JPH0255106U - - Google Patents

Info

Publication number
JPH0255106U
JPH0255106U JP13437888U JP13437888U JPH0255106U JP H0255106 U JPH0255106 U JP H0255106U JP 13437888 U JP13437888 U JP 13437888U JP 13437888 U JP13437888 U JP 13437888U JP H0255106 U JPH0255106 U JP H0255106U
Authority
JP
Japan
Prior art keywords
lead
flat plate
surface mount
inspecting
jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13437888U
Other languages
English (en)
Other versions
JPH0729638Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988134378U priority Critical patent/JPH0729638Y2/ja
Publication of JPH0255106U publication Critical patent/JPH0255106U/ja
Application granted granted Critical
Publication of JPH0729638Y2 publication Critical patent/JPH0729638Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】
第１図ａ，ｂは、本考案の一適用例であるＰＬ
ＣＣのリード曲がり検査装置の概要図であり、ａ
は上面図、ｂは側面図である。第２図は、前記適
用例における、透明平板に描き込んだ検査規準を
示す図。 ……基準平面、……透明ガラス板、……
鏡、……Ｘ―Ｙステージ、……光源、……
実体顕微鏡、……リード浮き許容範囲、……
リード曲がり許容範囲、……ＰＬＣＣ。

Claims (1)

    【実用新案登録請求の範囲】
  1. 平板に表面実装部品をのせ、表面実装部品のリ
    ード形状及びリード寸法を検査する治具において
    、平板に検査規準を描き込んだ透明平板を固定し
    、リードに近接させたことを特徴とする表面実装
    部品のリード形状及びリード寸法検査用治具。
JP1988134378U 1988-10-14 1988-10-14 表面実装部品の検査用治具 Expired - Lifetime JPH0729638Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988134378U JPH0729638Y2 (ja) 1988-10-14 1988-10-14 表面実装部品の検査用治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988134378U JPH0729638Y2 (ja) 1988-10-14 1988-10-14 表面実装部品の検査用治具

Publications (2)

Publication Number Publication Date
JPH0255106U true JPH0255106U (ja) 1990-04-20
JPH0729638Y2 JPH0729638Y2 (ja) 1995-07-05

Family

ID=31393083

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988134378U Expired - Lifetime JPH0729638Y2 (ja) 1988-10-14 1988-10-14 表面実装部品の検査用治具

Country Status (1)

Country Link
JP (1) JPH0729638Y2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107328373A (zh) * 2017-08-18 2017-11-07 深圳市伙伴科技有限公司 引脚平整度检测系统及方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59176155U (ja) * 1983-05-12 1984-11-24 ロ−ム株式会社 電子部品の検査具
JPS6276529A (ja) * 1985-09-27 1987-04-08 Fuji Kikai Seizo Kk フラツトパツク型ｉｃのリ−ド線曲がり検出方法
JPS62274205A (ja) * 1986-05-23 1987-11-28 Hitachi Tokyo Electron Co Ltd リ−ド平坦度検査方法および装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59176155U (ja) * 1983-05-12 1984-11-24 ロ−ム株式会社 電子部品の検査具
JPS6276529A (ja) * 1985-09-27 1987-04-08 Fuji Kikai Seizo Kk フラツトパツク型ｉｃのリ−ド線曲がり検出方法
JPS62274205A (ja) * 1986-05-23 1987-11-28 Hitachi Tokyo Electron Co Ltd リ−ド平坦度検査方法および装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107328373A (zh) * 2017-08-18 2017-11-07 深圳市伙伴科技有限公司 引脚平整度检测系统及方法

Also Published As

Publication number Publication date
JPH0729638Y2 (ja) 1995-07-05

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