JPH03138510A - Flatness measuring instrument for plane - Google Patents

Flatness measuring instrument for plane

Info

Publication number
JPH03138510A
JPH03138510A JP27596989A JP27596989A JPH03138510A JP H03138510 A JPH03138510 A JP H03138510A JP 27596989 A JP27596989 A JP 27596989A JP 27596989 A JP27596989 A JP 27596989A JP H03138510 A JPH03138510 A JP H03138510A
Authority
JP
Japan
Prior art keywords
flatness
measured
measurement
turntable
displacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP27596989A
Other languages
Japanese (ja)
Other versions
JPH0797029B2 (en
Inventor
Shigeru Mori
茂 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissan Motor Co Ltd
Original Assignee
Nissan Motor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissan Motor Co Ltd filed Critical Nissan Motor Co Ltd
Priority to JP1275969A priority Critical patent/JPH0797029B2/en
Publication of JPH03138510A publication Critical patent/JPH03138510A/en
Publication of JPH0797029B2 publication Critical patent/JPH0797029B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To measure the flatness of the plane by measuring displacement data at a specific measurement point on the measured surface by a displacement sensor while the measurement point is confirmed by a position detecting means, and operating the flatness from the difference between maximum displacement and minimum displacement in the entire area. CONSTITUTION:A body 1 to be measured is mounted on a turntable 11 through an adapter 14 and then the swivel arm 21 of a moving means 20 is turned and so fixed that the displacement sensor 23 faces the measured surface 2 of the object body 1. Then while the turntable 11 is rotated, the sensor 23 and a position detecting means 32 detect each position gap size of one circumference of the object 1 to be measured and input a detection signal to an arithmetic means 25. Then the means 20 is driven after one-circumference measurement to move the sensor 23 in a radius direction by a specific pitch, the table 11 is rotated, and the gap size of next one circumference is measured to input its data to the means 25. This operation is repeated to input gap sizes in the entire area from the outermost periphery of the innermost periphery of the measured surface 2 to the means 25, thereby calculating the flatness of the object to be measured.

Description

【発明の詳細な説明】 「発明の目的」 (産業上の利用分野) 本発明は、被測定物の平面の\11面度を正確かつ信頼
性高く測定し得る測定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION OBJECTS OF THE INVENTION (Industrial Field of Application) The present invention relates to a measuring device that can accurately and reliably measure the \11 surface degree of a flat surface of an object to be measured.

(従来の技術) 例えば、自動車の動力伝達装置などに用いられるハイポ
イドギヤは、高負荷にて使用されるのでその加工に際し
ては十分な仕1−り精度をもって正確に加工されること
が必要である。また、この/%イボイドギヤは、その背
面において他の部品と組み付けた状態で使用されるので
、特に背面の平面度の確保が信頼性向−1−のために必
要である。
(Prior Art) For example, hypoid gears used in automobile power transmission systems and the like are used under high loads, so it is necessary to process them accurately with sufficient finishing precision. Further, since this /% void gear is used in a state where it is assembled with other parts on its back surface, it is especially necessary to ensure the flatness of the back surface in order to improve reliability.

この平面度を測定する方法としては、ハイポイドギヤを
加工した後に、背面の当り面が凸部を呈するような3位
置を選定し、ついでこの3位置の高さを同一平面上に設
置した後に、凹部の寸法を測定する。そして、凸部の最
高値と凹部の最低値の差を平面度(μm)としている。
To measure this flatness, after machining the hypoid gear, select three positions where the contact surface on the back surface exhibits a convex part, then install the three positions on the same plane, and then Measure the dimensions of. The difference between the highest value of the convex portion and the lowest value of the concave portion is defined as the flatness (μm).

第11図〜第13図は、従来のハイポイドギヤ背面の゛
14面度測定方法およびその測定装置の一例を示す構成
図である。
FIGS. 11 to 13 are configuration diagrams showing an example of a conventional method and apparatus for measuring the 14-sidedness of the back surface of a hypoid gear.

まず、第11図に示すように、ハイポイドギヤ1の背面
2に光明丹を塗布した後、ハイポイドギヤ1の背面2と
定盤3とを摺合わせ、背面2のうち最も突出した3点を
選定する。ここで、ハイポイドギヤ1の背面2と定盤3
とを摺合わせた結果、第12図に示すように、背面2の
うち最も突出した3点は、金属間相互の直接接触となっ
て金属面4が露出することから、測定者は3つの凸部5
を選定することができる。
First, as shown in FIG. 11, after applying Komeitan to the back surface 2 of the hypoid gear 1, the back surface 2 of the hypoid gear 1 and the surface plate 3 are slid together, and the three most protruding points on the back surface 2 are selected. Here, the back side 2 of the hypoid gear 1 and the surface plate 3
As a result, as shown in FIG. 12, the three most protruding points on the back surface 2 are in direct contact between the metals and the metal surface 4 is exposed. Part 5
can be selected.

ついで、第13図に示すように、ハイポイドギヤ1を定
盤上にジヤツキを介して設置された補助定盤7」−に設
置し、ハイドゲージ9に取付けたダイヤルゲージ8を用
いて凸部5の3位置における高さが同一となるように3
つのジヤツキ6を調整する。そしてこの状態で、背面を
ダイヤルゲージにより走査して、最も低い四部の深さを
測定し、背面2の平面度を計算により決定する。
Next, as shown in FIG. 13, the hypoid gear 1 is placed on an auxiliary surface plate 7'' installed on the surface plate via jacks, and the protrusion 5 is measured using the dial gauge 8 attached to the hide gauge 9. 3 so that the heights at the 3 positions are the same
Adjust the two jacks 6. In this state, the back surface is scanned with a dial gauge to measure the depth of the four lowest parts, and the flatness of the back surface 2 is determined by calculation.

(発明が解決しようとする課題) しかしながら、従来の平面度測定においては、3つの凸
部を選定することにより平面度が決定されるが、この3
位置の正確な位置は、測定者の個人差により誤差を発生
されるなど不確定要素があり、数十μmの精度を要する
平面度測定においては好ましくない。
(Problem to be Solved by the Invention) However, in conventional flatness measurement, flatness is determined by selecting three convex portions;
The exact position has uncertainties such as errors caused by individual differences among the measurers, which is not preferable in flatness measurement which requires an accuracy of several tens of μm.

また、ハイポイドギヤの摺合わせなどの事前作業および
平面度測定のために多くの測定時間を要する。
Further, a lot of measurement time is required for preliminary work such as sliding alignment of hypoid gears and flatness measurement.

本発明は、上述した従来の技術に伴なう種々の欠点、問
題点を解決し、平面のτββ変度正確かつ信頼性高く測
定することができる〜+i面測定装置を提供することを
目的とすることにある。
An object of the present invention is to solve the various drawbacks and problems associated with the above-mentioned conventional techniques and to provide a +i-plane measuring device that can accurately and reliably measure the τββ variation of a plane. It's about doing.

[発明の構成コ (課題を解決するための手段) 」二記目的を達成するための本発明は、略円形状の測定
面を有する被測定物を搭載して回転させるターンテーブ
ルと、該ターンテーブルの回転位置を検出する位置検出
手段と、ターンテーブルに搭載された被測定物の測定面
に対向すると共に測定面との間隙寸法を検出する変位セ
ンサと、前記変位センサを測定面の半径方向に移動させ
るための移動手段と、前記測定面の平面度を演算する演
算手段とを備え、 前記演算手段は、前記変位センサと前記位置検出手段と
の検出信号により、前記測定面上の円周方向の3等分領
域における最も突出した位置の変位が互いに等しくなる
ように仮想基準面を決定して平面度の演算処理を行うこ
とを特徴とする平面の平面度測定装置である。
[Structure of the Invention (Means for Solving the Problems)] To achieve the second object, the present invention provides a turntable for mounting and rotating an object to be measured having a substantially circular measurement surface; a position detection means for detecting the rotational position of the table; a displacement sensor that faces the measurement surface of the object mounted on the turntable and detects the gap between the measurement surface; a moving means for moving the flatness of the measurement surface; and a calculation means for calculating the flatness of the measurement surface; This flatness measuring device is characterized in that a virtual reference plane is determined and flatness calculation processing is performed so that the displacements of the most protruding positions in three equal regions in a direction are equal to each other.

(作用) このように構成した本発明にあっては、測定面の所定の
測定点における変位データを位置検出手段により測定点
を確認しながら変位センサにて測定し、このデータを演
算手段に格納し、次に測定面の円周方向の3等分領域に
おける最も突出した位置の変位を等しくすべく、変位デ
ー・夕を同次変換により回転移動して仮想基準面を決定
する演算処理を行なう。そして、全域における最高変位
および最低変位の差から平面度を演算する。
(Function) In the present invention configured as described above, displacement data at a predetermined measurement point on the measurement surface is measured by the displacement sensor while confirming the measurement point by the position detection means, and this data is stored in the calculation means. Then, in order to equalize the displacement of the most protruding position in three equal areas in the circumferential direction of the measurement surface, arithmetic processing is performed to determine a virtual reference plane by rotationally moving the displacement data by homogeneous transformation. . Then, flatness is calculated from the difference between the highest displacement and the lowest displacement in the entire area.

(実施例) 以下、図面を参照して本発明の一実施例を説明する。(Example) Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

第1図は、本発明の一実施例に係る・ト面度測定装置の
全体を示す構成図、第2図は、第1図の■■線に沿う断
面図、第3図は、同実施例の操作手順を示すフローチャ
ート、第4〜7図は同実施例の演算原理を説明する概念
図、第8図(A) (B)は、アダプタの変形例を示す
断面図、第9図および第10図は、本発明の他の応用例
を示す平面および断面図である。
Fig. 1 is a block diagram showing the entire structure of a surface roughness measuring device according to an embodiment of the present invention, Fig. 2 is a cross-sectional view taken along the line Flowchart showing the operating procedure of the example, Figures 4 to 7 are conceptual diagrams explaining the calculation principle of the example, Figures 8 (A) and (B) are cross-sectional views showing modifications of the adapter, Figures 9 and FIG. 10 is a plan view and a sectional view showing another example of application of the present invention.

第1〜2図に示すように、本実施例の平面度測定装置1
0は、被測定物であるハイポイドギヤ1の背面2を測定
面として、当該被測定物1を所定の速度にて回転させる
ターンテーブル11をGしている。このハイポイドギヤ
1は、ターンテーブル11上面に突出形成された凸部1
1aにアダプタ14の通孔14aを嵌合し、さらにアダ
プター4をハイポイドギヤ1の凹部1aに嵌合すること
により、ハイポイドギヤ1とターンテーブル11とが同
心円となるようにターンテーブルに面に設置される。こ
こで、測定しようとするノ1イポイドギヤ1の形状、特
に四部1aの形状が複数種類ある場合には、第8図(A
)(B)に示すように、アダプタ14の形状を各ハイポ
イドギヤ1の形状に対応するように形成し、一方、これ
ら各アダプタ]4の通孔形状をターンテーブル11の凸
部形状に対応した形状に形成することにより、1、す用
アダプタを設けるだけで種々の/Sイボイドギヤを一つ
のターンテーブルで測定することが可能となる。
As shown in FIGS. 1 and 2, the flatness measuring device 1 of this embodiment
0 indicates a turntable 11 that rotates the object to be measured 1 at a predetermined speed, with the back surface 2 of the hypoid gear 1 being the object to be measured as the measurement surface. This hypoid gear 1 has a convex portion 1 formed protrudingly on the upper surface of the turntable 11.
1a into the through hole 14a of the adapter 14, and further fit the adapter 4 into the recess 1a of the hypoid gear 1, so that the hypoid gear 1 and the turntable 11 are installed on the surface of the turntable so that they form concentric circles. . Here, if there are multiple shapes of the ipoid gear 1 to be measured, especially the shapes of the four parts 1a,
) As shown in (B), the shape of the adapter 14 is formed to correspond to the shape of each hypoid gear 1, and on the other hand, the shape of the through hole of each of these adapters]4 is formed to a shape corresponding to the shape of the convex part of the turntable 11. By forming it in the following manner, it becomes possible to measure various /S void gears with one turntable by simply providing an adapter.

第8図(A)(B)に示す二つの71イボイドギヤ1は
、それぞれ四部1aの形状が異なっているが、アダプタ
14の段部14bの形状をこれら四部1aの形状にそれ
ぞれ対応して形成しており、また、アダプタ14の通孔
14aはターンテーブル1]の凸部11aの形状に対応
していることから、−方のハイポイドギヤの測定を終了
した後に、他方のハイポイドギヤの測定を行う場合には
、アダプタ14を取り替えるだけでハイポイドギヤの測
定を行うことができる。
The two 71 wart gears 1 shown in FIGS. 8(A) and 8(B) each have different shapes of the four parts 1a, but the shapes of the step parts 14b of the adapter 14 are formed to correspond to the shapes of these four parts 1a. In addition, since the through hole 14a of the adapter 14 corresponds to the shape of the protrusion 11a of the turntable 1], when measuring the other hypoid gear after completing the measurement of the - hypoid gear, The hypoid gear can be measured simply by replacing the adapter 14.

ハイポイドギヤ1の測定面2との間隙寸法Gを高精度に
て検出する変位センサ23は、移動手段20のアームに
取り付けられた状態で、測定面2に対向して設けられて
いる。移動手段20は、支軸24の回りに旋回する旋回
アーム21と、この旋回アーム21に対して直交すると
ともに旋回アーム21に沿って直線移動する横アーム2
2を白゛し、横アーム22の端部に前記変位センサ23
が固定されている。旋回アーム21は、被測定物1をタ
ーンテーブル111−に設置する際に旋回して、変位セ
ンサ23と被/11す宝物1とが干渉しないようになっ
ており、測定時には、変位センサ23が測定面2に対向
する位置まで移動して固定される。
A displacement sensor 23 that detects the gap G between the hypoid gear 1 and the measurement surface 2 with high precision is provided opposite to the measurement surface 2 while being attached to the arm of the moving means 20 . The moving means 20 includes a pivot arm 21 that pivots around a support shaft 24 and a horizontal arm 2 that is orthogonal to the pivot arm 21 and moves linearly along the pivot arm 21.
2 is shown in white, and the displacement sensor 23 is attached to the end of the horizontal arm 22.
is fixed. The rotating arm 21 rotates when the object 1 to be measured is placed on the turntable 111-, so that the displacement sensor 23 and the treasure 1 to be measured do not interfere with each other. It is moved to a position facing the measurement surface 2 and fixed.

横アーム22は、サーボモータ30等によりボールネジ
31等を介して旋回アーム21」二を往復移動するが、
測定時には、ターンテーブル11の回転状態と関連して
所定ピッチづつ移動するように図示しない制御手段から
指令信−J・が送信されるようになっている。また、こ
の変位センサ23のハイポイドギヤ1の測定面2に対す
る現在位置を把握するために、ターンテーブル11およ
び移動手段20の移動量は、位置検出手段32により検
出されるようになっており、この検出信−じ・は演算手
段25の記憶部に変位センサ23による間隙・」°法の
測定データと対応した状態で格納される。
The horizontal arm 22 reciprocates around the swing arm 21'' by a servo motor 30 or the like via a ball screw 31 or the like.
During measurement, a command signal -J is transmitted from a control means (not shown) to move the turntable 11 by a predetermined pitch in relation to the rotational state of the turntable 11. In addition, in order to grasp the current position of the displacement sensor 23 with respect to the measurement surface 2 of the hypoid gear 1, the amount of movement of the turntable 11 and the moving means 20 is detected by a position detecting means 32. The belief is stored in the storage section of the calculating means 25 in a state corresponding to the measurement data of the gap angle method by the displacement sensor 23.

変位センサ23としては、例えば磁気センサなどを用い
ることができ、ハイポイドギヤ1の測定面2に対する変
位センサ23との間隙寸法Gにより変化する磁石回路の
磁気量を利用して、間隙寸法Gの検出が行なわれる。こ
の変位センサ23にて検出された磁気量は電気量に変換
された後に、前述したように演算手段25の記憶部に記
憶されるようになっている。この記憶部に格納された間
隙寸法のデータは、さらに後述する演算処理が行われで
ハイポイドギヤ1の測定面2の平面度が決定される。
As the displacement sensor 23, a magnetic sensor or the like can be used, for example, and the gap size G can be detected by using the magnetic amount of the magnet circuit that changes depending on the gap size G between the displacement sensor 23 and the measurement surface 2 of the hypoid gear 1. It is done. The magnetic quantity detected by the displacement sensor 23 is converted into an electrical quantity and then stored in the storage section of the calculating means 25 as described above. The gap size data stored in the storage section is further subjected to arithmetic processing, which will be described later, to determine the flatness of the measurement surface 2 of the hypoid gear 1.

さらに、演算手段25には、当該演算手段にて演算した
測定結果を表示するための表示手段26が接続されてい
る。この表示手段26は、ある基準値をγ・め入力して
おき、測定結果がこの基準値を満足するか否かによって
合格、あるいは不合格の表示を行うものでも良いし、さ
らに、測定面2の部位別に測定データを表示するように
構成しても良い。この場合、測定データの値を種々の範
囲、例えば、基準面に対する測定値が0〜10 ft 
mであるときは「赤」、10〜20 lt mであると
きは「橙」、20〜3011mであるときは[黄J 、
−・・のように、CRTデイスプレィ]−にカラー表示
することも可能である。
Further, the calculation means 25 is connected to a display means 26 for displaying the measurement results calculated by the calculation means. This display means 26 may be of a type in which a certain reference value is inputted as γ, and a display of pass or fail is displayed depending on whether the measurement result satisfies this reference value. The measurement data may be displayed for each part. In this case, the value of the measurement data can be varied in various ranges, e.g.
When it is m, it is "red", when it is 10 to 20 lt m, it is "orange", and when it is 20 to 3011 m, it is [yellow J,
It is also possible to display the image in color on a CRT display, such as -.

次に、このように構成した本実施例の平面度測定装置の
測定手順と演算処理方法について、第3〜7図を参照し
つつ説明する。
Next, the measurement procedure and arithmetic processing method of the flatness measuring apparatus of this embodiment configured as described above will be explained with reference to FIGS. 3 to 7.

まず、測定すべき被測定物1をアダプター14を介して
ターンテーブル11七に設置した後に、移動手段20の
旋回アーム21を旋回して、変位センサ23が被測定物
1の測定面2に対向するように当該旋回アーム21を固
定する。ついで、ターンテーブル11を回転させながら
変位センサ23および位置検出手段32により、ノ1イ
ボイドギヤ1の1周分の各位置における間隙・」゛法G
を検出し、その検出信号を演算手段25に人力する。1
周分の測定を終了すると、移動手段20を駆動し0 て変位センサ23を所定ピッチだけ半径方向に移動させ
、再びターンテーブル11を回転させて、次の1周分の
間隙寸法Gを測定し、この測定データを演算手段25に
人力する。このような動作を繰り返し、ハイポイドギヤ
1の測定面2の最外周から最内周までの全域にわたる間
隙寸法Gを演算手段に入力する。
First, after installing the object 1 to be measured on the turntable 117 via the adapter 14, the rotating arm 21 of the moving means 20 is rotated so that the displacement sensor 23 faces the measurement surface 2 of the object 1. The pivot arm 21 is fixed so that the rotation arm 21 is fixed. Then, while rotating the turntable 11, the displacement sensor 23 and the position detection means 32 measure the gap at each position of the void gear 1 for one revolution.
is detected, and the detection signal is manually input to the calculation means 25. 1
After completing the measurement for the circumference, the moving means 20 is driven to move the displacement sensor 23 in the radial direction by a predetermined pitch, and the turntable 11 is rotated again to measure the gap size G for the next circumference. , this measurement data is manually input to the calculation means 25. By repeating such operations, the gap size G over the entire area from the outermost circumference to the innermost circumference of the measurement surface 2 of the hypoid gear 1 is inputted into the calculation means.

次に、測定された間隙寸法データから被測定物1の平面
度を算出する訳であるが、この演算処理は、第3図に示
すフローチャートおよび以下述べる手順で行われる。
Next, the flatness of the object to be measured 1 is calculated from the measured gap size data, and this calculation process is performed according to the flowchart shown in FIG. 3 and the procedure described below.

なお、従来被測定物に光明丹を塗布してこれを定盤にす
り合わせ、接触した3点を測定者の判断にて決定してい
た訳であるが、本実施例にあっては、この3点の決定を
以下の計算手順により求めるようにし、同時に平面度の
測定結果をも演算しようとするものである。
Note that conventionally, Komyotan was applied to the object to be measured and the object was rubbed against a surface plate, and the three points of contact were determined by the measurer's judgment, but in this example, these three points were determined by the measurer's judgment. The purpose is to determine the points using the following calculation procedure, and at the same time calculate the flatness measurement results.

ステップ1〜3 まず、第4図に示すように、測定面2のうち、互いに1
20°をなす(円周を3等分)半径方向1 の直線」二において、それぞれ最も間隙寸法Gが大きい
点を演算手段25の記憶部から抽出して、これら3点α
、β、γのZ軸方向の変位が等しくなるように、全変位
データとともに回転移動する。
Steps 1 to 3 First, as shown in FIG.
In the straight line in the radial direction 1 that forms a 20° angle (divides the circumference into 3 equal parts), the points with the largest gap size G are extracted from the storage section of the calculating means 25, and these three points α
, β, and γ are rotated together with all displacement data so that the displacements in the Z-axis direction are equal.

なお、X軸、Y軸、およびZ軸は、ターンテーブル11
における直交座標である。
Note that the X-axis, Y-axis, and Z-axis are the turntable 11.
is the orthogonal coordinate at .

この回転移動は、まず、第5図に示すように3点α、β
、γを含む平面に直交する法線ベクトルVを求め、3点
α、β、γの原点に対する座標を、それぞれ、 α(Xa、Ya、Za)、 β(X、 、Y、 、Zlj)、 γ(X2、Yア、Zア)にて表せば、 法線ベクトルV= (V、、 F、Vりは、■ Vx=  VX  V、=  Vy  Vt=  Vz
VI      IVI      IVVx = (
yβ−yα)(Zγ−2α)(Zβ−Za)(Yγ−Y
a) vy = (zβ−Za)(Xγ−Xa)(Xβ−Xa
)(Zγ−Za) 2 Vz =  (Xβ−Xa) (Y7−Ya)−(yβ
−Ya)  (Xγ−Xa) Vl  −(Vz2 +Vy2 VZ2)  2にて表
すことができる。
This rotational movement begins with three points α and β as shown in Figure 5.
, γ is found, and the coordinates of the three points α, β, and γ with respect to the origin are α(Xa, Ya, Za), β(X, , Y, , Zlj), respectively. If expressed as γ (X2, Ya, Za), the normal vector V = (V,, F, Vri is, ■ Vx = VX V, = Vy Vt = Vz
VI IVI IVVx = (
yβ-yα) (Zγ-2α) (Zβ-Za) (Yγ-Y
a) vy = (zβ-Za) (Xγ-Xa) (Xβ-Xa
)(Zγ-Za) 2 Vz = (Xβ-Xa) (Y7-Ya)-(yβ
-Ya) (Xγ-Xa) Vl - (Vz2 +Vy2 VZ2) 2.

次に、上記法線ベクトルVが、第7図に示すようにZ軸
と平行となるように同次変換式Tを求めると、 同次変換式 %式%) () ) このように全変位データに関し、その同次変換式との積
を求めることにより3点α、β、γにおける変位データ
がZ軸方向において同一となるように、回転移動の処理
が行なわれる。
Next, if we find the homogeneous transformation formula T so that the normal vector V becomes parallel to the Z axis as shown in Figure 7, then the homogeneous transformation formula %) () ) Thus, the total displacement Regarding the data, rotational movement processing is performed so that the displacement data at the three points α, β, and γ become the same in the Z-axis direction by calculating the product with the homogeneous transformation formula.

ステップ4〜5 次に、第6図に示すように、この回転移動を終了した状
態で、円周方向に任意に3等分した領域4 におけるそれぞれ最も突出した位置を走査して抽出し、
これら新たな3点α1、β1、γ1おける変位データが
ほぼ等しくなるまで変位データの回転移動処理を繰り返
す。そして、これら新たな3点α、β、γおける変位デ
ータが、等しくなった時の変位データα。、β。、γ。
Steps 4 to 5 Next, as shown in FIG. 6, after completing this rotational movement, scan and extract the most protruding position in each area 4 arbitrarily divided into three in the circumferential direction,
The rotational movement process of the displacement data is repeated until the displacement data at these three new points α1, β1, and γ1 become approximately equal. Displacement data α when the displacement data at these three new points α, β, and γ become equal. ,β. , γ.

を念む14面が仮想基準面となり、この仮想基準面を基
準として、変位データの最高変位と最低変位との差によ
って測定面の平面度が演算される。
The 14 planes with this in mind serve as virtual reference planes, and with this virtual reference plane as a reference, the flatness of the measurement plane is calculated based on the difference between the highest displacement and the lowest displacement of the displacement data.

このように本実施例によれば、基準位置の選択に際し、
測定者の主観的要素を含むことなく決定することができ
るので、正確かつ信頼性が高く測定することができる。
As described above, according to this embodiment, when selecting the reference position,
Since the determination can be made without including subjective factors of the measurer, accurate and reliable measurement can be achieved.

また、平面度の測定にさい事前作業をとくに必要とする
ことなく、測定時間を著しく短縮させることができる。
Moreover, no special pre-work is required when measuring flatness, and the measurement time can be significantly shortened.

なお、本発明は上記実施例に限定されることなく種々の
変形例が考えられる。
Note that the present invention is not limited to the above-mentioned embodiments, and various modifications can be made.

例えば、第9図に示すように測定面をいくつかの領域に
分割して各領域における平面度を測定することも可能で
ある。この場合、ハイポイドギヤ5 1の測定面2を同心状の3領域27.28.29に分割
し5、最高変位と最低変位とを測定し、両者の差により
平面度を演算することにより、各区域27.28.29
における平面度が得られる。したがって、測定面2全域
に代えて区画された領域ごとの平面度をより詳細にかつ
正確に得ることができる。
For example, as shown in FIG. 9, it is also possible to divide the measurement surface into several regions and measure the flatness in each region. In this case, the measuring surface 2 of the hypoid gear 51 is divided into three concentric regions 27, 28, and 29, the highest displacement and the lowest displacement are measured, and the flatness is calculated based on the difference between the two regions. 27.28.29
The flatness at is obtained. Therefore, the flatness of each sectioned area can be obtained in more detail and accurately instead of for the entire measurement surface 2.

また、本発明は、所定のテーバを有する測定面2にも適
用することができる。例えは、第10図に示すように、
測定面2の外周部2aと内周部2bの変位に差異がある
場合は、外周部2aおよび内周部2bのそれぞれの変位
の平均値を測定値から求めて、その差をもって「テーパ
ー量t」とし、表示手段26により表示させることがで
きる。
Furthermore, the present invention can also be applied to a measurement surface 2 having a predetermined taper. For example, as shown in Figure 10,
If there is a difference in displacement between the outer circumferential portion 2a and the inner circumferential portion 2b of the measurement surface 2, the average value of the displacement of the outer circumferential portion 2a and the inner circumferential portion 2b is determined from the measured values, and the difference is used as the “taper amount t”. ” and can be displayed by the display means 26.

さらに、ハイポイドギヤの測定面にボルト孔が設けられ
ている場合は、ボルト孔近傍における変位データを除外
して、前述の演算処理を行なって平面度を演算させるこ
とも可能である。
Furthermore, if a bolt hole is provided on the measurement surface of the hypoid gear, it is also possible to exclude the displacement data near the bolt hole and perform the above-mentioned calculation process to calculate the flatness.

(発明の効果) 以に述べたように本発明によれば、基準位置の6 選択に際し、測定者の主観的要素を含むことなく決定す
ることができるので、正確かつ信頼性が高く測定するこ
とができる。また、平面度の測定にさい事前作業をとく
に必要とすることなく、測定時間を著しく短縮させるこ
とができる。
(Effects of the Invention) As described above, according to the present invention, the reference position can be determined without including subjective factors of the measurer, so that accurate and reliable measurement can be achieved. Can be done. Moreover, no special pre-work is required when measuring flatness, and the measurement time can be significantly shortened.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明の一実施例に係る゛1ス面度測定装置
の全体を示す構成図、第2図は、第1図の■■線に沿う
断面図、第3図は、同実施例の操作手順を示すフローチ
ャート、第4〜7図は同実施例の演算原理を説明する概
念図、第8図(A)(B)は、アダプタの変形例を示す
断面図、第9図および第10図は、本発明の他の応用例
を示す平面および断面図、第11〜13図は従来の平面
度測定装置を示す説明図である。 32・・・位置検出手段。 1・・・被測定物、2・・・mlJ定面、10・・・平
面度測定装置、11・・・ターンテーブル、20・・・
移動手段、23・・・変位センサ、25・・・演算手段
、26・・・表示手段、]7 8 第4 因 2軸 第 図 (A) 4a
FIG. 1 is a block diagram showing the entire configuration of a surface roughness measuring device according to an embodiment of the present invention, FIG. 2 is a sectional view taken along the line XX in FIG. 1, and FIG. Flowchart showing the operating procedure of the embodiment, FIGS. 4 to 7 are conceptual diagrams explaining the calculation principle of the embodiment, FIGS. 8A and 8B are sectional views showing modifications of the adapter, and FIG. 9 and FIG. 10 are plan and cross-sectional views showing another application example of the present invention, and FIGS. 11 to 13 are explanatory views showing a conventional flatness measuring device. 32...Position detection means. DESCRIPTION OF SYMBOLS 1... Object to be measured, 2... mlJ constant surface, 10... Flatness measuring device, 11... Turntable, 20...
Moving means, 23...Displacement sensor, 25...Calculating means, 26...Displaying means, ]7 8 4th factor 2nd axis diagram (A) 4a

Claims (1)

【特許請求の範囲】 略円形状の測定面を有する被測定物を搭載して回転させ
るターンテーブルと、該ターンテーブルの回転位置を検
出する位置検出手段と、ターンテーブルに搭載された被
測定物の測定面に対向すると共に測定面との間隙寸法を
検出する変位センサと、前記変位センサを測定面の半径
方向に移動させるための移動手段と、前記測定面の平面
度を演算する演算手段とを備え、 前記演算手段は、前記変位センサと前記位置検出手段と
の検出信号により、前記測定面上の円周方向の3等分領
域における最も突出した位置の変位が互いに等しくなる
ように仮想基準面を決定して平面度の演算処理を行うこ
とを特徴とする平面の平面度測定装置。
[Claims] A turntable on which a measured object having a substantially circular measurement surface is mounted and rotated, a position detection means for detecting the rotational position of the turntable, and a measured object mounted on the turntable. a displacement sensor facing the measurement surface and detecting a gap size between the measurement surface and the measurement surface; a moving means for moving the displacement sensor in a radial direction of the measurement surface; and a calculation means for calculating the flatness of the measurement surface. The calculation means uses detection signals from the displacement sensor and the position detection means to determine a virtual reference so that the displacements of the most protruding positions in three equal regions in the circumferential direction on the measurement surface are equal to each other. A flatness measuring device for a plane, characterized in that it determines a surface and performs flatness calculation processing.
JP1275969A 1989-10-25 1989-10-25 Flatness measuring device and flatness measuring method Expired - Fee Related JPH0797029B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1275969A JPH0797029B2 (en) 1989-10-25 1989-10-25 Flatness measuring device and flatness measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1275969A JPH0797029B2 (en) 1989-10-25 1989-10-25 Flatness measuring device and flatness measuring method

Publications (2)

Publication Number Publication Date
JPH03138510A true JPH03138510A (en) 1991-06-12
JPH0797029B2 JPH0797029B2 (en) 1995-10-18

Family

ID=17562942

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1275969A Expired - Fee Related JPH0797029B2 (en) 1989-10-25 1989-10-25 Flatness measuring device and flatness measuring method

Country Status (1)

Country Link
JP (1) JPH0797029B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109682289A (en) * 2019-01-31 2019-04-26 武汉联航机电有限公司 A kind of face recognizing mechanism

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5882112A (en) * 1981-11-12 1983-05-17 Toshiba Corp Displacement measuring device
JPS6449907A (en) * 1987-08-20 1989-02-27 Hitachi Cable Method and device for measuring flatness of sheet material

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5882112A (en) * 1981-11-12 1983-05-17 Toshiba Corp Displacement measuring device
JPS6449907A (en) * 1987-08-20 1989-02-27 Hitachi Cable Method and device for measuring flatness of sheet material

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109682289A (en) * 2019-01-31 2019-04-26 武汉联航机电有限公司 A kind of face recognizing mechanism
CN109682289B (en) * 2019-01-31 2024-04-09 武汉联航机电有限公司 Face recognition mechanism

Also Published As

Publication number Publication date
JPH0797029B2 (en) 1995-10-18

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