JPH0263162B2 - - Google Patents
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- Publication number
- JPH0263162B2 JPH0263162B2 JP59028166A JP2816684A JPH0263162B2 JP H0263162 B2 JPH0263162 B2 JP H0263162B2 JP 59028166 A JP59028166 A JP 59028166A JP 2816684 A JP2816684 A JP 2816684A JP H0263162 B2 JPH0263162 B2 JP H0263162B2
- Authority
- JP
- Japan
- Prior art keywords
- eccentricity
- psd
- output
- outputs
- scale
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】
本発明はエンコーダを用いた電子測角器等の目
盛円板の回転に伴う偏心量を自動的に検査する装
置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a device that uses an encoder to automatically test the amount of eccentricity accompanying the rotation of a scale disc of an electronic goniometer or the like.
エンコーダを用いた電子測角器は、一般に放射
状にスリツト列を有する二枚の目盛円板の一方を
他方に対して回転させ、その際に生じるモアレ縞
を光電的に計数して回転角を測るものである。従
つて、目盛円板の回転軸が偏芯していると光電検
出信号が振幅変調を受け、その結果大きな測角誤
差を生じる。この回転軸の偏芯は、回転軸の未調
整、目盛円板の中心孔の偏芯等純粋に機械的なも
のが原因となつており、この回転軸の偏芯を除去
するために従来より行なわれてきた方法として、
第一に目盛円板の円周の真円度を精密加工により
保障し、その外縁にマイクロインジケータ等のフ
イラーを接触させながらインジケータ目盛を読取
つて偏芯調整を行うものがあり、第二に目盛円板
の目盛領域の外縁に円形刻線を全周に亘つて設け
るかまたは90゜ないし180゜おきに一定半径の位置
にマークを設け、この刻線またはマークの円板の
回転に伴う半径方向の変動を読取顕微鏡により計
測するものがある。 Electronic goniometers using encoders generally measure the angle of rotation by rotating one of two scale disks with radial slit rows relative to the other, and photoelectrically counting the moiré fringes that occur at this time. It is something. Therefore, if the axis of rotation of the scale disk is eccentric, the photoelectric detection signal will undergo amplitude modulation, resulting in a large angle measurement error. This eccentricity of the rotating shaft is caused by purely mechanical factors such as unadjusted rotational axis and eccentricity of the center hole of the scale disk. The method that has been used is
First, the roundness of the circumference of the scale disc is ensured by precision machining, and the eccentricity is adjusted by reading the indicator scale while contacting the outer edge with a filler such as a micro indicator. Circular marking lines are provided on the outer edge of the scale area of the disc, or marks are provided at constant radius positions every 90° to 180°, and the radial direction of the marking lines or marks as the disc rotates. There is a method that measures the fluctuations in using a reading microscope.
これらの方法は、従来から光学式セオドライト
や円周目盛刻線機の調整に用いられてきたもので
あり、回転軸の偏芯を除去するいう初期の目的は
達せられるが、前記第一の方法では円板の真円度
を保障するための精密加工が要求されるばかりか
円周と目盛線との偏芯も抑制しなければならず高
度の加工技術を要求されるため部品コストが高く
なり、また、第二の方法では顕微鏡を用いてミク
ロンオーダの高精度な読取を行うために相当の熟
練を要し、測定時間もかかる上読取誤差を免れな
いという問題を有していた。 These methods have traditionally been used to adjust optical theodolites and circumferential scale marking machines, and although they achieve the initial purpose of eliminating eccentricity of the rotating shaft, the first method described above Not only does this require precision machining to ensure the circularity of the disc, but it also has to prevent eccentricity between the circumference and the scale lines, which requires advanced processing technology and increases component costs. In addition, the second method requires considerable skill in order to perform highly accurate reading on the micron order using a microscope, takes a long time to measure, and has the problem of being subject to reading errors.
本発明は上述の点に鑑みてなされたものであ
り、迅速かつ高精度な偏芯量の自動計測を行ない
得る比較的簡単な構成の廉価な偏芯量自動検査装
置を提供することを目的とする。このため、本発
明に係る偏芯量の自動検査装置においては、被検
物である回転円板の外縁部に設けた円形刻線を照
明する光源と、該光源に対向して設けられ前記円
形刻線の像を結像する光学系と、該光学系によつ
て結像された前記円形刻線の像の像位置を検出す
るPSD(Positon Sensitive Device)と、前記光
源、前記光学系、及び前記PSDを一体として前
記回転円板との間で相対回転させる回転軸と、前
記PSDの二つの電極から各々出力される各電極
から前記像位置までの距離に比例した二つの光電
流i1、i2を各々光電圧v1、v2に変換する電流電圧
変換器と、各光電圧v1、v2の和出力V1+v2を出
力する加算器と、各光電圧v1、v2の差出力v1−v2
を出力する減算器と、前記和出力v1+v2及び差出
力v1−v2の比を出力する割算器と、該割算器の出
力に接続される表示器とからなる偏芯量の自動検
査置を構成し、偏芯量を光電検出して求める方式
を採用して上記目的を達成する。 The present invention has been made in view of the above-mentioned points, and an object of the present invention is to provide an inexpensive automatic eccentricity testing device with a relatively simple configuration that can perform rapid and highly accurate automatic measurement of eccentricity. do. Therefore, in the automatic eccentricity inspection device according to the present invention, there is provided a light source that illuminates the circular marking line provided on the outer edge of the rotating disk that is the object to be inspected, and a light source that illuminates the circular marking line provided opposite to the light source. an optical system that forms an image of the marked line; a PSD (Positon Sensitive Device) that detects the image position of the image of the circular marked line formed by the optical system; the light source; the optical system; a rotation axis that rotates the PSD integrally relative to the rotating disk; two photocurrents i 1 proportional to the distance from each electrode to the image position, each output from two electrodes of the PSD ; A current-voltage converter that converts i 2 into photovoltages v 1 and v 2 respectively, an adder that outputs the sum output V 1 + v 2 of each photo voltage v 1 and v 2 , and each photo voltage v 1 and v 2 The difference output v 1 − v 2
an eccentricity consisting of a subtracter that outputs , a divider that outputs the ratio of the sum output v 1 + v 2 and the difference output v 1 - v 2 , and a display connected to the output of the divider. The above objective is achieved by constructing an automatic inspection device and adopting a method of determining the amount of eccentricity by photoelectric detection.
以下、図面に基づいて本発明の実施例を説明す
る。 Embodiments of the present invention will be described below based on the drawings.
第1図は偏芯量dと誤差角dθの関係を示した
ものである。円K1は中心O1、半径rの偏芯のな
い参照円であり、円K2はO2を中心とし偏芯量
O1O2=dを有する円である。今、円K1と円K2は
微小間隔を隔てて対向し、固定円K1に対して円
K2は回転軸O2の廻りを回転するものと考える。
また、円K1を電子測角器における固定した目盛
円板、円K2を回転し得る走査目盛板と見做する
ことができる。測角の誤差dθは偏芯O1O2と直交
する位置B1、Q1、B2、Q2で最大で、dθ=∠
B1O2Q1=d/rであり、B1、B2点は誤差角に
夫々進み、遅れがあるから総合の最大誤差は2dθ
である。一方、偏芯O1O2の延長線上の点A1、A2
では誤差角は0であるが偏芯量は最大で2 2=
A1P1=dである。今、偏芯の観測点が図示のよ
うに直径C1C2と円K1の交点C1及びC2の二点だと
するを、偏芯量1 1及び2 2はその最大値1 1
及び2 2より小さい。真の偏芯量1 2を偏芯の
方向A2A1を求めるためには円K1を回転して観測
点C1、C2を夫々点A2、A1まで移動しなければな
らない。 FIG. 1 shows the relationship between the eccentricity d and the error angle dθ. Circle K 1 is a reference circle with center O 1 and radius r without eccentricity, and circle K 2 is centered on O 2 and has eccentricity.
O 1 O 2 = a circle with d. Now, the circle K 1 and the circle K 2 are opposite to each other with a small distance between them, and the circle K 1 is opposite to the fixed circle K 1 .
Consider K 2 to rotate around the rotation axis O 2 .
Further, the circle K1 can be regarded as a fixed scale disc in an electronic goniometer, and the circle K2 can be regarded as a rotatable scanning scale plate. The angle measurement error dθ is maximum at the positions B 1 , Q 1 , B 2 , Q 2 perpendicular to the eccentricity O 1 O 2 , and dθ = ∠
B 1 O 2 Q 1 = d/r, and the two points B 1 and B advance to the error angle, and since there is a delay, the total maximum error is 2dθ
It is. On the other hand, points A 1 and A 2 on the extension line of eccentricity O 1 O 2
In this case, the error angle is 0, but the eccentricity is at most 2 2 =
A 1 P 1 =d. Now, suppose that the eccentricity observation points are the two intersections C 1 and C 2 of the diameter C 1 C 2 and the circle K 1 as shown in the figure, and the eccentricities 1 1 and 2 2 are the maximum values 1 1
and 2 less than 2 . In order to obtain the true eccentricity 12 and the direction of eccentricity A2A1 , it is necessary to rotate the circle K1 and move the observation points C1 and C2 to the points A2 and A1 , respectively.
従つて、後述するようにPSDにより偏芯量を
連続的に計測しながらこの移動操作を行つた後円
K1を固定する。 Therefore, as described later, after performing this movement operation while continuously measuring the amount of eccentricity using PSD, the circular
Fix K1 .
第2図は本発明に係る偏芯量の自動検査装置の
一実施例を示すものである。第一の回転軸1には
円周目盛2を有する透明な目盛円板3が固定され
ており、第一の回転軸1に対して偏芯dを有する
第二の回転軸4には前記目盛円板2と同一の円周
目盛5を有する回転円板6が固定されている。前
記円周目盛5の外周円の更に外縁には偏芯測定に
供される円形刻線7が設けられている。前記目盛
円板3と回転円板6は円周目盛2及び5を微小間
隔だけ隔てて対向するように配置されている。第
一の回転軸1に固定されたアーム8及び9には
夫々LED10及びレンズ11とPSD12とを一
体となした受光部が観測点C1の中心軸上に配列
するようにして取付けられており、前記LED1
0から発せられる光束が円形刻線7を照明し、レ
ンズ11を経た結像光束により円形刻線7の像1
3がPSD12の受光面に入射する。該PSD12
は光スポツトの位置検査用センサーで、光スポツ
ト位置は半径方向に配置した電極P1、P2(第3図
参照)までの抵抗値により内分割され、PSD1
2はその分割比に対応する一対の光電流i1、i2を
位置信号として出力される。前記LED10は、
安定化電源14によつて駆動されており、前記
PSD12の出力は電子回路15によりμm単位
の偏芯量に換算されて表示器16により表示され
る。 FIG. 2 shows an embodiment of an automatic eccentricity testing device according to the present invention. A transparent scale disk 3 having a circumferential scale 2 is fixed to the first rotating shaft 1, and a second rotating shaft 4 having an eccentricity d with respect to the first rotating shaft 1 has the scale markings. A rotating disk 6 having the same circumferential scale 5 as the disk 2 is fixed. Further on the outer edge of the outer circumferential circle of the circumferential scale 5, a circular marking line 7 is provided for use in eccentricity measurement. The scale disc 3 and the rotary disc 6 are arranged to face each other with the circumferential scales 2 and 5 separated by a minute interval. Arms 8 and 9 fixed to the first rotating shaft 1 are each equipped with a light-receiving unit that is an integrated unit of an LED 10, a lens 11, and a PSD 12, and is arranged on the central axis of the observation point C1 . , said LED1
The light beam emitted from 0 illuminates the circular marked line 7, and the image 1 of the circular marked line 7 is formed by the imaging light flux that passes through the lens 11.
3 enters the light receiving surface of the PSD 12. The PSD12
is a sensor for inspecting the position of a light spot, and the light spot position is internally divided by the resistance value up to electrodes P 1 and P 2 (see Figure 3) arranged in the radial direction, and PSD1
2 outputs a pair of photocurrents i 1 and i 2 corresponding to the division ratio as position signals. The LED 10 is
It is driven by a stabilized power supply 14, and the
The output of the PSD 12 is converted by an electronic circuit 15 into an amount of eccentricity in μm units, and is displayed on a display 16.
尚、前記PSD12としては例えば浜松ホトニ
ツクス社製の一次元PSDS1543が実用に供し得る
が、その位置分解能は0.2μm、応答速度5μsecで
あり、迅速で高精度の位置検出が可能である。 As the PSD 12, for example, a one-dimensional PSDS1543 manufactured by Hamamatsu Photonics Co., Ltd. can be used in practice, and its position resolution is 0.2 μm and response speed is 5 μsec, allowing for quick and highly accurate position detection.
第3図は前記電子回路15のブロツク図であ
る。PSD12により光点13の電極P1、P2から
の距離に比例した光電流i1、i2が出力され、これ
ら光電流i1、i2は電流電圧変換器151,152
により夫々光電圧V1、V2に変換される。該光電
圧V1、V2は加算器153及び減算器154に入
力され、夫々和出力V1+V2、差出力V1−V2を得
る。割算器155はこの和出力V1+V2、差出力
V1−V2の比V1−V2/V1+V2を計算しμm単位
の偏芯量を出力する。そして、該割算器155の
出力である偏芯量は表示器16に表示される。 FIG. 3 is a block diagram of the electronic circuit 15. The PSD 12 outputs photocurrents i 1 , i 2 that are proportional to the distances of the light spot 13 from the electrodes P 1 , P 2 , and these photocurrents i 1 , i 2 are transferred to current-voltage converters 151 , 152 .
are converted into photovoltages V 1 and V 2 respectively. The photovoltages V 1 and V 2 are input to an adder 153 and a subtracter 154 to obtain a sum output V 1 +V 2 and a difference output V 1 -V 2 , respectively. The divider 155 outputs the sum output V 1 +V 2 and the difference output.
The ratio V 1 −V 2 /V 1 +V 2 of V 1 −V 2 is calculated and the amount of eccentricity in μm is output. The eccentricity amount, which is the output of the divider 155, is displayed on the display 16.
ここで、再び第2図を参照して偏芯の連続測定
の操作を説明する。 Here, the operation of continuous measurement of eccentricity will be explained with reference to FIG. 2 again.
第一の回転軸1をゆつくり回転させるとアーム
8,9及びLED10、レンズ11、PSD12が
連動して回転する。回転円板6は第一の回転軸1
に対して偏芯して取付けられているため、表示器
16に現われる偏芯量は連続的に変化し、第1図
における点A1とA2で夫々最大値及び最小値を示
す。この位置で回転軸1を止めると偏芯の最大値
とその方向が確認される。 When the first rotating shaft 1 is slowly rotated, the arms 8 and 9, the LED 10, the lens 11, and the PSD 12 are rotated in conjunction with each other. The rotating disk 6 is the first rotating shaft 1
Since it is mounted eccentrically with respect to the display 16, the amount of eccentricity appearing on the display 16 changes continuously, and shows the maximum and minimum values at points A1 and A2 in FIG. 1, respectively. When the rotating shaft 1 is stopped at this position, the maximum eccentricity value and its direction can be confirmed.
本実施例では電子測角器における透明な目盛円
板3び回転円板6についての偏芯測定の場合を述
べたが、不透明な回転板の偏芯計測も同様に行な
うことができる。この場合にはLED等による照
明系とPSDとが対向位置ではなく回転板の片側
に配置されるので、照明は半視野照明或いは半透
明プリズムを介しての落射照明となり、照明系と
検出系の光路分割を行えばよい。また、電子回路
15による信号処理は適当なマイクロコンピータ
で代行することもでき、偏芯量は内蔵のCRTま
たはプリンターに出力される。 In this embodiment, the eccentricity measurement of the transparent scale disk 3 and rotating disk 6 in an electronic goniometer has been described, but the eccentricity measurement of an opaque rotating disk can be performed in the same manner. In this case, the illumination system using LEDs, etc. and the PSD are placed on one side of the rotary plate instead of facing each other, so the illumination is half-field illumination or epi-illumination through a semi-transparent prism, and the illumination system and detection system are What is necessary is to perform optical path division. Further, the signal processing by the electronic circuit 15 can be performed by an appropriate microcomputer, and the eccentricity amount is outputted to the built-in CRT or printer.
更に、本実施例における偏芯観測点は一箇所で
あつたが、直径上の対向する二点ないしその中間
点を加えた三点で行なつても支障はない。 Furthermore, although the eccentricity observation point in this embodiment was one, there is no problem in performing the measurement at two diametrically opposed points or three points including the intermediate point thereof.
以上のように、本発明に係る偏芯量の自動検査
装置によれば比較的簡単な光学的構成と廉価な機
構を用いて、PSDの精確な位置検出機能の活用
により迅速かつ高精度の偏芯測定が可能となる。 As described above, the automatic eccentricity inspection device according to the present invention uses a relatively simple optical configuration and an inexpensive mechanism, and utilizes the accurate position detection function of the PSD to quickly and accurately detect eccentricity. Core measurement becomes possible.
また、本発明において用いているPSDは、光
スポツトの位置を二つの電極までの抵抗値により
内分割しその分割比に応じた一対の光電流を各電
極に出力するようにするもので、その出力はアナ
ログ信号である。従つて、無限に微少な幅の検出
が可能であり、このようなPSDを用いた願発明
は、例えば電子測角器等の目盛の偏芯の調節に用
いる偏芯量の自動検査装置として実用に十分耐え
られるものである。 Furthermore, the PSD used in the present invention divides the position of the optical spot according to the resistance value up to the two electrodes, and outputs a pair of photocurrents to each electrode according to the division ratio. The output is an analog signal. Therefore, it is possible to detect infinitely small widths, and the claimed invention using such a PSD can be put to practical use, for example, as an automatic eccentricity inspection device used to adjust the eccentricity of the scale of electronic goniometers, etc. It is sufficiently durable.
尚、本発明に係る偏芯量の自動検査装置は、単
に電子測角器のエンコーダに適用し得るのみなら
ず、透明円板及び不透明円板を有する光学機器や
精密計測機器の偏芯測定に広く応用することがで
きる。 The automatic eccentricity testing device according to the present invention can be applied not only to the encoder of an electronic goniometer, but also to the eccentricity measurement of optical instruments and precision measuring instruments having transparent discs and opaque discs. It can be widely applied.
第1図は偏芯量と誤差角の関係を示す概略図、
第2図は本発明一実施例の側面図、第3図は本発
明一実施例の電子回路のブロツク図である。
4……回転軸、6……回転円板、7……円形刻
線、10……LED(光源)、12……PSD(位置検
出素子)、15……電子回路、16……表示器。
Figure 1 is a schematic diagram showing the relationship between eccentricity and error angle.
FIG. 2 is a side view of one embodiment of the present invention, and FIG. 3 is a block diagram of an electronic circuit according to one embodiment of the present invention. 4... Rotating shaft, 6... Rotating disk, 7... Circular marking line, 10... LED (light source), 12... PSD (position detection element), 15... Electronic circuit, 16... Display device.
Claims (1)
刻線を照明する光源と、該光源に対向して設けら
れ前記円形刻線の像を結像する光学系と、該光学
系によつて結像された前記円形刻線の像の像位置
を検出するPSD(PositTon Sensitive Device)
と、前記光源、前記光学系、及び前記PSDを一
体として前記回転円板との間で相対回転させる回
転軸と、前記PSDの二つの電極から各々出力さ
れる各電極から前記像位置までの距離に比例した
二つの光電流i1、i2を各々光電圧v1、v2に変換す
る電流電圧変換器と、各光電圧v1、v2の和出力v1
+v2を出力する加算器と、各光電圧v1、v2の差出
力v1−v2を出力する減算器と、前記和出力v1+v2
及び差出力v1−v2の比を出力する割算器と、該割
算器の出力に接続される表示器とからなる偏芯量
の自動検査装置。1. A light source that illuminates a circular marked line provided on the outer edge of a rotating disk that is a test object, an optical system that is provided opposite to the light source and forms an image of the circular marked line, and a A PSD (PositTon Sensitive Device) that detects the image position of the image of the circular marked line thus formed.
, a rotation axis through which the light source, the optical system, and the PSD are integrally rotated relative to the rotating disk, and a distance from each electrode to the image position output from the two electrodes of the PSD, respectively. A current-voltage converter that converts two photocurrents i 1 and i 2 proportional to , respectively, into photovoltages v 1 and v 2 , and a sum output v 1 of each photovoltage v 1 and v 2 .
an adder that outputs +v 2 , a subtracter that outputs the difference output v 1 −v 2 of each photovoltage v 1 and v 2 , and the sum output v 1 +v 2
and a divider that outputs the ratio of difference output v 1 −v 2 , and a display connected to the output of the divider.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2816684A JPS60171405A (en) | 1984-02-17 | 1984-02-17 | Automatic eccentricity inspecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2816684A JPS60171405A (en) | 1984-02-17 | 1984-02-17 | Automatic eccentricity inspecting device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60171405A JPS60171405A (en) | 1985-09-04 |
| JPH0263162B2 true JPH0263162B2 (en) | 1990-12-27 |
Family
ID=12241156
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2816684A Granted JPS60171405A (en) | 1984-02-17 | 1984-02-17 | Automatic eccentricity inspecting device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60171405A (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7035361B2 (en) | 2002-07-15 | 2006-04-25 | Quellan, Inc. | Adaptive noise filtering and equalization for optimal high speed multilevel signal decoding |
| US7050388B2 (en) | 2003-08-07 | 2006-05-23 | Quellan, Inc. | Method and system for crosstalk cancellation |
| US7123676B2 (en) | 2003-11-17 | 2006-10-17 | Quellan, Inc. | Method and system for antenna interference cancellation |
| US7173551B2 (en) | 2000-12-21 | 2007-02-06 | Quellan, Inc. | Increasing data throughput in optical fiber transmission systems |
| US7215721B2 (en) | 2001-04-04 | 2007-05-08 | Quellan, Inc. | Method and system for decoding multilevel signals |
| US7307569B2 (en) | 2001-03-29 | 2007-12-11 | Quellan, Inc. | Increasing data throughput in optical fiber transmission systems |
| US7352824B2 (en) | 2001-03-29 | 2008-04-01 | Quellan, Inc. | Multilevel pulse position modulation for efficient fiber optic communication |
| US7522883B2 (en) | 2004-12-14 | 2009-04-21 | Quellan, Inc. | Method and system for reducing signal interference |
| US7616700B2 (en) | 2003-12-22 | 2009-11-10 | Quellan, Inc. | Method and system for slicing a communication signal |
| US9252983B2 (en) | 2006-04-26 | 2016-02-02 | Intersil Americas LLC | Method and system for reducing radiated emissions from a communications channel |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4855765B2 (en) * | 2005-11-30 | 2012-01-18 | オリンパス株式会社 | Endoscopic treatment device |
| CN112539714B (en) * | 2020-06-30 | 2022-07-26 | 深圳中科飞测科技股份有限公司 | Eccentricity detection method, processing method and detection equipment |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5635004A (en) * | 1979-08-29 | 1981-04-07 | Mitsubishi Electric Corp | Detector for center position of object to be measured |
-
1984
- 1984-02-17 JP JP2816684A patent/JPS60171405A/en active Granted
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7173551B2 (en) | 2000-12-21 | 2007-02-06 | Quellan, Inc. | Increasing data throughput in optical fiber transmission systems |
| US7352824B2 (en) | 2001-03-29 | 2008-04-01 | Quellan, Inc. | Multilevel pulse position modulation for efficient fiber optic communication |
| US7307569B2 (en) | 2001-03-29 | 2007-12-11 | Quellan, Inc. | Increasing data throughput in optical fiber transmission systems |
| US7215721B2 (en) | 2001-04-04 | 2007-05-08 | Quellan, Inc. | Method and system for decoding multilevel signals |
| US7602860B2 (en) | 2001-04-04 | 2009-10-13 | Quellan, Inc. | Method and system for decoding multilevel signals |
| US7035361B2 (en) | 2002-07-15 | 2006-04-25 | Quellan, Inc. | Adaptive noise filtering and equalization for optimal high speed multilevel signal decoding |
| US7573966B2 (en) | 2002-07-15 | 2009-08-11 | Quellan, Inc. | Adaptive noise filtering and equalization for optimal high speed multilevel signal decoding |
| US7050388B2 (en) | 2003-08-07 | 2006-05-23 | Quellan, Inc. | Method and system for crosstalk cancellation |
| US7626916B2 (en) | 2003-08-07 | 2009-12-01 | Quellan, Inc. | Method and system for crosstalk cancellation |
| US7123676B2 (en) | 2003-11-17 | 2006-10-17 | Quellan, Inc. | Method and system for antenna interference cancellation |
| US7366244B2 (en) | 2003-11-17 | 2008-04-29 | Quellan, Inc. | Method and system for antenna interference cancellation |
| US7616700B2 (en) | 2003-12-22 | 2009-11-10 | Quellan, Inc. | Method and system for slicing a communication signal |
| US7522883B2 (en) | 2004-12-14 | 2009-04-21 | Quellan, Inc. | Method and system for reducing signal interference |
| US9252983B2 (en) | 2006-04-26 | 2016-02-02 | Intersil Americas LLC | Method and system for reducing radiated emissions from a communications channel |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60171405A (en) | 1985-09-04 |
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