JPH0237378U - - Google Patents
Info
- Publication number
- JPH0237378U JPH0237378U JP11713588U JP11713588U JPH0237378U JP H0237378 U JPH0237378 U JP H0237378U JP 11713588 U JP11713588 U JP 11713588U JP 11713588 U JP11713588 U JP 11713588U JP H0237378 U JPH0237378 U JP H0237378U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- fixed
- adjacent
- insulating holder
- formed along
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 10
- 239000000853 adhesive Substances 0.000 claims 2
- 230000001070 adhesive effect Effects 0.000 claims 2
- 239000012212 insulator Substances 0.000 claims 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は第２図のＡ―Ａ線断面図であつて、本
考案に係るプローブカードの断面図、第２図はそ
の平面図、第３図は縦横比の大きいチツプの平面
図、第４図は従来のプローブカードを示す平面図
、断面図、第５図は縦横比の大きいチツプを２つ
並べた状態を示す平面図である。
１０……プリント基板、１１……開口、２１…
…第１探針、２２……第２探針、３０……橋部、
４１ａ，４１ｂ……隣接する２つのチツプ、４２
ａ……非隣接辺、４２ｂ……隣接辺、４３ａ……
非隣接辺に沿つて形成された電極、４３ｂ……隣
接辺に沿つて形成された電極、５０……絶縁保持
体。
1 is a sectional view taken along the line A--A in FIG. 2, which is a sectional view of a probe card according to the present invention, FIG. FIG. 4 is a plan view and a sectional view showing a conventional probe card, and FIG. 5 is a plan view showing two chips having a large aspect ratio arranged side by side. 10... Printed circuit board, 11... Opening, 21...
...first probe, 22...second probe, 30...bridge section,
41a, 41b... two adjacent chips, 42
a...Non-adjacent side, 42b...Adjacent side, 43a...
Electrodes formed along non-adjacent sides, 43b... electrodes formed along adjacent sides, 50... insulating holder.
Claims (1)
ブカードにおいて、円形又は略長方形状の開口が
設けられたプリント基板と、外形が円形又は長方
形の絶縁体で構成され、前記開口に装着される絶
縁保持体と、前記絶縁保持体に絶縁性接着剤で固
定され、隣接する２つのチツプの非隣接辺に沿つ
て形成された電極に接触する第１探針と、同様に
前記絶縁保持体に接着され、隣接辺に沿つて形成
された電極に接触する第２探針とを具備しており
、前記第２探針は隣接辺と略平行に前記絶縁保持
体に接着剤等で固定された絶縁物である橋部に固
定され、かつ橋部より電極までの突出長が、第１
探針の突出長と等しく設定されていることを特徴
とするプローブカード。 A probe card for simultaneously measuring two adjacent chips includes: a printed circuit board provided with a circular or substantially rectangular opening; an insulating holder comprising an insulator having a circular or rectangular outer shape and mounted in the opening; , a first probe fixed to the insulating holder with an insulating adhesive and contacting electrodes formed along non-adjacent sides of two adjacent chips; and a second probe that contacts an electrode formed along a side, and the second probe is an insulator fixed to the insulating holder with an adhesive or the like substantially parallel to the adjacent side. is fixed to the bridge part, and the protrusion length from the bridge part to the electrode is the first
A probe card characterized in that the length is set equal to the protrusion length of a probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988117135U JPH0621025Y2 (en) | 1988-09-06 | 1988-09-06 | Probe card that measures two adjacent chips simultaneously |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988117135U JPH0621025Y2 (en) | 1988-09-06 | 1988-09-06 | Probe card that measures two adjacent chips simultaneously |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0237378U true JPH0237378U (en) | 1990-03-12 |
| JPH0621025Y2 JPH0621025Y2 (en) | 1994-06-01 |
Family
ID=31360310
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988117135U Expired - Lifetime JPH0621025Y2 (en) | 1988-09-06 | 1988-09-06 | Probe card that measures two adjacent chips simultaneously |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0621025Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0964125A (en) * | 1995-08-24 | 1997-03-07 | Nippon Maikuronikusu:Kk | Probe card |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5832782A (en) * | 1981-08-20 | 1983-02-25 | 池田 与作 | Production of table tennis racket |
| JPS61260650A (en) * | 1985-05-15 | 1986-11-18 | Mitsubishi Electric Corp | Device for testing semiconductor element |
| JPH01201166A (en) * | 1988-02-05 | 1989-08-14 | Tokyo Kasoode Kenkyusho:Kk | Probe card |
-
1988
- 1988-09-06 JP JP1988117135U patent/JPH0621025Y2/en not_active Expired - Lifetime
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5832782A (en) * | 1981-08-20 | 1983-02-25 | 池田 与作 | Production of table tennis racket |
| JPS61260650A (en) * | 1985-05-15 | 1986-11-18 | Mitsubishi Electric Corp | Device for testing semiconductor element |
| JPH01201166A (en) * | 1988-02-05 | 1989-08-14 | Tokyo Kasoode Kenkyusho:Kk | Probe card |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0964125A (en) * | 1995-08-24 | 1997-03-07 | Nippon Maikuronikusu:Kk | Probe card |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0621025Y2 (en) | 1994-06-01 |