JPH03110353U - - Google Patents

Info

Publication number
JPH03110353U
JPH03110353U JP1920590U JP1920590U JPH03110353U JP H03110353 U JPH03110353 U JP H03110353U JP 1920590 U JP1920590 U JP 1920590U JP 1920590 U JP1920590 U JP 1920590U JP H03110353 U JPH03110353 U JP H03110353U
Authority
JP
Japan
Prior art keywords
data
signal
timing
data sampling
timing signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1920590U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1920590U priority Critical patent/JPH03110353U/ja
Publication of JPH03110353U publication Critical patent/JPH03110353U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例を示す全体構成図、
第2図はマイクロコンピユータのプログラムの一
例を示すフローチヤート、第3図aは実施例のデ
ータサンプリング装置により得られる設定信号と
検出信号のデータを、bは従来の装置により得ら
れた設定信号と検出信号のデータをそれぞれ示す
図、第4図は従来の計測装置の概要を説明する構
成図である。 10……試験機本体、12……ロードセル、1
3……差動トランス、21……制御回路(マイク
ロコンピユータ)、22……試験条件入力部、2
3……波形発生回路、24……加算器、25……
サーボアンプ、26,27……増幅器、28……
A/D変換器、29……タイミング信号発生回路
、30……遅延回路、31……レコーダ。
FIG. 1 is an overall configuration diagram showing an embodiment of the present invention;
Fig. 2 is a flowchart showing an example of a microcomputer program, Fig. 3a shows the setting signal and detection signal data obtained by the data sampling device of the embodiment, and b shows the setting signal and detection signal data obtained by the conventional device. FIG. 4 is a block diagram illustrating the outline of a conventional measuring device. 10...Testing machine body, 12...Load cell, 1
3...Differential transformer, 21...Control circuit (microcomputer), 22...Test condition input section, 2
3... Waveform generation circuit, 24... Adder, 25...
Servo amplifier, 26, 27...Amplifier, 28...
A/D converter, 29... timing signal generation circuit, 30... delay circuit, 31... recorder.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 負荷手段により負荷される供試体の変形に伴う
物理量を検出する検出手段と、供試体を負荷する
ためのパターンを定める設定信号を発生する設定
信号発生手段と、検出された信号が前記設定信号
になるように前記負荷手段を制御する制御手段と
、タイミング信号が入力するタイミングで前記検
出信号からデータをサンプリングするデータサン
プリング手段とを備えた材料試験機のデータサン
プリング装置において、前記物理量のデータを採
取する前に前記タイミング信号に同期させてサン
プリングした前記設定信号と検出信号との位相差
を算出する位相差算出手段と、前記タイミング信
号のタイミングを前記位相差分だけ遅延させる遅
延手段とを備え、前記データサンプリング手段は
、遅延されたタイミング信号に同期させて前記物
理量のデータを採取するようにしたことを特徴と
する材料試験機のデータサンプリング装置。
a detection means for detecting a physical quantity accompanying deformation of the specimen loaded by the loading means; a setting signal generating means for generating a setting signal defining a pattern for loading the specimen; In a data sampling device of a materials testing machine, the data of the physical quantity is collected, the data sampling device of the material testing machine comprising a control means for controlling the load means so that the load means is input, and a data sampling means for sampling data from the detection signal at a timing when a timing signal is input. a phase difference calculating means for calculating a phase difference between the setting signal and the detection signal sampled in synchronization with the timing signal before the timing signal; and a delay means for delaying the timing of the timing signal by the phase difference; A data sampling device for a material testing machine, wherein the data sampling means collects data of the physical quantity in synchronization with a delayed timing signal.
JP1920590U 1990-02-27 1990-02-27 Pending JPH03110353U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1920590U JPH03110353U (en) 1990-02-27 1990-02-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1920590U JPH03110353U (en) 1990-02-27 1990-02-27

Publications (1)

Publication Number Publication Date
JPH03110353U true JPH03110353U (en) 1991-11-12

Family

ID=31522339

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1920590U Pending JPH03110353U (en) 1990-02-27 1990-02-27

Country Status (1)

Country Link
JP (1) JPH03110353U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017145255A1 (en) * 2016-02-23 2017-08-31 株式会社島津製作所 Synchronization circuit for material tester and material tester
WO2020026363A1 (en) * 2018-07-31 2020-02-06 株式会社島津製作所 Material testing machine

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017145255A1 (en) * 2016-02-23 2017-08-31 株式会社島津製作所 Synchronization circuit for material tester and material tester
JPWO2017145255A1 (en) * 2016-02-23 2018-07-19 株式会社島津製作所 Synchronous circuit and material testing machine for material testing machine
US10866174B2 (en) 2016-02-23 2020-12-15 Shimadzu Corporation Synchronization circuit for material tester and material tester
WO2020026363A1 (en) * 2018-07-31 2020-02-06 株式会社島津製作所 Material testing machine
JPWO2020026363A1 (en) * 2018-07-31 2021-07-01 株式会社島津製作所 Material tester

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