JPH0244784A - Superconductive pattern forming method - Google Patents
Superconductive pattern forming methodInfo
- Publication number
- JPH0244784A JPH0244784A JP63194488A JP19448888A JPH0244784A JP H0244784 A JPH0244784 A JP H0244784A JP 63194488 A JP63194488 A JP 63194488A JP 19448888 A JP19448888 A JP 19448888A JP H0244784 A JPH0244784 A JP H0244784A
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- JP
- Japan
- Prior art keywords
- substrate
- pattern
- thin film
- superconducting
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、超伝導パターンの形成方法に関する。このパ
ターンはジョセフソン素子など多くのデバイスに幅広く
使われるものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for forming superconducting patterns. This pattern is widely used in many devices such as Josephson elements.
従来、超伝導パターンは、基板全面に超伝導薄膜を作製
した後、エツチング等によって所望のパターンを形成す
るのが一般的であった。Conventionally, superconducting patterns have generally been created by forming a superconducting thin film over the entire surface of a substrate and then forming a desired pattern by etching or the like.
しかしながら、超伝導薄膜、特に近年発見されたセラミ
ックス系超伝導薄膜、窃1えばYBazCu30’y−
δ+ ErBa2(:u307−δ(0<δ< 1 )
、B15iCaCuO系材料では、その材料組成が複
雑なこともあり、エツチングにより例えばY、Ba、C
uなとのエツチング速度が異なるため超伝導体の組成が
エツチングにより変化しやすいという問題があった。However, superconducting thin films, especially ceramic-based superconducting thin films discovered in recent years, such as YBazCu30'y-
δ+ ErBa2(:u307-δ(0<δ<1)
, B15iCaCuO-based materials may have complex material compositions, and may be etched to remove, for example, Y, Ba, C.
There was a problem in that the composition of the superconductor was easily changed by etching because the etching speed was different from that of the superconductor.
このため、エツチングにより超伝導特性を示さなくなっ
たり、パターンの結晶性、再現性、均一性も良くないと
いう欠点もあった。For this reason, there were also disadvantages in that superconducting properties were no longer exhibited due to etching, and the crystallinity, reproducibility, and uniformity of the pattern were poor.
本発明は、上記の問題点を解決すべくなされたもので、
エツチング操作を必要とせず、成膜操作のみで超伝導パ
ターンを形成し得る超伝導パターンの形成方法を提供す
ることを目的とする。The present invention was made to solve the above problems, and
It is an object of the present invention to provide a method for forming a superconducting pattern that does not require an etching operation and can be formed only by a film forming operation.
本発明は、パターニング用膜を単結晶基板上にパターニ
ングした後、該基板上に超伝導薄膜を成膜することを特
徴とする超伝導パターンの形成方法である。The present invention is a method for forming a superconducting pattern, which comprises patterning a patterning film on a single crystal substrate and then forming a superconducting thin film on the substrate.
すなわち、単結晶基板上に単結晶以外の材料の膜でパタ
ーニングを行った後、該基板上に超伝導薄膜を成膜する
と、パターニングされていない、単結晶基板上に直接成
膜された膜のみが、超伝導性を示すことを利用したもの
である。In other words, if a superconducting thin film is deposited on a single crystal substrate after patterning a film of a material other than single crystal on the substrate, only the unpatterned film deposited directly on the single crystal substrate will be removed. This method takes advantage of the fact that it exhibits superconductivity.
基板は、超伝導薄膜の材料により、超伝導性を示しやす
い基板を選んで使用する。すなわち、サファイア、 5
rTi03. TiO2,BeO、MgO、[:aO。For the substrate, a substrate that easily exhibits superconductivity is selected and used depending on the material of the superconducting thin film. i.e. sapphire, 5
rTi03. TiO2, BeO, MgO, [:aO.
SrOまたはBaO等を用いることができる。パターニ
ングする膜は、超伝導薄膜が形成されにくい膜なら何で
もよく、通常の蒸着材料、レジスト等が用いられ、その
結晶性は単結晶以外であれば、アモルファス、多結晶等
を用いることができる。SrO, BaO, etc. can be used. The film to be patterned may be any film that is difficult to form a superconducting thin film, and ordinary vapor deposition materials, resists, etc. can be used, and as long as its crystallinity is other than single crystal, amorphous, polycrystalline, etc. can be used.
従って、単結晶材料と同一物質、同一組成であっても、
結晶性が悪ければパターニング材として用いることもで
きる。Therefore, even if it is the same substance and composition as the single crystal material,
If the crystallinity is poor, it can also be used as a patterning material.
超伝導薄膜の材料は、特に制限はないが、好ましい材料
としては、その化合物組成がA−B−C−Dで表わされ
る4元または4元以上の多元化合物であり、AはLa
、 Ce 、 Pr 、 Nd 、 Pm 。The material of the superconducting thin film is not particularly limited, but preferred materials include quaternary or more than quaternary multicomponent compounds whose compound composition is represented by A-B-C-D, where A is La
, Ce, Pr, Nd, Pm.
Sm 、 Sc 、 Eu 、 Gd 、 Tb 、
Dy 、 Ho 。Sm, Sc, Eu, Gd, Tb,
Dy, Ho.
Er 、Tm 、Yb 、Lu 、Bi 、Tlおよび
Yからなる群より選ばれる一種以上の元素、BはBa
、Ca 、SrおよびPbからなる群より選ばれる一種
以上の元素、CはV、Ti 、Cr 。One or more elements selected from the group consisting of Er, Tm, Yb, Lu, Bi, Tl and Y, B is Ba
, Ca, Sr, and Pb, and C is V, Ti, and Cr.
Mn、Fe、Ni、Co、Ag、CdおよびCuからな
る群より選ばわる一種以上の元素、DはSおよび0から
なる群より選ばれる一種以上の元素を表わす。D represents one or more elements selected from the group consisting of Mn, Fe, Ni, Co, Ag, Cd and Cu; D represents one or more elements selected from the group consisting of S and 0;
基板上への超伝導薄膜の成膜方法としては、通常のスパ
ッタ法、電子ビーム加熱法、抵抗加熱法、MBE、CV
D法、イオンビーム法などが適用できる。Methods for forming superconducting thin films on substrates include conventional sputtering, electron beam heating, resistance heating, MBE, and CV.
D method, ion beam method, etc. can be applied.
このようにして作製された超伝導薄膜は、必要に応じて
熱処理ざわるが、単結晶基板は、超伝導薄膜との熱膨張
係数の近いものを選ぶことで、さらにその耐久性を向上
させることもできる。また、熱処理を行う場合、パター
ニングとして用いる膜は熱分解しない膜を用いることが
望ましく、これによって単結晶上の超伝導薄膜へ与える
影習もない。有機レジスト等をパターニング材料として
選んだ場合は、熱処理前に有機溶剤等でレジストを溶解
してから加熱すればよい。The superconducting thin film produced in this way is subjected to heat treatment if necessary, but the durability of the single crystal substrate can be further improved by selecting a single crystal substrate with a coefficient of thermal expansion similar to that of the superconducting thin film. You can also do it. Furthermore, when heat treatment is performed, it is desirable to use a film that does not decompose thermally as the film used for patterning, so that there is no adverse effect on the superconducting thin film on the single crystal. When an organic resist or the like is selected as the patterning material, the resist may be dissolved with an organic solvent or the like before heat treatment and then heated.
以下、本発明を実施例によりさらに説明する。 The present invention will be further explained below with reference to Examples.
実施例1
第1図は、本発明方法の工程を示す断面図である。まず
、単結晶基板1(本例では、MgO(100)を用いた
)上に、パターニング材として無機材料の5r07を用
いネガ形パターン2を作製した。(第1図−八)
この基板上に、マグネトロンスパッタ法でY−Ba −
Cu−0焼結体ターゲットを用いて、A「雰囲気中で成
膜したところ、「第1図−B」に示すようにY−Ba−
Cu−0薄@3,4が形成された。膜厚は5000人で
あった。この時の成膜条件は、基板温度400℃、Ar
ガス圧0.5Pa、スパッタパワー200Wで成膜した
。蒸着速度は1人/secであフた。さらに、この基板
を酸素霊囲気中で900℃、3時間の熱処理を行い、超
伝導パターン3を作製した。Au電極をつけて液体He
を用いて抵抗を測定したところMg04LM晶上のY−
Ba −Cu −0薄膜3は80にで電気抵抗がゼロと
なり超伝導性を示したが、パターニングした5i02上
のY−Ba−Cu−0薄膜4は、4にでも抵抗ゼロには
ならず超伝導性を示さなかった。Example 1 FIG. 1 is a sectional view showing the steps of the method of the present invention. First, a negative pattern 2 was formed on a single crystal substrate 1 (MgO (100) was used in this example) using an inorganic material 5r07 as a patterning material. (Fig. 1-8) Y-Ba-
When a film was formed in an atmosphere of A using a Cu-0 sintered target, Y-Ba- was formed as shown in Figure 1-B.
Cu-0 thin@3,4 was formed. The film thickness was 5000 people. The film forming conditions at this time were a substrate temperature of 400°C, Ar
The film was formed at a gas pressure of 0.5 Pa and a sputtering power of 200 W. The deposition rate was 1 person/sec. Further, this substrate was subjected to heat treatment at 900° C. for 3 hours in an oxygen atmosphere to produce a superconducting pattern 3. Liquid He with Au electrode attached
When the resistance was measured using
The Ba-Cu-0 thin film 3 exhibited superconductivity with zero electrical resistance at 80 nm, but the Y-Ba-Cu-0 thin film 4 on the patterned 5i02 did not reach zero resistance even at 400 nm and showed superconductivity. It showed no conductivity.
実施例2
サファイア(100)基板上にノボラック樹脂系レジス
ト(八Z−1350、シブレーファーイースト社製)で
パターニングを行い、さらにEr −Ba −Cu −
0をクラスターイオンビーム法で成膜した。この時の成
膜条件は、基板温度200℃で、Er2O3、BaCO
3、CuOをそれぞれ独立したイオンガンより蒸発させ
た。Er2O3の加速電圧は0.5KV、BaCO3と
CuOの加速電圧は3KVで、イオン電流は、すべて
100mAであフた。02を毎分9〜5x+1導入しな
がら、基板上での蒸着速度が1〜8人/secであり、
かツEr:Ba:Cuの組成比が1:2:3となるよう
に各イオンガンを制御した。その後、アセトンで上記レ
ジストを溶解除去し、実施例1と同様に熱処理を行った
ところ、実施例1と同様にサファイア基板上のみ良好な
超伝導薄膜を得た。臨界温度は、85にであった。Example 2 Patterning was performed on a sapphire (100) substrate using a novolac resin resist (YazZ-1350, manufactured by Sibley Far East Co., Ltd.), and further Er-Ba-Cu-
0 was formed into a film by the cluster ion beam method. The film forming conditions at this time were a substrate temperature of 200°C, Er2O3, BaCO
3. CuO was evaporated using separate ion guns. The acceleration voltage of Er2O3 is 0.5KV, the acceleration voltage of BaCO3 and CuO is 3KV, and the ion currents are all
It was cleared with 100mA. The deposition rate on the substrate is 1 to 8 people/sec while introducing 02 to 9 to 5x+1 per minute,
Each ion gun was controlled so that the composition ratio of Er:Ba:Cu was 1:2:3. Thereafter, the resist was dissolved and removed with acetone, and heat treatment was performed in the same manner as in Example 1. As in Example 1, a good superconducting thin film was obtained only on the sapphire substrate. The critical temperature was 85°C.
実施例3
Mg0基板上にAIl、203でパターニングを行い、
Bi −5r −Ca −Cu −0をマグネトロンス
パッタ法で成1反した。ターゲットはBi25r2(:
a、fl:u2012−w (X >0 )焼結体を用
いこの時の成膜条件は、基板温度200℃、Arガス圧
0.5Pa、スパッタパワー200Wで成膜した。蒸着
速度は1人/secであフた。さらに、この基板を酸素
雰囲気中で850℃、1時間の熱処理を行い、実施例1
と同様にMgO基板上のみ良好な超伝導薄膜を得た。臨
界温度は85にであった。Example 3 Patterning was performed on the Mg0 substrate with Al, 203,
A film of Bi-5r-Ca-Cu-0 was grown by magnetron sputtering. The target is Bi25r2 (:
a, fl: u2012-w (X > 0) A sintered body was used, and the film forming conditions at this time were a substrate temperature of 200° C., an Ar gas pressure of 0.5 Pa, and a sputtering power of 200 W. The deposition rate was 1 person/sec. Further, this substrate was heat-treated at 850°C for 1 hour in an oxygen atmosphere, and Example 1
Similarly, a good superconducting thin film was obtained only on the MgO substrate. The critical temperature was 85°C.
以上説明したように、本発明による超伝導パターンの形
成方法によれば、超伝導薄膜形成後、A611なエツチ
ング等の処理を行わないため、パターンの結晶性、再現
性、均一性の良い優れた超伝導パターンを形成すること
かできる。As explained above, according to the method for forming a superconducting pattern according to the present invention, since no processing such as A611 etching is performed after forming a superconducting thin film, an excellent pattern with good crystallinity, reproducibility, and uniformity can be obtained. It is possible to form superconducting patterns.
第1図は本発明の超伝導パターン形成方法の一例を示す
模式的断面図である。
1:単結晶基板
2:パターニング膜、
3:超伝導薄膜、
4二非超伝導薄膜。
特許出願人 キャノン株式会社FIG. 1 is a schematic cross-sectional view showing an example of the superconducting pattern forming method of the present invention. 1: Single crystal substrate 2: Patterned film, 3: Superconducting thin film, 42: Non-superconducting thin film. Patent applicant Canon Co., Ltd.
Claims (1)
基板上に超伝導薄膜を成膜することを特徴とする超伝導
パターンの形成方法。 2、有機レジストを単結晶基板上にパターニングした後
、該基板上に超伝導薄膜を成膜し、次いで該有機レジス
トを溶解除去することを特徴とする超伝導パターンの形
成方法。 3、前記超伝導薄膜の化合物組成をA−B−C−Dと表
わすとき、AがLa、Ce、Pr、Nd、Pm、Sm、
Sc、Eu、Gd、Tb、Dy、Ho、Er、Tm、Y
b、Lu、Bi、TlおよびYよりなる群から選ばれた
一種以上の元素;BがBa、Ca、SrおよびPbより
なる群から選ばれた一種以上の元素:CがV、Ti、C
r、Mn、Fe、Ni、Co、Ag、CdおよびCuよ
りなる群から選ばれた一種以上の元素;DがSおよびO
よりなる群から選ばれた一種以上の元素である請求項1
または2記載の超伝導パターンの形成方法。 4、前記単結晶基板が、サファイア、SiTiO_3、
TiO_2、BeO、MgO、CaO、SrOまたはB
aOである請求項1または2記載の超伝導パターンの形
成方法。[Claims] 1. A method for forming a superconducting pattern, which comprises patterning an inorganic material on a single crystal substrate and then forming a superconducting thin film on the substrate. 2. A method for forming a superconducting pattern, which comprises patterning an organic resist on a single crystal substrate, forming a superconducting thin film on the substrate, and then dissolving and removing the organic resist. 3. When the compound composition of the superconducting thin film is expressed as A-B-C-D, A is La, Ce, Pr, Nd, Pm, Sm,
Sc, Eu, Gd, Tb, Dy, Ho, Er, Tm, Y
b, one or more elements selected from the group consisting of Lu, Bi, Tl and Y; B is one or more elements selected from the group consisting of Ba, Ca, Sr and Pb; C is V, Ti, C
one or more elements selected from the group consisting of r, Mn, Fe, Ni, Co, Ag, Cd and Cu; D is S and O
Claim 1 is one or more elements selected from the group consisting of
Or the method for forming a superconducting pattern according to 2. 4. The single crystal substrate is sapphire, SiTiO_3,
TiO_2, BeO, MgO, CaO, SrO or B
The method for forming a superconducting pattern according to claim 1 or 2, wherein the superconducting pattern is aO.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63194488A JPH0244784A (en) | 1988-08-05 | 1988-08-05 | Superconductive pattern forming method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63194488A JPH0244784A (en) | 1988-08-05 | 1988-08-05 | Superconductive pattern forming method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0244784A true JPH0244784A (en) | 1990-02-14 |
Family
ID=16325364
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63194488A Pending JPH0244784A (en) | 1988-08-05 | 1988-08-05 | Superconductive pattern forming method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0244784A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0697522A (en) * | 1990-11-30 | 1994-04-08 | Internatl Business Mach Corp <Ibm> | Manufacture of thin film of super- conducting material |
| CN112117375A (en) * | 2020-09-24 | 2020-12-22 | 中国科学院微电子研究所 | Superconducting nanowire structure and preparation method thereof |
| CN112117376A (en) * | 2020-09-24 | 2020-12-22 | 中国科学院微电子研究所 | A kind of superconducting nanowire structure and preparation method thereof |
| JP2023076209A (en) * | 2021-11-22 | 2023-06-01 | 国立研究開発法人物質・材料研究機構 | Multifilamentary thin-film superconducting wire and its manufacturing method |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS592349A (en) * | 1982-06-28 | 1984-01-07 | Nippon Telegr & Teleph Corp <Ntt> | Formation of oxide superconductor circuit |
| JPS6441282A (en) * | 1987-07-21 | 1989-02-13 | Philips Nv | Method of depositing superconducting oxide material thin layer |
-
1988
- 1988-08-05 JP JP63194488A patent/JPH0244784A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS592349A (en) * | 1982-06-28 | 1984-01-07 | Nippon Telegr & Teleph Corp <Ntt> | Formation of oxide superconductor circuit |
| JPS6441282A (en) * | 1987-07-21 | 1989-02-13 | Philips Nv | Method of depositing superconducting oxide material thin layer |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0697522A (en) * | 1990-11-30 | 1994-04-08 | Internatl Business Mach Corp <Ibm> | Manufacture of thin film of super- conducting material |
| CN112117375A (en) * | 2020-09-24 | 2020-12-22 | 中国科学院微电子研究所 | Superconducting nanowire structure and preparation method thereof |
| CN112117376A (en) * | 2020-09-24 | 2020-12-22 | 中国科学院微电子研究所 | A kind of superconducting nanowire structure and preparation method thereof |
| JP2023076209A (en) * | 2021-11-22 | 2023-06-01 | 国立研究開発法人物質・材料研究機構 | Multifilamentary thin-film superconducting wire and its manufacturing method |
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