JPH0295236U - - Google Patents

Info

Publication number
JPH0295236U
JPH0295236U JP341789U JP341789U JPH0295236U JP H0295236 U JPH0295236 U JP H0295236U JP 341789 U JP341789 U JP 341789U JP 341789 U JP341789 U JP 341789U JP H0295236 U JPH0295236 U JP H0295236U
Authority
JP
Japan
Prior art keywords
wiring pattern
insulating film
semiconductor device
recess
sectional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP341789U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP341789U priority Critical patent/JPH0295236U/ja
Publication of JPH0295236U publication Critical patent/JPH0295236U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図イ,ロはそれぞれこの考案の一実施例の
半導体装置を示す部分断面図及びそのA―A線断
面図、第2図イ,ロ、第3図イ,ロはそれぞれ、
第1図イ,ロの半導体装置の製造工程別の部分断
面図及びそのA―A線断面図である。第4図イ,
ロはそれぞれ従来の半導体装置を示す部分断面図
及びそのA―A線断面図、第5図イ,ロ、第6図
イ,ロはそれぞれ第4図イ,ロの半導体装置の製
造工程別の部分断面図及びそのA―A線断面図で
ある。 1…半導体基板、2…絶縁膜、3…配線パター
ン、4…凹用絶縁膜、5…パツシベーシヨン用絶
縁膜、7…窓孔、8…配線パターン段差、9…凹
所。
FIGS. 1A and 1B are a partial cross-sectional view and a sectional view taken along line A--A of the semiconductor device according to an embodiment of this invention, FIGS.
1A and 1B are partial cross-sectional views of each manufacturing process of the semiconductor device of FIGS. Figure 4 A,
B is a partial cross-sectional view and a cross-sectional view taken along the line A-A of the conventional semiconductor device, respectively; FIGS. 5A and B, and FIGS. FIG. 2 is a partial cross-sectional view and a cross-sectional view taken along line AA of the same. DESCRIPTION OF SYMBOLS 1... Semiconductor substrate, 2... Insulating film, 3... Wiring pattern, 4... Insulating film for recess, 5... Insulating film for passivation, 7... Window hole, 8... Wiring pattern step, 9... Recess.

Claims (1)

【実用新案登録請求の範囲】 半導体基板上の絶縁膜上に配線パターンが形成
された半導体装置において、 前記絶縁膜に配線パターンと同一パターンで凹
所を形成し、この凹所に配線パターンを埋め込ま
せたことを特徴とする半導体装置。
[Claims for Utility Model Registration] In a semiconductor device in which a wiring pattern is formed on an insulating film on a semiconductor substrate, a recess is formed in the insulating film in the same pattern as the wiring pattern, and the wiring pattern is embedded in the recess. A semiconductor device characterized by:
JP341789U 1989-01-13 1989-01-13 Pending JPH0295236U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP341789U JPH0295236U (en) 1989-01-13 1989-01-13

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP341789U JPH0295236U (en) 1989-01-13 1989-01-13

Publications (1)

Publication Number Publication Date
JPH0295236U true JPH0295236U (en) 1990-07-30

Family

ID=31205035

Family Applications (1)

Application Number Title Priority Date Filing Date
JP341789U Pending JPH0295236U (en) 1989-01-13 1989-01-13

Country Status (1)

Country Link
JP (1) JPH0295236U (en)

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