JPH0259475U - - Google Patents
Info
- Publication number
- JPH0259475U JPH0259475U JP13757088U JP13757088U JPH0259475U JP H0259475 U JPH0259475 U JP H0259475U JP 13757088 U JP13757088 U JP 13757088U JP 13757088 U JP13757088 U JP 13757088U JP H0259475 U JPH0259475 U JP H0259475U
- Authority
- JP
- Japan
- Prior art keywords
- center portion
- cable
- insulation layer
- end portions
- cable insulation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000009413 insulation Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 5
- 230000015556 catabolic process Effects 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 239000004020 conductor Substances 0.000 description 1
Landscapes
- Testing Relating To Insulation (AREA)
Description
第１〜３図は本考案の実施例にかかるもので、
第１図は一部縦断側面図、第２ａ図は交流破壊試
験の説明図で、第２ｂ図はその作用の説明図、第
３図はインパルス破壊試験の説明図、第４図は従
来の試験用ケーブルの説明図、第５図は従来の交
流破壊試験の説明図、第６図は従来のインパルス
破壊試験の説明図。
１０，１０′：試験用ケーブル、１２：導体、
１４：内部半導電層、１６：ケーブル絶縁層、１
８：外部半導電層、２０：中央部、２２：端部、
２４：テーパ部、３０：電極、３２：水端末、３
４：純水、３５：試験電圧、３６：水槽、３８：
水、４０：絶縁油。
Figures 1 to 3 show examples of the present invention.
Fig. 1 is a partially longitudinal side view, Fig. 2a is an explanatory diagram of the AC breakdown test, Fig. 2b is an explanatory diagram of its action, Fig. 3 is an explanatory diagram of the impulse breakdown test, and Fig. 4 is a conventional test. FIG. 5 is an explanatory diagram of a conventional AC breakdown test, and FIG. 6 is an explanatory diagram of a conventional impulse breakdown test. 10, 10': Test cable, 12: Conductor,
14: Internal semiconducting layer, 16: Cable insulation layer, 1
8: outer semiconducting layer, 20: center part, 22: end part,
24: Tapered part, 30: Electrode, 32: Water terminal, 3
4: Pure water, 35: Test voltage, 36: Water tank, 38:
Water, 40: Insulating oil.
Claims (1)
ては所定の値であるが、端部２２においては中央
部２０より大で、中央部２０から端部２２に移る
部分で次第に大になつており、そのようにしたケ
ーブル絶縁層１６の上に外部半導電層１８が設け
られている、試験用ケーブル。 The thickness of the cable insulation layer 16 is a predetermined value at the center portion 20, is larger at the end portions 22 than at the center portion 20, and gradually increases from the center portion 20 to the end portions 22. a cable for testing, wherein the cable insulation layer 16 is provided with an outer semiconducting layer 18;
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13757088U JPH0621029Y2 (en) | 1988-10-21 | 1988-10-21 | Test cable |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13757088U JPH0621029Y2 (en) | 1988-10-21 | 1988-10-21 | Test cable |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0259475U true JPH0259475U (en) | 1990-05-01 |
| JPH0621029Y2 JPH0621029Y2 (en) | 1994-06-01 |
Family
ID=31399110
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13757088U Expired - Lifetime JPH0621029Y2 (en) | 1988-10-21 | 1988-10-21 | Test cable |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0621029Y2 (en) |
-
1988
- 1988-10-21 JP JP13757088U patent/JPH0621029Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0621029Y2 (en) | 1994-06-01 |