JPH0269965A - Semiconductor package and manufacture thereof - Google Patents

Semiconductor package and manufacture thereof

Info

Publication number
JPH0269965A
JPH0269965A JP63221672A JP22167288A JPH0269965A JP H0269965 A JPH0269965 A JP H0269965A JP 63221672 A JP63221672 A JP 63221672A JP 22167288 A JP22167288 A JP 22167288A JP H0269965 A JPH0269965 A JP H0269965A
Authority
JP
Japan
Prior art keywords
housing
package
groove
wall
lid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63221672A
Other languages
Japanese (ja)
Other versions
JP2762418B2 (en
Inventor
Hidehiro Iwase
岩瀬 英裕
Keiichi Habata
幅田 圭一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Chemical Corp
Original Assignee
Toshiba Chemical Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Chemical Corp filed Critical Toshiba Chemical Corp
Priority to JP63221672A priority Critical patent/JP2762418B2/en
Publication of JPH0269965A publication Critical patent/JPH0269965A/en
Application granted granted Critical
Publication of JP2762418B2 publication Critical patent/JP2762418B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

PURPOSE:To improve the adherence of a lead frame to a package and to improve workability by forming a premolded housing of thermoplastic resin and sealing its outer groove with a thermosetting sealing material. CONSTITUTION:A housing 1 has an outer wall 3 higher than an inner wall 2 on the inner periphery and a flowing wall 4 lower than the wall 2 on the inner periphery of the wall 2. An outer groove 6 is formed between the walls 2 and 3, and an inner groove 7 is formed between the walls 2 and 4. In the housing 1, a lead frame 5 is integrally formed of thermoplastic resin. A semiconductor element 10 is placed in the housing, and connected by the frame 5 and bonding wires 11. Then, a cover 13 is provided on the top of the wall 2. Thereafter, the wall 2 and the cover are temporarily applied with an adhesive or the like, a thermoplastic sealing material 12 is transfer molded to seal the groove 6, and the top of the groove 6 is sealed with the cover 13 with the material 12.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は、耐湿性、加工性に優れ、また高集積化大型素
子の搭載に好適な中空の熱可塑性樹脂製半導体パッケー
ジに関する。
[Detailed Description of the Invention] [Object of the Invention] (Industrial Application Field) The present invention provides a hollow thermoplastic resin semiconductor package that has excellent moisture resistance and processability and is suitable for mounting highly integrated large-sized elements. Regarding.

(従来の技術) 近年、半導体装置の素子密度か高くなり、今後もメモリ
ーの記憶容量でみると16メガビツト、64メガビツト
と集積度がまずまず高くなり、ベレットは大型化する傾
向にある。 現在多用されているエポキシ樹脂封止材に
よる半導体の封止方法は、第5図に示したように、半導
体素子20とリード端子21とをワイヤボンディングし
、それを封止材22で封止したり、第6図に示したよう
に、予じめ熱可塑性樹脂でリードフレーム21を一体に
成形したプリモールドパッケージλユをつくり、半導体
素子20を実装後、封止材22で封止してM24をした
ものであるが、いずれも限界に近づきつつある。 従っ
て今後は、高集積度素子の搭載に好適であり、また撮像
素子用にも利用できるものにするなめ、素子を直接樹脂
封止しない中空型あるいはカス封止型の半導体パッケー
ジになると思われる。 この型式のものは、従来がら種
々なものが開発されているが、満足すべきものがない。
(Prior Art) In recent years, the element density of semiconductor devices has increased, and in terms of memory storage capacity, the degree of integration will continue to increase to 16 megabits and 64 megabits, and there is a tendency for pellets to become larger. As shown in FIG. 5, the method of encapsulating a semiconductor using an epoxy resin encapsulating material, which is currently widely used, involves wire bonding a semiconductor element 20 and lead terminals 21, and then encapsulating them with a encapsulating material 22. Alternatively, as shown in FIG. 6, a pre-molded package λ is made by integrally molding the lead frame 21 with thermoplastic resin, and after the semiconductor element 20 is mounted, it is sealed with the sealing material 22. The M24 was used, but both are approaching their limits. Therefore, in the future, it is thought that hollow-type or gas-sealed semiconductor packages will be used, in which the elements are not directly sealed with resin, in order to be suitable for mounting highly integrated devices and also to be used for image pickup devices. Various types of this type have been developed in the past, but none have been satisfactory.

(発明が解決しようとする課題) 従来、中空型パッケージとしてセラミックパッケージが
あるが、非常に高価であり、多量に生産されるメモリー
等には経済的でない。 これに対して合成樹脂によるプ
リモールドパッケージもあるが、それぞれ欠点をもって
いる。 すなわち、熱硬化性樹脂製のものは、パッケー
ジ成形の際にパリが発生して、リードの樹脂かぶりが起
こる笠の欠点がある。 また、熱可塑性樹脂製のものは
、生産性が高く優れているものの、リードフレームと熱
可塑性樹脂との密着性が悪く、水分等の湿気の浸入によ
り半導体素子が損傷する等の欠点かある。
(Problems to be Solved by the Invention) Ceramic packages have conventionally been used as hollow packages, but they are very expensive and are not economical for memories etc. that are produced in large quantities. In contrast, there are pre-molded packages made of synthetic resin, but each has its own drawbacks. That is, those made of thermosetting resin have the disadvantage of a cap that generates flakes during package molding, causing resin fogging of the leads. Furthermore, although those made of thermoplastic resin are excellent in terms of high productivity, they have drawbacks such as poor adhesion between the lead frame and the thermoplastic resin, and damage to the semiconductor element due to infiltration of moisture such as moisture.

本発明は、これらの事情に鑑みてなされたもので、リー
ドフレームとパッケージとの密着が良くて耐湿性に優れ
、従ってまた半導体素子の損傷がなくて信頼性の高い、
かつ加工性、生産性が良くて安価な半導体パッケージ及
びその製造方法を提供しようとするものである。
The present invention has been made in view of these circumstances, and has good adhesion between the lead frame and the package, has excellent moisture resistance, and is highly reliable without damaging semiconductor elements.
The present invention also aims to provide an inexpensive semiconductor package with good processability and productivity, and a method for manufacturing the same.

[発明の構成] (課題を解決するための手段) 本発明者らは、上記の目的を達成しようと鋭意研究を重
ねた結果、熱可塑性樹脂のもつ良好な加工性と高い生産
性、熱硬化性樹脂のもつ優れた密着性を組み合わせ、か
つパッケージとしての優れた構造の採用から、上記目的
を達成できることを見いだし本発明を完成したものであ
る。
[Structure of the Invention] (Means for Solving the Problems) As a result of intensive research aimed at achieving the above object, the present inventors have discovered that thermoplastic resins have good processability, high productivity, and thermosetting properties. The present invention was completed based on the discovery that the above object can be achieved by combining the excellent adhesiveness of a plastic resin and adopting an excellent structure as a package.

すなわち、本発明の半導体パッケージは、半導体素子ペ
レットを内部に搭載するパッケージであって、リードフ
レームと一体にするとともに、内郭、該内郭の外周に内
郭より高く設けた外郭、及び内外郭間に該リードフレー
ムのリードが横断露出する外溝を有する熱可塑性樹脂製
プリモールド筐体と、外縁が筐体外溝側にはみ出すこと
なく筐体内郭に接してパッケージ内部を中空に形成する
蓋と、少くとも筺体外溝内をモールド充填するとともに
蓋を筐体に固着してパッケージ内部を気密に封止する熱
硬化性樹脂製モールド封止部とを具備することを特徴と
する。 さらの半導体パッケージの製造方法は、熱可塑
性樹脂製プリモールド筐体の内部中央に半導体素子ペレ
ットを搭載した後、筐体の内郭上部に蓋を配し、次いで
蓋を配した筐体を金型キャビティ内に装入して、筺体外
溝内及び該外溝上部を熱硬化性封止材でモールド封止部
を形成することを特徴とする。
That is, the semiconductor package of the present invention is a package in which a semiconductor element pellet is mounted inside, which is integrated with a lead frame, and has an inner shell, an outer shell provided on the outer periphery of the inner shell higher than the inner shell, and an inner and outer shell. A pre-molded casing made of thermoplastic resin having an outer groove between which the leads of the lead frame are exposed across; and a lid whose outer edge contacts the inner lining of the casing without protruding into the outer groove of the casing, forming a hollow interior of the package. The package is characterized by comprising a mold sealing part made of a thermosetting resin that fills at least the inside of the outer groove of the casing with a mold, and fixes the lid to the casing to airtightly seal the inside of the package. Furthermore, the manufacturing method for semiconductor packages is to mount a semiconductor element pellet in the center of a pre-molded thermoplastic resin housing, place a lid on the upper part of the inner wall of the housing, and then mold the housing with the lid on. It is characterized in that it is inserted into a mold cavity and a mold sealing portion is formed in the outer groove of the casing and the upper part of the outer groove with a thermosetting sealant.

本発明に用いるリードフレームとしては、42アロイ、
銅合金、又は銅張積層板を素材として用いたちのを挙げ
ることができる。
The lead frame used in the present invention includes 42 alloy,
Examples include those using copper alloy or copper-clad laminate as the material.

本発明に用いる熱可塑性樹脂としては、ポリブチレンテ
レフタレート、ポリフェニレンサルファイド、液晶ポリ
マー、ポリエーテルイミド、ポリアミド等が挙げられ、
これらは単独もしくは2種混合して使用することかでき
る。 この熱可塑性樹脂は筐体の樹脂部を形成するもの
で、通常射出成形によって形成する。
Examples of the thermoplastic resin used in the present invention include polybutylene terephthalate, polyphenylene sulfide, liquid crystal polymer, polyetherimide, polyamide, etc.
These can be used alone or in combination. This thermoplastic resin forms the resin part of the housing, and is usually formed by injection molding.

本発明の外溝に封入する熱硬化性封止材としては、エポ
キシ樹脂、ポリイミド樹脂等が挙げられ、これらは単独
もしくは2種以上混合して用いる。
Examples of the thermosetting sealing material to be filled in the outer groove of the present invention include epoxy resins and polyimide resins, and these may be used alone or in combination of two or more.

本発明に用いる内郭上の蓋としては、熱可塑性樹脂或い
は金属板、また透明なガラス板でもよく特に限定されな
い。 透明なガラス板等を用いる場合は撮像素子用の半
導体パッケージとして使用することができる。
The lid on the inner shell used in the present invention is not particularly limited and may be a thermoplastic resin or metal plate, or a transparent glass plate. When a transparent glass plate or the like is used, it can be used as a semiconductor package for an image sensor.

熱硬化性封止材で成形する場合に、パッケージの中空内
部に熱硬化性封止材が浸入するのを防止するために、蓋
と内郭との間を接着剤で固着させたり、弾性バッキング
を設けてもよい。 また熱硬化性樹脂封止材の成形は、
半導体素子を搭載し内郭上部に蓋をした後、パッケージ
を金型に挿入して射出成形、I・ランスファー成形、圧
縮成形等を行って成形する。
When molding with a thermosetting encapsulant, in order to prevent the thermosetting encapsulant from penetrating into the hollow interior of the package, adhesive may be used to bond the lid and inner shell, or an elastic backing may be used. may be provided. In addition, molding of thermosetting resin encapsulant is
After mounting the semiconductor element and putting a lid on the upper part of the inner shell, the package is inserted into a mold and molded by injection molding, I/transfer molding, compression molding, etc.

(作用) 内郭と外郭間に外溝を設け、熱硬化性封止材を封入した
ことによって、リードフレームと熱可塑性樹脂パッケー
ジとの密着性を向上させると共にリード端子側、内郭上
部蓋側からの湿気の浸入を防止し、半導体素子を保護す
ることかできる。
(Function) By providing an outer groove between the inner shell and the outer shell and sealing the thermosetting sealant, it improves the adhesion between the lead frame and the thermoplastic resin package, and also improves the adhesion between the lead terminal side and the inner shell upper lid side. It is possible to prevent the infiltration of moisture from the inside and protect the semiconductor elements.

また内溝と流止郭を設けたことによって、熱硬化性封止
材が流出しても流止郭で流出が防止されて内溝に留り、
半導体素子に悪影響を及ばずことがない。
In addition, by providing an inner groove and a flow stop, even if the thermosetting sealant flows out, the flow is prevented by the flow stop and remains in the inner groove.
There is no adverse effect on semiconductor elements.

(実施例) 次に本発明を図面を用いて説明する。(Example) Next, the present invention will be explained using the drawings.

第1図(a)は実施例のプリモールド筐体の正面図、第
1図(b )は第1図(a )のX−X線に沿う断面図
、第1図(C)は第1図(a )のYY線に沿う断面図
である。
FIG. 1(a) is a front view of the pre-molded casing of the example, FIG. 1(b) is a sectional view taken along the line X-X of FIG. 1(a), and FIG. It is a sectional view along the YY line of figure (a).

第1図において、筐体上は内郭2の外周に、内郭2より
高い外郭3と、内郭2の内周に内郭2より低い流止郭4
か設けである。 内郭2と外郭3との間には外溝6があ
り、正面図でリードフレーム5の直角方向における外溝
6は底部に開口してリードフレーム5が横断露出する部
分6aであり(第1図(b))、正面図でリードフレー
ム5の平行方向の外溝6は底部にまで開口させる必要の
ない部分6bである(第1図(C))。 また内郭2と
流止郭4との間には、内溝7か形成されている。 また
筐体1の中央はリードフレーム面まで凹状となって、素
子搭載部とリードのボンディング部が露出している。 
この筐体1は熱可塑性樹脂によってリードフレーム5か
一体に形成されている。
In Fig. 1, on the outer periphery of the inner shell 2, there is an outer shell 3 that is higher than the inner shell 2, and on the inner periphery of the inner shell 2 there is a flow stop shell 4 that is lower than the inner shell 2.
It is a provision. There is an outer groove 6 between the inner shell 2 and the outer shell 3, and the outer groove 6 in the direction perpendicular to the lead frame 5 in the front view is a portion 6a that opens at the bottom and exposes the lead frame 5 across (the first In FIG. 1B), the parallel outer groove 6 of the lead frame 5 in the front view is a portion 6b that does not need to be opened all the way to the bottom (FIG. 1C). Furthermore, an inner groove 7 is formed between the inner shell 2 and the stop shell 4. Furthermore, the center of the housing 1 is concave to the lead frame surface, exposing the element mounting portion and the bonding portion of the leads.
This housing 1 is integrally formed with a lead frame 5 made of thermoplastic resin.

次に第2図乃至第4図を用いて本発明の半導体パッケー
ジの製造工程を説明する。
Next, the manufacturing process of the semiconductor package of the present invention will be explained using FIGS. 2 to 4.

第2図(a )は構成体の1つである筐体に半導体素子
を搭載しワイヤーホンディングした状態を示した正面図
、第2図<b >は、第2図(a )のX−X線に沿う
断面図、第2図(C)は第2図(a>のY−Y線に沿う
断面図である。 第2図(a )ないし第2図(C)に
示したように筐体に半導体素子10を搭載し、リードフ
レーム5とボンデインクワイヤー11によって接続する
FIG. 2(a) is a front view showing a state in which a semiconductor element is mounted on a housing, which is one of the components, and wire bonded. FIG. 2(C) is a sectional view taken along the Y-Y line in FIG. 2(a). As shown in FIG. 2(a) to FIG. 2(C), A semiconductor element 10 is mounted on a casing and connected to a lead frame 5 by a bonding wire 11.

その後、第3図(a )ないし第3図(C)に示したよ
うに内郭2の上部にM13を設ける。 この藍は、プラ
スチック板や金属板、透明なカラス板でも良く、特に限
定されるものではない。 ガラス板やアクリル板等の透
明な蓋をすることによって撮像素子用の半導体パッケー
ジとすることができる。 内郭2と蓋13との間に接着
剤や弾性バッキングを用いて仮着し、外溝等に封入成形
される熱硬化性封止材の浸入を防止させることかできる
。 また、万一熱硬化性封止材が浸入したとしても内溝
7と流出部4によって浸入がとめられる。 内郭2に蓋
13をし、筐体を装入する金型14の断面図を第3図(
b)に−点鎖線で示した。
Thereafter, as shown in FIGS. 3(a) to 3(C), M13 is provided on the upper part of the inner shell 2. This indigo may be a plastic plate, a metal plate, or a transparent glass plate, and is not particularly limited. By covering it with a transparent lid such as a glass plate or acrylic plate, it can be used as a semiconductor package for an image sensor. It is possible to temporarily attach an adhesive or an elastic backing between the inner shell 2 and the lid 13 to prevent the thermosetting sealant molded into the outer groove from entering. Further, even if the thermosetting sealant should infiltrate, the inner groove 7 and the outflow portion 4 will prevent the infiltration. A sectional view of the mold 14 in which the inner shell 2 is covered with the lid 13 and the casing is inserted is shown in FIG.
In b) - is indicated by a dashed dotted line.

なお、15はスプルーである。 第4図(a )ないし
第4図(C)は本発明の半導体パッケージを示した正面
図および断面図である。 第3図(b)の状態で熱硬化
性封止材12をスプルー15からトランスファー成形し
て外溝を封入すると同時に外溝上部を熱硬化性封止材1
2で成形して諮13を完全に密封して、パッケージ内部
を中空にした半導体パッケージを製造することができる
Note that 15 is a sprue. FIGS. 4(a) to 4(c) are a front view and a sectional view showing a semiconductor package of the present invention. In the state shown in FIG. 3(b), the thermosetting sealant 12 is transfer-molded from the sprue 15 to seal the outer groove, and at the same time the upper part of the outer groove is covered with the thermosetting sealant 1.
It is possible to manufacture a semiconductor package in which the package 13 is completely sealed by molding in step 2, and the inside of the package is hollow.

[発明の効果] 以上の説明から明らかなように、本発明の半導体パッケ
ージは、熱可塑性樹脂の射出成形によって容易に成形加
工した特定構造のプリモード筐体をつくり、その外溝を
熱硬化性封止材で封止することによって、熱可塑性樹脂
およびリードフレームとの密着性を向上させたので、耐
湿性に優れ湿気等の浸入を防止して、半導体素子の損傷
をなくすことかでき、また加工性、生産性に優れている
ので、安価な信頼性の高い半導体パッケージを得ること
ができな。
[Effects of the Invention] As is clear from the above description, the semiconductor package of the present invention includes a pre-mode casing with a specific structure that is easily molded by injection molding of thermoplastic resin, and the outer groove of the pre-mode casing is sealed with thermosetting resin. By sealing with an encapsulant, we have improved the adhesion between the thermoplastic resin and the lead frame, so it has excellent moisture resistance and prevents moisture from entering, eliminating damage to the semiconductor element and making it easier to process. Because it has excellent performance and productivity, it is possible to obtain inexpensive and highly reliable semiconductor packages.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a )は本発明実施例における筐体の正面図、
第1図(b )は第1図<a )のX−X線に沿う断面
図、第1図(c )は第1図(a)のY−Y線に沿う断
面図、第2図ないし第4図は本発明の一実施例である半
導体パッケージの製造工程を示すもので各国の公国<a
 )は正面図、公国(b )及び(C)はそれぞれ分区
(a )のX−X線、YY線に沿う断面図、第5図及び
第6図は従来パッケージの断面図である。 1.23・・・筐体、 2・・・内郭、 3・・・外郭
、4・・・流止郭、 5.21・・・リードフレーム、
 6・・・外溝、 7・・・内溝、  10.20・・
・半導体素子、11・・・ボンディングワイヤー  1
.2.22・・・熱硬化性封止材、 13・・・蓋、 
 14・・・金型、15・・・スプルー 特許出願人 東芝ケミカル株式会社
FIG. 1(a) is a front view of the casing in the embodiment of the present invention;
Figure 1(b) is a sectional view taken along line X-X in Figure 1<a), Figure 1(c) is a sectional view taken along line Y-Y in Figure 1(a), Figure 4 shows the manufacturing process of a semiconductor package which is an embodiment of the present invention.
) is a front view, Principality (b) and (C) are cross-sectional views taken along line X-X and YY of division (a), respectively, and FIGS. 5 and 6 are cross-sectional views of the conventional package. 1.23... Housing, 2... Inner shell, 3... Outer shell, 4... Stop shell, 5.21... Lead frame,
6...Outer groove, 7...Inner groove, 10.20...
・Semiconductor element, 11...bonding wire 1
.. 2.22... Thermosetting sealant, 13... Lid,
14... Mold, 15... Sprue Patent applicant Toshiba Chemical Corporation

Claims (1)

【特許請求の範囲】 1半導体素子ペレットを内部に搭載するパッケージであ
って、リードフレームと一体にするとともに、内郭、該
内郭の外周に内郭より高く設けた外郭、及び内外郭間に
該リードフレームのリードが横断露出する外溝を有する
熱可塑性樹脂製プリモールド筺体と、外縁が筐体外溝側
にはみ出すことなく筺体内郭に接してパッケージ内部を
中空に形成する蓋と、少くとも筺体外溝内をモールド充
填するとともに蓋を筺体に固着してパッケージ内部を気
密に封止する熱硬化性樹脂製モールド封止部とを具備す
る半導体パッケージ。 2請求項1の半導体パッケージを製造するにあたり、熱
可塑性樹脂製プリモールド筐体の内部中央に半導体素子
ペレットを搭載した後、筺体の内郭上部に蓋を配し、次
いで蓋を配した筺体を金型キャビティ内に装入して、筺
体外溝内及び該外溝上部を熱硬化性封止材でモールド封
止部を形成することを特徴とする半導体パッケージの製
造方法。
[Scope of Claims] A package in which one semiconductor element pellet is mounted inside, which is integrated with a lead frame and includes an inner shell, an outer shell provided on the outer periphery of the inner shell higher than the inner shell, and between the inner and outer shells. A pre-molded housing made of thermoplastic resin having an outer groove through which the leads of the lead frame are exposed across; a lid whose outer edge contacts the inside of the housing without protruding into the outer groove of the housing to form a hollow interior of the package; A semiconductor package comprising a thermosetting resin mold sealing part that fills the outside groove of the housing with a mold and fixes a lid to the housing to airtightly seal the inside of the package. 2. In manufacturing the semiconductor package according to claim 1, after mounting a semiconductor element pellet in the center of the interior of a pre-molded thermoplastic resin housing, a lid is placed on the upper part of the inner wall of the housing, and then the housing with the lid is placed. 1. A method for manufacturing a semiconductor package, which comprises placing the package into a mold cavity and forming a mold sealing part in the outer groove of the housing and the upper part of the outer groove with a thermosetting sealant.
JP63221672A 1988-09-05 1988-09-05 Semiconductor package and manufacturing method thereof Expired - Lifetime JP2762418B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63221672A JP2762418B2 (en) 1988-09-05 1988-09-05 Semiconductor package and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63221672A JP2762418B2 (en) 1988-09-05 1988-09-05 Semiconductor package and manufacturing method thereof

Publications (2)

Publication Number Publication Date
JPH0269965A true JPH0269965A (en) 1990-03-08
JP2762418B2 JP2762418B2 (en) 1998-06-04

Family

ID=16770461

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63221672A Expired - Lifetime JP2762418B2 (en) 1988-09-05 1988-09-05 Semiconductor package and manufacturing method thereof

Country Status (1)

Country Link
JP (1) JP2762418B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025177396A1 (en) * 2024-02-20 2025-08-28 三菱電機株式会社 Semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025177396A1 (en) * 2024-02-20 2025-08-28 三菱電機株式会社 Semiconductor device

Also Published As

Publication number Publication date
JP2762418B2 (en) 1998-06-04

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