JPH02309260A - Probe pin - Google Patents
Probe pinInfo
- Publication number
- JPH02309260A JPH02309260A JP12886489A JP12886489A JPH02309260A JP H02309260 A JPH02309260 A JP H02309260A JP 12886489 A JP12886489 A JP 12886489A JP 12886489 A JP12886489 A JP 12886489A JP H02309260 A JPH02309260 A JP H02309260A
- Authority
- JP
- Japan
- Prior art keywords
- tip
- probe pin
- protrusion
- dirt
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、高密度基板の導通検査において、特にパッド
との信頼性の高い電気的接触を得るのに好敵なプローブ
ピンに関する４
〔従来の技術〕
従来のプローブピンは、実公昭６１−４６４６５号公報
に記載のように、先端が固定されたプランジャを有する
ものであった。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to probe pins that are particularly suitable for obtaining reliable electrical contact with pads in continuity testing of high-density substrates. [Technology] A conventional probe pin has a plunger with a fixed tip, as described in Japanese Utility Model Publication No. 46465/1983.
上記従来技術は５パツドにゴミが付着している場合につ
いて配慮されておらず、ゴミの上に先端部の突起がゴミ
に乗ると、そこで止まってしまい、他の突起がパッドと
接触することができず、接触不良が発生してしまうとい
う問題があった。The above conventional technology does not take into consideration the case where dirt is attached to the 5 pad, and if the protrusion at the tip rests on the dirt, it will stop there and other protrusions may come into contact with the pad. However, there was a problem in that poor contact occurred.
本発明の目的は、先端部の突起がゴミに乗っても他の突
起でパッドと接触できるようにすることにある。An object of the present invention is to enable the protrusion at the tip to contact the pad with other protrusions even if it gets on dirt.
上記目的を達成するために、プランジャ先端部を可動す
るようにしたものである。In order to achieve the above object, the tip of the plunger is movable.
先端部の突起がゴミに乗ると、突起の先端はプランジャ
の中心よりズしているため先端部が傾き、他の突起がパ
ッドに接触することができる。When the protrusion at the tip gets on dirt, since the tip of the protrusion is offset from the center of the plunger, the tip tilts and other protrusions can come into contact with the pad.
以下、本発明の一実施例を第１図、第２図により説明す
る。An embodiment of the present invention will be described below with reference to FIGS. 1 and 2.
第１図は、実施例を示した断面図で、ボール１゜チュー
ブ２．スプリング３．プランジャ４．先端部５から成っ
ている。FIG. 1 is a sectional view showing an embodiment, in which a ball 1° tube 2. Spring 3. Plunger 4. It consists of a tip 5.
従来のプローブピンでは、先端部５の突起１゜５ａがゴ
ミ６に乗ると先端部５はそこで止まってしまい、電気的
接触を得ることはできなかった。In the conventional probe pin, when the protrusion 1.5a of the tip 5 gets on the dirt 6, the tip 5 stops there, making it impossible to establish electrical contact.
そこで本発明によるプローブピンでは、第２図に示す如
く、先端部５の突起１，５ａがゴミ６に乗ると、先端部
５が傾き、突起２，５ｂがパッド７に接触し、電気的接
触を得ることができるようになる。Therefore, in the probe pin according to the present invention, as shown in FIG. 2, when the protrusions 1 and 5a of the tip 5 get on the dirt 6, the tip 5 tilts and the protrusions 2 and 5b come into contact with the pad 7, making electrical contact. You will be able to obtain
本実施例によればゴミによって接触不良にならないとい
う効果がある。According to this embodiment, there is an effect that poor contact will not occur due to dust.
本発明によれば、先端部の突起がゴミに乗っても、他の
突起でパッドと電気的接触が可能なので。According to the present invention, even if the protrusion at the tip gets on dirt, it is possible to make electrical contact with the pad using other protrusions.
ゴミに左右されずに常に接触信頼性を確保できるという
効果がある。This has the effect of always ensuring contact reliability regardless of dust.
第１図は本発明の一実施例の断面図、第２図は第１図の
先端部拡大図である。
１・・・ボール、２・・・チューブ、３・・・スプリン
グ。
４・・・プランジャ、５・・・先端部、５ａ・・・突起
１゜５ｂ・・・突起２，６・・・ゴミ、７・・・パッド
。
力ｌ己
第２圀FIG. 1 is a sectional view of an embodiment of the present invention, and FIG. 2 is an enlarged view of the tip of FIG. 1. 1...Ball, 2...Tube, 3...Spring. 4... Plunger, 5... Tip, 5a... Protrusion 1° 5b... Protrusion 2, 6... Dust, 7... Pad. Power's second territory
Claims (1)
ローブピン。1. A probe pin characterized in that the tip of the plunger is movable.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12886489A JPH02309260A (en) | 1989-05-24 | 1989-05-24 | Probe pin |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12886489A JPH02309260A (en) | 1989-05-24 | 1989-05-24 | Probe pin |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02309260A true JPH02309260A (en) | 1990-12-25 |
Family
ID=14995255
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12886489A Pending JPH02309260A (en) | 1989-05-24 | 1989-05-24 | Probe pin |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02309260A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04113442U (en) * | 1991-03-22 | 1992-10-05 | 太陽誘電株式会社 | probe structure |
| KR100823873B1 (en) * | 2006-11-01 | 2008-04-21 | 주식회사 아이에스시테크놀러지 | Test socket |
-
1989
- 1989-05-24 JP JP12886489A patent/JPH02309260A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04113442U (en) * | 1991-03-22 | 1992-10-05 | 太陽誘電株式会社 | probe structure |
| KR100823873B1 (en) * | 2006-11-01 | 2008-04-21 | 주식회사 아이에스시테크놀러지 | Test socket |
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