JPH0285377U - - Google Patents

Info

Publication number
JPH0285377U
JPH0285377U JP16487688U JP16487688U JPH0285377U JP H0285377 U JPH0285377 U JP H0285377U JP 16487688 U JP16487688 U JP 16487688U JP 16487688 U JP16487688 U JP 16487688U JP H0285377 U JPH0285377 U JP H0285377U
Authority
JP
Japan
Prior art keywords
frequency
jig
signal input
view
probe card
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16487688U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16487688U priority Critical patent/JPH0285377U/ja
Publication of JPH0285377U publication Critical patent/JPH0285377U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例を示す縦断面図、第
2図は同平面図、第3図は同分解斜視図、第4図
aは従来例を示す縦断面図、bは同平面図である
。 1…高周波信号入・出力用プローブカード、2
…プローブ、3…ICのリード押え、4…金メツ
キパターン、5…セラミツク基板、6…基台、7
…測定するIC。
Fig. 1 is a longitudinal sectional view showing an embodiment of the present invention, Fig. 2 is a plan view thereof, Fig. 3 is an exploded perspective view of the same, Fig. 4 a is a longitudinal sectional view showing a conventional example, and Fig. 4 b is a plan view thereof. It is a diagram. 1...Probe card for high frequency signal input/output, 2
...probe, 3...IC lead holder, 4...gold plating pattern, 5...ceramic substrate, 6...base, 7
...IC to be measured.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 高周波ICの特性評価用治具において、高周波
信号の入・出力部にプローブカード構造を有する
ことを特徴とする高周波IC測定治具。
A high-frequency IC measurement jig, which is a high-frequency IC characteristic evaluation jig, characterized in that it has a probe card structure at the high-frequency signal input/output section.
JP16487688U 1988-12-20 1988-12-20 Pending JPH0285377U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16487688U JPH0285377U (en) 1988-12-20 1988-12-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16487688U JPH0285377U (en) 1988-12-20 1988-12-20

Publications (1)

Publication Number Publication Date
JPH0285377U true JPH0285377U (en) 1990-07-04

Family

ID=31450857

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16487688U Pending JPH0285377U (en) 1988-12-20 1988-12-20

Country Status (1)

Country Link
JP (1) JPH0285377U (en)

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