JPH02287172A - Testing method - Google Patents

Abstract

PURPOSE:To shorten a testing time required for a decision of the normal/ defective state by setting a sequence of measuring items in order of a high fraction defective and omitting the measurement for test items succeeding after the time when even one of the measuring items is decided as defective. CONSTITUTION:A device to be tested is measured according to many test items and an arrangement of the test items are changed in order of the high fraction defective as the result of test. When a dispersion in the performance of the device to be tested is found, the order is changed. When the decision is made as normal for all of the test items, the device to be tested is decided as normal, and if the decision is made as defective for even one of the test items, the succeeding test items are omitted after that time, then the device to be tested is decided as defective. A provability deciding the defect at the earlier order time of the test items is thereby made to be high, and the testing time required for the decision of normal/defective state can be reduced.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a test method, and more particularly to a test method that shortens the test time.

Speed-following J-port illusion 1 For electronic components, a single element is subjected to a large number of test items, and is measured according to the large number of test items to continuously judge whether it is good or bad.

An example of this test method will be explained with reference to the flowchart in FIG.

In this figure, Te5tl, Te5t2. a old e4
estn represents each test item, and when all n test items are judged as Go, the test is judged as "good", and if even one of the n test items is judged as NG, the subsequent tests are Test items are not performed and the test is judged to be "poor".

(L''; In the case of the above test method, the test time spent on pass/fail judgment is Tl, T2,...T
When n is expressed as ΣTi. However, i-凰n is the number of test items to be tested at that time. However, if a test item that has been judged as NG happens to be in a late ranking, all the test time that has been spent on the test item that has been judged as Go is wasted.

- The present invention was proposed with the aim of solving the above problems, and in sequentially carrying out the work of measuring the device under test and determining the quality of the device according to a plurality of predetermined test items,
There is provided a test method characterized in that the above-mentioned measurements are performed in the order of test items classified for each predetermined failure rate, measurements after the measurement item determined to be defective are omitted, and the next device under test is measured.

tsunetane hindi An embodiment of the present invention will be described below with reference to FIG.

Te5tl', Te5t2', ...
4estn' are tests/items that are rearranged in order of increasing failure rate as a result of continuous measurement of the device under test, and the order is changed depending on variations in the performance of the device under test. Similar to the example in Figure 2, when all n test items are judged as GO, the test is judged as "good", and if even one of the n test items is judged as NG, subsequent test items is not carried out, and the test is judged to be "poor". Therefore, in the case of the present invention, there is a high probability that a "defective" determination will be made at an early rank of the test item, and the test time ΣTi spent on the pass/fail determination is correspondingly shortened.

1=1 In the above embodiment, the case where the order of measurement items is set in descending order of defective rate has been explained, but the present invention is not limited to the above embodiment, and the defective rate may be divided into 10% increments, for example. , even if the defective rate fluctuates within each defective rate range,
Instead of changing the overall order of measurement items, the order of measurement items may be changed only when there is a variation exceeding the defective rate range.

As described above, according to the present invention, it is possible to shorten the test time.

[Brief explanation of the drawing]

Te5tl', Te5t2'・old...Te5
ty'・・・Test item. Written amendment (method) % formula % 2. Invention title test method 3. Relationship with the case of the person making the amendment Patent applicant 2-9-1 Seiran, Otsu City, Shiga Prefecture 520 Kansai NEC Corporation 5. In column 6 of "Brief explanation of drawings" of the specification submitted at the time of filing, between "Brief explanation of drawings" and rTestJ on page 4, lines 13 and 14 of the amendment, "Fig. Figure 1 and Figure 2 are flowcharts explaining the test method according to the present invention.

Claims (2)

[Claims] (1) In sequentially carrying out the work of measuring and determining the quality of the device under test according to multiple predetermined test items,
A test method characterized in that the above-mentioned measurements are carried out in the order of test items categorized by a predetermined failure rate, measurements after the measurement item determined to be defective are omitted, and the next device under test is measured. (2) The test method according to claim 1, characterized in that the measurement is carried out by rearranging the test items classified for each predetermined defect in descending order of defect rate.