JPH02308438A - Detecting structure for light intensity of emitted light - Google Patents

Detecting structure for light intensity of emitted light

Info

Publication number
JPH02308438A
JPH02308438A JP1128462A JP12846289A JPH02308438A JP H02308438 A JPH02308438 A JP H02308438A JP 1128462 A JP1128462 A JP 1128462A JP 12846289 A JP12846289 A JP 12846289A JP H02308438 A JPH02308438 A JP H02308438A
Authority
JP
Japan
Prior art keywords
light
emitted
emitted light
reflected
light intensity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1128462A
Other languages
Japanese (ja)
Inventor
Hiroaki Nishikuma
西隈 弘明
Shuichi Hoshino
秀一 星野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NHK Spring Co Ltd
Original Assignee
NHK Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NHK Spring Co Ltd filed Critical NHK Spring Co Ltd
Priority to JP1128462A priority Critical patent/JPH02308438A/en
Priority to US07/399,710 priority patent/US5126988A/en
Publication of JPH02308438A publication Critical patent/JPH02308438A/en
Pending legal-status Critical Current

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  • Moving Of The Head For Recording And Reproducing By Optical Means (AREA)
  • Optical Head (AREA)

Abstract

PURPOSE:To prevent an undesirable influence exerted on other optical element caused by a reflected light from the photodetecting surface of a photodetector by using the photodetector having the photodetecting surface inclined from the surface vertical to an optical axis of a reflected emitted light. CONSTITUTION:An emitted light from a semiconductor laser 1 is reflected and deflected by a polarization beam splitter 4, becomes light for measuring the intensity of the emitted light, passes through a glass cover 16 of the photodetecting surface of a light intensity detector inclined agains the surface vertical to an optical axis of this light, made incident on a photodiode 17 of the same inclination, and a light intensity of the emitted light is measured. By this inclined photodetecting surface, a reflected light from the photodetecting surface is not made incident on a photometric sensor 9, etc., of an optical element for controlling an optical head of other optical element, and it is prevented that such an undesirable influence as a noise is generated, etc., is exerted.

Description

【発明の詳細な説明】 [発明の目的コ 〈産業上の利用分野〉 本発明は、被照射体に向けて光源から発せられた出射光
の光強度を検出するための出射光の光強度検出構造に関
する。
[Detailed Description of the Invention] [Purpose of the Invention (Industrial Application Field) The present invention relates to a method for detecting the light intensity of emitted light for detecting the light intensity of emitted light emitted from a light source toward an irradiated object. Regarding structure.

〈従来の技術〉 従来、例えば光学式記録媒体としての光ディスクの記録
面に収束光を照射すると共に、その反射光を検出するこ
とにより、記録及び再生を行うようにした光学式情報記
録再生装置がある。この装置では、光ディスクの記録ト
ラックに対する光学ヘッドのフォーカシング及びトラッ
キングの各エラーを検出して、光学ヘッドの位置制御を
行うと共に、その検出光により情報の再生を行っている
。
<Prior Art> Conventionally, there has been an optical information recording and reproducing device that performs recording and reproducing by irradiating convergent light onto the recording surface of an optical disk as an optical recording medium and detecting the reflected light. be. This device detects each error in focusing and tracking of an optical head with respect to a recording track of an optical disk, controls the position of the optical head, and reproduces information using the detected light.

上記装置としては、第6図に示されるように、光源とし
ての半導体レーザ31がら発せられる出射光32の光路
中に偏光ビームスプリッタ33を配置しており、光磁気
記録再生装置の場合にはカー効果によりデータの再生を
行うため、偏光ビームスプリッタ33には、P偏光成分
の透過率が60〜80%程度でありかつS偏光成分の反
射率が100%であるものが用いらている。図示されな
い光磁気ディスクからの反射光34が、図の破線により
示されるように左方から偏光ビームスプリッタ33内に
入射するが、反射光34の一部が、偏光ビームスプリッ
タ33内にて出射光32の光路とは異なる向きに変向さ
れて、偏光ビームスプリッタ33の図に於ける下面から
下方に向けてデータ検出光35として出射される。その
データ検出光35の光路−ヒには、上記したフォーカシ
ング及びトラッキングの各エラーの検出並びにデータ再
生のための測光センサ36が配置されている。
As shown in FIG. 6, the above device has a polarizing beam splitter 33 disposed in the optical path of the emitted light 32 emitted from a semiconductor laser 31 as a light source, and in the case of a magneto-optical recording/reproducing device, In order to reproduce data based on the effect, the polarizing beam splitter 33 has a transmittance of approximately 60 to 80% for the P-polarized light component and a reflectance of 100% for the S-polarized light component. Reflected light 34 from a magneto-optical disk (not shown) enters the polarizing beam splitter 33 from the left side as shown by the broken line in the figure, but a part of the reflected light 34 enters the polarizing beam splitter 33 as an output light. The light is deflected in a direction different from the optical path of the polarizing beam splitter 33, and is emitted downward from the bottom surface of the polarizing beam splitter 33 as a data detection light 35. A photometric sensor 36 for detecting the above-mentioned focusing and tracking errors and for data reproduction is arranged on the optical path of the data detection light 35.

ところで、記録やデータ再生時には、適切な光強度をも
って光磁気ディスクに対して照射するべく出射光32の
光強度を検出することが必要であるが、半導体レーザ3
1内に設けられた図示されない公知形式のモニタ用フォ
トダイオードにより出射光32の光強度を検出すること
ができる。しかしながら、偏光ビームスプリッタ33内
を通過する反射光34の残りが、反射光34及び出射光
32の両光路が互いに一致していることから、半導体レ
ーザ31内に入射するため、その入射光をもモニタ用フ
ォトダイオードにより検出してしまうため、出射光32
の光強度のみを検出することができない。
By the way, when recording or reproducing data, it is necessary to detect the light intensity of the emitted light 32 in order to irradiate the magneto-optical disk with an appropriate light intensity.
The light intensity of the emitted light 32 can be detected by a monitor photodiode of a known type (not shown) provided in the light emitting device 1 . However, since the optical paths of the reflected light 34 and the emitted light 32 coincide with each other, the remainder of the reflected light 34 passing through the polarizing beam splitter 33 enters the semiconductor laser 31, so that the remaining reflected light 34 also dissipates the incident light. Since it is detected by the monitor photodiode, the emitted light 32
It is not possible to detect only the light intensity of .

また、偏光ビームスプリッタ33にて図に於ける上方に
向けて変向された出射光32の一部を検出することによ
り、出射光32の光強度を検出することができ、その変
向された出射光32の一部からなる検出光37の光路」
二に光強度検出器38を配置すれば良い。しかしながら
、その光強度検出器38の受光面としてのケーシングに
設けられたガラスカバー39の表面及びケーシング内に
設けられたフォトダイオード41の受光面にて検出光3
7が反射する。これら反射光40が、図の想像線により
示されるように、検出光37の光路と一致するデータ検
出光35の光路上に配置された測光センサ36に入射す
ることになる。従って、測光センサ36により検出する
各エラー検出信号及び再生信号に対するノイズとなって
、各信号の劣化が生じる虞れがあるため、」二記ノイズ
を除去することが望ましい。
In addition, by detecting a part of the emitted light 32 that has been deflected upward in the figure by the polarizing beam splitter 33, the light intensity of the emitted light 32 can be detected, and the light intensity of the emitted light 32 can be detected. Optical path of detection light 37 consisting of a part of emitted light 32
A light intensity detector 38 may be placed second. However, the detected light 3 is detected on the surface of the glass cover 39 provided on the casing as the light receiving surface of the light intensity detector 38 and on the light receiving surface of the photodiode 41 provided inside the casing.
7 is reflected. These reflected lights 40 enter the photometric sensor 36 arranged on the optical path of the data detection light 35 that coincides with the optical path of the detection light 37, as shown by the imaginary lines in the figure. Therefore, since there is a risk that the noise may become noise in each error detection signal and reproduction signal detected by the photometric sensor 36 and cause deterioration of each signal, it is desirable to remove the noise described in 2.

〈発明が解決しようとする課題〉 このような従来技術の問題点に鑑み、本発明の主な目的
は、光検出器の受光面からの反射光による他の光学素子
に対する悪影響を防止し得る出射光の光強度検出構造を
提供することにある。
<Problems to be Solved by the Invention> In view of the problems of the prior art, the main object of the present invention is to provide an output capable of preventing the adverse effects of light reflected from the light-receiving surface of a photodetector on other optical elements. An object of the present invention is to provide a light intensity detection structure for emitted light.

[発明の構成] 〈課題を解決するための手段〉 このような目的は、本発明によれば、被照射体に向けて
光源から発せられた出射光の一部を異なる向きに変向さ
せるための変向手段と、前記出射光の光強度を検出する
べく前記変向された出射光の光路中に配置された光検出
器とを有する出射光の光強度検出構造に於て、前記光検
出器の受光面が、前記変向された出射光の光軸に直交す
る面に対して傾けられていることを特徴とする出射光の
光強度検出構造を提供することにより達成される。
[Structure of the Invention] <Means for Solving the Problems> According to the present invention, such an object is to deflect a part of the emitted light emitted from the light source toward the irradiated object in a different direction. and a photodetector disposed in the optical path of the deflected emitted light to detect the light intensity of the emitted light. This is achieved by providing a light intensity detection structure for emitted light, characterized in that the light receiving surface of the device is inclined with respect to a plane perpendicular to the optical axis of the deflected emitted light.

また、前記光検出器を支持する支持体が、前記変向され
た出射光を通すための通孔と、前記受光面からの反射光
が前記通孔内を逆行する向きに進むことを阻止するべく
前記通孔の内壁面に設けられた反射阻止手段とを有する
と良い。
Further, the support supporting the photodetector has a through hole for passing the deflected emitted light and prevents reflected light from the light receiving surface from traveling in the opposite direction within the through hole. It is preferable to include reflection prevention means provided on the inner wall surface of the through hole.

〈作用〉 このようにすれば、光検出器の受光面からの反射光が、
検出光の光路とは異なる向きに向かうため、検出光の光
路上にある他の光学素子に対して悪影響を及ぼすことを
防止することができる。
<Operation> By doing this, the reflected light from the light-receiving surface of the photodetector is
Since the light is directed in a direction different from the optical path of the detection light, it is possible to prevent adverse effects on other optical elements on the optical path of the detection light.

〈実施例〉 以下、本発明の好適実施例を添付の図面について詳しく
説明する。
<Embodiments> Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

第1図は、本発明が適用された光磁気記録再生装置の要
部を示す模式図である。第1図に示されるように、光源
としての・半導体レーザ1から図示されない光磁気ディ
スクに向けて発せられた出射光2の光路上には、コリメ
ータレンズ3及び偏光ビームスプリッタ4が配設されて
いる。
FIG. 1 is a schematic diagram showing the main parts of a magneto-optical recording and reproducing apparatus to which the present invention is applied. As shown in FIG. 1, a collimator lens 3 and a polarizing beam splitter 4 are arranged on the optical path of the emitted light 2 emitted from a semiconductor laser 1 as a light source toward a magneto-optical disk (not shown). There is.

偏光ビームスプリッタ4を通過した出射光2は、光磁気
ディスクにて反射して反射光5となって、図の破線によ
り示されるように偏光ビームスプリッタ4内に入射する
。光磁気記録の場合にはカー効果により信号を読み取る
ため、偏光フィルム6には一般にP偏光成分の透過率が
60〜80%でありかつS偏光成分の反射率が100%
のものを用いており、P偏光成分の一部とS偏光成分と
が、偏光ビームスプリッタ4内に対角位置に配設された
偏光フィルム6にて反射される。従って、反射光5の一
部は、偏光ビームスプリッタ4内に於て偏光フィルム6
により向きを変向されて、偏光ビームスプリッタ4の図
に於ける下面から下方に向けてデータ信号検出光7とし
て出射する。
The emitted light 2 that has passed through the polarizing beam splitter 4 is reflected by the magneto-optical disk to become reflected light 5, which enters the polarizing beam splitter 4 as shown by the broken line in the figure. In the case of magneto-optical recording, since signals are read by the Kerr effect, the polarizing film 6 generally has a transmittance of 60 to 80% for the P-polarized light component and a reflectance of 100% for the S-polarized light component.
A part of the P-polarized light component and the S-polarized light component are reflected by the polarizing film 6 disposed diagonally within the polarizing beam splitter 4. Therefore, a part of the reflected light 5 is transmitted to the polarizing film 6 in the polarizing beam splitter 4.
The direction of the polarizing beam splitter 4 is changed, and the data signal detection light 7 is emitted downward from the bottom surface of the polarizing beam splitter 4 in the figure.

このデータ信号検出光7の光路上には集光レンズ8及び
測光センサ9がそれぞれ同軸的に配設されており、デー
タ信号検出光7を集光レンズ8により測光センサ9に収
束させて、フォーカシング及びトラッキングの各エラー
の検出並びにデータの検出を行うようになっている。
A condenser lens 8 and a photometric sensor 9 are coaxially disposed on the optical path of this data signal detection light 7, and the data signal detection light 7 is converged onto the photometric sensor 9 by the condenser lens 8 for focusing. and tracking errors and data detection.

ところで、出射光2の一部が、前記と同様に偏光フィル
ム6にて光路を変向されて、偏光ビームスプリッタ4の
図に於ける上面から上方に向けて検出光11として出射
する。この検出光11の光路上には集光レンズ12及び
受光素子しての光強度検出器13が配設されており、検
出光11を光強度検出器13に収束させて、出射光2の
光強度を検出する。光強度検出器13の検出値をリード
線14から図示されない制御回路に出力することにより
、半導体レーザ1の出力を監視して、出射光2の光強度
を適切に制御することができる。
By the way, a part of the emitted light 2 has its optical path changed by the polarizing film 6 in the same way as described above, and is emitted upward from the top surface of the polarizing beam splitter 4 as the detection light 11. A condensing lens 12 and a light intensity detector 13 as a light receiving element are arranged on the optical path of this detection light 11, and the detection light 11 is converged on the light intensity detector 13, and the output light 2 is Detect intensity. By outputting the detection value of the light intensity detector 13 to a control circuit (not shown) through the lead wire 14, the output of the semiconductor laser 1 can be monitored and the light intensity of the emitted light 2 can be appropriately controlled.

上記した光強度検出器13は、図に良く示されるように
キャンパッケージタイプからなり、そのケーシング15
内の図示されないベースに固定されたフォトダイオード
17と、そのフォトダイオード17に向けて検出光11
を通過させるためのガラスカバー16とを有する。この
光強度検出器13の受光面としてのガラスカバー16の
入射面及びフォトダイオード17の受光面が、検出光1
1の光軸に対して直交する面に対して傾くように、光強
度検出器13が支持部材18に取付けられている。その
ため、ガラスカバー16の入射面からの反射光19と、
検出光11のフォトダイオード17の受光面からの反射
光20とが、それぞれ図の想像線により示されるように
検出光11の光軸とは異なる向きに反射するため、上記
各反射光19.20が、検出光11の光路と一致するデ
ータ信号検出光7の光路上を通って測光センサ9にノイ
ズとして混入することを容易に防止できる。
The light intensity detector 13 described above is of a can package type as clearly shown in the figure, and its casing 15
A photodiode 17 is fixed to a base (not shown) inside, and a detection light 11 is directed toward the photodiode 17.
It has a glass cover 16 for passing through. The incident surface of the glass cover 16 as a light receiving surface of the light intensity detector 13 and the light receiving surface of the photodiode 17 are connected to the detection light 1.
The light intensity detector 13 is attached to the support member 18 so as to be inclined with respect to a plane perpendicular to the optical axis of the light intensity detector 13 . Therefore, the reflected light 19 from the incident surface of the glass cover 16,
Since the reflected light 20 of the detected light 11 from the light receiving surface of the photodiode 17 is reflected in a direction different from the optical axis of the detected light 11 as shown by the imaginary lines in the figure, each of the reflected light 19 and 20 However, it is possible to easily prevent the data signal detection light 7 from entering the photometric sensor 9 as noise through the optical path of the data signal detection light 7 that coincides with the optical path of the detection light 11.

光強度検出器13には、前記したキャンパッケージタイ
プのみならず、例えば第2図に示されるようにプラスチ
ックモールドタイプの光強度検出器21を用いることか
できる。この第2の実施例では、前記実施例と同様の部
分については同一の符号を付してその説明を省略するが
、図に良く示されるように検出光11の光軸に直交する
面に対して光強度検出器21の入射面22が傾斜して形
成されていると共に、フォトダイオード17も傾斜して
モールドされている。従って、前記と同様に、各反射光
19.20が検出光11の光路−1−を通って測光セン
サ9に入射することを防止できる。
As the light intensity detector 13, not only the can package type described above but also a plastic mold type light intensity detector 21 as shown in FIG. 2, for example, can be used. In this second embodiment, the same parts as those in the previous embodiment are given the same reference numerals and their explanations are omitted. The entrance surface 22 of the light intensity detector 21 is formed to be inclined, and the photodiode 17 is also molded to be inclined. Therefore, similarly to the above, it is possible to prevent each of the reflected lights 19 and 20 from entering the photometric sensor 9 through the optical path -1- of the detection light 11.

また、プラスチックモールドタイプの光強度検出器21
では、ケーシングの形状を自由に形成することができる
ため、第3図に示されるように、入射面22をフォトダ
イオード17とは反対向きに傾斜するように形成しても
良い。この場合にも、各反射光19.20が、図に示さ
れるように互いに異なる向きに反射して、前記と同様に
測光センサ9に入射することを防止できる。
In addition, a plastic mold type light intensity detector 21
Since the shape of the casing can be formed freely, the entrance surface 22 may be formed to be inclined in the opposite direction to the photodiode 17, as shown in FIG. In this case as well, each of the reflected lights 19 and 20 can be prevented from being reflected in different directions as shown in the figure and entering the photometric sensor 9 in the same manner as described above.

第4図は、光磁気記録再生装置の光学ヘッドの本体23
に支持部材18を介して固定されたプラスチックモール
ドタイプの検出器21が示されている。この実施例では
、第1の実施例と同様に検出器21が傾いて取り付けら
れているが、本体23には検出光11を通すための通孔
24が設けられていると共に、通孔24の光強度検出器
21側の開口部には、検出光11の光束を通し得る程度
の開口面積を残すように形成された内向突設部25が設
けられている。このようにすることにより、光強度検出
器21からの各反射光19.20が内向突設部25によ
り阻止されるため、反射光19.20が、通孔24の内
壁面を反射するなどして逆向きに進んで測光センサ9に
達することを好適に防止できる。また、第5図に示され
るように、通孔24の内壁面にねじ山形状を成す複数の
突部26を形成しても良く、この場合にも第4図に示し
た実施例と同様の効果がある。また、上記実施例に示し
たように通孔24の内壁面に何等かの凸状部を設けるこ
とに限ることなく、例えば反射率の極めそ低い塗料を通
孔24の内壁面に塗布するなどしても良い。
FIG. 4 shows the main body 23 of the optical head of the magneto-optical recording/reproducing device.
A plastic mold type detector 21 is shown fixed to the support member 18 through the support member 18 . In this embodiment, the detector 21 is installed at an angle as in the first embodiment, but the main body 23 is provided with a through hole 24 through which the detection light 11 passes. An inward protrusion 25 is provided in the opening on the light intensity detector 21 side, which is formed so as to leave an opening area large enough to allow the light beam of the detection light 11 to pass through. By doing this, each reflected light 19.20 from the light intensity detector 21 is blocked by the inward protrusion 25, so that the reflected light 19.20 is prevented from reflecting off the inner wall surface of the through hole 24. It is possible to suitably prevent the photometric sensor 9 from traveling in the opposite direction and reaching the photometric sensor 9. Further, as shown in FIG. 5, a plurality of thread-shaped protrusions 26 may be formed on the inner wall surface of the through hole 24, and in this case as well, similar to the embodiment shown in FIG. effective. Furthermore, it is not limited to providing some kind of convex portion on the inner wall surface of the through hole 24 as shown in the above embodiment, but for example, coating the inner wall surface of the through hole 24 with a paint having extremely low reflectance, etc. You may do so.

このように、例えば光磁気記録再生装置に於て、トラッ
キング及びフォーカシングの各エラー並びにデータ検出
用の測光センサ9と、出射光2の光強度を検出するため
の光強度検出器21とが、偏光ビームスプリッタ4を介
して相対する位置に配置されている場合に、光強度検出
器21の受光面からの反射光が、ノイズとして各検出信
号に混入することを防止できるため、安定した位置制御
を行うことができると共に、データ信号の対ノイズ比を
向上し得る。
In this way, for example, in a magneto-optical recording and reproducing device, the photometric sensor 9 for detecting tracking and focusing errors and data, and the light intensity detector 21 for detecting the light intensity of the emitted light 2, are configured to detect polarized light. When placed at opposite positions via the beam splitter 4, the reflected light from the light receiving surface of the light intensity detector 21 can be prevented from being mixed into each detection signal as noise, allowing stable position control. In addition, the noise-to-noise ratio of the data signal can be improved.

[発明の効果コ このように本発明によれば、光強度検出器からの反射光
が、光強度検出器に向かう光路を通って他の光学素子に
達することを防止して、他の光学素子に対する悪影響を
防止できる光強度の検出構造を、簡単な構造により形成
しかつ低廉化し得るため、その効果は極めて大である。
[Effects of the Invention] As described above, according to the present invention, the reflected light from the light intensity detector is prevented from reaching other optical elements through the optical path toward the light intensity detector, and the reflected light is prevented from reaching other optical elements. The light intensity detection structure that can prevent adverse effects on the light intensity can be formed with a simple structure and at low cost, so the effect is extremely large.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、光磁気記録再生装置に適用された本発明に基
づく出射光の光強度検出構造の要部を示す模式図である
。 第2図は、第2の実施例を示す図である。 第3図は、第3の実施例を示す第2図と同様の図である
。 第4図は、第4の実施例を示す図である。 第5図は、第5の実施例を示す第4図と同様の図である
。 第6図は、従来の実施例を示す模式図である。
FIG. 1 is a schematic diagram showing a main part of a light intensity detection structure for emitted light based on the present invention applied to a magneto-optical recording/reproducing device. FIG. 2 is a diagram showing a second embodiment. FIG. 3 is a diagram similar to FIG. 2 showing a third embodiment. FIG. 4 is a diagram showing a fourth embodiment. FIG. 5 is a diagram similar to FIG. 4 showing the fifth embodiment. FIG. 6 is a schematic diagram showing a conventional embodiment.

Claims (2)

【特許請求の範囲】[Claims] (1)被照射体に向けて光源から発せられた出射光の一
部を異なる向きに変向させるための変向手段と、前記出
射光の光強度を検出するべく前記変向された出射光の光
路中に配置された光検出器とを有する出射光の光強度検
出構造に於て、 前記光検出器の受光面が、前記変向された出射光の光軸
に直交する面に対して傾けられていることを特徴とする
出射光の光強度検出構造。
(1) Direction changing means for redirecting a part of the emitted light emitted from the light source toward the irradiated object in a different direction, and the redirected emitted light for detecting the light intensity of the emitted light. and a photodetector disposed in the optical path of the emitted light, wherein the light receiving surface of the photodetector is perpendicular to the optical axis of the deflected emitted light. A light intensity detection structure for emitted light, characterized by being tilted.
(2)前記光検出器を支持する支持体が、前記変向され
た出射光を通すための通孔と、前記受光面からの反射光
が前記通孔内を逆行する向きに進むことを阻止するべく
前記通孔の内壁面に設けられた反射阻止手段とを有する
ことを特徴とする請求項1に記載の出射光の光強度検出
構造。
(2) A support supporting the photodetector has a through hole for passing the deflected output light and prevents reflected light from the light receiving surface from traveling in the reverse direction within the through hole. 2. The light intensity detection structure for emitted light according to claim 1, further comprising reflection preventing means provided on an inner wall surface of said through hole.
JP1128462A 1989-05-22 1989-05-22 Detecting structure for light intensity of emitted light Pending JPH02308438A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1128462A JPH02308438A (en) 1989-05-22 1989-05-22 Detecting structure for light intensity of emitted light
US07/399,710 US5126988A (en) 1989-05-22 1989-08-25 Optical head structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1128462A JPH02308438A (en) 1989-05-22 1989-05-22 Detecting structure for light intensity of emitted light

Publications (1)

Publication Number Publication Date
JPH02308438A true JPH02308438A (en) 1990-12-21

Family

ID=14985314

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1128462A Pending JPH02308438A (en) 1989-05-22 1989-05-22 Detecting structure for light intensity of emitted light

Country Status (1)

Country Link
JP (1) JPH02308438A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008209266A (en) * 2007-02-27 2008-09-11 Yokogawa Electric Corp Bidirectional optical module and optical pulse tester

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61208644A (en) * 1985-03-13 1986-09-17 Sharp Corp Optical head
JPS6381636A (en) * 1986-09-26 1988-04-12 Olympus Optical Co Ltd Optical pickup

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61208644A (en) * 1985-03-13 1986-09-17 Sharp Corp Optical head
JPS6381636A (en) * 1986-09-26 1988-04-12 Olympus Optical Co Ltd Optical pickup

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008209266A (en) * 2007-02-27 2008-09-11 Yokogawa Electric Corp Bidirectional optical module and optical pulse tester

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