JPH0227545U

JPH0227545U -

Info

Publication number: JPH0227545U
Application number: JP10586588U
Authority: JP
Priority date: 1988-08-10
Filing date: 1988-08-10
Publication date: 1990-02-22
Anticipated expiration: 2003-08-10
Also published as: JPH0720580Y2

Description

[Brief explanation of drawings]

第１図は本考案によるレンズテスタの光路系の
一実施例を適用したレンズテスタの概略構成を示
すブロツク図、第２図はレンズマウントの平面図
、第３図はその―断面図、第４図は光源部の
構成図、第５図は光源部の各構成要素の放射又は
透過分光特性を示すグラフ、第６図はチヤートの
平面図、第７図は軸外ミラー部の平面図、第８図
はその左側面図、第９図はセンサ部の平面図、第
１０図はそのＸ―Ｘ断面図、第１１図は第９図の
―断面図、第１２図は演算回路のブロツ
ク図、第１３図は演算回路に於るコントラスト演
算に係る正弦波信号の説明図、第１４図及び第１
５図は軸外測定点位置を示す図、第１６図は制御
部及び判定部のフローチヤート、第１７図は測定
により得られるデイフオーカス量に対するコント
ラスト値の特性曲線、第１８図はコントラスト測
定のサブルーチンのフローチヤート、第１９図は
走査平均レジスタ群の概念図、第２０図は走査時
間短縮化を説明する概念図、第２１図は判定サブ
ルーチンのフローチヤート、第２２図は基準像面
位置と平均像面位置との関係を示す説明図、第２
４図は判定サブルーチンのフローチヤート、第２
５図は表示パネルの平面図、第２６図は本考案に
係るレンズテスタを適用したレンズテスタシステ
ムの構成ブロツク図、第２７図はパソコン部によ
る測定結果の表示の一例を示す図、第２８図及び
第２９図は第２７図の表示の説明図、第３０図は
第２８図及び第２９図と対応した像面変化の説明
図、第３１図は従来例である投影テストの説明図
、第３２図はＭＴＦ曲線を示すグラフ、第３３図
は単一空間周波数に於るＭＴＦの値から被検レン
ズの固有ＭＴＦの推察を説明する図である。１……被検レンズ、２……光学系、１０……レ
ンズマウント部（レンズ保持部）、２２……軸上
ミラー（ミラー）、２３……軸外ミラー（ミラー
）、３１Ａ・３１Ｚ……ＣＣＤセンサ（検知手段
）、２１１……ハロゲンランプ（光源）、２１６
……ハーフミラー、２１７……ミラー。 Fig. 1 is a block diagram showing a schematic configuration of a lens tester to which an embodiment of the optical path system of a lens tester according to the present invention is applied, Fig. 2 is a plan view of a lens mount, Fig. 3 is a cross-sectional view thereof, and Fig. 4 The figure is a configuration diagram of the light source section, FIG. 5 is a graph showing the radiation or transmission spectral characteristics of each component of the light source section, FIG. 6 is a plan view of the chart, FIG. 7 is a plan view of the off-axis mirror section, and FIG. Figure 8 is its left side view, Figure 9 is a plan view of the sensor section, Figure 10 is its XX cross-sectional view, Figure 11 is a cross-sectional view of Figure 9, and Figure 12 is a block diagram of the arithmetic circuit. , Fig. 13 is an explanatory diagram of a sine wave signal related to contrast calculation in the arithmetic circuit, Fig. 14 and Fig. 1
Figure 5 is a diagram showing the off-axis measurement point position, Figure 16 is a flowchart of the control unit and determination unit, Figure 17 is a characteristic curve of contrast value with respect to the amount of defocus obtained by measurement, and Figure 18 is a subroutine for contrast measurement. Figure 19 is a conceptual diagram of the scanning average register group, Figure 20 is a conceptual diagram explaining scanning time reduction, Figure 21 is a flowchart of the determination subroutine, and Figure 22 is a conceptual diagram of the scanning average register group. Explanatory diagram showing the relationship with the image plane position, 2nd
Figure 4 is a flowchart of the determination subroutine, the second
Fig. 5 is a plan view of the display panel, Fig. 26 is a block diagram of the configuration of a lens tester system to which the lens tester according to the present invention is applied, Fig. 27 is a diagram showing an example of display of measurement results by the personal computer section, Fig. 28 29 is an explanatory diagram of the display in FIG. 27, FIG. 30 is an explanatory diagram of image plane changes corresponding to FIGS. 28 and 29, and FIG. 31 is an explanatory diagram of the conventional projection test. FIG. 32 is a graph showing the MTF curve, and FIG. 33 is a diagram illustrating the estimation of the characteristic MTF of the lens to be tested from the MTF value at a single spatial frequency. DESCRIPTION OF SYMBOLS 1... Lens to be tested, 2... Optical system, 10... Lens mount section (lens holding section), 22... On-axis mirror (mirror), 23... Off-axis mirror (mirror), 31A/31Z... CCD sensor (detection means), 211...Halogen lamp (light source), 216
...Half mirror, 217...Mirror.

補正昭６３．１１．１６図面の簡単な説明を次のように補正する。明細書第９６頁第１０行目〜第１１行目の、「
関係を示す説明図、」と「第２４図は」の間に、
「第２３図は従来例である投影テストの説明図、
」を挿入する。明細書第９６頁第１８行目の、「変化の説明図
、」を、「変化の説明図である。」に補正する。明細書第９６頁第１８行目〜第９７頁第２行目
の、「第３１図は〜である。」を削除する。Amendment November 16, 1981 The brief description of the drawing is amended as follows. On page 96, lines 10 to 11 of the specification, “
Between "Explanatory diagram showing the relationship" and "Figure 24 is",
``Figure 23 is an explanatory diagram of a conventional example of a projection test.
” is inserted. In the 18th line of page 96 of the specification, "Explanatory diagram of the change" is corrected to "This is an explanatory diagram of the change." ``Figure 31 is...'' from page 96, line 18 to page 97, line 2 of the specification is deleted.

Claims

[Scope of utility model registration request]

A test lens is held in a lens holder so as to be rotatable, and light that has passed through a lattice chart of a predetermined pitch is incident on the held test lens from on-axis and off-axis, and on-axis and off-axis light are detected. In a lens tester configured to detect a chart image by a detection means placed in front of each optical path, light emitted from a light source is reflected by a half mirror to form axial light, and the half mirror is It is characterized in that the transmitted light is reflected by a mirror to form off-axis light, and the on-axis and off-axis light after passing through the test lens are respectively reflected by the mirror and guided to the detection means. Optical path system of lens tester.