JPH0281482U

JPH0281482U -

Info

Publication number: JPH0281482U
Application number: JP16108288U
Authority: JP
Priority date: 1988-12-12
Filing date: 1988-12-12
Publication date: 1990-06-22

Description

[Brief explanation of drawings]

第１図は本考案の実施例を示す電気回路図、第
２図は、開放試験回路の要部の電圧、電流の状況
を示すオシログラム、第３図イはコンデンサ回路
投入時の、またロは本考案による投入試験回路投
入時の電圧、電流の状況を示すオシログラム、第
４図イはコンデンサ回路開放時の、またロは本考
案による開放試験回路開放時の電圧、電流の状況
を示すオシログラム、第５図は従来公知のコンデ
ンサ回路の開閉試験装置の電気回路図を示す。Ｃ_０，Ｃ_１，Ｃ_３……コンデンサ、Ｃ_２……電
圧波形調整用コンデンサ、Ｅ_０，Ｅ_１，Ｅ_２……
直流高電圧装置、Ｌ_０，Ｌ_１，Ｌ_３……電流調整
用リアクトル、ＤＳ_０，ＤＳ_１，ＤＳ_２……開閉
器、ＭＳ_１，ＭＳ_２……投入器、Ｓ……切換開閉
器、ＴＰ……供試開閉器、ＡＵＸ……補助開閉器
、ＴＣ_０ ……投入試験回路、ＴＣ_１ ……電流源回
路、ＴＣ_２ ……電圧源回路、ＴＣ……開放試験回
路。 Fig. 1 is an electric circuit diagram showing an embodiment of the present invention, Fig. 2 is an oscillogram showing the voltage and current conditions of the main parts of the open test circuit, and Fig. 3 A shows the state when the capacitor circuit is turned on and B. An oscillogram showing the voltage and current conditions when the test circuit according to the present invention is turned on; FIG. 4A shows the voltage and current conditions when the capacitor circuit is opened, and FIG. FIG. 5 shows an electrical circuit diagram of a conventionally known switching test device for capacitor circuits. C ₀ , C ₁ , C ₃ ... Capacitor, C ₂ ... Voltage waveform adjustment capacitor, E ₀ , E ₁ , E ₂ ...
DC high voltage device, L ₀ , L ₁ , L ₃ ... current adjustment reactor, DS ₀ , DS ₁ , DS ₂ ... switch, MS ₁ , MS ₂ ... closing device, S ... switching switch, TP... Test switch, AUX... Auxiliary switch, TC ₀ ... Closing test circuit, TC ₁ ... Current source circuit, TC ₂ ... Voltage source circuit, TC ... Open test circuit.

Claims

[Scope of utility model registration request]

A current source circuit consisting of a series connection of a capacitor charged by a DC high-voltage device, a current adjustment reactor, and a charger, a capacitor charged by a DC high-voltage device, a current adjustment reactor, and a test switch. An open circuit configured by connecting a voltage source circuit in which a voltage waveform adjustment capacitor is installed in parallel to a series circuit of a closing device that is closed in synchronization with the opening of the switch under test. a test circuit, a capacitor charged by a DC high voltage device;
A multiple circuit breaker for capacitor circuits includes a closing test circuit consisting of a current adjustment reactor connected in series to this, and a switching switch that switches and connects the switch under test to the open test circuit and the closing test circuit. Frequency switching test equipment.