JPH03106684U - - Google Patents
Info
- Publication number
- JPH03106684U JPH03106684U JP1628390U JP1628390U JPH03106684U JP H03106684 U JPH03106684 U JP H03106684U JP 1628390 U JP1628390 U JP 1628390U JP 1628390 U JP1628390 U JP 1628390U JP H03106684 U JPH03106684 U JP H03106684U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- socket
- contacts
- integrated circuit
- semiconductor integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Connecting Device With Holders (AREA)
Description
第１図は本考案による一実施例を示すＩＣソケ
ツトの断面図、第２図は第１図の絶縁基体の一部
を拡大して示した部分拡大断面図、第３図及び第
４図は第１図示すＩＣソケツトに二種類のコンタ
クトプローブピンが挿入された状態を示す部分拡
大断面図、第５図及び第６図は第３図及び第４図
で示すコンタクトプローブピンをもつＩＣソケツ
トによる治具を示した断面図、第７図は従来に於
けるＩＣソケツトの一例を示す断面図、第８図及
び第９図は第７図のＩＣソケツトで構成される電
気的特性試験用治具を示す断面図である。
１……ＩＣソケツト、２……押さえ板、３……
絶縁基体、４……接触子、５……接触子縁端、６
……シヤフト、７……ストツパ、８……固定ぬじ
孔、９……ＩＣ、１０……ピンソケツト、１１…
…コンタンクトプローブピン、１２……固定ピン
、１３……テスト基板、１４……固定ぬじ、１５
……高さ調整基体、１６……接触パツド、１７…
…コンタクトプローブ座、１８……配線ランド、
１９……はんだ付けの箇所、２０……配線材、２
１……ＩＣソケツト取付孔、２２……コンタクト
プローブ孔、２３……クランド。
Fig. 1 is a sectional view of an IC socket showing an embodiment of the present invention, Fig. 2 is a partially enlarged sectional view showing a part of the insulating substrate in Fig. 1, and Figs. 3 and 4 are Fig. 1 is a partially enlarged sectional view showing two types of contact probe pins inserted into the IC socket shown in Fig. 1, and Figs. 5 and 6 show the IC socket with the contact probe pins shown in Figs. 3 and 4. 7 is a sectional view showing an example of a conventional IC socket, and FIGS. 8 and 9 are electrical characteristic test jigs constructed of the IC socket shown in FIG. 7. FIG. 1...IC socket, 2...pressing plate, 3...
Insulating base, 4... Contact, 5... Contact edge, 6
...Shaft, 7...Stopper, 8...Fixing screw hole, 9...IC, 10...Pin socket, 11...
... Contact probe pin, 12 ... Fixing pin, 13 ... Test board, 14 ... Fixing screw, 15
...Height adjustment base, 16...Contact pad, 17...
...Contact probe seat, 18...Wiring land,
19... Soldering location, 20... Wiring material, 2
1...IC socket mounting hole, 22...contact probe hole, 23...clamp.
Claims (1)
ともに絶縁基板に埋設された接触子と、この接触
子に埋設側の接触子延端に接触するとともにこの
接触子延端に通ずる穴に固定されるか、あるいは
挿入されるコンタクトプローブピンとを有するこ
とを特徴とする半導体集積回路装置のソケツト。 A contact that contacts an external lead of a semiconductor integrated circuit device and is embedded in an insulating substrate; and a contact that contacts an extended end of the contact buried in the contact and is fixed in a hole that communicates with the extended end of the contact; Alternatively, a socket for a semiconductor integrated circuit device, characterized in that it has a contact probe pin to be inserted.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1628390U JPH03106684U (en) | 1990-02-20 | 1990-02-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1628390U JPH03106684U (en) | 1990-02-20 | 1990-02-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03106684U true JPH03106684U (en) | 1991-11-05 |
Family
ID=31519557
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1628390U Pending JPH03106684U (en) | 1990-02-20 | 1990-02-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03106684U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002075570A (en) * | 2000-08-28 | 2002-03-15 | Nec Kyushu Ltd | Ic socket |
-
1990
- 1990-02-20 JP JP1628390U patent/JPH03106684U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002075570A (en) * | 2000-08-28 | 2002-03-15 | Nec Kyushu Ltd | Ic socket |
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