JPH0267747A - Bipolar cmos gate array circuit device - Google Patents

Bipolar cmos gate array circuit device

Info

Publication number
JPH0267747A
JPH0267747A JP21912088A JP21912088A JPH0267747A JP H0267747 A JPH0267747 A JP H0267747A JP 21912088 A JP21912088 A JP 21912088A JP 21912088 A JP21912088 A JP 21912088A JP H0267747 A JPH0267747 A JP H0267747A
Authority
JP
Japan
Prior art keywords
supply
type buried
basic cell
cell matrix
circuit device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21912088A
Other languages
Japanese (ja)
Inventor
Minoru Kamata
稔 鎌田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP21912088A priority Critical patent/JPH0267747A/en
Publication of JPH0267747A publication Critical patent/JPH0267747A/en
Pending legal-status Critical Current

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  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

PURPOSE:To produce a supply-to-supply capacity without incrseaing a number of processes and to prevent erroneous operation due to supply noise by using an N<+>type buried layer formed as a collector electrode, as one of supply interconnection layers to a basic cell matrix. CONSTITUTION:On a semiconductor substrate 100, there are provided an input/ output circuit 101 and a basic cell matrix consisting of basic cells 102. Further, metallic supply interconnection layers 103 extended vertically and metallic supply interconnection layers 105 extended transversely are provided reticulately while N<+>type buried layers 104 are provided between the basic cell matrix and the input/output circuit 101. Since N<+>type buried layers 111, 112 are formed as a collector electrode of a vertical NPN bipolar transistor or a substrate electrode of a P-type MOSFET, the N<+>type buried layers for interconnection with a power supply can be formed without increasing a number of processes. Parasitic PN junction capacity can be used effectively as a supply-to-supply capacity for absorbing supply noise.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明はバイポーラCMOSゲートアレイ回路装置にお
いて、コレクタ電極として形成されるN゛型埋込み層を
基本セルマトリクスへの一方電源配線層として使用する
ことにより、電源電位を安定させると共に配線効率を向
上させたものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a bipolar CMOS gate array circuit device in which an N-type buried layer formed as a collector electrode is used as one power supply wiring layer to a basic cell matrix. This stabilizes the power supply potential and improves wiring efficiency.

〔従来の技術〕[Conventional technology]

従来のバイポーラCMOSゲートアレイ回路装置は、第
3図に示す様に基本セルマトリクスの周囲に配置された
入出力回路から基本セルマトリクスに対し電源用の金属
配線を網目状に配置・配線していた。
In the conventional bipolar CMOS gate array circuit device, as shown in Figure 3, metal wiring for power supply is arranged and routed in a mesh pattern from the input/output circuits arranged around the basic cell matrix to the basic cell matrix. .

〔発明が解決しようとする課題] しかし、前述の従来技術では電源間容量の小さな金属配
線層を電源配線として使用していたため、能動素子の動
作に伴なう電源電位の変動が著しく、回路特性の劣化を
誘発するという問題点を有する。さらに従来技術では金
属配線層の一部を電源配線層として使用するため、金属
配線層により形成する信号配線の配線効率を著しく低下
させるという問題点をも有していた。
[Problems to be Solved by the Invention] However, in the above-mentioned conventional technology, a metal wiring layer with a small capacitance between power supplies is used as a power supply wiring, and therefore the power supply potential fluctuates significantly due to the operation of the active element, which deteriorates the circuit characteristics. This has the problem of inducing deterioration of the Furthermore, in the prior art, a part of the metal wiring layer is used as a power supply wiring layer, so there is a problem in that the wiring efficiency of the signal wiring formed by the metal wiring layer is significantly reduced.

そこで本発明はこのような問題点を解決するもので、そ
の目的とするところは回路特性が安定した配線効率の高
いバイポーラCMOSゲートアレイ回路装置を提供する
ものである。
SUMMARY OF THE INVENTION The present invention is intended to solve these problems, and its purpose is to provide a bipolar CMOS gate array circuit device with stable circuit characteristics and high wiring efficiency.

[課題を解決するための手段〕 本発明のバイポーラCMOSゲートアレイ回路装置は、 a)バイポーラトランジスタ及び相補型MOSFETよ
り成るバイポーラCMO3混成半導体集積回路装置にお
いて、 b)主として相補型MOS F ETより成る基本セル
と。
[Means for Solving the Problems] The bipolar CMOS gate array circuit device of the present invention comprises: a) a bipolar CMO3 hybrid semiconductor integrated circuit device consisting of bipolar transistors and complementary MOSFETs, and b) a basic structure mainly consisting of complementary MOSFETs. With cell.

C)複数の前記基本セルをマトリクス状に配置して成る
基本セルマトリクスと d)主としてバイポーラトランジスタより成る入出力回
路と、 e)低比抵抗のN9型埋込み層を具備し、f)前記N゛
型埋込み層が前記基本セルマトリクスと前記入出力回路
との間に配置されると共に基本セルマトリクスの一方電
源配線層としたことを特徴とする。
C) a basic cell matrix formed by arranging a plurality of the basic cells in a matrix; d) an input/output circuit mainly composed of bipolar transistors; e) a low resistivity N9 type buried layer; A type embedding layer is arranged between the basic cell matrix and the input/output circuit, and is one of the power supply wiring layers of the basic cell matrix.

〔実 施 例〕〔Example〕

第1図は本発明の実施例におけるバイポーラCMOSゲ
ートアレイ回路装置のレイアウト図を示す。
FIG. 1 shows a layout diagram of a bipolar CMOS gate array circuit device in an embodiment of the present invention.

同図からも明らかな様に、半導体基板100上に基本セ
ル102から成る基本セルマトリクスと、入出力回路1
01を配置し、縦方向の金属電源配線層103及び横方
向の金属電源配線層105を基本セルマトリクス上に網
目状に、またN0型埋込み層104を基本セルマトリク
スと入出力回路101との間に形成することにより本発
明のバイポーラCMOSゲートアレイ回路装置は容易に
形成することができる。
As is clear from the figure, a basic cell matrix consisting of basic cells 102 and an input/output circuit 1 are provided on a semiconductor substrate 100.
01, a vertical metal power wiring layer 103 and a horizontal metal power wiring layer 105 are arranged in a mesh pattern on the basic cell matrix, and an N0 type buried layer 104 is placed between the basic cell matrix and the input/output circuit 101. By forming the bipolar CMOS gate array circuit device of the present invention, it is possible to easily form the bipolar CMOS gate array circuit device of the present invention.

また第2図は基本セルにおける主要断面図であり、同図
からも明らかな様にN゛型埋込み層111.112は縦
型NPNバイポーラトランジスタのコレクク電極やP型
MOSFETのサブストレート電極として形成される為
、工程の増加なしに電源配線用のN゛型埋込み層を形成
できる。
FIG. 2 is a main cross-sectional view of the basic cell, and as is clear from the figure, the N-type buried layers 111 and 112 are formed as the collector electrode of a vertical NPN bipolar transistor or the substrate electrode of a P-type MOSFET. Therefore, an N-type buried layer for power supply wiring can be formed without increasing the number of steps.

さらにN′″型埋型埋層104は他方電位にバイアスさ
れたP−半導体基板100を有す為、寄生PN接合容量
を電源雑音吸収用の電源間容量として活用することがで
きる。
Furthermore, since the N''' type buried layer 104 has the P- semiconductor substrate 100 biased to the other potential, the parasitic PN junction capacitance can be utilized as a power supply capacitance for absorbing power supply noise.

〔発明の効果1 以上述べたように本発明によればN″″型埋型埋層を一
方電源配線として使用することにより、工程を増やすこ
となく電源間容量を形成でき、電源雑音に起因する回路
誤動作を防止することができるという効果を有する。
[Effect of the invention 1 As described above, according to the present invention, by using the N″″ type buried layer as one power supply wiring, the capacitance between the power supplies can be formed without increasing the number of steps, and the power supply noise caused by power supply noise can be formed. This has the effect of preventing circuit malfunctions.

さらに本発明によれば金属電源配線層をN゛型埋込み層
と置き換えることができることにより、信号配線効率を
向上させる、即ちチップコストを低減することができる
という効果を有する。
Further, according to the present invention, since the metal power supply wiring layer can be replaced with an N-type buried layer, the signal wiring efficiency can be improved, that is, the chip cost can be reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のバイポーラCMOSゲートアレイ回路
装置のレイアウト図。 第2図は本発明のバイポーラCMOSゲートアレイ回路
装置における基本セルの断面図。 第3図は従来のバイポーラCMOSゲートアレイ回路装
置のレイアウト図。 100、110.130 P−半導体基板 101.131・・・入出力回路 102.132・・・基本セル 103.133・・・縦方向の金属電源配線104.1
11.112 ・・・N3型埋込み層 105.135・・・横方向の金属電源配線113・・
・・・・・P+型埋込み層 114・・・・・・・深いN3拡散層 115.119・・・N型囲戸型拡散層116・・・・
・・・N゛型差込み層 117・・・・・・・ベース拡散層 118・・・・・・・エミッタ拡散層 120.123・・・P4拡散層 121.122・・・N+拡散層 124.125・・・ゲート電極 126・・・・・・・P型囲戸型拡散層以上 出願人 セイコーエプソン株式会社 代理人 弁理士 上 柳 雅 誉(他1名)第1コ 第2回
FIG. 1 is a layout diagram of a bipolar CMOS gate array circuit device of the present invention. FIG. 2 is a sectional view of a basic cell in the bipolar CMOS gate array circuit device of the present invention. FIG. 3 is a layout diagram of a conventional bipolar CMOS gate array circuit device. 100, 110.130 P-semiconductor substrate 101.131... Input/output circuit 102.132... Basic cell 103.133... Vertical metal power supply wiring 104.1
11.112...N3 type buried layer 105.135...Horizontal metal power supply wiring 113...
...P+ type buried layer 114...Deep N3 diffusion layer 115.119...N type walled diffusion layer 116...
...N-type insertion layer 117...Base diffusion layer 118...Emitter diffusion layer 120.123...P4 diffusion layer 121.122...N+ diffusion layer 124. 125...Gate electrode 126......P-type enclosure type diffusion layer or above Applicant: Seiko Epson Co., Ltd. Agent Patent attorney Masaharu Kamiyanagi (and 1 other person) 1st Co. 2nd session

Claims (1)

【特許請求の範囲】 a)バイポーラトランジスタ及び相補型M@O@SFE
Tより成るバイポーラCM@O@S混成半導体集積回路
装置において、 b)主として相補型M@O@SFETより成る基本セル
と、 c)複数の前記基本セルをマトリクス状に配置して成る
基本セルマトリクスと d)主としてバイポーラトランジスタより成る入出力回
路と、 e)低比抵抗のN^+型埋込み層を具備し、f)前記N
^+型埋込み層が前記基本セルマトリクスと前記入出力
回路との間に配置されると共に基本セルマトリクスの一
方電源配線層としたことを特徴とするバイポーラCM@
O@Sゲートアレイ回路装置。
[Claims] a) Bipolar transistor and complementary M@O@SFE
In a bipolar CM@O@S hybrid semiconductor integrated circuit device consisting of T, b) a basic cell mainly consisting of complementary M@O@SFETs, and c) a basic cell matrix consisting of a plurality of the basic cells arranged in a matrix. and d) an input/output circuit mainly composed of bipolar transistors, e) a low resistivity N^+ type buried layer, and f) the N^+ type buried layer.
A bipolar CM@ characterized in that a ^+ type buried layer is arranged between the basic cell matrix and the input/output circuit, and also serves as one power supply wiring layer of the basic cell matrix.
O@S gate array circuit device.
JP21912088A 1988-09-01 1988-09-01 Bipolar cmos gate array circuit device Pending JPH0267747A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21912088A JPH0267747A (en) 1988-09-01 1988-09-01 Bipolar cmos gate array circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21912088A JPH0267747A (en) 1988-09-01 1988-09-01 Bipolar cmos gate array circuit device

Publications (1)

Publication Number Publication Date
JPH0267747A true JPH0267747A (en) 1990-03-07

Family

ID=16730559

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21912088A Pending JPH0267747A (en) 1988-09-01 1988-09-01 Bipolar cmos gate array circuit device

Country Status (1)

Country Link
JP (1) JPH0267747A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5245596A (en) * 1991-06-26 1993-09-14 Eastman Kodak Company Optical head having a grating with a doubly periodic structure

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5245596A (en) * 1991-06-26 1993-09-14 Eastman Kodak Company Optical head having a grating with a doubly periodic structure

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