JPH0288143U - - Google Patents
Info
- Publication number
- JPH0288143U JPH0288143U JP16801088U JP16801088U JPH0288143U JP H0288143 U JPH0288143 U JP H0288143U JP 16801088 U JP16801088 U JP 16801088U JP 16801088 U JP16801088 U JP 16801088U JP H0288143 U JPH0288143 U JP H0288143U
- Authority
- JP
- Japan
- Prior art keywords
- laser beam
- moving coil
- light emitting
- parallelizes
- converges
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 claims description 3
- 238000006073 displacement reaction Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Description
第１図は本考案の実施例１を示す構成図、第２
図は本考案の実施例２を示す構成図、第３図は従
来の半導体発光素子の光学特性装置を示す構成図
である。
１……半導体レーザ、２……レーザ電源、３…
…３軸ステージ、４……コリメートレンズ、５…
…収束レンズ、６……ムービングコイルａ、７…
…ナイフエツジ、８……ムービングコイルｂ、９
……光電気変換部、１０……制御処理装置、１１
……ハーフミラー、１２……固定プリズム、１３
……可変プリズム、１４……ムービングコイル。
Fig. 1 is a configuration diagram showing the first embodiment of the present invention;
This figure is a block diagram showing a second embodiment of the present invention, and FIG. 3 is a block diagram showing a conventional optical characteristic device for a semiconductor light emitting device. 1... Semiconductor laser, 2... Laser power supply, 3...
...3-axis stage, 4...collimating lens, 5...
...Convergent lens, 6...Moving coil a, 7...
...Knife edge, 8...Moving coil b, 9
...Photoelectric conversion unit, 10...Control processing device, 11
... Half mirror, 12 ... Fixed prism, 13
...Variable prism, 14...Moving coil.
Claims (1)
部と、レーザビームを平行にするコリメートレン
ズ部と、コリメートされたレーザビームを収束さ
せ収束点を駆動電流対変位量がリニアなムービン
グコイルにて可変する可動部と、光電気変換を行
う変換部と、前記各部を全体的に制御および信号
処理をする制御処理装置とを有することを特徴と
する半導体発光素子の光学特性装置。 A stage unit that aligns the optical axis of the semiconductor laser to be measured, a collimating lens unit that parallelizes the laser beam, and a moving coil that converges the collimated laser beam and changes the convergence point with a linear drive current vs. displacement amount. 1. An optical characteristic device for a semiconductor light emitting device, comprising a movable part, a conversion part that performs photoelectric conversion, and a control processing device that generally controls each of the parts and performs signal processing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16801088U JPH0288143U (en) | 1988-12-26 | 1988-12-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16801088U JPH0288143U (en) | 1988-12-26 | 1988-12-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0288143U true JPH0288143U (en) | 1990-07-12 |
Family
ID=31456816
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16801088U Pending JPH0288143U (en) | 1988-12-26 | 1988-12-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0288143U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022090835A (en) * | 2020-12-08 | 2022-06-20 | アンリツ株式会社 | Waveform observation device and waveform observation method |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5883339A (en) * | 1981-11-10 | 1983-05-19 | Teac Co | Recording or reproducing system |
| JPS59143933A (en) * | 1983-02-07 | 1984-08-17 | Pioneer Electronic Corp | Characteristic measuring device for semiconductor laser |
| JPS59163525A (en) * | 1983-03-08 | 1984-09-14 | Japan Spectroscopic Co | Movable mirror driving device of continuous driving type michelson's interferometer |
| JPS5945738B2 (en) * | 1981-04-18 | 1984-11-08 | 新日本製鐵株式会社 | Pre-treatment method for sintering raw materials |
| JPS6035243B2 (en) * | 1977-11-07 | 1985-08-13 | 富士写真フイルム株式会社 | Super calendar device |
| JPS62175640A (en) * | 1986-01-29 | 1987-08-01 | Sharp Corp | Spectral distribution measuring apparatus for light emitting element |
-
1988
- 1988-12-26 JP JP16801088U patent/JPH0288143U/ja active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6035243B2 (en) * | 1977-11-07 | 1985-08-13 | 富士写真フイルム株式会社 | Super calendar device |
| JPS5945738B2 (en) * | 1981-04-18 | 1984-11-08 | 新日本製鐵株式会社 | Pre-treatment method for sintering raw materials |
| JPS5883339A (en) * | 1981-11-10 | 1983-05-19 | Teac Co | Recording or reproducing system |
| JPS59143933A (en) * | 1983-02-07 | 1984-08-17 | Pioneer Electronic Corp | Characteristic measuring device for semiconductor laser |
| JPS59163525A (en) * | 1983-03-08 | 1984-09-14 | Japan Spectroscopic Co | Movable mirror driving device of continuous driving type michelson's interferometer |
| JPS62175640A (en) * | 1986-01-29 | 1987-08-01 | Sharp Corp | Spectral distribution measuring apparatus for light emitting element |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022090835A (en) * | 2020-12-08 | 2022-06-20 | アンリツ株式会社 | Waveform observation device and waveform observation method |