JPS603537A - Tension tester - Google Patents
Tension testerInfo
- Publication number
- JPS603537A JPS603537A JP58110535A JP11053583A JPS603537A JP S603537 A JPS603537 A JP S603537A JP 58110535 A JP58110535 A JP 58110535A JP 11053583 A JP11053583 A JP 11053583A JP S603537 A JPS603537 A JP S603537A
- Authority
- JP
- Japan
- Prior art keywords
- light
- elongation
- sample
- detector
- projector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/06—Special adaptations of indicating or recording means
- G01N3/068—Special adaptations of indicating or recording means with optical indicating or recording means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
- G01N2203/0647—Image analysis
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は引張試験機に係り、詳しくは紫外線ランプを使
用し、試料にあらかじめマークしだ標線を照射すること
によって試料」二の標線のみ発光させ、該発光した光を
検出し多品種の試料の伸びを非接触で、かつ高精度で測
定する装置を具備した引張試験機に関する。[Detailed Description of the Invention] The present invention relates to a tensile testing machine, and more specifically, by using an ultraviolet lamp and irradiating the marked line on the sample in advance, only the second marked line on the sample is emitted, and the emitted light is This invention relates to a tensile testing machine equipped with a device that detects light and measures the elongation of a wide variety of samples in a non-contact manner and with high precision.
従来、試料における伸びの測定法としては試料にスケー
ルを当てて人が直接伸びを読み取る直接測定法、可視光
線を使用して測定する非接触測定法、試料に伸び測定用
治具を取り付けて治具の変位量より伸びを測定する接触
測定法などがあるが、直接測定法は時々刻々移動中の標
線間の長さを目で追尾する方法であり高精度測定には不
向きである。又、可視光線を使用した非接触法はプラス
チック、ゴムのような伸び量が大きく、かつ多品種。Conventional methods for measuring elongation in a sample include direct measurement, in which a scale is placed on the sample and a person directly reads the elongation, non-contact measurement, in which visible light is used, and elongation measurement jig is attached to the sample. There is a contact measurement method that measures elongation rather than the amount of displacement of the tool, but the direct measurement method involves visually tracking the length between the gauge lines as it moves from moment to moment, and is not suitable for high-precision measurement. In addition, the non-contact method using visible light can be applied to a wide variety of products, such as plastics and rubber, which have a large amount of elongation.
多様の色物に適用する場合、試料の伸びの増大につれて
地肌が変色し、試料地肌と標線とのコントラストが変化
するなどの問題からすべての試料の伸びを正確に測定す
ることはできないという欠点がある。たとえば、黒色試
料の場合について述べると、黒色試料に白色で標線をマ
ークして引張ると、黒色試料は白く変色し、標線の白と
判別することができなくなる。また、黒色試料に赤系統
の色で標線をマークして引張る場合、引張前は標線の赤
が試料の黒よシ明るいが、荷重をかけて引張って行くと
試料は白く変色し、標線の赤系統より明るくなり、試料
の明暗が反転することになり、標線の検出ができなくな
る。まだ、投光器からの可視光線が変色して白化した部
分より反射して受光器に入射することになり、一層標線
の検出を不可能ならしめる。When applied to various colored objects, the disadvantage is that it is not possible to accurately measure the elongation of all samples due to problems such as the background color changing as the elongation of the sample increases and the contrast between the sample background and the marking line changing. There is. For example, in the case of a black sample, if a black sample is marked with a white marking line and pulled, the black sample will turn white and cannot be distinguished from the white marking line. In addition, when a black sample is marked with a marked line in a red color and pulled, the red on the marked line is brighter than the black of the sample before the tension is applied, but as the load is applied and the sample is pulled, the sample changes color to white and the marked line is pulled. It becomes brighter than the red color of the line, and the brightness of the sample is reversed, making it impossible to detect the marked line. However, visible light from the projector is reflected from the discolored and whitened portion and enters the receiver, making it even more impossible to detect the marked line.
これらの理由により多品種、多様の色物すべての試料の
伸び測定に可視光線を使用することは不可能である。For these reasons, it is impossible to use visible light to measure the elongation of all samples of various types and colors.
一方、接触測定法は、試料に伸び測定用の治具を測定の
都度取り付ける煩わしさがあり、捷た、治具の重さが往
々にして誤差の原因となる。特にフィルムのように微少
な引張荷重で切断する試料は治具取付箇所に応力がかか
り、治具取付箇所より切断する等の問題があって伸びを
測定することができない。On the other hand, the contact measurement method involves the trouble of attaching a jig for elongation measurement to the sample each time a measurement is made, and the weight of the jig when it is broken often causes errors. In particular, with samples such as films that are cut with a small tensile load, stress is applied to the jig attachment point, and there are problems such as cutting from the jig attachment point, making it impossible to measure elongation.
かくして、これら従来の何れの測定法においても未だ高
精度の測定を可能ならしめるには種々の改善がめられて
いる。Thus, in any of these conventional measurement methods, various improvements are still being made to enable highly accurate measurements.
本発明は叙上の如き現状に対応し、前記非接触法、接触
法の何れでも測定困難とされていた多品種、多様な色物
試料の伸びを高精度で測定することを課題とし、非接触
法ではあるが、投光器の光源として紫外1″を採用する
員に着目して 1改善された測定装置を有する引張試験
機を提供することを目的とするものである。The present invention addresses the above-mentioned current situation and aims to measure elongation of a wide variety of colored samples with high precision, which has been difficult to measure using either the non-contact method or the contact method. Although it is a contact method, it aims to provide a tensile testing machine with an improved measuring device, focusing on those who use ultraviolet 1'' as the light source of the projector.
即ち、本発明の特徴とするところは、紫外線ランプを光
源に用いた投光器と該投光器からの照射を受けて発光す
る試料の発光光線を受光すると共に入射しだ入射光量を
検出する検出器を含む受光器とを一対として、試料の伸
び方向に間隔をおいて配設された少くとも2対の投受光
装置と、前記受光器の検出器による検出に従って前記投
受光装置を試料の伸び方向において試料上に螢光塗料で
マークしだ標線に自動的に追尾させる追尾機構と、該追
尾機構の作動に伴って各投受光装置の変位信号を発信す
るそれぞれの伸び検出器と、該両伸び検出器からの受信
信号を受けてその差を演算する伸び差演算器とからなる
引張試験機にある。That is, the features of the present invention include a light projector using an ultraviolet lamp as a light source and a detector that receives the emitted light of a sample that emits light upon irradiation from the projector and detects the amount of incident light. At least two pairs of light emitting/receiving devices are arranged at intervals in the elongation direction of the sample, and the light emitting/receiving device is arranged as a pair in the elongation direction of the sample. A tracking mechanism that automatically tracks the marked line marked with fluorescent paint on the top, a respective elongation detector that transmits a displacement signal of each light emitting and receiving device in conjunction with the operation of the tracking mechanism, and both elongation detectors. This tensile testing machine consists of a differential elongation calculator that receives signals received from the tester and calculates the difference between them.
本発明の試験機による測定法では、試料に螢光塗料で標
線をマークし、紫外線を照射することによって、標線の
み発光させる。荷重をかけて試料を引張って白く変色し
た部分からの紫外線等の反射光線の影響は受光器にフィ
ルターを取付けることで解決できる。かくして検出器に
入射する入射光は標線の児光によるものだけとなり、本
発明の試験機を使えば多品種の色物試料の伸びを高精度
で測定することが可能である。In the measurement method using the tester of the present invention, a marked line is marked on a sample with fluorescent paint, and ultraviolet rays are irradiated to cause only the marked line to emit light. The effects of reflected light such as ultraviolet rays from areas that turn white when the sample is pulled under load can be resolved by attaching a filter to the receiver. In this way, the only incident light that enters the detector is the light from the gauge line, and the tester of the present invention allows the elongation of a wide variety of colored samples to be measured with high precision.
以下、引続き添付図面にもとづいて上記本発明引張試験
機の具体的な実施態様につき詳述する。Hereinafter, specific embodiments of the tensile testing machine of the present invention will be described in detail based on the accompanying drawings.
第1図は本発明に係る引張試験機の概要を示し、図にお
いて、(6)α0)は夫々試料(1)に螢光塗料でマー
クした標線(2) (3)に紫外線を照射する投光器、
(7) (1])は前記投光器(6) (10)から
の各照射を受けて発光する試料の発光光線を受光し検出
する受光器であり、これら投光器と受光器は夫々その1
つを一対のセットとして2対の投受光装置(6) (7
) 、 (10) (11)を形成し、試料の伸び方向
に間隔をおいてマークされだ標線(2)(3)に夫々対
応する如く配設され、引張試験機の基本要素を構成して
いる。Figure 1 shows an outline of the tensile testing machine according to the present invention. In the figure, (6) α0) irradiates ultraviolet rays to marked lines (2) and (3) marked with fluorescent paint on the sample (1), respectively. floodlight,
(7) (1) is a light receiver that receives and detects the light emitted from the sample that emits light upon receiving each irradiation from the light emitters (6) and (10);
Two pairs of light emitting/receiving devices (6) (7)
), (10), and (11), and are arranged so as to correspond to marked lines (2) and (3), respectively, marked at intervals in the elongation direction of the sample, and constitute the basic elements of a tensile testing machine. ing.
そして、この両投受光装置(6) (7)、 (10)
(11)は夫々、受光器(7) (11)に含まれる
後述する検出器の検出に従って回転する平衡電動機(5
) (9)の該回転によって回転作動する移動用ねじ0
4:+ Q5)に取り付けられ、受光器(7) (11
)への入射光量を検出することによって6対の投受光装
置(a) (7) 、 Cl0) (11)を夫々自動
的に前記標線(2) (3)に追尾させ得るように構成
されている。And this double light emitting/receiving device (6) (7), (10)
(11) are balanced electric motors (5) that rotate according to detection by a detector included in the light receiver (7) and (11), which will be described later.
) The moving screw 0 rotates by the rotation of (9).
4:+ Q5), and the receiver (7) (11
) is configured so that the six pairs of light projecting/receiving devices (a) (7), Cl0) (11) can be automatically tracked to the marked lines (2) and (3), respectively, by detecting the amount of light incident on the ing.
一方、(4) (8)は前記平衡電動機(5) (9)
の回転を受け、前記投光器及び受光器よりなる6対の投
受光装置(6) (7) 、 (]、0) (11)の
変位を変位信号として発信する伸び検出器であり、前記
各平衡電動機(5) (9)の端部に取り付けられ夫々
発信信号を伸び差演算器02)に入力して必要に応じそ
の演算結果を記録計(13)に記録するようになってい
る。On the other hand, (4) and (8) are the balanced motors (5) and (9).
The elongation detector is an elongation detector that transmits the displacement of six pairs of light emitting/receiving devices (6) (7) , (], 0) (11) consisting of the light emitter and the light receiver as a displacement signal in response to the rotation of the light emitter and the light receiver. They are attached to the ends of the electric motors (5) and (9), respectively, and input the transmitted signals to a differential expansion calculator 02), and record the calculation results on a recorder (13) as necessary.
本発明引張試験機は、叙上の如き各構成を基幹とするも
のであるが、特にその重要な特色をなすものは紫外線ラ
ンプを光源とする投光器(6)α0)ならびにこれに対
応する受光器(7) (11)の構成である。The tensile tester of the present invention is based on the above-mentioned configurations, but its most important features are a light emitter (6) α0) whose light source is an ultraviolet lamp and a corresponding light receiver. (7) This is the configuration of (11).
第2図及び第3図は、かかる投光器(6)θ0)及び受
光器(7) (11)の詳細を図示しており、投光器(
6) (10)においては、紫外線ランプ(26)を光
源とし、該ランプ(26)からの放射光線は凹面鏡(2
7)と凸レンズ(25)の組み合わせによって効率よく
試料(1)の標線(2) (8)を照射するように構成
され、特に紫外線ランプC26)からの可視光線をカッ
トするフィルター(24)を有して標線(2)(3)の
照射は紫外線のみで行ない、可視光線を照射した場合に
問題となる試料(1)からの反射の影響を排除した構造
を採用している。Figures 2 and 3 show details of the emitter (6) θ0) and the receiver (7) (11), and show the emitter (6) θ0) and receiver (7) (11) in detail.
6) In (10), an ultraviolet lamp (26) is used as a light source, and the radiation from the lamp (26) is transmitted through a concave mirror (26).
7) and a convex lens (25) to efficiently irradiate the marked lines (2) and (8) of the sample (1). In particular, a filter (24) that cuts visible light from the ultraviolet lamp C26) is used. The irradiation of the marked lines (2) and (3) is performed only with ultraviolet light, and a structure is adopted in which the influence of reflection from the sample (1), which would be a problem when irradiated with visible light, is eliminated.
一方、各受光器(7) (11)は第3図に図示する如
く、試料(1)の標線(2) (3)の発光光量を受け
紫外線をカットするフィルター(34)を備えると共に
、紫外線をカットし可視光線のみ集光する凸レンズ(1
3つと、集光しだ入射光量を検出する多素子半導体検出
器(36)を有して可視光線のみ凸レンズ(351で集
光し検出器(36)に導入することによって信頼性を向
上せしめる装置構成から々っている。On the other hand, each light receiver (7) (11), as shown in FIG. Convex lens (1) that cuts ultraviolet rays and focuses only visible light.
3, and a multi-element semiconductor detector (36) that collects and detects the amount of incident light, and improves reliability by focusing only visible light with a convex lens (351) and introducing it into the detector (36). It depends on the composition.
なお、この受光器(7) (11)の構成において、特
に多素子半導体検出器(36)は多素子を2等分割して
、各2等分割した多素子半導体の検出器(36A) (
36B)の出力は夫々の増巾器(37) (38)によ
って増巾され更に差動増巾器(39)に入力されて増幅
し各平衡電動機(5) (9)を回転させる仕組が採り
入れられている。In addition, in the configuration of the light receivers (7) (11), in particular, the multi-element semiconductor detector (36) divides the multi-element into two equal parts, and the multi-element semiconductor detector (36A) (
The output of 36B) is amplified by each amplifier (37) (38) and further inputted to a differential amplifier (39) for amplification and rotates each balanced motor (5) (9). It is being
即ち、各受光器(7) (11)と試料(1)の各標線
(2) (3)との対応が完全にとれておれば多素子半
導体検出器(36)。2ユ□1え□イエ1□(36A)
(36B)。 1出力は等しく、差動増巾器(39)の
出力は零となり平衡電動機(5) (9)は静止の状態
となる。That is, if each photoreceiver (7) (11) and each marked line (2) (3) of the sample (1) perfectly correspond to each other, it is a multi-element semiconductor detector (36). 2yu□1e□ye1□(36A)
(36B). 1 output is equal, the output of the differential amplifier (39) becomes zero, and the balanced motors (5) and (9) become stationary.
これに対し、標線(2) (3)と、受光器(7) (
11)との対応にずれが生じると、2等分割した多素子
半導体検出器(36A)(36B)の出力に差を生じ、
平衡電動機(5)(9)は上記の差がなくなるまで回転
を続け、投光器と受光器の対からなる投受光装置を変位
させ試料(1)の標線(2) (8)の中心を夫々常に
精度よく自動追尾が可能となっている。On the other hand, the marked lines (2) (3) and the receiver (7) (
11), a difference will occur in the outputs of the equally divided multi-element semiconductor detectors (36A) (36B),
The balance motors (5) and (9) continue to rotate until the above difference disappears, and the light emitting and receiving device consisting of a pair of light emitter and light receiver is displaced to center the marked lines (2) and (8) of the sample (1), respectively. Automatic tracking is always possible with high precision.
かくして本発明引張試験機は叙上の如き構成を有してな
り、試料の伸びを測定するにあたっては、先ず第1図に
示すように試料(1)にマークした2つの標線(2)
(3)に投光器(6) (10)からの紫外線を照射す
ることによって該標線(2) (3)のみを発光させる
。そして、発光した光は夫々受光器(7) (]1)に
より受光する。Thus, the tensile testing machine of the present invention has the configuration as described above, and when measuring the elongation of a sample, first, as shown in FIG.
By irradiating (3) with ultraviolet rays from the projectors (6) and (10), only the marked lines (2) and (3) are caused to emit light. The emitted light is then received by the respective light receivers (7) (]1).
この受光された各標線の発光光量は次いで第3図に図示
される受光器内のフィルター(34)によって紫外線が
カットされ、可視光線のみが凸レンズ(3つで集光され
て多素子半導体検出器(36)に導入され、この検出器
(36)で検出されてアナログ信号を発し、受光器にお
ける増巾作用を経て平衡電動機(5) (9)を回転さ
せる。The amount of light emitted from each of the received marks is then filtered by a filter (34) in the light receiver shown in Figure 3 to remove ultraviolet rays, and only visible light is focused by three convex lenses to be detected by a multi-element semiconductor. The light is introduced into the detector (36), detected by the detector (36), and emits an analog signal, which rotates the balanced motors (5) and (9) through an amplification effect in the photoreceiver.
この平衡電動機(5) (9)の回転が起生ずると、1
つは投受光装置移動用ねじ0→(15)を回転し、一対
になった投光器、受光器からなる投受光装置(6)(7
) 、 (10)01)を自動的に各標線(2) (3
)に追尾させ、平衡状態に至るまで同役受光装置を変位
させると共に、他のもう1つとして平衡電動機(5)
(9)の端部に取り付けて設けた伸び検出器(4) (
8)を作動させ、前記投光器。When this balanced motor (5) (9) rotates, 1
One is to rotate the light emitting/receiving device moving screw 0 → (15), and the light emitting/receiving device (6) (7) consisting of a pair of emitter and receiver is rotated.
), (10)01) for each marked line (2) (3
), and displaces the dual photodetector until it reaches an equilibrium state, and as another balance motor (5)
Elongation detector (4) attached to the end of (9) (
8) Activate the floodlight.
受光器の変位信号を発信させ伸び差演算器(12)に導
入する。A displacement signal from the light receiver is transmitted and introduced into a differential expansion calculator (12).
かくして、このように各伸び検出器(4) (8)から
の発信信号が導入されると、前記伸び差演算器θ2)に
より両信号の差を演算によってめれば両標線(2)(3
)間の伸びを自動的に測定することができる。Thus, when the transmission signals from each elongation detector (4) (8) are introduced in this way, the difference between both signals is calculated by the elongation difference calculator θ2), and both the gauge lines (2) ( 3
) can be automatically measured.
以上のようにして紫外線投光器と検出器を含む受光器を
組合せ使用し、各機素を併設することによって試料の伸
びを高精度に測定することが可能となる。As described above, by using a combination of an ultraviolet light projector and a light receiver including a detector, and installing each element together, it becomes possible to measure the elongation of a sample with high precision.
なお、上記説明は投受光装置のセットを2対とした場合
について述べたが、標線数の増加に伴ない適宜、その数
を増加すれば同様にして複数の各標線間の伸びを同時に
測定することも出来、設計的改変も任意である。The above explanation is based on the case where the set of light emitting and receiving devices is two pairs, but as the number of gauge lines increases, if the number is increased as appropriate, the elongation between multiple gauge lines can be simultaneously achieved. It can also be measured, and design changes can be made as desired.
本発明は、以上のように投光器の光源に紫外線ランプを
使用し、試料にあらかじめマークしだ標線を照射するこ
とによって試料上の標線のみを発光させ、その発光した
光を検出器を用いて検出しこれに従って一対になった投
光器と受光器を自動的に標線に追尾させると共に伸び検
出器、伸び差演算器を付設して標線間の伸びを測定し引
張試験を行なうものであり、前記追尾機構によって投受
光装置が試料の標線の中心を常に精度良く自動追尾可能
となり、紫外線照射による発光利用と相俟って従来非接
触法、接触法でも困難とされていたゴム、プラスチック
の如き伸び量が大きく、かつ多品種、多様な色物や引張
りによって地肌が変色する試料に適用する場合において
もその伸びを極めて精度よく測定することを可能ならし
める外、治具取り付けの不便を起すことなく、従って又
、誤差原因を可及的少なくして自動化を促進する上に頗
る有用な効果を有する。As described above, the present invention uses an ultraviolet lamp as the light source of the projector and irradiates the sample with the marked line in advance, so that only the marked line on the sample emits light, and the emitted light is used with a detector. This system automatically tracks the paired emitter and receiver to the marked line based on this information, and is also equipped with an elongation detector and an elongation difference calculator to measure the elongation between the marked lines and perform a tensile test. The tracking mechanism enables the light emitting and receiving device to automatically track the center of the sample's mark line with high precision at all times, and together with the use of light emitted by ultraviolet irradiation, it is possible to detect rubbers and plastics, which were previously difficult to achieve with non-contact or contact methods. In addition to making it possible to measure the elongation with extremely high accuracy even when applied to samples with a large amount of elongation such as those with a wide variety of colors and materials whose background changes in color due to tension, this method also eliminates the inconvenience of mounting a jig. Therefore, it also has a very useful effect in promoting automation by minimizing the causes of errors.
第1図は本発明引張試験機の略示概要図、第2図及び第
3図は前記第1図における投光器、受光器の構造説明図
である。
(1)・・・・・・・・・・・試料、 (2) (3)
・曲・・標線。
(4) (8)・−・・・・伸び検出器、(5) (9
)・・曲平衡電動機。
(6) (10)・・・・・投光器、(7) (11)
・・・曲受光器。
(12)・・・・・・・・・・坤び差演算器、o3)・
曲・記録計。
(24) (34)・・・・・・・フィルl−,(26
)・曲・・紫外線ランプ。
(37) (38)・・・・・・・増巾器、(39)・
曲・差動増巾器。
第1図
第2図
第3図FIG. 1 is a schematic diagram of the tensile testing machine of the present invention, and FIGS. 2 and 3 are structural explanatory diagrams of the projector and receiver in FIG. 1. (1)・・・・・・・・・・Sample, (2) (3)
・Curves・marked lines. (4) (8)---Elongation detector, (5) (9
)...Curved balance electric motor. (6) (10)...Floodlight, (7) (11)
...Curved receiver. (12)・・・・・・・・・Difference calculator, o3)・
Song/recorder. (24) (34)・・・・・・Phil l-, (26
)・Song・・Ultraviolet lamp. (37) (38)......Amplifier, (39)...
Song/differential amplifier. Figure 1 Figure 2 Figure 3
Claims (1)
からの照射を受けて発光する試料の発光光線を受光する
と共に、入射しだ入射光量を検出する検出器を含む受光
器とを一対として、試料の伸び方向に間隔をおいて配設
された少くとも2対の投受光装置と、前記受光器の検出
器による検出に従って前記投受光装置を試料の伸び方向
において試料上に螢光塗料でマークした標線に自動的に
追尾させる追尾機構と、該追尾機構の作動に伴って各投
受光装置の変位信号を発信する夫々の伸び検出器と、前
記面伸び検出器からの発信信号を受けてその差を演算す
る伸び差演算器とからなることを特徴とする引張試験機
。 2、 受光器に含まれる検出器が多素子半導体検出器で
ある特許請求の範囲第1項記載の引張試験機。 8、 受光器に含まれる多素子半導体検出器は2等分割
された多素子半導体からなる特許請求の範囲第2項記載
の引張試験機。 4、 追尾機構が受光器の検出器による検出信号に従っ
て回転する平衡電動機と、該電動機の回転によって回転
する移動用ねじからなる特許請求の範囲第1項、第2項
又は第8項記載の引張試験機。 5、 伸び差演算器の演算結果を記録計によって記録す
る特許請求の範囲第1項ないし第4項の何れか各項記載
の引張試験機。[Scope of Claims] (1) A light receiving device that includes a light projector using an ultraviolet lamp as a light source, and a detector that receives the emitted light from a sample that emits light upon irradiation from the projector and detects the amount of incident light. at least two pairs of light emitting/receiving devices arranged at intervals in the elongation direction of the sample; a tracking mechanism that automatically tracks a marked line marked with fluorescent paint; a respective elongation detector that transmits a displacement signal for each light emitting/receiving device in accordance with the operation of the tracking mechanism; 1. A tensile tester comprising: a difference in elongation calculator which receives a transmission signal and calculates the difference. 2. The tensile testing machine according to claim 1, wherein the detector included in the light receiver is a multi-element semiconductor detector. 8. The tensile testing machine according to claim 2, wherein the multi-element semiconductor detector included in the light receiver comprises a multi-element semiconductor divided into two equal parts. 4. The tensioning device according to claim 1, 2 or 8, wherein the tracking mechanism comprises a balance motor that rotates in accordance with a detection signal from a detector of a light receiver, and a moving screw that rotates as the motor rotates. testing machine. 5. A tensile testing machine according to any one of claims 1 to 4, in which the calculation results of the differential elongation calculator are recorded by a recorder.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58110535A JPS603537A (en) | 1983-06-20 | 1983-06-20 | Tension tester |
| US06/618,607 US4605857A (en) | 1983-06-20 | 1984-06-08 | Tensile tester |
| DE8484106992T DE3463843D1 (en) | 1983-06-20 | 1984-06-19 | Tensile tester |
| EP84106992A EP0129242B1 (en) | 1983-06-20 | 1984-06-19 | Tensile tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58110535A JPS603537A (en) | 1983-06-20 | 1983-06-20 | Tension tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS603537A true JPS603537A (en) | 1985-01-09 |
| JPH0220930B2 JPH0220930B2 (en) | 1990-05-11 |
Family
ID=14538269
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58110535A Granted JPS603537A (en) | 1983-06-20 | 1983-06-20 | Tension tester |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4605857A (en) |
| EP (1) | EP0129242B1 (en) |
| JP (1) | JPS603537A (en) |
| DE (1) | DE3463843D1 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62287941A (en) * | 1986-06-02 | 1987-12-14 | Mitsubishi Electric Corp | Electric discharge machining device |
| JPH02106250A (en) * | 1988-10-14 | 1990-04-18 | Hitachi Seiki Co Ltd | Lubricating oil management method and retry counting method for NC machine tool maintenance |
| JPH05169347A (en) * | 1991-12-20 | 1993-07-09 | Honda Motor Co Ltd | Abnormal tool joining method for NC device |
| WO2021177569A1 (en) * | 2020-03-04 | 2021-09-10 | 주식회사 엘지에너지솔루션 | Thin film specimen for tensile test and physical property evaluation method for thin film specimen |
| KR102522830B1 (en) * | 2021-10-13 | 2023-04-17 | 박용수 | Rubber test piece for tensile test with protrution scale for elongation measurement integrated with the test piece |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3608884A1 (en) * | 1986-03-17 | 1987-09-24 | Mitec Moderne Ind Gmbh | MEASURING ARRANGEMENT |
| US4754134A (en) * | 1987-04-16 | 1988-06-28 | Shin Meiwa Industry Co., Ltd. | Method of and apparatus for inspecting a stripped wire end |
| DE3740227C2 (en) * | 1987-11-27 | 1994-03-24 | Schenck Ag Carl | Method and device for measuring deformations on samples or test specimens in testing machines |
| DE3720303C2 (en) * | 1987-06-19 | 1993-09-30 | Schenck Ag Carl | Sample clamping device for testing machines |
| DE3720248A1 (en) * | 1987-06-19 | 1989-01-05 | Schenck Ag Carl | METHOD AND ARRANGEMENT FOR MEASURING DEFORMATION ON SAMPLES OR TEST BODIES IN TESTING MACHINES |
| EP0320122A3 (en) * | 1987-11-30 | 1992-04-29 | United Kingdom Atomic Energy Authority | A method of position monitoring and apparatus therefor |
| FR2695207B1 (en) * | 1992-09-01 | 1994-12-09 | Aerospatiale | Installation for measuring the deformation in situ of test strings subjected to long-term creep tests. |
| US5383776A (en) * | 1992-12-31 | 1995-01-24 | Hoechst Celanese Corporation | Apparatus for analyzing polymer defects |
| JP2692599B2 (en) * | 1994-07-27 | 1997-12-17 | 株式会社島津製作所 | Laser non-contact extensometer |
| DE19520371B4 (en) * | 1995-06-02 | 2005-06-02 | Dantec Ettemeyer Gmbh | Method and device for increasing the measuring range of speckle measuring systems during strain measurements on a sample |
| DE19620419A1 (en) * | 1996-05-21 | 1997-11-27 | Ettemeyer Gmbh & Co Mes Und Pr | Optical contact free measurement of surface displacement |
| JP3373831B2 (en) * | 2000-01-19 | 2003-02-04 | 岸本産業株式会社 | Test specimen elongation measuring method and apparatus |
| CN102288496A (en) * | 2011-08-15 | 2011-12-21 | 中核苏阀横店机械有限公司 | Distance scaling instrument |
| CN103063174A (en) * | 2011-10-20 | 2013-04-24 | 上海力远计算机科技有限公司 | Wireless prestress tensile elongation measuring device |
| CN105203041B (en) * | 2015-09-21 | 2017-11-10 | 南昌航空大学 | A kind of method of broadband fluorescence integrated intensity than measuring strain |
| CN112361941A (en) * | 2020-11-09 | 2021-02-12 | 天津正丽科技有限公司 | Device and method for rapidly and qualitatively detecting deformation of invisible tooth appliance |
| GB2618524B (en) * | 2022-05-02 | 2025-02-05 | Imetrum Ltd | Non-contact deformation monitoring system |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4850084U (en) * | 1971-10-12 | 1973-06-30 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2989690A (en) * | 1959-04-29 | 1961-06-20 | Gen Electric | Elongation, length, and velocity gage |
| US3435231A (en) * | 1965-08-10 | 1969-03-25 | Instron Ltd | Optical means for following the relative movement of two marks on a specimen during tensile testing |
| US3559253A (en) * | 1968-11-05 | 1971-02-02 | Cluett Peabody & Co Inc | Textile web shrinking apparatus comprising means for measuring distance between index marks on the web |
| GB1416541A (en) * | 1972-11-06 | 1975-12-03 | Wallace Co Ltd H W | Method and apparatus for following the motion of a datum mark |
| GB1553101A (en) * | 1976-04-30 | 1979-09-19 | Iwamoto Seisakusho Co Ltd | Automatic tensile test apparatus |
-
1983
- 1983-06-20 JP JP58110535A patent/JPS603537A/en active Granted
-
1984
- 1984-06-08 US US06/618,607 patent/US4605857A/en not_active Expired - Lifetime
- 1984-06-19 DE DE8484106992T patent/DE3463843D1/en not_active Expired
- 1984-06-19 EP EP84106992A patent/EP0129242B1/en not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4850084U (en) * | 1971-10-12 | 1973-06-30 |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62287941A (en) * | 1986-06-02 | 1987-12-14 | Mitsubishi Electric Corp | Electric discharge machining device |
| JPH02106250A (en) * | 1988-10-14 | 1990-04-18 | Hitachi Seiki Co Ltd | Lubricating oil management method and retry counting method for NC machine tool maintenance |
| JPH05169347A (en) * | 1991-12-20 | 1993-07-09 | Honda Motor Co Ltd | Abnormal tool joining method for NC device |
| WO2021177569A1 (en) * | 2020-03-04 | 2021-09-10 | 주식회사 엘지에너지솔루션 | Thin film specimen for tensile test and physical property evaluation method for thin film specimen |
| KR102522830B1 (en) * | 2021-10-13 | 2023-04-17 | 박용수 | Rubber test piece for tensile test with protrution scale for elongation measurement integrated with the test piece |
Also Published As
| Publication number | Publication date |
|---|---|
| US4605857A (en) | 1986-08-12 |
| EP0129242B1 (en) | 1987-05-20 |
| EP0129242A1 (en) | 1984-12-27 |
| DE3463843D1 (en) | 1987-06-25 |
| JPH0220930B2 (en) | 1990-05-11 |
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