JPH0242658A - Substrate with protective film for production of optical memory element - Google Patents

Substrate with protective film for production of optical memory element

Info

Publication number
JPH0242658A
JPH0242658A JP63192386A JP19238688A JPH0242658A JP H0242658 A JPH0242658 A JP H0242658A JP 63192386 A JP63192386 A JP 63192386A JP 19238688 A JP19238688 A JP 19238688A JP H0242658 A JPH0242658 A JP H0242658A
Authority
JP
Japan
Prior art keywords
substrate
protective film
optical memory
memory element
recording layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63192386A
Other languages
Japanese (ja)
Other versions
JPH0782666B2 (en
Inventor
Junichiro Nakayama
純一郎 中山
Kenji Ota
賢司 太田
Hiroyuki Katayama
博之 片山
Akira Takahashi
明 高橋
Yoshiteru Murakami
善照 村上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP19238688A priority Critical patent/JPH0782666B2/en
Priority to US07/384,254 priority patent/US5002813A/en
Priority to KR1019890010765A priority patent/KR0129760B1/en
Publication of JPH0242658A publication Critical patent/JPH0242658A/en
Publication of JPH0782666B2 publication Critical patent/JPH0782666B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26Apparatus or processes specially adapted for the manufacture of record carriers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S428/00Stock material or miscellaneous articles
    • Y10S428/913Material designed to be responsive to temperature, light, moisture
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/146Laser beam
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T156/00Adhesive bonding and miscellaneous chemical manufacture
    • Y10T156/10Methods of surface bonding and/or assembly therefor
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/23Sheet including cover or casing
    • Y10T428/239Complete cover or casing
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/31504Composite [nonstructural laminate]
    • Y10T428/31507Of polycarbonate

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Manufacturing Optical Record Carriers (AREA)
  • Credit Cards Or The Like (AREA)
  • Optical Record Carriers And Manufacture Thereof (AREA)

Abstract

PURPOSE:To continuously produce an optical memory element by opening apertures only in the parts of protective films corresponding to recording layers to be formed on a substrate and functioning the same as the mask to form the recording layers in a process for forming the recording layers. CONSTITUTION:Front and rear surfaces 11, 12 of the substrate 10 are respectively covered by the protective films 21, 22 and the apertures 211 are opened to the protective film 21 covering the front surface 11. The positions of the apertures 211 are set in accordance with the positions where the recording layers 111 to be formed on the substrate 10 are formed. The end parts of the substrate 10 are covered by the protective film 21. On the other hand, the protective film 22 covering the rear surface 12 of the substrate 10 is covered on the rear surface 12 over the entire surface. The need for the mask is, therefore, eliminated at the time of producing the optical memory element. The continuous production of the optical memory element is enabled.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は光カード、光ディスクに代表される光メモリ素
子の製造に用いられる保護フィルム付基板に関する。
DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to a substrate with a protective film used for manufacturing optical memory elements such as optical cards and optical disks.

〈従来の技術〉 従来の光メモリ素子製造用保護フィルム付基板(以下、
単に「基板10jとする)を第3図〜第5図を参照しつ
つ説明する。
<Conventional technology> Conventional substrate with protective film for manufacturing optical memory elements (hereinafter referred to as
The substrate 10j will be simply explained with reference to FIGS. 3 to 5.

光メモリ素子は、再生専用のROM形がCD、CD−R
OM、VDとして商品化されている。また、情報の書込
、消去可能な光メモリ素子の開発も急速に進んでいる。
Optical memory elements are read-only ROM types such as CDs and CD-Rs.
It has been commercialized as OM and VD. Furthermore, the development of optical memory elements in which information can be written and erased is progressing rapidly.

光カード等の光メモリ素子は、基板10に記録領域とし
ての記録層111が形成されたものである。
An optical memory element such as an optical card has a recording layer 111 as a recording area formed on a substrate 10.

この記録層111に対してレーザ光等を照射して再生成
いは記録を行うのである。
This recording layer 111 is irradiated with a laser beam or the like to perform reproduction or recording.

記録層111が形成されて光メモリ素子となる基板10
は、その表裏面11.12が保護フィルム21.22に
よってカバーされている。保護フィルム21.22は、
記録層111の形成以前に基板10の表裏面11.12
に傷が付かないように保護するものである。
A substrate 10 on which a recording layer 111 is formed to become an optical memory element
The front and back surfaces 11 and 12 are covered with protective films 21 and 22. The protective film 21.22 is
Before forming the recording layer 111, the front and back surfaces 11 and 12 of the substrate 10 are
This is to protect it from being scratched.

この基板10は、保護フィルム21.22が剥がされて
光メモリ素子の製造装置に送り込まれる(第3図(a)
参照)。基板10は製造装置内で、基板10に形成され
るべき記録層111に対応した部分のみが開口したマス
ク30によって覆われて、記録層形成プロセス部50に
送られる。この記録層形成プロセス部50によって、基
板10の表面11には記録層111が形成される(第3
図(b)参照)。その後、当該基板10は、ガイドトラ
ックを形成するガイドトラック形成プロセス部51、カ
ッタによる切断プロセス部52(第3図(C)参照)、
透明な合成樹脂による保護層13を形成する保護層形成
プロセス部(図示省略)等の複数のプロセスを経て光メ
モリ素子となる。
The protective films 21 and 22 are peeled off from the substrate 10, and the substrate 10 is sent to an optical memory device manufacturing apparatus (see FIG. 3(a)).
reference). The substrate 10 is covered with a mask 30 in which only the portion corresponding to the recording layer 111 to be formed on the substrate 10 is opened in the manufacturing apparatus, and is sent to the recording layer forming process section 50. By this recording layer forming process section 50, a recording layer 111 is formed on the surface 11 of the substrate 10 (third
(See figure (b)). Thereafter, the substrate 10 is divided into a guide track forming process section 51 for forming guide tracks, a cutting process section 52 using a cutter (see FIG. 3(C)),
An optical memory element is obtained through a plurality of processes including a protective layer forming process section (not shown) that forms a protective layer 13 made of transparent synthetic resin.

また、マスク30によって基板10の表面11を覆わな
いで記録層111を形成すると、第5図に示すように記
録層111が基板10の全面にわたって形成されるので
、保護層13を記録層111の上に形成したとしても記
録層111が基板lOの端部において直接外気に露出す
るため、耐環境性において劣った光メモリ素子となる。
Furthermore, if the recording layer 111 is formed without covering the surface 11 of the substrate 10 with the mask 30, the recording layer 111 will be formed over the entire surface of the substrate 10 as shown in FIG. Even if the recording layer 111 is formed on the substrate 10, the recording layer 111 is directly exposed to the outside air at the end of the substrate 10, resulting in an optical memory element with poor environmental resistance.

〈発明が解決しようとする課題〉 上述した従来のマスクは板状に構成されているので、例
えばフレキシブル基板等の長尺シート状の基板から連続
的に光メモリ素子を製造することが不可能である。また
、マスクを用いないと上述したように耐環境性に劣った
光メモリ素子となる。
<Problems to be Solved by the Invention> Since the conventional mask described above is configured in a plate shape, it is impossible to continuously manufacture optical memory elements from a long sheet-shaped substrate such as a flexible substrate, for example. . Furthermore, if a mask is not used, the optical memory element will have poor environmental resistance as described above.

すなわち、従来の光メモリ素子製造用保護フィルム付基
板ではマスクは必要不可欠な要素であった。
That is, in the conventional substrate with a protective film for manufacturing an optical memory element, a mask was an essential element.

そのため、従来の光メモリ素子製造用保護フィルム付基
板を用いて製造される光メモリ素子は、生産効率が低く
、コストを下げることが難しかった。
Therefore, optical memory devices manufactured using conventional substrates with protective films for manufacturing optical memory devices have low production efficiency, and it has been difficult to reduce costs.

本発明は上記事情に鑑みて創案されたもので、シート状
の基板から連続的に光メモリ素子を製造することができ
る光メモリ素子製造用保護フィルム付基板を提供するこ
とを目的としている。
The present invention was devised in view of the above circumstances, and an object of the present invention is to provide a substrate with a protective film for manufacturing an optical memory element, which allows optical memory elements to be continuously manufactured from a sheet-like substrate.

く課題を解決するための手段〉 本発明に係る光メモリ素子製造用保護フィルム付基板は
、その表面が保護フィルムでカバーされている。そして
、前記保護フィルムは基板に形成しようとする記録層に
対応した部分のみに開口が開設されており、かつ記録層
形成プロセスでは記録層を形成するマスクとして機能す
る。
Means for Solving the Problems> The surface of the substrate with a protective film for manufacturing an optical memory element according to the present invention is covered with a protective film. The protective film has an opening formed only in a portion corresponding to the recording layer to be formed on the substrate, and functions as a mask for forming the recording layer in the recording layer forming process.

〈作用〉 保護フィルムが記録層形成プロセスにおいてマスクとし
て機能するので、基板には保護フィルムに開設された開
口に対応した部分のみに記録層が形成される。
<Operation> Since the protective film functions as a mask in the recording layer forming process, the recording layer is formed on the substrate only in the portions corresponding to the openings formed in the protective film.

〈実施例〉 以下、図面を参照して本発明に係る一実施例を説明する
<Example> Hereinafter, an example according to the present invention will be described with reference to the drawings.

第1図は本発明に係る光メモリ素子製造用保護フィルム
付基板の一実施例を示す斜視図、第2図は本発明に係る
光メモリ素子製造用保護フィルム付基板を用いて光メモ
リ素子を製造する製造装置の概略的構成図である。なお
、説明の都合上第1図では保護フィルムの厚さを誇張し
て示している。
FIG. 1 is a perspective view showing an embodiment of a substrate with a protective film for manufacturing an optical memory device according to the present invention, and FIG. 2 shows a process for manufacturing an optical memory device using the substrate with a protective film for manufacturing an optical memory device according to the present invention. FIG. 2 is a schematic configuration diagram of the device. For convenience of explanation, the thickness of the protective film is exaggerated in FIG. 1.

基板10は、柔軟性を有するとともに、透明な樹脂、例
えばポリカーボネイト樹脂等から構成されており、その
表裏面11.12は保護フィルム21.22でそれぞれ
カバーされている。基板100表面11をカバーする保
護フィルム21には、開口211が開設されている。こ
の間口211の位置は、基板10に形成される記録層1
11が形成されるべき位置に対応して設定されており、
基板10の端部は保護フィルム21によって必ずカバー
されるようになっている。
The substrate 10 is made of a flexible and transparent resin, such as polycarbonate resin, and its front and back surfaces 11 and 12 are covered with protective films 21 and 22, respectively. An opening 211 is formed in the protective film 21 that covers the surface 11 of the substrate 100. The position of this opening 211 is determined by the position of the recording layer 1 formed on the substrate 10.
11 is set corresponding to the position where it should be formed,
The ends of the substrate 10 are always covered with the protective film 21.

一方、基板10の裏面12をカバーする保護フィルム2
2は、裏面12を全面にわたってカバーしている。
On the other hand, a protective film 2 covering the back surface 12 of the substrate 10
2 covers the entire back surface 12.

なお、基板10の厚さは0.2〜1.0 mm程度に設
定するのが好ましいが、これには限定されない。
Note that the thickness of the substrate 10 is preferably set to about 0.2 to 1.0 mm, but is not limited to this.

保護フィルム21.22は耐熱温度が記録層111を基
板10に形成する時の温度以上であり、熱膨張率が基板
10と路間等であるものがよい。例えば、ビニール、ポ
リエチレン、ナイロン、ジュラコン、ポリプロピレン、
アセテート、ポリエステル或いはABS等の合成樹脂の
うちから、上述した条件に適合するものを適宜選択して
用いる。なお、この保護フィルム21.22の厚さは0
.01〜0.3 nun程度がよい。
It is preferable that the protective films 21 and 22 have a heat resistance temperature higher than the temperature at which the recording layer 111 is formed on the substrate 10 and a coefficient of thermal expansion that is between the substrate 10 and the gap. For example, vinyl, polyethylene, nylon, duracon, polypropylene,
Among synthetic resins such as acetate, polyester, and ABS, one that satisfies the above-mentioned conditions is appropriately selected and used. Note that the thickness of this protective film 21.22 is 0.
.. Approximately 01 to 0.3 nun is preferable.

このように表裏面11.12がそれぞれ保護フィルム2
1.22でカバーされた基板10は、第2図に示すよう
に基板供給軸41に巻回状態で収納される。そして、基
板10は、ローラ45.46.47等の送り出し手段に
よって、表面11に記録層111を形成する記録層形成
プロセス部42、基板10にガイ−トドラックを形成す
るガイドトラック形成プロセス部43、カツク441に
よって基板10を切断する切断プロセス部44、透明な
合成樹脂による保護層形成プロセス(図示省略)等の複
数のプロセスを経て光メモリ素子となる。
In this way, the front and back surfaces 11 and 12 are each protected by a protective film 2.
The substrate 10 covered by 1.22 is stored in a wound state around the substrate supply shaft 41 as shown in FIG. Then, the substrate 10 is processed by a recording layer forming process section 42 that forms the recording layer 111 on the surface 11 by feeding means such as rollers 45, 46, 47, a guide track forming process section 43 that forms guide tracks on the substrate 10, An optical memory element is obtained through a plurality of processes including a cutting process section 44 for cutting the substrate 10 with a cut 441 and a process for forming a protective layer using a transparent synthetic resin (not shown).

記録層形成プロセス部42では、保護フィルム21がマ
スクとして機能するので、例えばスパッタリング、蒸着
等の適宜な手段によって、基板10には開口211に対
応した部分のみに記録層111が形成される。すなわち
、開口211以外の部分は保護フィルム21によってカ
バーされているので、記録層111が形成されることは
ない。
In the recording layer forming process section 42, the protective film 21 functions as a mask, so the recording layer 111 is formed on the substrate 10 only in the portion corresponding to the opening 211 by appropriate means such as sputtering or vapor deposition. That is, since the portion other than the opening 211 is covered by the protective film 21, the recording layer 111 is not formed.

なお、上述した実施例では、保護フィルム21に開口2
11が予め開設されているものとしたが、開口211に
対応した切れ目を保護フィルム21に設けておき、製造
装置に基板10を挿入する直前に切れ目を切り取って開
口とすることも可能である。この場合には、基板10が
汚染されるおそれはより少なくなる。
In addition, in the embodiment described above, the opening 2 is provided in the protective film 21.
Although it is assumed that the opening 11 is opened in advance, it is also possible to provide a cut corresponding to the opening 211 in the protective film 21 and cut out the cut immediately before inserting the substrate 10 into the manufacturing apparatus to form the opening. In this case, there is less possibility that the substrate 10 will be contaminated.

また、上述した4つのプロセス、すなわち記録層形成プ
ロセス、ガイドトラック形成プロセス、切断プロセス及
び保護層形成プロセスは、この順序に限定されるもので
はなく、任意に入れ換えることができるものである。
Further, the above-mentioned four processes, that is, the recording layer forming process, the guide track forming process, the cutting process, and the protective layer forming process, are not limited to this order, and can be arbitrarily replaced.

この光メモリ素子製造用保護フィルム付基板を用いて製
造される光メモリ素子としては、光カード、光ディスク
等があるが、大量生産、低コストが要求される光カード
に特に適している。
Optical memory devices manufactured using this substrate with a protective film for optical memory device manufacturing include optical cards, optical disks, etc., and are particularly suitable for optical cards that require mass production and low cost.

〈発明の効果〉 本発明に係る光メモリ素子製造用保護フィルム付基板で
は、予めマスクとして機能する保護フィルムによって基
板の表面がカバーされているので、光メモリ素子の製造
時にマスクを必要としない。
<Effects of the Invention> In the substrate with a protective film for manufacturing an optical memory element according to the present invention, since the surface of the substrate is covered in advance with a protective film that functions as a mask, a mask is not required when manufacturing the optical memory element.

従って、この基板をフレキシブル基板とすれば、連続的
に光メモリ素子を製造することが可能となり、それに伴
って生産効率を高め、コストを低(することが可能にな
る。
Therefore, if this substrate is made into a flexible substrate, it becomes possible to continuously manufacture optical memory elements, thereby increasing production efficiency and reducing costs.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係る光メモリ素子製造用保護ライルム
付基板の一実施例を示す斜視図、第2図は本発明に係る
光メモリ素子製造用保護フィルム付基板を用いて光メモ
リ素子を製造する製造装置の概略的構成図、第3図は従
来の光メモリ素子製造用保護フィルム付基板を用いた場
合における光メモリ素子の製造工程の概略的説明図、第
4図は従来の光メモリ素子製造用保護フィルム付基板で
マスクを用いた場合の場合の光メモリ素子の断面図、第
5図はマスクを用いない場合の光メモリ素子の断面図で
ある。 10・・・基板、11・・・表面、111  ・・・記
録層、21・・・保護フィルム、211  ・・・開口
FIG. 1 is a perspective view showing an embodiment of a substrate with a protective film for manufacturing an optical memory device according to the present invention, and FIG. 2 shows a process for manufacturing an optical memory device using the substrate with a protective film for manufacturing an optical memory device according to the present invention. A schematic configuration diagram of the apparatus, FIG. 3 is a schematic explanatory diagram of the manufacturing process of an optical memory device using a conventional substrate with a protective film for manufacturing an optical memory device, and FIG. 4 is a schematic diagram of the manufacturing process of a conventional optical memory device with a protective film FIG. 5 is a cross-sectional view of the optical memory element when a mask is used on the substrate, and FIG. 5 is a cross-sectional view of the optical memory element when no mask is used. DESCRIPTION OF SYMBOLS 10... Substrate, 11... Surface, 111... Recording layer, 21... Protective film, 211... Opening.

Claims (1)

【特許請求の範囲】[Claims] (1)表面が保護フィルムでカバーされた光メモリ素子
製造用保護フィルム付基板において、前記保護フィルム
は基板に形成しようとする記録層に対応した部分のみに
開口が開設されており、かつ記録層形成プロセスでは記
録層を形成するマスクとして機能することを特徴とする
光メモリ素子製造用保護フィルム付基板。
(1) In a substrate with a protective film for manufacturing an optical memory element whose surface is covered with a protective film, the protective film has an opening only in a portion corresponding to the recording layer to be formed on the substrate, and A substrate with a protective film for manufacturing an optical memory element, which functions as a mask for forming a recording layer in a process.
JP19238688A 1988-08-01 1988-08-01 Substrate with protective film for optical memory device manufacturing Expired - Lifetime JPH0782666B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP19238688A JPH0782666B2 (en) 1988-08-01 1988-08-01 Substrate with protective film for optical memory device manufacturing
US07/384,254 US5002813A (en) 1988-08-01 1989-07-21 Substrate with protective film and method of manufacturing optical memory device using the same
KR1019890010765A KR0129760B1 (en) 1988-08-01 1989-07-28 Substrate with a protective film and optical memory device manufacturing method using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19238688A JPH0782666B2 (en) 1988-08-01 1988-08-01 Substrate with protective film for optical memory device manufacturing

Publications (2)

Publication Number Publication Date
JPH0242658A true JPH0242658A (en) 1990-02-13
JPH0782666B2 JPH0782666B2 (en) 1995-09-06

Family

ID=16290434

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19238688A Expired - Lifetime JPH0782666B2 (en) 1988-08-01 1988-08-01 Substrate with protective film for optical memory device manufacturing

Country Status (3)

Country Link
US (1) US5002813A (en)
JP (1) JPH0782666B2 (en)
KR (1) KR0129760B1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL9400539A (en) * 1994-04-06 1995-11-01 Dorned Bv ID card with optical memory.
AU5810196A (en) * 1995-07-21 1997-02-18 Bod Berlin Optical Disc Gmbh Method of producing an information-bearing disc which can be scanned by a laser beam, and disc produced thereby
CN1145156C (en) 1997-06-19 2004-04-07 伯顿化学股份有限公司 coated disc
US6363599B1 (en) 1999-08-04 2002-04-02 Komag, Inc. Method for manufacturing a magnetic disk including a glass substrate
US6808665B1 (en) * 2001-08-03 2004-10-26 Jeffrey D. Percival Thermoforming process for masked polymers

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH061561B2 (en) * 1985-08-21 1994-01-05 株式会社日立製作所 Light disk
JPS62188043A (en) * 1986-02-14 1987-08-17 Victor Co Of Japan Ltd Method for reforming substrate surface
JPS6334750A (en) * 1986-07-29 1988-02-15 Pioneer Electronic Corp Production of duplicated optical disk
JPH0350935A (en) * 1989-07-19 1991-03-05 Fujitsu Ltd Digital radio transmission equipment

Also Published As

Publication number Publication date
KR900003828A (en) 1990-03-27
US5002813A (en) 1991-03-26
JPH0782666B2 (en) 1995-09-06
KR0129760B1 (en) 1998-04-07

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