JPH0283438U - - Google Patents
Info
- Publication number
- JPH0283438U JPH0283438U JP16412288U JP16412288U JPH0283438U JP H0283438 U JPH0283438 U JP H0283438U JP 16412288 U JP16412288 U JP 16412288U JP 16412288 U JP16412288 U JP 16412288U JP H0283438 U JPH0283438 U JP H0283438U
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- front side
- back side
- light sources
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims 3
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第１図は本考案の光弾性測定装置の一実施例の
説明図、第２図は他の実施例の説明図である。
３……被検査体、４，５……光源、４１，５１
……白熱電球、４２，５２……直線偏光板、４３
，５３，８３……四分の一波長板、７……切換え
装置、８……観察装置、８１……直線偏光板。
FIG. 1 is an explanatory diagram of one embodiment of the photoelasticity measuring device of the present invention, and FIG. 2 is an explanatory diagram of another embodiment. 3...Object to be inspected, 4,5...Light source, 41,51
... Incandescent light bulb, 42, 52 ... Linear polarizing plate, 43
, 53, 83... Quarter wavelength plate, 7... Switching device, 8... Observation device, 81... Linear polarizing plate.
Claims (1)
され上記被検査体に偏光系測定光を投射する複数
の光源と、これら光源のうち表側または裏側のい
ずれか一方の光源を選択的に作動させる切換え装
置とを具備し、上記被検査体から反射または透過
して来た上記測定光の光弾性効果による変化を観
察して上記被検査体内に存在する応力を測定する
ことを特徴とする光弾性測定装置。 A plurality of light sources arranged on the front side and the back side of a transparent object to be inspected and projecting polarized measurement light onto the object to be inspected, and a switch that selectively activates either the front side or the back side of these light sources. photoelasticity measurement, characterized in that the stress existing in the object to be inspected is measured by observing changes due to the photoelastic effect of the measurement light reflected or transmitted from the object to be inspected. Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16412288U JPH0628659Y2 (en) | 1988-12-19 | 1988-12-19 | Photoelasticity measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16412288U JPH0628659Y2 (en) | 1988-12-19 | 1988-12-19 | Photoelasticity measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0283438U true JPH0283438U (en) | 1990-06-28 |
| JPH0628659Y2 JPH0628659Y2 (en) | 1994-08-03 |
Family
ID=31449454
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16412288U Expired - Lifetime JPH0628659Y2 (en) | 1988-12-19 | 1988-12-19 | Photoelasticity measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0628659Y2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008051604A (en) * | 2006-08-23 | 2008-03-06 | Horiba Ltd | Sample analysis method, sample analyzer and program |
| JP2015515631A (en) * | 2012-04-23 | 2015-05-28 | サン−ゴバン グラス フランスＳａｉｎｔ−Ｇｏｂａｉｎ Ｇｌａｓｓ Ｆｒａｎｃｅ | Method and apparatus for measuring the bubble structure of prestressed glazing |
| WO2015186356A1 (en) * | 2014-06-03 | 2015-12-10 | Okinawa Institute Of Science And Technology School Corporation | System and method for obtaining force based on photoelasticity |
-
1988
- 1988-12-19 JP JP16412288U patent/JPH0628659Y2/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008051604A (en) * | 2006-08-23 | 2008-03-06 | Horiba Ltd | Sample analysis method, sample analyzer and program |
| JP2015515631A (en) * | 2012-04-23 | 2015-05-28 | サン−ゴバン グラス フランスＳａｉｎｔ−Ｇｏｂａｉｎ Ｇｌａｓｓ Ｆｒａｎｃｅ | Method and apparatus for measuring the bubble structure of prestressed glazing |
| WO2015186356A1 (en) * | 2014-06-03 | 2015-12-10 | Okinawa Institute Of Science And Technology School Corporation | System and method for obtaining force based on photoelasticity |
| JP2017517003A (en) * | 2014-06-03 | 2017-06-22 | 学校法人沖縄科学技術大学院大学学園 | System and method for acquiring force based on photoelasticity |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0628659Y2 (en) | 1994-08-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0628659Y2 (en) | Photoelasticity measuring device | |
| JPS63181905U (en) | ||
| JPS637305U (en) | ||
| JPH01180752U (en) | ||
| JPS63157607U (en) | ||
| JPS63155006U (en) | ||
| JPS63165561U (en) | ||
| JPS62140313U (en) | ||
| JPH01107905U (en) | ||
| JPH0243638U (en) | ||
| JPH0316017U (en) | ||
| JPS6314143U (en) | ||
| JPH0224368U (en) | ||
| JPS6465406A (en) | Interferometer for flatness measurement | |
| JPS63170706U (en) | ||
| JPH01142874U (en) | ||
| JPS6210611U (en) | ||
| JPH02128968U (en) | ||
| JPS6383645U (en) | ||
| GB1244337A (en) | Improvements in or relating to optical apparatus | |
| JPS61147961U (en) | ||
| JPH034222U (en) | ||
| JPH0365945U (en) | ||
| JPH02109237U (en) | ||
| JPH0250642U (en) |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |