JPH0247439B2 - EKISOEPITAKISHARUSEICHOHOHO - Google Patents

EKISOEPITAKISHARUSEICHOHOHO

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Publication number
JPH0247439B2
JPH0247439B2 JP22584084A JP22584084A JPH0247439B2 JP H0247439 B2 JPH0247439 B2 JP H0247439B2 JP 22584084 A JP22584084 A JP 22584084A JP 22584084 A JP22584084 A JP 22584084A JP H0247439 B2 JPH0247439 B2 JP H0247439B2
Authority
JP
Japan
Prior art keywords
epitaxial growth
solution
gaas
melt
slider
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP22584084A
Other languages
Japanese (ja)
Other versions
JPS61106491A (en
Inventor
Shigetaka Murasato
Atsushi Matsuzaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Holdings Corp
Original Assignee
Showa Denko KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Showa Denko KK filed Critical Showa Denko KK
Priority to JP22584084A priority Critical patent/JPH0247439B2/en
Publication of JPS61106491A publication Critical patent/JPS61106491A/en
Publication of JPH0247439B2 publication Critical patent/JPH0247439B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

(産業上の利用分野) 本発明は、液相エピタキシヤル成長方法に関
し、より詳細には、スライドボート法による
GaAlAs層のエピタキシヤル成長に関し、成長用
Ga溶液の酸化を防止し結晶性の良いエピ層を得
るための液相エピタキシヤル成長方法に関する。 (従来技術) GaP、GaAlAsなどの化合物半導体結晶は、半
導体発光素子として盛んに用いられており、液相
エピタキシヤル成長法又は気相エピタキシヤル成
長法等により製造されている。就中、スライドボ
ート法による液相エピタキシヤル成長方法は連続
多層エピタキシヤル成長が可能であるために多用
されている。 しかし、特にGaAlAs層をスライドボート法に
より液相エピタキシヤル成長させる場合には、次
のような問題がある。すなわち、スライドボート
法は、GaAsウエハーについて第2図にその概略
を示すように、ボート2の上に、複数の溶液溜め
4,5を有するスライダー3を摺動可能に構成し
た装置を用いて、まず、ボート2の所定箇所に設
けた基板ホルダー13内にGaAs基板1を載置
し、一方、各溶液溜め4,5内にメルト用原料と
して所定量のGa,Al,GaAs、必要なp形又は
n形用ドーパントを調整して装入し、原料仕込み
を行つた後、装置内にH2ガスを流入しつつ所定
の温度プログラムに従つて昇温し、成長用メルト
6,7を得た後、GaAs基板1上にp形及びn形
のGaAlAs層をエピタキシヤル成長させる工程に
よるものである。しかし、上記原料仕込みの際、
Alを含むGaメタル溶液が極めて酸化しやすく、
酸化した溶液を使用すると、酸化膜のために基板
が濡れず、エピタキシヤル成長が阻害されたり或
いは異常成長となつたりし、延いては得られた半
導体結晶の発光効率の低下、寿命特性の悪化等を
招き、歩留まり低下にもつながることになる。 このため、従来は、上記原料仕込みに際し、グ
ローブボツクスを用いて不活性雰囲気中で原料装
入を行つたり、またAl(融点660℃)をGaから分
離しておき溶解した後エピ成長直前にGa−GaAs
溶液に投入するなどの対策が試みられていたが、
このような方法は特別な治具、装置を必要とする
ために操作の煩雑化、装置構成の複雑化をもたら
し、生産性を低下させる等、効果的な解決策では
ないという問題があつた。 (発明の目的) 本発明は、前述のスライドボート法による
GaAlAs層の液相エピタキシヤル成長に伴う問題
点を解決し、原料溶液の酸化を簡易に、かつ、効
果的に防止でき、結晶性の良いエピタキシヤル成
長層を得ることができる方法を提供することを目
的とするものである。 (発明の構成) かゝる目的達成のため、本発明者らは、従来の
スライドボート法における原料仕込み段階につい
て原因を分析し検討したところ、従来は仕込みに
おいて予めAlをGa溶液に溶け込ませた後雰囲気
調整し、その後にエピタキシヤル成長工程に入る
ため、Alを含む液体Gaメルトが著しい酸化状態
にならざるを得ないことに起因することを究明し
た。これに基づいて仕込み段階ではAlをGaに溶
け込まさない方策を見い出すべく更に研究を重ね
た結果、原料仕込み段階ではGaメタルをインゴ
ツトとして溶液溜めに装填してこれをエピタキシ
ヤル成長工程の温度プログラムに従つて昇温し溶
融せしめることによつて、可能であることを見い
出し、本発明をなしたものである。 以下に本発明を実施例に基づいて詳細に説明す
る。 本発明では、まず、スライダーの溶液溜めへの
メルト用原料の仕込みに先立つて、Gaメタルイ
ンゴツトを次のようにして製造し、準備する。 所定量のGaメタルを精秤して溶解し、これを
スライダー3(第1図)の溶液溜め4,5と同一
平面形状の鋳型(図示せず)に鋳込み、冷却凝固
してインゴツトを得る。その際、温度はGaの融
点(29.8℃)以下に保ち、鋳型はテフロン等で製
作したものを用いるが、内面をコーテイングした
鋳型でもよく、また溶解から鋳込み、冷却凝固ま
での作業雰囲気は大気中であつても支障はない
が、不活性ガス中で行う方が酸化防止上望まし
い。 また、Al(融点660℃)及びGaAs(融点1237℃)
は、適宜エツチングを行つた後、所定量を秤量し
ておく。これらの大きさ、形状は任意のものでよ
い。ドーパントとしては、n形GaAlAs層用には
Te、Sn等々を使用し、p形GaAlAs層用には
Mg、Zn等々を使用する。 次に、これらのメルト用原料を第1図に示すよ
うにスライダー3の溶液溜め4,5に装填する。
その手順は、第1図に示すように、まず溶液溜め
4,5の底部に前記Al11、GaAs及びドーパン
ト12を入れ、次いでGaメタルインゴツト8,
9をこれらの上に入れるが、この場合、Gaメタ
ルインゴツトは、既述の如く装填前の段階で溶液
溜め4,5と同一平面形状の鋳型を用いて製造さ
れているので、溶液溜め4,5の上部に蓋の如く
載置することができ、以降での原料溶解段階でま
ずGaメタルインゴツトが溶解してAl、GaAs及
びドーパント上に流れ込み、均一な所要溶液を得
ることができる等の効果がある。また、Gaメタ
ルを溶液溜めと同一平面形状にすることにより
Gaメタルの厚さを極小にでき、従つて、スライ
ダーの厚さも極小となり、多段成長装置に有利と
なる効果がある。 これらの原料装填作業は、Gaメタルインゴツ
トが溶けない温度、好ましくは25℃以下で行う必
要があるが、大気雰囲気中で行うことができるの
で、特別の装置を必要とせず、通常のクリーンベ
ンチ内で行うことができる。 なお、ボート2の基板ホルダー13内にGaAs
基板1を装入する必要があることは云うまでもな
い。 このようにメルト原料をスライダー3に装填し
た後、エピタキシヤル成長用炉(図示せず)内に
セツトし、真空引き→Arガス通流→真空引きの
操作を数回繰り返して炉内雰囲気の置換を行い、
炉内の残留酸素を除去する。 最終的には、H2を炉内に通流しつつ昇温し、
通常の温度プログラムに従つてエピタキシヤル成
長を行う。この昇温過程でGaメタルインゴツト
が溶融し、次いでAl、GaAs、ドーパントなどが
溶解して所要の溶液を各溶液溜め内に得ることが
できる。 次に本発明の一実施例を示す。 (実施例) 第1表に示す組成及び純度のメルト用原料を準
備した。 まず、Gaメタルを50℃で溶解し、これをテフ
ロン製で溶液溜めと同形の鋳型に所定量を流し込
み、冷所にて凝固させてGaメタルインゴツトを
製造した。次いでスライダーの一方の溶液溜め底
部に、秤量したGaAs、Al、Znドーパントを投入
し、もう一方の溶液溜め底部に、秤量した
GaAs、Al、Teドーパントを投入し、各々その
上に前記Gaメタルインゴツトを蓋をするように
して装填した。一方、ボート上の基板ホルダー内
にはGaAs基板を載置した。なお、これらの原料
装填作業はすべて大気下、25℃にてクリーンベン
チ内で行つた。
(Industrial Application Field) The present invention relates to a liquid phase epitaxial growth method, more specifically, a slide boat method.
Regarding epitaxial growth of GaAlAs layer,
This article relates to a liquid phase epitaxial growth method for preventing oxidation of a Ga solution and obtaining an epitaxial layer with good crystallinity. (Prior Art) Compound semiconductor crystals such as GaP and GaAlAs are widely used as semiconductor light emitting devices, and are manufactured by a liquid phase epitaxial growth method, a vapor phase epitaxial growth method, or the like. In particular, a liquid phase epitaxial growth method using a slide boat method is frequently used because it allows continuous multilayer epitaxial growth. However, especially when a GaAlAs layer is liquid-phase epitaxially grown by the slide boat method, there are the following problems. That is, the slide boat method uses a device in which a slider 3 having a plurality of solution reservoirs 4 and 5 is configured to be slidable on a boat 2, as schematically shown in FIG. 2 for GaAs wafers. First, the GaAs substrate 1 is placed in the substrate holder 13 provided at a predetermined location on the boat 2, and on the other hand, a predetermined amount of Ga, Al, GaAs as a raw material for the melt is placed in each solution reservoir 4, 5, and the necessary p-type Alternatively, after adjusting and charging the n-type dopant and preparing the raw materials, the temperature was raised according to a predetermined temperature program while flowing H 2 gas into the device to obtain growth melts 6 and 7. This is followed by a step of epitaxially growing p-type and n-type GaAlAs layers on the GaAs substrate 1. However, when preparing the above raw materials,
Ga metal solution containing Al is extremely easy to oxidize.
If an oxidized solution is used, the substrate will not be wetted due to the oxide film, inhibiting epitaxial growth or causing abnormal growth, and eventually reducing the luminous efficiency and life characteristics of the obtained semiconductor crystal. etc., leading to a decrease in yield. For this reason, conventionally, when charging the above raw materials, the raw materials were charged in an inert atmosphere using a glove box, or Al (melting point 660°C) was separated from Ga and then melted immediately before epitaxial growth. Ga−GaAs
Countermeasures such as pouring it into a solution were attempted, but
Such a method requires special jigs and equipment, resulting in complicated operations and a complicated equipment configuration, which reduces productivity and is not an effective solution. (Object of the invention) The present invention is based on the slide boat method described above.
To provide a method capable of solving problems associated with liquid phase epitaxial growth of a GaAlAs layer, easily and effectively preventing oxidation of a raw material solution, and obtaining an epitaxially grown layer with good crystallinity. The purpose is to (Structure of the Invention) In order to achieve the above object, the present inventors analyzed and studied the causes of the raw material preparation step in the conventional slide boat method, and found that in the past, Al was dissolved in the Ga solution in advance during the preparation. We have determined that this is due to the fact that the liquid Ga melt containing Al must be brought into a highly oxidized state because the atmosphere is adjusted and then the epitaxial growth process begins. Based on this, we conducted further research to find a method to prevent Al from dissolving into Ga during the preparation stage.As a result, we loaded Ga metal as an ingot into the solution reservoir during the raw material preparation stage and used it as a temperature program for the epitaxial growth process. Therefore, we have discovered that it is possible to melt the material by increasing the temperature, and have developed the present invention. The present invention will be explained in detail below based on examples. In the present invention, first, prior to charging raw materials for melt into the solution reservoir of the slider, a Ga metal ingot is manufactured and prepared as follows. A predetermined amount of Ga metal is accurately weighed and melted, poured into a mold (not shown) having the same planar shape as the solution reservoirs 4 and 5 of the slider 3 (FIG. 1), and solidified by cooling to obtain an ingot. At this time, the temperature is kept below the melting point of Ga (29.8℃), the mold is made of Teflon, etc., but a mold with a coating on the inside may also be used, and the working atmosphere from melting to casting to cooling and solidification is atmospheric air. Although there is no problem even if the reaction is carried out, it is preferable to carry out the reaction in an inert gas in order to prevent oxidation. Also, Al (melting point 660℃) and GaAs (melting point 1237℃)
After performing appropriate etching, a predetermined amount is weighed. These may have any size and shape. As a dopant, for n-type GaAlAs layer,
Te, Sn, etc. are used, and for p-type GaAlAs layer
Mg, Zn, etc. are used. Next, these melt raw materials are loaded into the solution reservoirs 4 and 5 of the slider 3 as shown in FIG.
The procedure is as shown in FIG.
9 is placed on top of these, but in this case, since the Ga metal ingot is manufactured using a mold with the same planar shape as the solution reservoirs 4 and 5 at the stage before loading, as described above, the solution reservoir 4 , 5 like a lid, and in the subsequent raw material melting step, the Ga metal ingot is first melted and flows onto the Al, GaAs, and dopants, and a uniform required solution can be obtained. There is an effect. In addition, by making the Ga metal coplanar with the solution reservoir,
The thickness of the Ga metal can be minimized, and therefore the thickness of the slider can also be minimized, which is advantageous for multi-stage growth equipment. These raw material loading operations must be carried out at a temperature that does not melt the Ga metal ingot, preferably below 25°C, but since it can be carried out in the air, no special equipment is required and a normal clean bench can be used. It can be done within. Note that there is GaAs in the substrate holder 13 of the boat 2.
Needless to say, it is necessary to load the substrate 1. After loading the melt raw material into the slider 3 in this way, it is set in an epitaxial growth furnace (not shown), and the operation of evacuation → Ar gas flow → vacuum evacuation is repeated several times to replace the atmosphere in the furnace. and
Remove residual oxygen in the furnace. Finally, the temperature is raised while H 2 is passed through the furnace,
Epitaxial growth is carried out according to the usual temperature program. During this temperature raising process, the Ga metal ingot is melted, and then Al, GaAs, dopants, etc. are dissolved, and the required solution can be obtained in each solution reservoir. Next, an embodiment of the present invention will be described. (Example) Raw materials for melt having the composition and purity shown in Table 1 were prepared. First, Ga metal was melted at 50°C, a predetermined amount of this was poured into a Teflon mold of the same shape as the solution reservoir, and solidified in a cold place to produce a Ga metal ingot. Next, a weighed amount of GaAs, Al, and Zn dopant was introduced into the bottom of one solution reservoir of the slider, and a weighed amount of GaAs, Al, and Zn dopant was added to the bottom of the other solution reservoir.
GaAs, Al, and Te dopants were introduced, and the Ga metal ingot was placed on each dopant with a lid. Meanwhile, a GaAs substrate was placed inside the substrate holder on the boat. All of these raw material loading operations were performed in a clean bench at 25°C in the atmosphere.

【表】 その後、エピタキシヤル成長用炉内にセツト
し、Arでガス置換を行つた後、H2を3/min
の流量で通流しつつ昇温を開始した。 エピタキシヤル成長のため温度プログラムは、
第3図に示すように、上記昇温により各メルトを
820℃(同図中、A)に加熱し、820℃で60分間保
持後、スライダーを摺動させてGaAs基板にpメ
ルトを被せ、0.3℃/minの冷却速度で冷却しつ
つ、795℃(C)になつたところで、スライダー
を更に摺動させてnメルトを被せ、750℃(D)
においてスライダーを摺動させてワイプオフを行
つた。 一方、比較例として、本実施例に対してメルト
原料の仕込みの点でのみ異なり、溶融Gaを用い
て大気中で仕込んだ場合(比較例1)、並びにグ
ローブボツクスを用いて不活性雰囲気中でGaを
溶解して仕込みを行い、そのまゝエピタキシヤル
成長用炉にセツトした場合(比較例2)について
も、同様の温度プログラムに従つてエピタキシヤ
ル成長を行つた。 以上の手順で作製したGaAlAsエピタキシヤル
ウエハーについて相対発光効率を調らべた結果を
第4図に示す。同図からわかるように、溶融Ga
を用いて大気中でメルト原料を仕込んだ比較例1
に比らべ、比較例2及び本実施例のものは発光効
率が優れていて同等レベルである。 (発明の効果) 以上詳述したように、本発明は、メルト原料の
仕込み段階でGaメタルを溶融させないようにす
るものであるから、Ga−Al溶液における酸化を
仕込み段階で抑制でき、しかも、そのために複雑
な特別の治具、装置などを必要としないので操作
が煩雑とならずに簡単であり、結果として
GaAlAsエピタキシヤルウエハーの諸特性(輝度
等)の向上も図り得る等、その実用的効果は大き
い。
[Table] After that, it was set in an epitaxial growth furnace, and after gas replacement with Ar, H 2 was added at 3/min.
The temperature was started to rise while flowing at a flow rate of . The temperature program for epitaxial growth is
As shown in Figure 3, each melt is
After heating to 820°C (A in the figure) and holding at 820°C for 60 minutes, slide the slider to cover the GaAs substrate with p-melt and heat to 795°C (A) while cooling at a cooling rate of 0.3°C/min. When it reaches C), slide the slider further and cover it with n-melt, and heat it to 750℃ (D).
Wipe off was performed by sliding the slider. On the other hand, as a comparative example, the only difference from this example is in the preparation of the melt raw material. In the case where Ga was melted and charged and then directly set in the epitaxial growth furnace (Comparative Example 2), epitaxial growth was performed according to the same temperature program. FIG. 4 shows the results of examining the relative luminous efficiency of the GaAlAs epitaxial wafer produced by the above procedure. As can be seen from the figure, molten Ga
Comparative example 1 in which melt raw materials were prepared in the atmosphere using
Compared to this, Comparative Example 2 and this example have excellent luminous efficiency and are at the same level. (Effects of the Invention) As described in detail above, the present invention prevents Ga metal from being melted during the preparation stage of melt raw materials, so that oxidation in the Ga-Al solution can be suppressed during the preparation stage, and moreover, For this purpose, there is no need for complicated special jigs or equipment, so the operation is simple and not complicated, and as a result,
It has great practical effects, such as improving various properties (brightness, etc.) of GaAlAs epitaxial wafers.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図はスライドボート法における
メルト原料の仕込みを説明する断面図であつて、
第1図は本発明の場合を示し、第2図は従来法の
場合を示し、第3図は本発明の一実施例における
温度プログラムを示す図、第4図は得られたウエ
ハーの相対発光効率を示す図である。 1……GaAs基板、2……ボート、3……スラ
イダー、4,5……溶液溜め、6,7……成長用
溶液、8,9……Gaメタルインゴツト、11…
…Al、12……GaAs及びドーパント。
FIGS. 1 and 2 are cross-sectional views illustrating the preparation of melt raw materials in the slide boat method, and
Fig. 1 shows the case of the present invention, Fig. 2 shows the case of the conventional method, Fig. 3 shows the temperature program in one embodiment of the present invention, and Fig. 4 shows the relative luminescence of the obtained wafer. It is a figure showing efficiency. 1... GaAs substrate, 2... Boat, 3... Slider, 4, 5... Solution reservoir, 6, 7... Growth solution, 8, 9... Ga metal ingot, 11...
...Al, 12...GaAs and dopant.

Claims (1)

【特許請求の範囲】 1 スライドボート法によるGaAlAs液相エピタ
キシヤル成長方法において、成長溶液用原料とし
てスライダーの溶液溜めと同一平面形状を有する
固体Gaと、Al,GaAsメタル及びドーパントを
用いることを特徴とする液相エピタキシヤル成長
方法。 2 固体Gaが溶液溜め内のAl,GaAs及びドー
パントの上部に載置されていることを特徴とする
特許請求の範囲第1項記載の液相エピタキシヤル
成長方法。
[Claims] 1. A GaAlAs liquid phase epitaxial growth method using a slide boat method, characterized in that solid Ga having the same planar shape as the solution reservoir of the slider, Al, GaAs metal, and dopant are used as raw materials for the growth solution. A liquid phase epitaxial growth method. 2. The liquid phase epitaxial growth method according to claim 1, wherein solid Ga is placed on top of Al, GaAs, and dopants in the solution reservoir.
JP22584084A 1984-10-29 1984-10-29 EKISOEPITAKISHARUSEICHOHOHO Expired - Lifetime JPH0247439B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22584084A JPH0247439B2 (en) 1984-10-29 1984-10-29 EKISOEPITAKISHARUSEICHOHOHO

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22584084A JPH0247439B2 (en) 1984-10-29 1984-10-29 EKISOEPITAKISHARUSEICHOHOHO

Publications (2)

Publication Number Publication Date
JPS61106491A JPS61106491A (en) 1986-05-24
JPH0247439B2 true JPH0247439B2 (en) 1990-10-19

Family

ID=16835645

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22584084A Expired - Lifetime JPH0247439B2 (en) 1984-10-29 1984-10-29 EKISOEPITAKISHARUSEICHOHOHO

Country Status (1)

Country Link
JP (1) JPH0247439B2 (en)

Also Published As

Publication number Publication date
JPS61106491A (en) 1986-05-24

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