JPH0257078U - - Google Patents

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Publication number
JPH0257078U
JPH0257078U JP13565788U JP13565788U JPH0257078U JP H0257078 U JPH0257078 U JP H0257078U JP 13565788 U JP13565788 U JP 13565788U JP 13565788 U JP13565788 U JP 13565788U JP H0257078 U JPH0257078 U JP H0257078U
Authority
JP
Japan
Prior art keywords
address
refresh address
refresh
selection circuit
application device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13565788U
Other languages
English (en)
Other versions
JPH0725726Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13565788U priority Critical patent/JPH0725726Y2/ja
Publication of JPH0257078U publication Critical patent/JPH0257078U/ja
Application granted granted Critical
Publication of JPH0725726Y2 publication Critical patent/JPH0725726Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【図面の簡単な説明】
第1図はこの考案の実施例を示すブロツク図、
第2図はそのビツト入替回路の具体例を示す図、
第3図は従来のアドレス印加装置を示すブロツク
図である。

Claims (1)

  1. 【実用新案登録請求の範囲】 テストアドレスとリフレツシユアドレス発生器
    からのリフレツシユアドレスとを選択回路で選択
    して被試験ダイナミツクRAMへ供給する半導体
    試験装置のアドレス印加装置において、 上記リフレツシユアドレス発生器は順次歩進す
    るアドレスを発生するものであり、そのリフレツ
    シユアドレス発生器と上記選択回路との間にビツ
    ト入替回路が設けられていることを特徴とする半
    導体試験装置のアドレス印加装置。
JP13565788U 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置 Expired - Lifetime JPH0725726Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13565788U JPH0725726Y2 (ja) 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13565788U JPH0725726Y2 (ja) 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置

Publications (2)

Publication Number Publication Date
JPH0257078U true JPH0257078U (ja) 1990-04-25
JPH0725726Y2 JPH0725726Y2 (ja) 1995-06-07

Family

ID=31395481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13565788U Expired - Lifetime JPH0725726Y2 (ja) 1988-10-17 1988-10-17 半導体試験装置のアドレス印加装置

Country Status (1)

Country Link
JP (1) JPH0725726Y2 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001338497A (ja) * 2000-05-24 2001-12-07 Fujitsu Ltd メモリ試験方法

Also Published As

Publication number Publication date
JPH0725726Y2 (ja) 1995-06-07

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