JPH0247055B2 - - Google Patents
Info
- Publication number
- JPH0247055B2 JPH0247055B2 JP56006785A JP678581A JPH0247055B2 JP H0247055 B2 JPH0247055 B2 JP H0247055B2 JP 56006785 A JP56006785 A JP 56006785A JP 678581 A JP678581 A JP 678581A JP H0247055 B2 JPH0247055 B2 JP H0247055B2
- Authority
- JP
- Japan
- Prior art keywords
- cathode
- oxide
- cathode substrate
- substrate
- ion implantation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/13—Solid thermionic cathodes
- H01J1/14—Solid thermionic cathodes characterised by the material
Landscapes
- Solid Thermionic Cathode (AREA)
Description
【発明の詳細な説明】
本発明は酸化物陰極に関し、特に電流密度が大
で、長寿命である電子放射特性の秀れた酸化物陰
極に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an oxide cathode, and more particularly to an oxide cathode with high current density, long life, and excellent electron emission characteristics.
酸化物陰極は通常、例えばニツケル(以下Ni
と記す)などの陰極基体に電子放射性物質とする
例えば炭酸バリウム(BaCO3)、炭酸カルシウム
(CaCO3)、炭酸ストロンチウム(SrCO3)などを
適当な割合に混合した混合物を陰極基板に吹付け
などにより被着させ、電子管に組込んで真空にし
た後、前記BaCO3やCaCO3の炭酸塩を熱分解し
て酸化バリウム(BaO)や酸化カルシウム
(CaO)の酸化物にした後電子放射を行なわせて
いる。 The oxide cathode is usually made of, for example, nickel (Ni
For example, a mixture of barium carbonate (BaCO 3 ), calcium carbonate (CaCO 3 ), strontium carbonate (SrCO 3 ), etc., mixed in an appropriate ratio, is sprayed onto the cathode substrate, such as a cathode substrate (noted as ). After the carbonate of BaCO 3 and CaCO 3 is thermally decomposed into oxides of barium oxide (BaO) and calcium oxide (CaO), electron emission is performed. It's set.
従来の酸化物陰極の使用法においてはこのよう
な方法により製造した酸化物陰極で充分満足され
ていたが、近年酸化物陰極においても電流密度が
大で更に長寿命を要求される苛酷な使用が多くな
り、従来の酸化物陰極では必ずしも満足されなく
なつてきている。このような酸化物陰極で電流密
度が大であり長寿命のものを得る手段として、
Niを主体とする陰極基板にBaを添加して合金化
したものを使用する方法が研究され、例えば、電
子通信学会技術研究報告電子デバイスED78―33
に発表されている。即ちNiを主体とする陰極基
板にBaなどの還元材を混入しておくことにより、
電子放射性物質の陰極基板側に生ずる中間層に
Baを浸み出させて中間層の抵抗を減少して電子
放射特性を向上し、寿命を長くできるという理論
に基づくものである。このNi―Mg系基体合金
と、Baを合金化したNi―Ba―Mg基体合金の電
流特性を縦軸に対数目盛でJs/T5/4(Js:飽和電
流密度A/cm2、T:絶対温度)横軸に1/Tで表
わすと第2図のようになることが、上記文献に示
されており、Baを合金化することにより電流特
性は1.4倍位に向上する。ところが金属BaをNi中
に固溶させることは非常に難かしく精々0.3%の
BaをNiマトリツクス中に封入できるだけであ
る。この程度の含有量でも著しい特性面の向上が
立証されてはいるが、大きな欠点としてこのよう
な材料は非常に硬く加工が困難で、加工割れが生
じたり圧延加工ができず、真空中でのなまし工程
を並行して行なわなければならないという作業性
の悪さと共に、小さな陰極で形状の複雑なものは
成形できないという欠点を有している。更にこの
ような材料を使用した陰極は酸化物を被着する電
子放射面の裏側であるヒータ側においても固溶し
たBaが析出し、ヒータ側への電子放射が行なわ
れ、陰極・ヒータ間の絶縁低下を来たし雑音等特
性面への悪影響が出るため、これを防ぐために
は、陰極基板の裏面には電子放射を行なわないよ
う隔絶板を付加する等の工夫をしなければならな
い欠点がある。 In the conventional usage of oxide cathodes, the oxide cathodes manufactured by this method were fully satisfactory, but in recent years, oxide cathodes have also been subjected to severe use that requires high current density and longer lifespan. Increasingly, conventional oxide cathodes are no longer necessarily satisfactory. As a means of obtaining such an oxide cathode with high current density and long life,
Research has been conducted on the use of a Ni-based cathode substrate alloyed with Ba added, for example, in the Institute of Electronics and Communication Engineers Technical Research Report Electronic Devices ED78-33.
It has been announced. In other words, by mixing a reducing agent such as Ba into the cathode substrate, which is mainly made of Ni,
In the intermediate layer that forms on the cathode substrate side of the electron radioactive material
This is based on the theory that leaching Ba reduces the resistance of the intermediate layer, improving electron emission characteristics and extending life. The current characteristics of this Ni-Mg base alloy and the Ni-Ba-Mg base alloy alloyed with Ba are plotted on a logarithmic scale with the vertical axis as Js/T 5/4 (Js: saturation current density A/cm 2 , T: The above-mentioned document shows that when expressed as 1/T on the horizontal axis (absolute temperature), it becomes as shown in FIG. 2, and by alloying Ba, the current characteristics are improved by about 1.4 times. However, it is very difficult to form a solid solution of metallic Ba in Ni, and at most 0.3%
It is only possible to encapsulate Ba in the Ni matrix. Although it has been demonstrated that even at this level of content, significant improvements in properties are achieved, the major drawback is that such materials are extremely hard and difficult to process, resulting in process cracks, being unable to be rolled, and being difficult to process in a vacuum. In addition to poor workability in that the annealing process must be carried out in parallel, it also has the disadvantage that complex shapes cannot be molded using small cathodes. Furthermore, in cathodes made of such materials, solid solution Ba is precipitated on the heater side, which is the back side of the electron emitting surface covered with oxide, and electrons are emitted toward the heater side, causing a gap between the cathode and the heater. The insulation deteriorates and adversely affects characteristics such as noise, so in order to prevent this, it is necessary to take measures such as adding an isolation plate to the back surface of the cathode substrate to prevent electron emission.
本発明はこのような欠点に鑑みなされたもの
で、小型で複雑な形状の陰極でも容易に形成で
き、しかもBaを陰極基板の内部に含んで電子放
射特性や寿命を向上させ、しかも他の特性の劣化
を生じさせない酸化物陰極を提供するもので、具
体的にはイオン注入法により、陰極基板の電子放
射面側の0.1〜2μの厚さでBaを埋込むもので以下
図面により詳細に説明する。 The present invention was developed in view of these drawbacks, and it is possible to easily form a small cathode with a complicated shape. Moreover, Ba is contained inside the cathode substrate to improve electron emission characteristics and lifetime, and to improve other characteristics. The purpose is to provide an oxide cathode that does not cause deterioration. Specifically, Ba is embedded in a thickness of 0.1 to 2 μm on the electron emitting surface side of the cathode substrate using an ion implantation method. This will be explained in detail in the drawings below. do.
第1図は本発明の一実施例である酸化物陰極を
製造する工程を示す工程図である。。まず第1図
aに示すごとく、陰極基板1と陰極スリーブ2を
溶接した後第1図bに示すように陰極基板1に凹
面を形成する。この凹面の形成は、電子ビームが
ある点に収束し易くするためのもので、必要とす
るビームの形状によつては必ずしも凹面を必要と
しないし、逆に種々異なつた凹面を必要とする場
合もある。次に第1図cに示すようにイオン注入
装置により陰極基板1の電子放射面にBaイオン
を注入する。このイオン注入装置は通常の半導体
への不純物注入に用いられる周知のもので、イオ
ン源としては金属バリウムを使用しなくても有機
バリウム等で良い。この場合Baイオンの注入は
1011〜1014イオン/cm2であればよく、またNi板へ
の注入深さはイオンに与えられるエネルギーから
せいぜい0.1μmから2μmの深さにとどまり注入さ
れたBaイオンはエネルギーを失なつてBa原子と
なる。陰極基板1の厚さは通常0.1〜0.3mm位の厚
さがあるためBaの注入は陰極基板1の極く表面
部分だけということになるがこの埋込んだBaの
目的は中間抵抗層の低下にあるため、陰極基板表
面にのみ寄与すれば良く、逆に陰極基板1の裏面
からの電子放射の心配は全然なく、むしろ好まし
い。次にこのBaを埋込んだ陰極基板1の表面を
できるだけ湿気にさらさないよう乾燥空気中や不
活性雰囲気中で、第1図dに示すように、陰極基
板1の電子放射面にオキサイド3を例えば吹付に
より付着する。次に第1図eに示すようにヒータ
4を陰極スリーブ2内に挿入すれば通常の酸化物
陰極を形成することができる。 FIG. 1 is a process diagram showing a process for manufacturing an oxide cathode according to an embodiment of the present invention. . First, as shown in FIG. 1a, after welding the cathode substrate 1 and the cathode sleeve 2, a concave surface is formed on the cathode substrate 1 as shown in FIG. 1b. The purpose of forming this concave surface is to make it easier for the electron beam to converge on a certain point. Depending on the desired shape of the beam, a concave surface may not necessarily be necessary; on the other hand, there may be cases where various concave surfaces are required. There is also. Next, as shown in FIG. 1c, Ba ions are implanted into the electron emitting surface of the cathode substrate 1 using an ion implantation device. This ion implantation device is a well-known device used for implanting impurities into ordinary semiconductors, and as an ion source, organic barium or the like may be used instead of metallic barium. In this case, Ba ion implantation is
10 11 to 10 14 ions/cm 2 is sufficient, and the depth of implantation into the Ni plate is at most 0.1 μm to 2 μm from the energy given to the ions, and the implanted Ba ions lose energy. Becomes a Ba atom. Since the thickness of the cathode substrate 1 is usually about 0.1 to 0.3 mm, Ba is implanted only in the very surface area of the cathode substrate 1, but the purpose of this buried Ba is to lower the intermediate resistance layer. Therefore, it is necessary to contribute only to the surface of the cathode substrate 1, and there is no fear of electron emission from the back surface of the cathode substrate 1, which is rather preferable. Next, oxide 3 is applied to the electron emitting surface of the cathode substrate 1 as shown in FIG. For example, it is attached by spraying. Next, as shown in FIG. 1e, by inserting the heater 4 into the cathode sleeve 2, a normal oxide cathode can be formed.
上記実施例では陰極形状を形成した後の陰極の
電子放射面にBaを埋込む例を示したが、このよ
うにすればBaを埋込んだ陰極表面が汚染しない
うちにオキサイドを付着することができる利点は
あるがオキサイド吹付前に化学処理または熱処理
をしてクリーニングすることを考慮すれば陰極基
板を形成する前の大きな素板の状態でイオン注入
をしても表面だけのBa埋込であるため後の陰極
形状形成においても加工困難の不都合はなく、イ
オン注入のとき板状でできるため容易であるとい
う利点がある。またこのようなイオン注入は量産
が可能であり、経済的にも充分安価にできる。 In the above example, Ba is embedded in the electron emitting surface of the cathode after the cathode shape is formed, but in this way, oxide can be attached to the surface of the cathode embedded with Ba before it becomes contaminated. Although it has the advantage of being able to do so, if you consider cleaning it by chemical treatment or heat treatment before oxide spraying, even if you do ion implantation in the large blank state before forming the cathode substrate, Ba will only be implanted on the surface. Therefore, there is no disadvantage that processing is difficult in forming the cathode shape later, and there is an advantage that it is easy to form a plate shape during ion implantation. Further, such ion implantation can be mass-produced and can be done economically at a sufficiently low cost.
以上説明したように本発明によれば陰極基板表
面のみにBaを埋込んだため、陰極形成の加工に
は影響がなくまた陰極基板裏面のヒータ側への電
子放射はなく、陰極・ータ間の絶縁抵抗等特性へ
の悪影響もなく、電子放射特性の改善および寿命
向上を大幅に達成できる酸化物陰極を得ることが
でき、高電流密度動作など苛酷な用途にも酸化物
陰極を使用できる効果がある。 As explained above, according to the present invention, since Ba is embedded only in the surface of the cathode substrate, there is no effect on the process of forming the cathode, and there is no electron emission toward the heater side on the back surface of the cathode substrate, and there is no effect between the cathode and the electrode. It is possible to obtain an oxide cathode that significantly improves electron emission characteristics and lifespan without adversely affecting properties such as insulation resistance, and allows the oxide cathode to be used in harsh applications such as high current density operation. There is.
第1図は本発明の一実施例である陰極製造工程
を示す断面図、第2図は電子通信学会技術研究報
告ED78―33によるNi―Mg系基体合金とBaを合
金化したNi―Ba―Mg基体合金との電流特性を
比較する図である。
1……陰極基板、2……陰極スリーブ、3……
オキサイド。
Fig. 1 is a cross-sectional view showing the cathode manufacturing process according to an embodiment of the present invention, and Fig. 2 is a Ni-Ba alloy formed by alloying a Ni-Mg base alloy with Ba according to the Technical Research Report ED78-33 of the Institute of Electronics and Communication Engineers. FIG. 3 is a diagram comparing current characteristics with that of an Mg-based alloy. 1... Cathode substrate, 2... Cathode sleeve, 3...
oxide.
Claims (1)
を被着して電子放射させる酸化物陰極において、 前記陰極基板の該一面にイオン注入法により
0.1〜2μmの深さでバリウムを埋込んだことを特
徴とする酸化物陰極。[Scope of Claims] 1. In an oxide cathode that emits electrons by depositing an oxide on one surface of the cathode substrate, which is the electron emitting surface, the one surface of the cathode substrate is coated with an oxide by an ion implantation method.
An oxide cathode characterized by having barium embedded at a depth of 0.1 to 2 μm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP678581A JPS57121124A (en) | 1981-01-20 | 1981-01-20 | Oxide cathode |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP678581A JPS57121124A (en) | 1981-01-20 | 1981-01-20 | Oxide cathode |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57121124A JPS57121124A (en) | 1982-07-28 |
| JPH0247055B2 true JPH0247055B2 (en) | 1990-10-18 |
Family
ID=11647820
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP678581A Granted JPS57121124A (en) | 1981-01-20 | 1981-01-20 | Oxide cathode |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57121124A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0320070A (en) * | 1989-06-16 | 1991-01-29 | Matsushita Electron Corp | Semiconductor device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS605877A (en) * | 1983-06-22 | 1985-01-12 | New Japan Radio Co Ltd | Oxide cathode |
-
1981
- 1981-01-20 JP JP678581A patent/JPS57121124A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0320070A (en) * | 1989-06-16 | 1991-01-29 | Matsushita Electron Corp | Semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57121124A (en) | 1982-07-28 |
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