ダイヤモンド被覆部材の形成に使用される基体としては
、その表面上にダイヤモンド層の形成か可能なものであ
れば、どのようなものでも使用することができ、気相合
成法によるダイヤモンド膜の形成用として公知の基体な
ど各種のものの中から目的に応じて適宜に選定すること
かてきる。-Substrate- Any substrate can be used as long as it is possible to form a diamond layer on the surface of the substrate used to form the diamond-coated member. Depending on the purpose, an appropriate material can be selected from among various substrates known for forming the material.
前記基体として、たとえばシリコン、マンガン、バナジ
ウム、タリウム、アルミニウム、チタン、タングステン
、モリブデン、ゲルマニウムおよびクロムなどの金属、
これらの酸化物、窒化物および炭化物、これらの合金、
A1.03−Pe系、TiC−Ni系、TiC−Co
系およびB、C−Fe系等のサーメットならびに各種セ
ラミウクス等を挙げることができる。As said substrate, metals such as silicon, manganese, vanadium, thallium, aluminum, titanium, tungsten, molybdenum, germanium and chromium,
These oxides, nitrides and carbides, their alloys,
A1.03-Pe system, TiC-Ni system, TiC-Co
Examples include cermets such as cermets such as cermets based on B-type, B-Fe type, and various types of ceramiuxes.
また、このダイヤモンド被覆部材を切削工具類等の超硬
工具類などに利用する場合、好適に使用することかでき
る基体としては、たとえば。Further, when this diamond-coated member is used for carbide tools such as cutting tools, examples of substrates that can be suitably used include, for example.
WC−Co系合金、@C−Tie−Cg系合金、WC−
TiC−TaC−Co系合金、WC−TiN−Co系合
金、 WC−Tie−TiN−C。WC-Co alloy, @C-Tie-Cg alloy, WC-
TiC-TaC-Co alloy, WC-TiN-Co alloy, WC-Tie-TiN-C.
系合金などの超硬合金類を挙げることができる。Examples include cemented carbide alloys such as alloys.
これら超硬合金の中でも、Coの含有率が1〜30重量
%であるものは特に好ましい、また、Si3N4. S
iC、5iO1,TiC、A見、03、あるいは。Among these cemented carbides, those with a Co content of 1 to 30% by weight are particularly preferred, and Si3N4. S
iC, 5iO1, TiC, A-view, 03, or.
これらの混合物からなる焼結体も好ましい。A sintered body made of a mixture of these is also preferred.
また、このダイヤモンド被覆部材をエレクトロニクス分
野等における回路基板に利用する場合5前記基体として
は、たとえば、シリコーンウェハーあるいはその加工品
等を挙げることができる。Further, when this diamond-coated member is used as a circuit board in the electronics field, examples of the substrate include a silicon wafer or a processed product thereof.
なお、これらの基体は、気相合成法ダイヤモンド膜との
密着性をさらに向上させるための表面処理、たとえば、
洗沙処理、傷付処理が施されていてもよい。These substrates may be subjected to surface treatments to further improve their adhesion to the vapor phase synthesized diamond film, such as
It may be subjected to a washing process or a scratching process.
基体の形状についても特に制限がないのであるか、工具
としてこのダイヤモンド被覆部材を使用するのてあれば
、基体の形状を各種の工具の形状に合せておくのか良い
。There are no particular restrictions on the shape of the base, or if this diamond-coated member is to be used as a tool, the shape of the base may be matched to the shape of various tools.
一中間層の形成−
この発明の方法では、前記基体の表面に、一酸化炭素ガ
スと水素ガスと基体を構成する元素を含有するガスとを
含む原料ガスを励起して得られる活性ガスを、接触させ
ることにより、中間層を形成する。1. Formation of intermediate layer - In the method of the present invention, an active gas obtained by exciting a raw material gas containing carbon monoxide gas, hydrogen gas, and a gas containing an element constituting the substrate is applied to the surface of the substrate. By contacting, an intermediate layer is formed.
前記一酸化炭素としては特に制限がなく、たとえば石炭
、コークスなどと空気または水蒸気を熱時反応させて得
られる発生炉ガスや水性ガスを充分に精製したものを用
いることができる。The carbon monoxide is not particularly limited, and for example, sufficiently purified generator gas or water gas obtained by hot reaction of coal, coke, etc. with air or steam can be used.
ここで特筆すべきことは、原料ガスの成分として一酸化
炭素を使用せずにメタンガス等を使用すると、ダイヤモ
ンドと基体を構成する元素の炭化物とを含有する中間層
が形成されなくなる。What should be noted here is that if methane gas or the like is used instead of carbon monoxide as a raw material gas component, an intermediate layer containing diamond and carbides of the elements constituting the substrate will not be formed.
前記水素ガスには、特に制限がなく、たとえば石油類の
ガス化、天然ガス、水性ガスなどの変成、水の電解、鉄
と水蒸気との反応、石炭の完全ガス化などにより得られ
るものを充分に精製したものを用いることがてきる。There are no particular restrictions on the hydrogen gas, and hydrogen gas that can be obtained, for example, by gasification of petroleum, metamorphosis of natural gas, water gas, etc., electrolysis of water, reaction of iron with steam, complete gasification of coal, etc. is sufficient. It can be used after being purified.
前記水素ガスを構成する水素は励起されることにより原
子状水素を形成する。Hydrogen constituting the hydrogen gas is excited to form atomic hydrogen.
この原子状水素は、ダイヤモンド類の析出と同時に析出
するグラファイトやアモルファスカーボン等の非ダイヤ
モンド類成分を除去する作用を有する。This atomic hydrogen has the effect of removing non-diamond components such as graphite and amorphous carbon that are deposited simultaneously with the precipitation of diamonds.
基体を構成する元素を含有するガスとしては、たとえば
、基体構成元素の水素化物、ハロゲン化物等を挙げるこ
とができ、より具体的には、5iHn、WF、、 Ti
C文4等を挙げることがてきる。Examples of the gas containing the elements constituting the substrate include hydrides and halides of the elements constituting the substrate, and more specifically, 5iHn, WF, Ti.
Can list C sentences such as 4.
また、前記基体の種類と原料ガスとの組み合わせを考慮
することが重要であり、基体と前記原料ガスとの組み合
せの好適な具体的な例のいくつかを示すと1次のとおり
である。Further, it is important to consider the combination of the type of the substrate and the source gas, and some preferred specific examples of combinations of the substrate and the source gas are as follows.
基 体 原料ガス
Sr 5ill、+ co+ H*SiOオ
SiH4+ CO+ HaSi3N4Sil1
4+ CO+ HtSiCsiL+ co+ Hz
曹C−Co IFF、 + CO+
H。Substrate Raw material gas Sr 5ill, + co+ H*SiO SiH4+ CO+ HaSi3N4Sil1
4+ CO+ HtSiCsiL+ co+ Hz Ca-Co IFF, + CO+
H.
TiCTiCJl、 + co+ H。TiCTiCJl, +co+H.
なお、この発明においては炭素源として一酸化炭素に他
のガス、たとえばCH,などを一部併用することもでき
る。また、上記原料ガスには基体と同−組IIi、物を
生成するようなガス、たとえば基体がSi、N4で構成
されている場合はN2を添加することも可能である。In addition, in this invention, other gases such as CH, etc. may be partially used in combination with carbon monoxide as a carbon source. Further, it is also possible to add to the above raw material gas a gas that produces the same substance as the substrate, for example, N2 when the substrate is composed of Si and N4.
lX料ガスにおける前記各成分の濃度としては、一酸化
炭素ガスについては通常、1〜b好ましくは3〜30容
量%であり、水素ガスにつぃては通常10〜98.9容
量%2好ましくは65〜96.9容量%てあり、前記基
体構成元素含有ガスについては通常0.1〜lO容量%
、好ましくは0.1〜5容量%である。The concentration of each of the above-mentioned components in the lX material gas is usually 1 to 3% by volume for carbon monoxide gas, preferably 3 to 30% by volume for hydrogen gas, and preferably 10 to 98.9% by volume for hydrogen gas. is 65 to 96.9% by volume, and the gas containing the base element is usually 0.1 to 10% by volume.
, preferably 0.1 to 5% by volume.
前記原料ガスの励起手段としては、特に制限はなく、た
とえば直流または交流のアーク放電によりプラズマ分解
する方法、高周波誘導放電によりプラズマ分解する方法
、マイクロ波放電によりプラズマ分解する方法(有磁場
−CVD法を含む)、あるいはプラズマ分解をイオン室
またはイオン銃で行なわせ、電解によりイオンを引き出
すイオンビーム法、熱フィラメントによる加熱て熱分解
する熱分解法CEACVD法も含む)、さらに燃焼炎法
、スパッタリング法などのいずれも採用することができ
る。気相法において反応室内に原料ガスを導入する方法
としては、一酸化炭素ガスと水素ガスと前記元素含有ガ
スとを初めから混合して導入してもよいし、またこれら
を個々に導入して反応室内で混合してもよい。There are no particular limitations on the excitation means for the raw material gas, such as plasma decomposition using DC or AC arc discharge, high frequency induced discharge, plasma decomposition using microwave discharge (magnetic field-CVD method). ), or ion beam method in which plasma decomposition is carried out in an ion chamber or ion gun, and ions are extracted by electrolysis, thermal decomposition method (CEACVD method, in which pyrolysis is performed by heating with a hot filament), combustion flame method, and sputtering method. Any of these can be adopted. In the gas phase method, the raw material gases may be introduced into the reaction chamber by mixing carbon monoxide gas, hydrogen gas, and the element-containing gas from the beginning, or by introducing these gases individually. They may be mixed within the reaction chamber.
なお、中間層形成時の他の反応条件は、通常のダイヤモ
ンド薄膜形成の際の条件に準じて設定することができる
。Note that other reaction conditions for forming the intermediate layer can be set according to conditions for forming a normal diamond thin film.
たとえば、反応装置内の圧力は通常は10−’Torr
〜800 Torrに保たれ、また基体温度は1通常3
50℃〜1.Zoo℃の範囲内に、反応時間は1分〜5
時間に設定される。For example, the pressure within the reactor is typically 10-'Torr.
~800 Torr, and the substrate temperature is typically 3
50℃~1. Within the range of Zoo℃, the reaction time is 1 minute to 5 minutes.
set to time.
また、前記原料ガスの供給割合としては1通常、10〜
1,000 s e c mであり、好ましくは20〜
SOOsecmである。Further, the feed rate of the raw material gas is usually 1 to 10.
1,000 sec m, preferably 20~
It is SOOsecm.
以上のようにして形成された中間層における基体構成元
素の濃度については、基体の種類やダイヤモンド層の厚
みによって一概に決定することができないのであるが、
通常、0.1〜lO重量%、好ましくは0.1〜5重量
%である。前記濃度が前記範囲を外れるといずれも、ダ
イヤモンド層の密着性が悪くなる傾向にある。なお、こ
の基体構成元素の濃度は、中間層の全厚みにおいて必ず
しも均一である必要はなく、たとえば、基体面より、こ
の濃度を順次小さくすることも好ましい方法である。The concentration of the constituent elements of the substrate in the intermediate layer formed as described above cannot be determined unconditionally depending on the type of substrate and the thickness of the diamond layer.
It is usually 0.1 to 10% by weight, preferably 0.1 to 5% by weight. If the concentration is out of the range, the adhesion of the diamond layer tends to deteriorate. Note that the concentration of the element constituting the base body does not necessarily have to be uniform throughout the entire thickness of the intermediate layer; for example, it is also preferable to gradually reduce this concentration from the base surface.
また、この中間層の厚みは、基体の種類やダイヤモンド
層の厚みによって相違して一概に決定することかできな
いのであるが、通常、0.1〜57tmてあり、好まし
くは[1,1〜3ILmである。前記厚みが0.1 )
bm未満であると、ダイヤモンド層の密着性が大きくな
らず、また、5gmを超える厚みになると、厚みを大き
くするに比例する効果が奏されないことがある。The thickness of this intermediate layer differs depending on the type of substrate and the thickness of the diamond layer and cannot be determined unconditionally, but it is usually 0.1 to 57 tm, preferably [1,1 to 3 ILm]. It is. The thickness is 0.1)
If it is less than bm, the adhesion of the diamond layer will not be increased, and if the thickness exceeds 5 gm, the effect proportional to the increase in thickness may not be achieved.
また、この中間層の厚みは、ダイヤモンド層の厚みとも
相関し、この中間層とダイヤモンド層との熱膨張係数が
大きく異なる場合には、この中間層とダイヤモンド層と
の厚みの合計かlOpm以下になるようにvRfrJす
ると共に、中間層の厚みをダイヤモンド層の厚みよりも
薄くするのが好ましい、中間層の厚みがダイヤモンド層
の厚みよりも大きくなるとダイヤモンド層による硬度お
よび耐摩耗性等を十分に確保することができなくなるこ
とかある。The thickness of this intermediate layer also correlates with the thickness of the diamond layer, and if the coefficient of thermal expansion between this intermediate layer and the diamond layer is significantly different, the total thickness of this intermediate layer and the diamond layer must be less than 1Opm. It is preferable to set vRfrJ so that the thickness of the intermediate layer is thinner than the thickness of the diamond layer.If the thickness of the intermediate layer is greater than the thickness of the diamond layer, the hardness and wear resistance of the diamond layer can be sufficiently ensured. There are times when you will not be able to do anything.
−・ダイヤモンド層の形成−
以上のようにして基体上に中間層を形成してから、その
中間層上に気相法によりダイヤモンド層を形成する。- Formation of Diamond Layer - After forming the intermediate layer on the substrate as described above, a diamond layer is formed on the intermediate layer by a vapor phase method.
このダイヤモンド層の形成方法は、特に限定されるもの
ではなく、公知の方法を採用することかでき、たとえば
、炭素源ガスと水素ガスとを含有する原料ガスを励起し
て得られる活性ガスを1反応室内に配置した前記基体に
お番プる前記中間層に接触することにより、形成される
。The method for forming this diamond layer is not particularly limited, and any known method may be adopted. For example, an active gas obtained by exciting a raw material gas containing a carbon source gas and a hydrogen gas is The intermediate layer is formed by contacting the intermediate layer with the substrate placed in the reaction chamber.
前記炭素源ガスとしては、各種炭化水素、含ハロゲン化
合物、含酸素化合物、含窒素化合物等のガスを使用する
ことができる。As the carbon source gas, gases such as various hydrocarbons, halogen-containing compounds, oxygen-containing compounds, and nitrogen-containing compounds can be used.
炭化水素化合物としては、例えばメタン、エタン、プロ
パン、ブタン等のパラフィン系炭化水素;エチレン、プ
ロピレン、ブチレン等のオレフィン系炭化水素;アセチ
レン、アリレン等のアセチレン系炭化水素:ブタジェン
等のジオレフィン系炭化水素二ジクロプロパン、シクロ
ブタンシクロペンタン、シクロヘキサン等の脂環式炭化
水素;シクロブタジェン、ベンゼン、トルエン、キシレ
ン、ナフタレン等の芳香族炭化水素:塩化メチル、臭化
メチル、塩化メチレン、四塩化炭素等のハロゲン化炭化
水素などを挙げることができる。Examples of hydrocarbon compounds include paraffinic hydrocarbons such as methane, ethane, propane, and butane; olefinic hydrocarbons such as ethylene, propylene, and butylene; acetylenic hydrocarbons such as acetylene and arylene; and diolefinic hydrocarbons such as butadiene. Alicyclic hydrocarbons such as hydrogen dichloropropane, cyclobutane, cyclopentane, and cyclohexane; Aromatic hydrocarbons such as cyclobutadiene, benzene, toluene, xylene, and naphthalene; Methyl chloride, methyl bromide, methylene chloride, carbon tetrachloride, etc. Examples include halogenated hydrocarbons.
含ハロゲン化合物としては、たとえば、ハロゲン化メタ
ン、ハロゲン化エタン、ハロゲン化ベンゼン等の含ハロ
ゲン化炭化水素等を挙げることができる。Examples of the halogen-containing compound include halogenated hydrocarbons such as halogenated methane, halogenated ethane, and halogenated benzene.
含酸素化合物としては1例えばアセトン、ジエチルケト
ン、ベンゾフェノン等のケトン類;メタノール、エタノ
ール、プロパツール、ブタノール等のアルコール類;メ
チルエーテル、エチルエーテル、エチルメチルエーテル
、メチルプロピルエーテル、エチルプロとルエーテル、
フェノールエーテル、アセタール、環式エーテル(ジオ
キサン、エチレンオキシド等)のエーテル類:アセトン
、ビナコリン、メチルオキシド、芳香族ケトン(アセト
フェノン、ベンゾフェノン等)、ジケトン、環式ケトン
等のケトン類:ホルムアルデヒド、アセトアルデヒド、
ブチルアルデヒド、ベンズアルデヒド等のアルデヒド類
:ギ酸、酢酸、プロピオン酸、コハク酸、醋酸、シュウ
酸、酒石酸、ステアリン酸等の有機酸類;酢酸メチル、
酢酸エチル等の酸エステル類:エチレングリコール、ジ
エチレングリコール等の二価アルコール類;一酸化炭素
、二酸化炭素等を挙げることかできる。Examples of oxygen-containing compounds include ketones such as acetone, diethyl ketone, and benzophenone; alcohols such as methanol, ethanol, propatool, and butanol; methyl ether, ethyl ether, ethyl methyl ether, methyl propyl ether, ethyl propyl ether,
Ethers such as phenol ethers, acetals, and cyclic ethers (dioxane, ethylene oxide, etc.): Ketones such as acetone, vinacolin, methyl oxide, aromatic ketones (acetophenone, benzophenone, etc.), diketones, and cyclic ketones: formaldehyde, acetaldehyde,
Aldehydes such as butyraldehyde and benzaldehyde; organic acids such as formic acid, acetic acid, propionic acid, succinic acid, acetic acid, oxalic acid, tartaric acid, and stearic acid; methyl acetate,
Acid esters such as ethyl acetate; dihydric alcohols such as ethylene glycol and diethylene glycol; carbon monoxide and carbon dioxide.
含窒素化合物としては、例えばトリメチルアミン、トリ
エチルアミンなどのアミン類等を挙げることができる。Examples of the nitrogen-containing compound include amines such as trimethylamine and triethylamine.
また、前記炭素源ガスとして、単体ではないか、消防法
に規定される第4類危険物;カッリンなどの第1石油類
、ケロシン、テレピン油、しょう脳油、松根油などの第
2石油類、重油などの第3石油類、ギヤー油、シリンダ
ー油などの第4石油類などのガスをも使用することがで
きる。また前記各種の炭素化合物を混合して使用するこ
ともできる。In addition, the carbon source gas may be a single substance or a class 4 hazardous substance stipulated in the Fire Service Act; a class 1 petroleum such as Kallin, or a class 2 petroleum such as kerosene, turpentine, ginger oil, pine oil, etc. Gases such as tertiary petroleum oils such as , heavy oil, and quaternary petroleum oils such as gear oil and cylinder oil can also be used. It is also possible to use a mixture of the various carbon compounds mentioned above.
これらの炭素源ガスの中でも、常温で気体または蒸気圧
の高いメタン、エタン、プロパン等のパラフィン系炭化
水素;あるいはアセトン、ペンゾフェノン等のケトン類
、メタノール、エタノール等のアルコール類、一酸化炭
素、二酸化炭素ガス等の含酸素化合物が好ましく、一酸
化炭素は特に好ましい。Among these carbon source gases, paraffin hydrocarbons such as methane, ethane, and propane, which are gases or have high vapor pressure at room temperature; or ketones such as acetone and penzophenone, alcohols such as methanol and ethanol, carbon monoxide, and dioxide. Oxygen-containing compounds such as carbon gas are preferred, and carbon monoxide is particularly preferred.
水素ガスについては、前記中間層の形成において使用さ
れたのと同様のガスを使用することができる。As for the hydrogen gas, the same gas as used in forming the intermediate layer can be used.
この原料ガスとして、たとえば、一酸化炭素ガスと水素
ガスとの混合ガスを用いる場合、一酸化炭素ガスの割合
は、通常、l容量%以上であり、好ましくは3容量%以
上である。When a mixed gas of carbon monoxide gas and hydrogen gas is used as this raw material gas, for example, the proportion of carbon monoxide gas is usually 1% by volume or more, preferably 3% by volume or more.
この割合か1容量%未満であると、ダイヤモンド層が得
られないことがある。If this ratio is less than 1% by volume, a diamond layer may not be obtained.
前記反応室内への前記原料ガスの供給量は、前記原料ガ
スにおける前記炭素源ガスの含有率や反応系が連続系で
あるか非連続系であるかにより異なるので、−概に決定
することはできないが、通常、10〜t、ooo SC
CM、好ましくは20〜5003CCMである。The amount of the raw material gas supplied into the reaction chamber varies depending on the content of the carbon source gas in the raw material gas and whether the reaction system is a continuous system or a discontinuous system. Not possible, but usually 10~t, ooo SC
CM, preferably 20 to 5003 CCM.
ダイヤモンド層を形成する際の前記反応室内における前
記基体の表面温度、正確には中間層の表面温度は、通常
、 35(1〜! 、200℃、好ましくは600 S
−1,100℃である。The surface temperature of the substrate in the reaction chamber when forming the diamond layer, more precisely the surface temperature of the intermediate layer, is usually 35 (1~!, 200°C, preferably 600 S).
-1,100°C.
この温度か350℃よりも低いと、前記中間層上に析出
するダイヤモンドの析出速度が遅くなったり、非ダイヤ
モンド成分を多量に含有するダイヤモンド層が形成した
りする。一方、1,200℃を超えると、中間層上に析
出したダイヤモンド層がエツチングにより削られてしま
い、ダイヤモンドの析出速度の向上が見られないことが
ある。If this temperature is lower than 350° C., the precipitation rate of diamond deposited on the intermediate layer may be slowed down, or a diamond layer containing a large amount of non-diamond components may be formed. On the other hand, if the temperature exceeds 1,200° C., the diamond layer deposited on the intermediate layer is etched away, and no improvement in the diamond precipitation rate may be observed.
前記反応室内における反応圧力は1通常、10−’へ1
0’torr 、好ましくは10−’〜10″’tor
rであり、特に好ましくはlO−コヘ800 torr
である。The reaction pressure in the reaction chamber is usually 1 to 10-'.
0'torr, preferably 10-'~10''torr
r, particularly preferably lO-cohe 800 torr
It is.
この反応圧力が10−’torrよりも低いと、ダイヤ
モンドの析出速度が遅くなったり、ダイヤモンドが析出
しなくなったりすることがある。一方。If the reaction pressure is lower than 10-'torr, the diamond precipitation rate may be slow or diamond may not be precipitated. on the other hand.
10’torrを超えても、それに相当する効果は奏さ
れないことがある。Even if it exceeds 10'torr, the corresponding effect may not be achieved.
反応時間は、温度1反応圧力、必要とする層厚などによ
り相違するので一概に決定することはできない。The reaction time cannot be determined unconditionally because it varies depending on the temperature, reaction pressure, required layer thickness, etc.
このダイヤモンド層の厚みについては基体の種類により
異なるが一般に0.01μm以上、好ましくは0.05
〜100 #Lmの範囲が望ましい、厚みが0.01I
Lmより薄いダイヤモンド層は、ダイヤモンド薄膜とし
ての化学的および物理的特性による作用が不充分になる
ことがあり、 1100pより厚いダイヤモンド層はそ
の形成に非常な長時間を要するようになる。The thickness of this diamond layer varies depending on the type of substrate, but is generally 0.01 μm or more, preferably 0.05 μm or more.
Desirable range is ~100#Lm, thickness is 0.01I
A diamond layer thinner than Lm may have insufficient chemical and physical properties to act as a diamond thin film, and a diamond layer thicker than 1100p may require a very long time to form.
一ダイヤモンド被覆部材−
このようにして製造されたダイヤモンド被覆部材は、中
間層が、前記基体構成元素炭化物とダイヤモンドとを含
有すること、そして中間層形成のための炭素源に一酸化
炭素を用いていることからCI(4等を用いる場合と違
って濃度をより大きくすることができること、炭化物形
成が容易なことなどにより、基体とダイヤモンド被覆膜
との密着性が改善されている。1. Diamond-coated member - The diamond-coated member manufactured in this manner is characterized in that the intermediate layer contains the carbide of the base constituent element and diamond, and that carbon monoxide is used as a carbon source for forming the intermediate layer. The adhesion between the substrate and the diamond coating film is improved due to the fact that the concentration can be made higher than when CI (4, etc.) is used, and carbide formation is easy.
[実施例] 次にこの発明の実施例と比較例を説明する。[Example] Next, examples and comparative examples of the present invention will be described.
(実施例1)
基体としてSiからなる板材をマイクロ波プラズマCV
D装置の反応室内に設置した。(Example 1) A plate material made of Si as a base was subjected to microwave plasma CV
It was installed inside the reaction chamber of D device.
次いでこの反応室内にSiH,ガス’t 1 secm
。Then, SiH, gas 't 1 sec.
.
COガスを7 secm、 H*ガスを101005e
でそれぞれ導入し、反応室内の圧力を40torr、板
材温度900℃の条件下に周波数2.45GHzのマイ
クロ波電淵の出力を400Wに設定した。CO gas 7 sec, H* gas 101005e
The output of the microwave power source with a frequency of 2.45 GHz was set to 400 W under the conditions that the pressure inside the reaction chamber was 40 torr and the plate temperature was 900° C.
この条件でマイクロ波放電方式によるプラズマ処理を3
0分間行なった。Under these conditions, plasma treatment using the microwave discharge method was performed for 3
This was done for 0 minutes.
反応終了後、中間層を表面に形成した板材を反応室から
泡出し、中間層の膜厚を測定したところ、約1.81h
mであった。なお、上記と同じ条件で板材上に成膜させ
た薄膜をオージェ分析法と微小X線回折法で分析したと
ころ、SiCが約45容量%、ダイヤモンド約55容量
%であることか確認できた。After the reaction was completed, the plate material with the intermediate layer formed on its surface was bubbled out of the reaction chamber, and the thickness of the intermediate layer was measured, and it was found that it was approximately 1.81 hours.
It was m. When a thin film formed on a plate under the same conditions as above was analyzed by Auger analysis and micro X-ray diffraction, it was confirmed that SiC was about 45% by volume and diamond was about 55% by volume.
次に、この中間層を表面に形成した板材を反応室内に設
置して、COガスを7 secm、 Hzガスを93s
cc−でそれぞれ導入したほかは前記と同様の条件でプ
ラズマ処理を60分間行なった。その結果。Next, the plate material with this intermediate layer formed on the surface was installed in the reaction chamber, and CO gas was applied for 7 seconds and Hz gas was applied for 93 seconds.
Plasma treatment was performed for 60 minutes under the same conditions as above except that cc- was introduced. the result.
上記中間層の表面にダイヤモンド層が形成され、全膜厚
は約4.1pmであった。こうして得られたダイヤモン
ド被覆部材の表面をラマン分光分析したところ、133
2cm−’に鋭いピークが見られるのみで、アモルファ
ス成分は認められなかった。A diamond layer was formed on the surface of the intermediate layer, and the total thickness was about 4.1 pm. Raman spectroscopic analysis of the surface of the diamond-coated member thus obtained revealed that 133
Only a sharp peak was observed at 2 cm-', and no amorphous component was observed.
また、このダイヤモンド被覆部材につき、硬度計(明石
製作所製; ^Vに一^■)を用いて表面硬度を測定し
たところ、ダイヤモンド圧子(50kg荷重)によるキ
ズは全く見られなかった。Further, when the surface hardness of this diamond-coated member was measured using a hardness meter (manufactured by Akashi Seisakusho; ^V to 1^■), no scratches caused by the diamond indenter (50 kg load) were observed.
(比較例1)
実施例1と同じ板材を基体として、中間層の形成を省略
してダイヤモンド層を次の要領で直接板材表面に形成し
た。(Comparative Example 1) Using the same plate material as in Example 1 as a substrate, the formation of the intermediate layer was omitted and a diamond layer was directly formed on the surface of the plate material in the following manner.
すなわち、プラズマ処理を120分間行なったほかは実
施例と同じ条件で板材表面にダイヤモンド層を形成した
6反応条件および結果を第1表に示す。That is, Table 1 shows six reaction conditions and results in which a diamond layer was formed on the surface of the plate material under the same conditions as in the example except that the plasma treatment was performed for 120 minutes.
(実施例2)
基体としての板材かSiCからなること、中間層の形成
に際しプラズマ処理を20分行なったこと、ならびにダ
イヤモンド層の形成に際しCOガスの流量を5 sec
m、および、H,ガスの流量を95SCC−にしたこと
を除いて実施例1と同じ条件でダイヤモンド被覆部材を
製造した。(Example 2) The base material was made of SiC, plasma treatment was performed for 20 minutes when forming the intermediate layer, and the flow rate of CO gas was set at 5 seconds when forming the diamond layer.
A diamond-coated member was manufactured under the same conditions as in Example 1 except that the flow rates of m and H gas were set to 95SCC-.
反応条件および結果を第1表に示す。The reaction conditions and results are shown in Table 1.
(実施例3)
基体としての板材がW C−Coからなること、中間層
の形成時に反応室内にSiH4ガスの代りにW F s
ガスを2 sec■で導入したこと、を除いて実施例1
と同じ条件でダイヤモンド被覆部材を製造した0反応条
件および結果を第1表に示す。(Example 3) The plate material as the base was made of W C-Co, and W F s was used instead of SiH4 gas in the reaction chamber during the formation of the intermediate layer.
Example 1 except that the gas was introduced at 2 sec.
Table 1 shows the reaction conditions and results for producing a diamond-coated member under the same conditions.
(比較例2)
中間層の形成時に反応室内にCOガスの代りにCH,ガ
スを25ec−で導入し、かつ5iHnガスの流量を0
1scc層としたこと、中間層の形成時にプラズマ処理
を100分間行なったこと、ダイヤモンド層の形成時に
反応室内にCOガスの代りにCH,ガスを1 secm
で導入し、かつプラズマ処理を120分行なったこと、
を除いて実施例2と同じ条件でダイヤモンド被覆部材を
製造した0反応条件および結果を第1表に示す。(Comparative Example 2) When forming the intermediate layer, CH gas was introduced into the reaction chamber instead of CO gas at 25 ec-, and the flow rate of 5iHn gas was 0.
1 scc layer, plasma treatment was performed for 100 minutes when forming the intermediate layer, and CH gas was added to the reaction chamber for 1 sec instead of CO gas when forming the diamond layer.
, and plasma treatment was performed for 120 minutes.
Table 1 shows the reaction conditions and results for manufacturing a diamond-coated member under the same conditions as in Example 2 except for the following.
(以下、余白)
第1表
第1表に明らかなように、この発明の方法を採用して製
造されるダイヤモンド被覆部材は、被覆膜と基体との密
着性に優れ、層剥離がなく、シかも被覆層の硬度が高い
うえに1層形成時間が短いこと、すなわち高い成膜速度
で製造することができる。(Hereinafter, blank spaces) Table 1 As is clear from Table 1, the diamond-coated member produced by the method of the present invention has excellent adhesion between the coating film and the substrate, and there is no layer peeling. Furthermore, the hardness of the coating layer is high and the time required to form one layer is short, that is, it can be manufactured at a high film formation rate.
[発明の効果]
この発明の製造方法によると、中間層形成のための炭素
源に一酸化炭素を用いるから、メタンガス等を用いる従
来方法と違って高い成膜速度で中間層を製造することが
できる。[Effects of the Invention] According to the manufacturing method of the present invention, carbon monoxide is used as the carbon source for forming the intermediate layer, so unlike the conventional method using methane gas etc., the intermediate layer can be manufactured at a high film formation rate. can.
また、この発明の製造方法では、一酸化炭素と水素と基
体を構成する元素を含有するガスとからなる原料ガスを
使用して、前記元素の炭化物とダイヤモンドとを含有す
る中間層を形成しているので、その中間層の上に形成す
るダイヤモンド層の密着性が高くなる。しかもそのダイ
ヤモンド層の高度が大さく耐摩耗性が良好である。Further, in the manufacturing method of the present invention, an intermediate layer containing carbide of the element and diamond is formed using a raw material gas consisting of carbon monoxide, hydrogen, and a gas containing an element constituting the substrate. This increases the adhesion of the diamond layer formed on the intermediate layer. Furthermore, the diamond layer has a large height and has good wear resistance.
したがってこの発明はたとえば切削工具類、研摩材、耐
摩耗性機械部品、光学部品、電気番電子材料など各種工
業分野に好適なダイヤモンド被覆部材を高い生産性の下
に提供することがで♂る。Therefore, the present invention can provide diamond-coated members suitable for various industrial fields such as cutting tools, abrasives, wear-resistant mechanical parts, optical parts, electrical and electronic materials, etc., with high productivity.
Claims (1)
を含有するガスとを含む原料ガスを励起して得られる活
性ガスを基体に接触させて中間層を形成し、この中間層
上に、ダイヤモンド膜を形成することを特徴とするダイ
ヤモンド被覆部材の製造方法。(1) An active gas obtained by exciting a raw material gas containing carbon monoxide gas, hydrogen gas, and a gas containing elements constituting the substrate is brought into contact with the substrate to form an intermediate layer, and an intermediate layer is formed on the intermediate layer. A method of manufacturing a diamond-coated member, comprising forming a diamond film.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8609289A JPH02267268A (en) | 1989-04-05 | 1989-04-05 | Production of diamond coated member |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8609289A JPH02267268A (en) | 1989-04-05 | 1989-04-05 | Production of diamond coated member |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02267268A true JPH02267268A (en) | 1990-11-01 |
Family
ID=13877067
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8609289A Pending JPH02267268A (en) | 1989-04-05 | 1989-04-05 | Production of diamond coated member |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02267268A (en) |
-
1989
- 1989-04-05 JP JP8609289A patent/JPH02267268A/en active Pending
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