JPH0240539Y2 - - Google Patents

Description

[Detailed description of the invention] [Purpose of the invention] (Industrial application field) The invention is applicable to, for example, circuit board inspection machines and mounted board inspection machines that inspect integrated circuits (ICs) used in televisions, videos, etc. The present invention relates to a contact probe that is used by being inserted into a pin board such as an in-circuit inspection machine (in-circuit inspection machine), and particularly relates to a contact probe with movable ends.

(Prior Art) This type of contact probe that has already been proposed is configured as shown in FIG.

That is, in FIG. 1, a conductive, cylindrical sleeve 2 is inserted through a flat pin board 1 in a circuit board inspection machine, and the sleeve 2 has openings at both ends. 2a, 2b
includes a pair of electrically conductive plunger contact pins 3;
4 is made slidable via an extensible coil spring 5, and is protruded so as to prevent it from slipping out by stoppers 6a and 6b formed on a part of the sleeve 2 by drawing. ing. Further, each inner end portion 3c and 4 of each of the plunger contact pins 3, 4
For example, c is a flexible connecting conductor 9 made of copper wire.
A connecting conductor 9 connecting both plunger contact pins 3 and 4 forms a conductive circuit.

Therefore, in the above-mentioned contact probe, the contact portion 3b of one plunger contact pin 3 is brought into contact with the object to be tested (for example, an IC), and the contact portion 4b of the other plunger contact pin 4 is brought into contact with the power supply side of the power supply circuit. By making contact, the current of this power supply circuit passes through the connection conductor 9 to test the continuity of the object to be tested.

(Problem to be Solved by the Invention) However, in the above-mentioned contact probe, the coil spring 5 and the connecting conductor 9 located concentrically with the coil spring 5 repeatedly and continuously bend each other during continuity testing of the test object. Moreover, due to repeated sliding contact, the extremely thin connecting conductor 9 may untwist or
There is a risk of wire breakage, which has the disadvantage of erroneously testing a normal test object for poor continuity.

In order to eliminate the above-mentioned drawbacks, the present invention provides a pair of plunger contact pins that are energized by independent coil springs so as to protrude outward, so that even if the thin connecting conductive wire is bent, It is designed to prevent disconnection due to sliding contact with the coil spring, to ensure stable continuity and contact continuity in the continuity test of the object to be inspected, and to improve the reliability of the inspection of the object to be inspected. The present invention provides a contact probe characterized by the following.

[Structure of the idea]

(Means for Solving the Problems and Their Effects) In the present invention, a pair of plunger contact pins are protruded outward from the openings at both ends of the sleeve, and are locked with stoppers to prevent them from coming out, and are slidable. The inner ends of both plunger contact pins are connected by a connecting conductive wire coated with a synthetic resin material, and each coil spring is interposed between each of the stoppers and each of the plunger contact pins to allow the plunger to flex. This structure is designed to eliminate contact caused by

(Embodiment of the invention) Hereinafter, the present invention will be described with reference to an illustrated embodiment.

In addition, the present invention will be described with the same reference numerals attached to the same constituent members as in the above-described specific example.

In FIG. 2, reference numeral 1 denotes a flat pin board in a circuit board inspection machine, and the pin holes 1a of this pin board 1 are electrically conductive.
A cylindrical sleeve 2 is inserted through the sleeve 2, and a pair of electrically conductive plunger contact pins 3, 4 having respective contact portions 3b, 4b are inserted into openings 2a, 2b at both ends of the sleeve 2. Above sleeve 2
Each stopper 6a, 6b is formed on a part of the body by drawing so as to protrude outwardly. Also, both plunger contact pins 3,
Extensible coil springs 10a, 10b are interposed between the flanges 3a, 4a of the contact portions 3b, 4b of 4 and the stoppers 6a, 6b. energizes each of the plunger contact pins 3 and 4 to independently project outward.

On the other hand, the inner ends 3c and 4c of each of the plunger contact pins 3 and 4 are connected by a flexible connecting conductive wire 9 made of, for example, a copper wire. The connected conductive wires 9 form a conductive circuit.

Therefore, in the present invention, when testing continuity of an object to be tested, the contact portion 3b of one plunger contact pin 3 is brought into contact with the object to be tested, and the contact portion 4b of the other plunger contact pin 4 is placed on the power supply side of the power supply circuit. By contacting the power supply circuit, the current of this power supply circuit passes through the connection conductive wire 9 to test the continuity of the object to be tested.

On the other hand, when the contact portion 3b of the one plunger contact pin 3 contacts the test object during the continuity test of the test object, each of the coil springs 10a,
Even if the connecting conductive wire 9 is repeatedly and repeatedly bent due to contact against the elastic force of the coil spring 10b, there is no risk of sliding contact with the coil spring 5 as in the above-mentioned specific example. Since there is no wire breakage, reliable inspection can be continued for a long period of time.

Next, in the embodiment of the present invention shown in FIG. 3, the outer side of the connecting conductive wire 9 is coated with a synthetic resin material 9a such as a polyimide tube. This strengthens the connecting conductive wire 9 to prevent untwisting, deformation, and disconnection.

Incidentally, although the above-described embodiment has been described in which the plunger contact pins 3 and 4 are inserted into the openings at both ends of the sleeve 2, for example, one side of the sleeve 2 may be It is free to modify the design so that the plunger contact pin is inserted only into the opening.

[Effect of idea]

As described above, according to the present invention, the sleeve 2
A pair of plunger contact pins 3, 4 are respectively projected outwardly from the openings 2a, 2b at both ends thereof, are locked with respective stoppers 6a, 6b to prevent them from coming out, and are slidably fitted, so that the plunger contact pins 3, 4 are slidably fitted. The inner ends 3c and 4c of the pins 3, 4 are connected by a connecting conductive wire 9 coated with a synthetic resin material, and the stoppers 6a, 6b and the plunger contact pin 3,
Since the coil springs 10a and 10b are interposed between the connecting conductive wire 9 and the connecting conductive wire 9, there is no risk of sliding contact even if the connecting conductive wire 9 is bent. Not only can inspection be performed, but the life of the contact probe can be extended.

[Brief explanation of the drawing]

FIG. 1 is a sectional view of a contact probe that has already been proposed, FIG. 2 is a sectional view of a contact probe according to the present invention, and FIG. 3 is a diagram showing another embodiment of the present invention. 2... Sleeve, 3, 4... Plunger contact pin, 6a, 6b... Stopper, 9... Connection conductive wire, 10a, 10b... Coil spring.

Claims (1)

[Scope of utility model registration request] A pair of plunger contact pins protrude outward from the openings at both ends of the sleeve and are secured by respective stoppers so as to be slidably fitted, and both inner ends of the plunger contact pins are connected to each other. An elastic wire is inserted between a connecting conductive wire covered with a synthetic resin material, both flanges of the two plunger contact pins, and each of the stoppers, and is biased so that the two plunger contact pins protrude outward. A contact probe characterized by comprising each coil spring.