JPH0240948A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPH0240948A
JPH0240948A JP63191327A JP19132788A JPH0240948A JP H0240948 A JPH0240948 A JP H0240948A JP 63191327 A JP63191327 A JP 63191327A JP 19132788 A JP19132788 A JP 19132788A JP H0240948 A JPH0240948 A JP H0240948A
Authority
JP
Japan
Prior art keywords
cmos
circuit
logic
integrated circuit
channel mos
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63191327A
Other languages
Japanese (ja)
Inventor
Akio Harasawa
原澤 昭夫
Kenichi Uchiumi
賢一 内海
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
NEC Engineering Ltd
Original Assignee
NEC Corp
NEC Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, NEC Engineering Ltd filed Critical NEC Corp
Priority to JP63191327A priority Critical patent/JPH0240948A/en
Publication of JPH0240948A publication Critical patent/JPH0240948A/en
Pending legal-status Critical Current

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  • Logic Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Pulse Circuits (AREA)

Abstract

PURPOSE:To control independently the rise time and the fall time of a CMOS logic circuit by inserting variable resistance elements controlled from mutually independent external terminals, in an power supply route and a grounding route of the CMOS logic circuit. CONSTITUTION:An internal inverter circuit is constituted of a CMOS inverter circuit, N-channel or P-channel MOS Tr 3 and Tr 4. In the CMOS inverter circuit, gates of a P-channel MOS Tr 1 and an N-channel MOS transistor Tr 2 are mutually connected, and drains of the transistors are mutually connected. The above node-points are made the logic input and the logic output, respectively. The MOS Tr 3 and Tr 4 are inserted, respectively, in the power supply side and the grounding side of the CMOS inverter circuit. The Tr 3 and the Tr 4 are used as variable resistance elements, and the gates of them are connected with the external input terminals 5 and 6, respectively. By voltages independently applied to the external input terminals 5, 6, characteristics of the rise time and the fall time of output voltage can be independently controlled.

Description

【発明の詳細な説明】 [産業上の利用分野コ 本発明はCMOS半導体集積回路に関し、特に、CMO
S論理回路の伝搬遅延特性を集積回路の外部から制御可
能にした半導体集積回路に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a CMOS semiconductor integrated circuit, and in particular to a CMOS semiconductor integrated circuit.
The present invention relates to a semiconductor integrated circuit in which the propagation delay characteristics of an S logic circuit can be controlled from outside the integrated circuit.

[従来の技術] CMOS半導体集積回路の伝搬遅延時間のうち、立上が
り時間はPチャンネルMOS)ランジスタのオン抵抗と
出力負荷容量の積に依存し、立下がり時間はNチャンネ
ルMOSトランジスタのオン抵抗と出力負荷容量との積
に依存する。
[Prior art] Among the propagation delay times of CMOS semiconductor integrated circuits, the rise time depends on the product of the on-resistance of the P-channel MOS transistor and the output load capacitance, and the fall time depends on the product of the on-resistance of the N-channel MOS transistor and the output Depends on the product with load capacity.

通常、MOSトランジスタのオン抵抗はプロセス変動・
温度に依存し、出力負荷容量は回路構成及びチップ上の
配線ルーティングに依存する。
Normally, the on-resistance of a MOS transistor is affected by process variations.
Depending on temperature, the output load capacitance depends on the circuit configuration and wiring routing on the chip.

[発明が解決しようとする課題] 上述した従来のCMOS半導体集積回路は、伝搬遅延時
間を決定する要素の制御が困難であることから、伝搬遅
延時間の調整及び出力波形の整形を行うことができない
という問題点があった。
[Problems to be Solved by the Invention] The conventional CMOS semiconductor integrated circuit described above cannot adjust the propagation delay time or shape the output waveform because it is difficult to control the elements that determine the propagation delay time. There was a problem.

本発明はかかる問題点に鑑みてなされたものであって、
集積回路の外部から伝搬遅延特性の制御が可能な半導体
集積回路を提供することを目的とする。
The present invention has been made in view of such problems, and includes:
An object of the present invention is to provide a semiconductor integrated circuit whose propagation delay characteristics can be controlled from outside the integrated circuit.

[課題を解決するための手段] 本発明に係る半導体集積回路は、外部端子から抵抗値を
制御可能な第1及び第2の可変抵抗素子と、前記第1の
可変抵抗素子を介して電源に接続され、前記第2の可変
抵抗素子を介して接地されたCMOS論理回路とを具備
したことを特徴とする半導体集積回路。
[Means for Solving the Problems] A semiconductor integrated circuit according to the present invention includes first and second variable resistance elements whose resistance values can be controlled from an external terminal, and a power supply via the first variable resistance element. and a CMOS logic circuit connected to the ground via the second variable resistance element.

[作用] 本発明によれば、CMOS論理回路の電源接続経路に介
挿された第1の可変抵抗素子がPチャンネルMOSトラ
ンジスタのオン抵抗を決定し、CMOS論理回路の接地
経路に介挿された第2の可変抵抗素子がNチャンネルM
OSトランジスタのオン抵抗を決定するように作用する
。これら2つの可変抵抗素子の抵抗値は外部端子より制
御可能であるため、CMOS論理回路の立上がり時間及
び立下がり時間を夫々独立に制御でき、結局、回路の伝
搬遅延特性の制御が可能になる。
[Function] According to the present invention, the first variable resistance element inserted in the power supply connection path of the CMOS logic circuit determines the on-resistance of the P-channel MOS transistor, and the first variable resistance element inserted in the ground path of the CMOS logic circuit determines the on-resistance of the P-channel MOS transistor. The second variable resistance element is N channel M
It acts to determine the on-resistance of the OS transistor. Since the resistance values of these two variable resistance elements can be controlled from external terminals, the rise time and fall time of the CMOS logic circuit can be controlled independently, and as a result, the propagation delay characteristics of the circuit can be controlled.

[実施例] 次に、本発明の実施例について添付の図面を参照して説
明する。
[Example] Next, an example of the present invention will be described with reference to the accompanying drawings.

第1図は本発明を集積回路の内部インバータ・ゲートに
適用した実施例を示す図である。この回路は、Pチャン
ネルMOSトランジスタ1及びNチャンネルMOS)ラ
ンジスタ2のゲート同士及びドレイン同士を接続し、そ
の各節点を論理入力及び論理出力としてなるCMOSイ
ンバータ回路と、この回路の電源側及び接地側に夫々介
挿されたNチャンネル又はPチャンネルのMOS)ラン
ジスタ3及び4とにより構成される。MOS)ランジス
タ3,4は可変抵抗素子として使用されるもので、その
ゲートは夫々外部入力端子5.6に接続されている。
FIG. 1 is a diagram showing an embodiment in which the present invention is applied to an internal inverter gate of an integrated circuit. This circuit consists of a CMOS inverter circuit that connects the gates and drains of a P-channel MOS transistor 1 and an N-channel MOS transistor 2, and uses each node as a logic input and output, and a power supply side and a ground side of this circuit. N-channel or P-channel MOS) transistors 3 and 4 inserted into the MOS transistors 3 and 4, respectively. The MOS transistors 3 and 4 are used as variable resistance elements, and their gates are connected to external input terminals 5 and 6, respectively.

CMOSインバータ回路の入力には集積回路の内部信号
が与えられ、出力には他の内部ゲートが接続されている
。その等測的な負荷容量をコンデンサ7で表現する。
An internal signal of the integrated circuit is applied to the input of the CMOS inverter circuit, and another internal gate is connected to the output. The isometric load capacitance is expressed by capacitor 7.

ここで、PチャンネルMOSトランジスタ1のオン抵抗
値をRION、NチャンネルMOS)ランジスタ2のオ
ン抵抗値をR2o、、外部入力端子5に印加される電圧
V、に依存して定まるMOSトランジスタ3のソース・
ドレイン間の抵抗値をR3(V5)、外部入力端子6に
印加される電圧v6に依存して定まるMOS)ランジス
タ4のソース・ドレイン間の抵抗値をR4(V、6 )
 、コンデンサ7の容量をC1電源電圧をVDDとした
とき、MOSトランジスタ1及び2で構成されるCMO
Sインバータ・ゲートの論理出力電圧V。utは、出力
が立上がる場合には、PチャンネルMOS)−ランジス
タ1がオフからオンになった時刻をt=0として Vout−VDD・ [1− 十 出力が立下がる場合には、PチャンネルMOS)−ラン
ジスタ2がオフからオンになった時刻をt=0として ■・・t=voo・ ・・・ (2) で表現される。
Here, the on-resistance value of the P-channel MOS transistor 1 is RION, the on-resistance value of the N-channel MOS transistor 2 is R2o, and the source of the MOS transistor 3 is determined depending on the voltage V applied to the external input terminal 5.・
The resistance value between the drain is R3 (V5), and the resistance value between the source and drain of the MOS transistor 4, which is determined depending on the voltage v6 applied to the external input terminal 6, is R4 (V, 6).
, when the capacitance of capacitor 7 is C1 and the power supply voltage is VDD, CMO consisting of MOS transistors 1 and 2
Logic output voltage V of the S inverter gate. When the output rises, ut is the P-channel MOS) - Vout-VDD, with the time when transistor 1 turns on from off to t=0, [1-1] When the output falls, the P-channel MOS )--t=0 is the time when the transistor 2 is turned on from off, and it is expressed as ■...t=voo... (2).

これらの(1)式及び(2)式から明らかなように、外
部入力端子5及び6に印加する電圧v5及び■6により
論理出力電圧■。、の立上がり特性及び立下がり特性を
独立して制御することが可能である。従って、これらの
関係を用いて従来不可能であった0MO3論理ゲートの
伝搬遅延時間の調整及び出力波形の整形が半導体集積回
路の外部端子より可能となる。
As is clear from these equations (1) and (2), the logical output voltage ■ is determined by the voltages v5 and ■6 applied to the external input terminals 5 and 6. It is possible to independently control the rise and fall characteristics of . Therefore, by using these relationships, it becomes possible to adjust the propagation delay time of the 0MO3 logic gate and shape the output waveform from the external terminal of the semiconductor integrated circuit, which was previously impossible.

第2図は本発明を集積回路の外部入力インバータ・バッ
ファに適用した例であり、CMOSインバータ回路の論
理入力に外部論理入力端子8を介して入力信号が与えら
れる以外は、構成及び動作とも第1図の回路と同様であ
る。
FIG. 2 shows an example in which the present invention is applied to an external input inverter/buffer of an integrated circuit. This circuit is similar to the circuit shown in FIG.

第3図は本発明を外部出力インバータ・バッファに適用
した例であり、CMOSインバータ回路の論理出力が外
部論理出力端子9を介して、等偏負荷容量7に接続され
ている以外は構成・動作とも第1図の回路と同様である
FIG. 3 shows an example in which the present invention is applied to an external output inverter/buffer, and the configuration and operation are the same except that the logic output of the CMOS inverter circuit is connected to the equal load capacitor 7 via the external logic output terminal 9. Both circuits are similar to the circuit shown in FIG.

なお、上記実施例ではCMOSインバータ回路を例にと
ったが、本発明は0MO3論理ゲート、演算回路等のC
MO3回路全搬に適用可能であることはいうまでもない
In the above embodiment, a CMOS inverter circuit was taken as an example, but the present invention is applicable to CMOS inverter circuits such as 0MO3 logic gates and arithmetic circuits.
Needless to say, it is applicable to all MO3 circuits.

[発明の効果] 以上説明したように本発明はCMOS論理回路の電源接
続経路及び接地経路に夫々独立した外部端子から制御さ
れる可変抵抗素子を挿入することにより、従来不可能で
あったCMO3論理ゲートの伝搬遅延時間の調整及び出
力波形の整形が半導体集積回路の外部端子から可能とな
るという効果がある。
[Effects of the Invention] As explained above, the present invention enables CMO3 logic, which was previously impossible, by inserting variable resistance elements controlled from independent external terminals into the power supply connection path and the ground path of a CMOS logic circuit. This has the advantage that the gate propagation delay time can be adjusted and the output waveform can be shaped from an external terminal of the semiconductor integrated circuit.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の第1の実施例に係るCMOS半導体集
積回路の回路図、第2図は本発明の第2の実施例に係る
CMOS半導体集積回路の回路図、第3図は本発明の第
3の実施例に係るCMOS半導体集積回路の回路図であ
る。 1;PチャンネルMOSトランジスタ、2;Nチャンネ
ルMO3)ランジスタ、3,4;MOSトランジスタ、
5,6;外部入力端子、7;等価負荷容量、8;外部論
理入力端子、9;外部論理出力端子
FIG. 1 is a circuit diagram of a CMOS semiconductor integrated circuit according to a first embodiment of the present invention, FIG. 2 is a circuit diagram of a CMOS semiconductor integrated circuit according to a second embodiment of the present invention, and FIG. 3 is a circuit diagram of a CMOS semiconductor integrated circuit according to a second embodiment of the present invention. FIG. 3 is a circuit diagram of a CMOS semiconductor integrated circuit according to a third embodiment of the present invention. 1; P channel MOS transistor, 2; N channel MO3) transistor, 3, 4; MOS transistor,
5, 6; External input terminal, 7; Equivalent load capacity, 8; External logic input terminal, 9; External logic output terminal

Claims (1)

【特許請求の範囲】[Claims] (1)外部端子から抵抗値を制御可能な第1及び第2の
可変抵抗素子と、前記第1の可変抵抗素子を介して電源
に接続され、前記第2の可変抵抗素子を介して接地され
たCMOS論理回路とを具備したことを特徴とする半導
体集積回路。
(1) first and second variable resistance elements whose resistance values can be controlled from external terminals; connected to a power supply via the first variable resistance element and grounded via the second variable resistance element; A semiconductor integrated circuit characterized by comprising a CMOS logic circuit.
JP63191327A 1988-07-30 1988-07-30 Semiconductor integrated circuit Pending JPH0240948A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63191327A JPH0240948A (en) 1988-07-30 1988-07-30 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63191327A JPH0240948A (en) 1988-07-30 1988-07-30 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPH0240948A true JPH0240948A (en) 1990-02-09

Family

ID=16272710

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63191327A Pending JPH0240948A (en) 1988-07-30 1988-07-30 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH0240948A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05136664A (en) * 1991-08-14 1993-06-01 Advantest Corp Variable delay circuit
KR100465968B1 (en) * 1997-07-31 2005-04-20 삼성전자주식회사 CMOS inverter circuit with improved power supply voltage and temperature dependence

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05136664A (en) * 1991-08-14 1993-06-01 Advantest Corp Variable delay circuit
KR100465968B1 (en) * 1997-07-31 2005-04-20 삼성전자주식회사 CMOS inverter circuit with improved power supply voltage and temperature dependence

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