JPH0246673A - Contact element for semiconductor integrated circuit measurement device - Google Patents

Abstract

PURPOSE:To reduce the component of reactance and resistance for reducing the number of maintenance process by providing contact shoes electrically connected to a sort substrate performing connection to an electric circuit of a test evaluation device and a spring contact shoe suppressing an IC lead to the fixed contact shoes. CONSTITUTION:Fixed contact shoes 8 and 9 electrically connected to a sort substrate 4 for making connection with an electric circuit of a test evaluation device and a spring contact shoe 3 for pushing a lead 1a of an IC 1 to the fixed contact shoes 8 and 9 are provided. The fixed contact shoe 9 for pressing a lead 1a of the IC 1 has no spring property so that its size can be shortened, while the impact at the time of pressing the lead 1a of the IC 1 and the fixed contact shoe 9 is absorbed by a pusher 3 as the spring contact shoe so that no damage is given to the lead 1a of the IC 1. Thereby, a distance from the contact part with the lead 1a of the IC to a measurement circuit can be shortened, the components of resistance and reactance can be reduced while saving the number of maintenance processes.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a measurement device that connects an IC and a measurement circuit when testing the electrical characteristics of a semiconductor integrated circuit (hereinafter referred to as an IC). .

[Conventional technology]

Conventionally, when measuring the electrical characteristics of an IC, a characteristic testing device (hereinafter referred to as an IC tester) having a measurement circuit and an automatic sorting device (hereinafter referred to as a handler) that automatically supplies and stores ICs are used.
As shown in Fig. 4, the flat package C1 to be measured is sent from the handler supply section to the measurement section, which is the connection part with the IC tester, and positioned, and then the spring-strength package C1 is stretched from the IC tester. A contactor (hereinafter referred to as a contactor) 2 was used to establish electrical continuity with the lead 1a of the ICI, thereby making it possible to measure electrical characteristics. 4 is a board having a measurement circuit; 5 is a cable connecting the spring contact 2 and the board 4; 6 is a contactor block;
is a button for crimping the ICI lead 1a to the contactor 2.

[Problem to be solved by the invention]

Recent ICs have increased in speed and density, resulting in a large number of pins, and as a result, the appearance of packages such as flat types has made electrical property testing extremely demanding. In other words, contactors located between the IC and the IC tester also have resistance and reactance components that contribute to the lack of accuracy in electrical characteristic tests. Part to I
The structure of the C tester shortens the distance between the measurement circuits, and furthermore, as the number of pins increases as described above, the structure of the contactor section has become extremely complicated. In addition, the contactor requires external pressure to bring it into contact with the IC leads, and in order to apply this pressure evenly to all the leads, the contactor itself is provided with spring properties. Therefore, inexpensive commercially available IC sockets are often used for this contactor, but they have the disadvantage that the contactor itself is easily damaged by external shock, and when repairing it, it is necessary to connect the measurement circuit and the contactor with the wiring. Considerable maintenance man-hours and techniques are required, such as the need to remove the parts.

An object of the present invention is to provide a contact element for a semiconductor integrated circuit measuring device that solves the above problems.

[Differences between the invention and the prior art]

The present invention differs from the above-mentioned conventional contactor having spring properties in that the contactor part is fixed and the life time of the contactor can be extended.

[Means to solve the problem]

In order to achieve the above object, the present invention provides a contact element of an automatic sorting device for measuring the electrical characteristics of semiconductor integrated circuits.
It has a fixed contact electrically connected to the product type board for connection to the electric circuit of the test and evaluation device, and a spring contact that presses the IC lead against the fixed contact.

〔Example〕

Embodiments of the present invention will be described below with reference to the drawings.

(Example 1) FIG. 1 is a sectional view showing Example 1 of the present invention, and FIG. 2 is a front view showing a fixed contact.

In the figure, an insulating contactor stand 7 is installed on a board 4 having a measurement circuit, and a plurality of conductors 8, 8... are laid on the contactor stand 7 at a pitch corresponding to the leads 1a of the flat package ICI. , a protrusion 9 is provided on the conductor 8 to reduce the contact resistance between the lead 1a of the ICI and the conductor 8. Further, each conductor 8 is electrically connected to the substrate 4 via the cable 5. Here, the contactor stand 7, the conductor 8, the protrusion 9, etc. constitute a fixed contact.

On the other hand, a button (spring contact) 3 for crimping the ICI lead 1a to the conductor 8 is located above the contactor stand 7.
is provided to be movable up and down, and the button 3 is biased downward by a spring 3a.

According to the present invention, since the fixed contact for crimping the IC lead does not have spring properties, its dimensions can be reduced, and the impact when the IC lead and the fixed contact are crimped is absorbed by the spring contact. IC
will not damage the leads.

(Example 2) FIG. 3 is a sectional view showing a second embodiment of the present invention.

In this embodiment, a contactor stand 7 is provided with a through hole 10 for linearly connecting a conductor 8 to a wiring pattern formed on a substrate 4. This embodiment has the advantage that the distance from the contact portion with the IC lead to the measurement circuit can be shortened, so that the resistance and reactance components described above can be reduced.

It is preferable that the bushings for pressing the IC leads against the contactors be movable bushings that move independently for each pin in order to reduce variations in the pressure of each pin.

〔Effect of the invention〕

As explained above, by making the contactor part a fixed structure, the present invention can shorten the contactor length, reduce reactance and resistance components, improve the durability of the contactor itself, and reduce maintenance man-hours. It has the effect of achieving reduction.

[Brief explanation of the drawing]

Fig. 1 is a sectional view showing Embodiment 1 of the present invention, Fig. 2 is a front view showing a fixed contact, Fig. 3 is a sectional view showing Embodiment 2 of the invention, and Fig. 4 is a conventional example. FIG. 1... IC3... Button 4... Board with measurement circuit 5... Cable 6... Contactor block 7... Contactor stand 8... Conductor 9... Protrusion 10... Through Hall ε Figure Figure Figure

Claims (1)

[Claims] (1) In a contact element of an automatic sorting device that measures the electrical characteristics of semiconductor integrated circuits, a fixed contact electrically connected to the product type board that connects to the electric circuit of the test evaluation device and the leads of the IC are connected to the 1. A contact element for a semiconductor integrated circuit measuring device, comprising a spring contact that is pressed against a fixed contact.