JPH0230754A - Vacuum deposition method - Google Patents
Vacuum deposition methodInfo
- Publication number
- JPH0230754A JPH0230754A JP18010588A JP18010588A JPH0230754A JP H0230754 A JPH0230754 A JP H0230754A JP 18010588 A JP18010588 A JP 18010588A JP 18010588 A JP18010588 A JP 18010588A JP H0230754 A JPH0230754 A JP H0230754A
- Authority
- JP
- Japan
- Prior art keywords
- substance
- vapor deposition
- deposited
- vacuum
- boat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 19
- 238000001771 vacuum deposition Methods 0.000 title description 2
- 239000000126 substance Substances 0.000 claims abstract description 23
- 230000008018 melting Effects 0.000 claims abstract description 20
- 238000002844 melting Methods 0.000 claims abstract description 20
- 239000000758 substrate Substances 0.000 claims abstract description 14
- 238000007740 vapor deposition Methods 0.000 claims description 25
- 239000000463 material Substances 0.000 claims description 23
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 238000004299 exfoliation Methods 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
- 238000000151 deposition Methods 0.000 description 21
- 230000008021 deposition Effects 0.000 description 15
- 238000001704 evaporation Methods 0.000 description 14
- 238000010438 heat treatment Methods 0.000 description 14
- 230000008020 evaporation Effects 0.000 description 13
- 238000010894 electron beam technology Methods 0.000 description 9
- 229910052721 tungsten Inorganic materials 0.000 description 8
- 230000000694 effects Effects 0.000 description 7
- 230000003287 optical effect Effects 0.000 description 5
- 239000002245 particle Substances 0.000 description 5
- 238000001816 cooling Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229910052909 inorganic silicate Inorganic materials 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
- 230000008022 sublimation Effects 0.000 description 1
- 239000011882 ultra-fine particle Substances 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は、蒸着方法に関する。[Detailed description of the invention] (Industrial application field) The present invention relates to a vapor deposition method.
(従来の技術〕
一般に、基板に蒸着物質(誘電体又は金属)を堆積させ
る方法において、被蒸着物質の加熱溶融は、例えば”7
114膜ハンドブツク、2章真空蒸着法」に記載される
ごとく、抵抗加熱法、電子ビーム加熱法等が用いられて
いる。(Prior Art) Generally, in a method of depositing a vapor deposition material (dielectric or metal) on a substrate, heating and melting of the vapor deposition material is performed, for example, by
As described in 114 Film Handbook, Chapter 2, "Vacuum Deposition Method," resistance heating method, electron beam heating method, etc. are used.
例えば、融点の低いSiOを蒸着物質とした場合、第3
図に示すように、ポート状の抵抗発熱体1に顆粒状のS
i04をのせ、取付電極3に数10Aの電流を流して
SiO4を溶融し、真空中(I X 10 ”’〜5
X I O−’Torr)で数人/Sの蒸着速度で基板
上に蒸着させている。For example, if SiO, which has a low melting point, is used as the vapor deposition material, the third
As shown in the figure, granular S is applied to the port-shaped resistance heating element 1.
i04 is mounted, a current of several tens of amperes is passed through the attached electrode 3 to melt the SiO4, and the SiO4 is placed in a vacuum (I
It is deposited on the substrate at a deposition rate of several people/S using XIO-'Torr).
また、融点の比較的高いCrを被蒸着物質とした場合、
第4図に示すように、冷却るつぼ5にCr6を入れ、C
r6に電子銃7から電子ビーム8を照射して基板上に蒸
着している。Furthermore, when Cr, which has a relatively high melting point, is used as the material to be deposited,
As shown in FIG. 4, Cr6 is put into the cooling crucible 5, and C
An electron beam 8 is irradiated from an electron gun 7 to r6 to deposit it on the substrate.
上記抵抗発熱体によりSiOを蒸着する抵抗加熱法にあ
っては、蒸@物質のSiOを溶融制御する際の取付電極
に流す電流の大、小により、抵抗発熱体からSiOがこ
ぼれ落ちて基板蒸着に必要な絶対量を蒸着できない場合
がある。さらに、蒸着速度の制御が不安定になり易く、
蒸着速度が大きくなりすぎた場合、基板側に蒸着物質が
[飛び」と称せられる「ツブ」として付着する不具合が
あった(表1、従来例1参照)。In the resistance heating method that vaporizes SiO using the resistance heating element described above, depending on the magnitude of the current flowing through the attached electrode when controlling the melting of the vaporized SiO material, SiO spills from the resistance heating element and is deposited on the substrate. It may not be possible to deposit the required absolute amount. Furthermore, control of the deposition rate tends to become unstable;
When the evaporation rate becomes too high, there is a problem in that the evaporation material adheres to the substrate side as "bubbles" called "splatters" (see Table 1, Conventional Example 1).
一方、電子ビームによりCrを加熱する電子ビーム加熱
法にあっては、C「への電子ビーム照射面とC「の内部
とに温度差が生しるとともにCrは昇華性蒸着物質のた
め、Crの加熱に際し均熱効果を取り入でガス出しをし
つつ蒸着を行わないと、Crが急激に高熱を受けてガス
と共に突沸し、上記と同様に「ツブ」が飛び出し、基板
側に付着する不具合があった。かかる「ツブ」は、大き
い場合、数10〜100μmの大きさとなり、膜剥離の
原因となったり、レンズ等の場合では光学視野中で障害
物となり、外観不良、歩留りを低下させる原因となる不
具合があった(表1、従来例2参照)。On the other hand, in the electron beam heating method in which Cr is heated with an electron beam, a temperature difference occurs between the electron beam irradiated surface of C' and the inside of C', and since Cr is a sublimable evaporation substance, Cr If you do not perform vapor deposition while releasing gas by incorporating a soaking effect when heating, Cr will suddenly receive high heat and will bump together with the gas, resulting in the problem of "stubbles" popping out and adhering to the substrate side as described above. there were. Such "bulbs" can be several tens to 100 μm in size and cause film peeling, or in the case of lenses, become an obstruction in the optical field of view, resulting in defects that cause poor appearance and reduced yield. (See Table 1, Conventional Example 2).
本発明は、上記問題点に迄みてなされたものであって、
蒸着物質の「飛び」を極力少なくするとともに、溶融パ
ワー、溶融サイズをデジタル可変し得る電子ビーム熔融
による一定した蒸着速度を得る薄着方法を提供すること
を目的とする。The present invention has been made in view of the above problems, and includes:
The object of the present invention is to provide a thin deposition method that minimizes the "flying" of the deposited material and obtains a constant deposition rate using electron beam melting, which can digitally vary the melting power and melting size.
〔課題を解決するための手段および作用〕上記目的を達
成するために、本発明の蒸着方法においては、蒸着物質
を基板に真空蒸着するにあたり、蒸着物質を覆うように
溶融ボート上面に上記蒸着物質より高融点のメンシュ状
板材を設置して上記蒸着物質を蒸発させるものである。[Means and effects for solving the problems] In order to achieve the above object, in the vapor deposition method of the present invention, when vacuum-depositing a vapor deposition substance onto a substrate, the vapor deposition substance is placed on the upper surface of the melting boat so as to cover the vapor deposition substance. A mensch-like plate material with a higher melting point is installed to evaporate the above deposited substance.
即ち、高電圧低電流電子銃加熱方式により蒸着物質Si
Oを蒸着する場合、SiOより高融点のMoまたはW等
のボックス型ボートに顆粒状のSiOを入れ、SiOを
覆うようにボート上面にWまたはTa等の10〜20μ
mメソシュサイズのネット状板を配置し、ネット状板の
上から電子ビームを蒸着物質に照射するものである。か
かる場合、ネット状板、ボートの底および周辺は照射面
温度に近似して昇温するためSiOの溶融とガス出し時
に全均加熱作用が働き一定した蒸着速度が保持されると
ともに、常に蒸着物質の均一な超微細粒子(入オーダー
)の蒸発が行われる。さらに、ネット状板により10〜
30μm以上の大きいツブ状の突沸性蒸着物質が捕獲さ
れるので、基板面に付着する「飛び」が最小限に防止さ
れる。That is, the deposition material Si is heated using a high voltage and low current electron gun heating method.
When evaporating O, granular SiO is placed in a box-shaped boat made of Mo or W, which has a higher melting point than SiO, and 10 to 20μ of W or Ta is placed on the top of the boat to cover the SiO.
A net-like plate of m mesh size is arranged, and the vapor deposition material is irradiated with an electron beam from above the net-like plate. In such a case, the temperature of the net-like plate, the bottom of the boat, and the surrounding area rises to approximate the temperature of the irradiated surface, so that a uniform heating effect works during the melting of SiO and gas release, and a constant evaporation rate is maintained, and the evaporation material is constantly The evaporation of uniform ultrafine particles (in order) is carried out. Furthermore, 10~
Since large bump-like vapor deposition substances of 30 μm or more are captured, "flying" adhering to the substrate surface is prevented to a minimum.
また、低電圧高電流電子銃加熱方式により蒸着物質Cr
を蒸着する場合、Crより高融点のWまたはTa等のボ
ックス型ボートに顆粒状のCrを入れ、Crを覆うよう
にボート上面にWまたはTa等の10〜20μmメツシ
ュサイズのネット状板を配置し、ネット状板の上から電
子ビームを蒸着物質に照射するもので、上記高電圧低電
流電子銃加熱方式と同様な作用が得られる。In addition, the evaporation material Cr is
When depositing Cr, granular Cr is placed in a box-shaped boat made of W or Ta, which has a higher melting point than Cr, and a net-like plate of 10 to 20 μm mesh size made of W or Ta is placed on the top of the boat to cover the Cr. , in which an electron beam is irradiated onto the vapor deposition material from above the net-like plate, and the same effect as the high-voltage, low-current electron gun heating method described above can be obtained.
(実施例] 以下、図面を用いて本発明の実施例を詳細に説明する。(Example] Embodiments of the present invention will be described in detail below with reference to the drawings.
(第1実施例)
第1図に示すように、電子銃加熱方式として7着物質の
真空溶融に使用する冷却ハースライナ−10にMoまた
はw?I!lのボックス型ボート11を配設する。次に
、ボード11内に1着物質として顆粒状の5tO12を
入れ、5iOI2を覆うようにボート11上面に5j0
12より高融点であるWまたはTa製の10〜20μm
メンシュサイズのネット状板13を配置する。そしてチ
ャンバー内をI X 10−5〜5 X I O−’T
orrの真空度に排気した後、数10mAの電流をチャ
ージし、電子銃14から電子ビーム15をネット状板1
3上から蒸着物質12に照射して蒸着物質12を蒸発さ
せ、基板16に蒸着した。この時、蒸着速度は5〜50
人/secで行った。(First Example) As shown in FIG. 1, a cooling hearth liner 10 used for vacuum melting of a substance as an electron gun heating method is made of Mo or W. I! A box-shaped boat 11 of 1 is installed. Next, granular 5tO12 is put into the board 11 as the first substance, and 5j0 is placed on the top surface of the boat 11 so as to cover the 5iOI2.
10-20μm made of W or Ta which has a higher melting point than 12
A mensch-sized net-like plate 13 is arranged. And inside the chamber I X 10-5 ~ 5 X I O-'T
After evacuation to a vacuum level of
The evaporation substance 12 was evaporated by irradiating the evaporation substance 12 from above 3, and was deposited on the substrate 16. At this time, the deposition rate is 5 to 50
It was done in person/sec.
かかる方法で、基板としてBK−7ガラス仮16 (n
=1.516)を用い、蒸着速度を50人/ Sec
に設定して成膜を行った評価を表1 (実施例1参照)
に示す。即ち、光学顕微鏡(x200)で外観を観察し
たところ[飛び」の付着は、粒径l〜2μmのものが数
個確認されたのみでほとんどない状態であった。また、
蒸着速度も同時に確認したところ28〜30人/sec
であった。In this method, BK-7 glass temporary 16 (n
= 1.516), and the deposition rate was set to 50 persons/Sec.
Table 1 shows the evaluation of film formation performed with the settings set to 1 (see Example 1).
Shown below. That is, when the appearance was observed using an optical microscope (x200), there was almost no adhesion of "flying particles", with only a few particles having a particle diameter of 1 to 2 .mu.m being observed. Also,
The deposition rate was also confirmed at the same time and was 28 to 30 people/sec.
Met.
本実施例によれば、蒸着物質の「飛び」を防止し得ると
ともに、設定した蒸着速度にコントロールしつつ蒸着を
行うことができた。According to this example, it was possible to prevent the evaporation material from "flying" and to perform the evaporation while controlling the evaporation rate to a set value.
(第2実施例)
第2図に示すように、第1実施例と同様な冷却ハースラ
イナ−10にWまたはTa製のボックス型ボート17を
配設する。次に、ボード17内に蒸着物質として顆粒状
のCr18を入れ、C「18を覆うようにボート17上
面にCr18より高融点であるWまたはTa製の10〜
20μmメツシュサイズのネット状板19を配置する。(Second Embodiment) As shown in FIG. 2, a box-shaped boat 17 made of W or Ta is disposed on a cooling hearth liner 10 similar to that of the first embodiment. Next, granular Cr18 is put into the board 17 as a vapor deposition material, and 10~10~10~10~10~100% of W or Ta, which has a higher melting point than Cr18, is placed on the top surface of the boat 17 so as to cover the C18.
A net-like plate 19 having a mesh size of 20 μm is arranged.
そしてチャンバー内をl X 10−S〜5 X 10
−’Torrの真空度に排気した後、数10Aの電流を
チャージし、電子銃20から電子ビーム21をネット状
仮19上から蒸着物質18に照射して蒸着物質18を蒸
発させ、基板22に蒸着した。このとき、蒸着速度は3
〜10人/secで行った。Then inside the chamber l x 10-S~5 x 10
After evacuation to a vacuum level of -' Torr, a current of several tens of amperes is charged, and the electron beam 21 from the electron gun 20 is irradiated onto the vapor deposition material 18 from above the net-like temporary material 19 to evaporate the vapor deposition material 18 and deposit it on the substrate 22. Deposited. At this time, the deposition rate is 3
~10 people/sec.
かかる方法で、基板としてBK−7ガラス仮22 (n
=1.516)を用い、蒸着速度を6人/seeに設
定して成膜を行った評価を表1 (実施例2参照)に示
す。即ち、光学顕微鏡(x200)で外観を観察したと
ころ「飛び」の付着は、粒径1・−3μmのものが点在
して6〜7個確認されたのみで良好な成膜であった。ま
た、蒸着速度も同時に確認したところ5〜6人/see
で設定した蒸着速度と路間−であった。In this method, BK-7 glass temporary 22 (n
Table 1 (see Example 2) shows the evaluation of film formation performed using the following method (=1.516) and setting the deposition rate to 6 people/see. That is, when the appearance was observed using an optical microscope (x200), only 6 to 7 "flying" particles with a particle size of 1.-3 μm were observed scattered, indicating that the film was formed well. Also, when we checked the deposition rate at the same time, it was 5 to 6 people/see.
The deposition rate and path distance were set at -.
なお、上記第1実施例、第2実施″例に示したように、
昇華性蒸着物質に対する「飛び(スプラッシュ)」の防
止および蒸着速度の制御の容易性により、従来、抵抗加
熱蒸着法で行われていた蒸着物質、例えばAl、Ce0
z、CeFe、TizO:+。In addition, as shown in the above-mentioned first embodiment and second embodiment,
Due to the prevention of "splash" for sublimable deposition materials and the ease of controlling the deposition rate, deposition materials conventionally performed by resistance heating deposition methods, such as Al, Ce0, etc.
z, CeFe, TizO: +.
TiO等もしくは電子ビーム蒸着法で行われていた蒸着
物質、例えば、Taz○s、Ti0z、Zr0zA2□
Oz、SiO□等についても、蒸着物質の昇華性、溶融
性に限定を受けずに上記実施例と同様な作用、効果を奏
しつつ実施することができる。TiO, etc. or evaporation substances performed by electron beam evaporation, such as Taz○s, Ti0z, Zr0zA2□
Oz, SiO□, etc. can also be used without being limited by the sublimation and melting properties of the vapor deposition material, and can be carried out while producing the same effects and effects as in the above embodiments.
表 1
〔発明の効果〕
以上のように、本発明の蒸着方法によれば、蒸着物質の
基板側に付着する[飛び(スプラッシュ)」を最小限に
抑えることができるので、剥離しにくい蒸着膜が形成さ
れるとともに外観品質の向上を図ることができる。さら
に、蒸着速度が一定に制御し得るため、蒸着膜の光学特
性(屈折率、吸収率)または結晶性を任意にコントロー
ルすることができる。Table 1 [Effects of the Invention] As described above, according to the vapor deposition method of the present invention, it is possible to minimize the "splash" of the vapor deposition material adhering to the substrate side, thereby reducing the vapor deposition film that is difficult to peel off. is formed, and the appearance quality can be improved. Furthermore, since the deposition rate can be controlled to be constant, the optical properties (refractive index, absorption rate) or crystallinity of the deposited film can be controlled as desired.
第1図は本発明の1着方法の第1実施例の説明図、第2
図は本発明の1着方法の第2実施例の説明図、第3図お
よび第4図は従来の蒸着方法の説明図である。
11・・・ボート
12・・・蒸着物質
13・・・メンシュ状板
第1図
特許出願人 オリンパス光学工業株式会社+1 ボ
ート
12−茎着吻貨
13・・メツツユ状(反Figure 1 is an explanatory diagram of the first embodiment of the first-place method of the present invention;
The figure is an explanatory diagram of a second embodiment of the one-layer deposition method of the present invention, and FIGS. 3 and 4 are explanatory diagrams of a conventional vapor deposition method. 11...Boat 12...Vapour-deposited substance 13...Mensch-like plate Figure 1 Patent applicant Olympus Optical Co., Ltd.
Claims (1)
質を覆うように溶融ボート上面に上記蒸着物質より高融
点のメッシュ状板材を設置して上記蒸着物質を蒸発させ
ることを特徴とする蒸着方法。(1) A vapor deposition method characterized in that when a vapor deposition substance is vacuum-deposited on a substrate, a mesh plate material having a higher melting point than the vapor deposition substance is placed on the top surface of a melting boat so as to cover the vapor deposition substance, and the vapor deposition substance is evaporated. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18010588A JPH0230754A (en) | 1988-07-18 | 1988-07-18 | Vacuum deposition method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18010588A JPH0230754A (en) | 1988-07-18 | 1988-07-18 | Vacuum deposition method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0230754A true JPH0230754A (en) | 1990-02-01 |
Family
ID=16077512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18010588A Pending JPH0230754A (en) | 1988-07-18 | 1988-07-18 | Vacuum deposition method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0230754A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04110191U (en) * | 1991-03-07 | 1992-09-24 | 赤井電機株式会社 | Continuous electrolyzed ionized water generator |
| JPH05253572A (en) * | 1992-03-13 | 1993-10-05 | Nippon Torimu:Kk | Continuous electrolytic ion water making device integrated with water purifier |
| JPH0655173A (en) * | 1992-01-28 | 1994-03-01 | Japan Storage Battery Co Ltd | Electrolytic tank for ion water generator |
| KR101015277B1 (en) * | 2008-12-10 | 2011-02-15 | 삼성모바일디스플레이주식회사 | Evaporation source |
-
1988
- 1988-07-18 JP JP18010588A patent/JPH0230754A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04110191U (en) * | 1991-03-07 | 1992-09-24 | 赤井電機株式会社 | Continuous electrolyzed ionized water generator |
| JPH0655173A (en) * | 1992-01-28 | 1994-03-01 | Japan Storage Battery Co Ltd | Electrolytic tank for ion water generator |
| JPH05253572A (en) * | 1992-03-13 | 1993-10-05 | Nippon Torimu:Kk | Continuous electrolytic ion water making device integrated with water purifier |
| KR101015277B1 (en) * | 2008-12-10 | 2011-02-15 | 삼성모바일디스플레이주식회사 | Evaporation source |
| US8366831B2 (en) | 2008-12-10 | 2013-02-05 | Samsung Display Co., Ltd. | Evaporation source |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5292559A (en) | Laser transfer process | |
| JPH089772B2 (en) | Vapor deposition device | |
| JPS61204372A (en) | Method for making material amorphous by use of implantation of heterogeneous atom into solid by electron beam | |
| JPS5983766A (en) | Vacuum evaporation deposition by electron gun | |
| US4701769A (en) | Thermal head and method for fabrication thereof | |
| JP2570560Y2 (en) | Electron beam evaporation source | |
| JPS6155588B2 (en) | ||
| JP2790654B2 (en) | Method for forming titanium dioxide film on plastic lens substrate | |
| RU2121522C1 (en) | Evaporator | |
| JPS6250460A (en) | Vaporizing method | |
| KR0116791Y1 (en) | Evaporator for resistance heating vacuum deposition | |
| JPS5910992B2 (en) | Vapor deposition equipment | |
| JPH0541697B2 (en) | ||
| JPH0892734A (en) | Evaporation of mg | |
| JPH0480376A (en) | Method of alloying metal surface | |
| JPS60169561A (en) | Method and apparatus for forming thin film | |
| JPH0587591B2 (en) | ||
| JPS61163267A (en) | Vacuum deposition device | |
| US3930901A (en) | Coating ingot pretreatment | |
| JPH08283942A (en) | Evaporation method for sublimable metal materials | |
| KR920000244B1 (en) | Thin film formation method by e-beam deposition | |
| JPS5815491Y2 (en) | Electron gun type evaporation source | |
| JPS5842769A (en) | Ion plating device using light beam | |
| JPH0313566A (en) | Production of thin film | |
| JPH0336262A (en) | Vacuum film forming device |