JPH031773B2 - - Google Patents
Info
- Publication number
- JPH031773B2 JPH031773B2 JP26292589A JP26292589A JPH031773B2 JP H031773 B2 JPH031773 B2 JP H031773B2 JP 26292589 A JP26292589 A JP 26292589A JP 26292589 A JP26292589 A JP 26292589A JP H031773 B2 JPH031773 B2 JP H031773B2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- scintillator
- measuring
- photoelectric conversion
- conversion element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000006243 chemical reaction Methods 0.000 claims description 19
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 claims description 2
- 239000003513 alkali Substances 0.000 claims description 2
- 150000004820 halides Chemical class 0.000 claims description 2
- 229910052761 rare earth metal Inorganic materials 0.000 claims description 2
- 150000002910 rare earth metals Chemical class 0.000 claims description 2
- PBYZMCDFOULPGH-UHFFFAOYSA-N tungstate Chemical compound [O-][W]([O-])(=O)=O PBYZMCDFOULPGH-UHFFFAOYSA-N 0.000 claims description 2
- 239000000463 material Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000000691 measurement method Methods 0.000 description 4
- 239000005355 lead glass Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- FVAUCKIRQBBSSJ-UHFFFAOYSA-M sodium iodide Chemical compound [Na+].[I-] FVAUCKIRQBBSSJ-UHFFFAOYSA-M 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- XQPRBTXUXXVTKB-UHFFFAOYSA-M caesium iodide Chemical compound [I-].[Cs+] XQPRBTXUXXVTKB-UHFFFAOYSA-M 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 235000009518 sodium iodide Nutrition 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
Landscapes
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
Description
【発明の詳細な説明】
［発明の技術分野］
この発明は、Ｘ線TV装置で使用されているＸ
線イメージインテンシフアイアの相対輝度測定装
置に関する。[Detailed Description of the Invention] [Technical Field of the Invention] This invention relates to
The present invention relates to a relative brightness measuring device for line image intensifiers.
［発明の技術的背景］
従来、Ｘ線イメージインテンシフアイア（以
下、I.I.と記す）の輝度の変化は、所定の線量と
線質のＸ線をI.I.に照射し、この時のI.I.出力面の
明るさを測定して、単位線量率Ｄ（mR／Ｓ）と
その出力面輝度Ｂ（cd／m2）との比［Gx＝Ｂ／Ｄ
（cd／m2／mR／Ｓ）］で求め、同様の測定法によ
る過去のある基準時点でのGx（相対変換係数）
（以下、Ｘ線イメージインテンシフアイアもしく
はI.I.の相対輝度という）の値との比較で行なつ
ている。[Technical Background of the Invention] Conventionally, the brightness of an X-ray image intensifier (hereinafter referred to as II) can be changed by irradiating the II with X-rays of a predetermined dose and quality, and changing the output surface of the II at this time. Measure the brightness and calculate the ratio of the unit dose rate D (mR/S) to its output surface brightness B (cd/m 2 ) [Gx=B/D
(cd/m 2 /mR/S)] and Gx (relative conversion coefficient) at a certain reference point in the past using a similar measurement method.
(hereinafter referred to as relative brightness of X-ray image intensifier or II).
第１図は、従来から行なわれているI.I.のGx測
定法を示したものであり、ａはＸ線線量率の測
定、ｂはI.I.出力面輝度の測定である。図中、１
はＸ線発生器、２はアルミ板、３はＸ線遮蔽板、
４は線量計のプローブ、５はI.I.、６は輝度計で
ある。この測定法では、図示のとおり線量計４と
輝度計６が必要であり、これらの測定器は使用し
ている期間中、測定器に狂いが生じないように常
に厳重な管理と定期的な較正を行ない、輝度管理
を行なつている。そして、線量計４においてはそ
のプローブは、環境温度、湿度等に敏感で、測定
値の精度を確保するために、使用周囲環境には、
常に細心の注意を払わなければならない。又、輝
度計６においては、構成部品である光電子増倍管
の劣化に応じ、メータ指示値の較正を定期的に行
なつている。 FIG. 1 shows a conventional II Gx measurement method, in which a is the measurement of the X-ray dose rate and b is the measurement of the II output surface brightness. In the figure, 1
is an X-ray generator, 2 is an aluminum plate, 3 is an X-ray shielding plate,
4 is a dosimeter probe, 5 is II, and 6 is a luminance meter. This measurement method requires a dosimeter 4 and a luminance meter 6 as shown in the diagram, and these measuring instruments must be strictly controlled and periodically calibrated to ensure that they do not go awry while in use. and performs brightness management. In the dosimeter 4, the probe is sensitive to environmental temperature, humidity, etc., and in order to ensure the accuracy of measurement values, the surrounding environment in which it is used must be
One must always be extremely careful. Further, in the luminance meter 6, the meter indication value is periodically calibrated in accordance with deterioration of the photomultiplier tube, which is a component.
［背景技術の問題点］
近時、I.I.の性能向上は著しく、Ｘ線映像診断
装置への使用が急速に普及してきた。しかしなが
ら、このI.I.は、使用中に輝度劣化を生じた場合
には診断に支障をきたすことになる。病院等でこ
のI.I.輝度の変化度を調べるには、取扱技師がＸ
線TV像の観察から視感的に判断しているが、こ
れには個人差があるばかりでなく、正確な経時変
化を知ることができない。[Problems with Background Art] In recent years, the performance of II has improved significantly, and its use in X-ray image diagnostic equipment has rapidly become widespread. However, this II will hinder diagnosis if brightness deterioration occurs during use. To check the degree of change in this II brightness at a hospital, etc., the handling technician should
Judgments are made visually based on observation of linear TV images, but not only does this vary from person to person, but it is not possible to accurately determine changes over time.
従つて、定量的に変化度を知るためには、従来
は既述のとおり、完全に管理、較正された測定器
により、且つ、扱いなれたI.I.メーカの取扱者が
病院に出向き、測定していることが多い。 Therefore, in order to quantitatively determine the degree of change, conventionally, as mentioned above, a fully managed and calibrated measuring instrument was used, and an experienced II manufacturer's operator went to the hospital and measured it. There are often
又、線量計４及び輝度計６等は、これらの測定
器が高価で且つ、取扱い上において比較的使いな
れていないと測定ミスをすること等があるため、
又、頻繁に使用するものでないにも拘らず高価で
あるため、一般の病院で常備していることはほと
んどなく、院内でのＸ線作業技師が直接測定する
ことも、まれである。しかし、最近、被検者のＸ
線被爆保護という立場から、I.I.の輝度変化の管
理が一層要求されるようになつた。 In addition, the dosimeter 4, luminance meter 6, etc. are expensive, and if they are not used relatively well, measurement errors may occur.
Furthermore, because it is expensive even though it is not used frequently, it is rarely kept in general hospitals, and it is also rare for X-ray technicians to directly measure it in the hospital. However, recently, the subject's
From the standpoint of radiation exposure protection, control of luminance changes in II has become even more required.
［発明の目的］
この発明の目的は、取扱い容易にして人体に有
害なＸ線を被爆することなく、安全に一般の病院
等で使用中のI.I.の輝度変化を容易に測定、追跡
することができるＸ線イメージインテンシフアイ
アの相対輝度測定装置を提供することである。[Purpose of the Invention] The purpose of the invention is to provide a system that is easy to handle and can safely measure and track changes in brightness of II during use in general hospitals, etc., without exposing the human body to harmful X-rays. An object of the present invention is to provide an apparatus for measuring the relative brightness of an X-ray image intensifier.
［発明の概要］
この発明は、Ｘ線の照射により蛍光を発するシ
ンチレータと、このシンチレータからの蛍光を受
光して電気信号に変換する光電変換素子と、前記
光電変換素子でＸ線イメージインテンシフアイア
の出力光を測定するとき光量を減衰させるフイル
タと、前記光電変換素子の出力信号を増幅する増
幅器と、この増幅器の出力信号により入射Ｘ線強
度及びＸ線イメージインテンシフアイア出力光強
度を表示できるメータとを具備することを特徴と
するＸ線イメージインテンシフアイアの相対輝度
測定装置である。[Summary of the Invention] The present invention includes a scintillator that emits fluorescence when irradiated with X-rays, a photoelectric conversion element that receives the fluorescence from the scintillator and converts it into an electrical signal, and an X-ray image intensifier using the photoelectric conversion element. a filter that attenuates the amount of light when measuring the output light of the photoelectric conversion element, an amplifier that amplifies the output signal of the photoelectric conversion element, and an output signal of the amplifier that can display the incident X-ray intensity and the X-ray image intensifier output light intensity. 1 is a relative brightness measuring device for an X-ray image intensifier characterized by comprising a meter.
［発明の実施例］
以下、この発明のI.I.の相対輝度測定装置の一
実施例について第２図及び第３図を参照して説明
する。本測定装置はヘツド本体７とメータ本体８
とからなつており、ヘツド本体７だけを取出して
一部断面で示したものが第３図である。そしてヘ
ツド本体７は、黒色の合成樹脂ケース９のに窓部
に着脱自在に取付けられたシンチレータ１０およ
び前記ケース９内に配設されたNDフイルタ１
１、同様に前記ケース内に配設された透明な鉛ガ
ラス１２、光電変換素子１３、DC増幅器１４か
ら構成されている。しかして、I.I.の相対輝度測
定に当り、Ｘ線強度測定時は、NDフイルタの代
わりにシンチレータ１０のみをヘツド本体前端部
に着脱自在に取付け、一方、I.I.の出力光強度測
定時は、シンチレータ１０のみをヘツド本体前端
部に着脱自在に取り付け、使用される。尚、前記
シンチレータ１０は、入射Ｘ線の強度に比例して
蛍光を発するものである。前記NDフイルタ１１
は、I.I.の出力光強度を測定する時に透過光の強
さを減衰させるためのものである。又、鉛ガラス
１２は、入射Ｘ線の強度を測定する時、Ｘ線の通
過を遮蔽し、シンチレータ１０の発光のみを透過
させるためのものであるが、光電変換素子１３へ
のＸ線による劣化をより少なくするために設けた
ものであり、測定値自体には影響がないため必ず
しも必要としない。さらに前記光電変換素子１３
は前記シンチレータ１０及びI.I.の蛍光を電気信
号に変換するためのもので、この実施例では例え
ばサイドオンタイプの光電子増倍管が使用され
る。又、前記DC増幅器１４は、光電変換素子１
３の出力信号を調整する手段であつて本実施例で
は前記光電変換素子１３の出力信号をリニアに増
幅するためのものである。尚、前記シンチレータ
１０とNDフイルタ１１は、ヘツド本体７にワン
タツチで着脱自在になつている。[Embodiments of the Invention] Hereinafter, an embodiment of the relative brightness measuring device according to II of the present invention will be described with reference to FIGS. 2 and 3. This measuring device consists of a head body 7 and a meter body 8.
FIG. 3 shows a partial cross-section of only the head body 7 . The head body 7 includes a scintillator 10 removably attached to the window of a black synthetic resin case 9, and an ND filter 1 disposed inside the case 9.
1. Consists of a transparent lead glass 12, a photoelectric conversion element 13, and a DC amplifier 14, which are similarly placed inside the case. Therefore, when measuring the relative brightness of II, only the scintillator 10 is removably attached to the front end of the head body instead of the ND filter when measuring the X-ray intensity, whereas when measuring the output light intensity of II, the scintillator 10 The chisel is detachably attached to the front end of the head body and used. Incidentally, the scintillator 10 emits fluorescence in proportion to the intensity of incident X-rays. Said ND filter 11
is for attenuating the intensity of transmitted light when measuring the output light intensity of II. Furthermore, when measuring the intensity of incident X-rays, the lead glass 12 is used to block the passage of X-rays and allow only the emitted light from the scintillator 10 to pass through. This is provided to further reduce the amount of noise, and is not necessarily necessary as it does not affect the measured value itself. Furthermore, the photoelectric conversion element 13
is for converting the fluorescence of the scintillators 10 and II into electrical signals, and in this embodiment, for example, a side-on type photomultiplier tube is used. Further, the DC amplifier 14 includes the photoelectric conversion element 1
In this embodiment, it is a means for adjusting the output signal of the photoelectric conversion element 13 and linearly amplifies the output signal of the photoelectric conversion element 13. Incidentally, the scintillator 10 and the ND filter 11 can be attached to and detached from the head body 7 with a single touch.
このようなヘツド本体７はメータ本体８に接続
されている。そして、動作時にはメータ本体８か
らヘツド本体７内のDC増幅器１４へ入力電圧が
供給され、光電変換素子１３へは負の高電圧が供
給される。 Such a head body 7 is connected to a meter body 8 . During operation, an input voltage is supplied from the meter body 8 to the DC amplifier 14 in the head body 7 , and a negative high voltage is supplied to the photoelectric conversion element 13.
次に前記測定装置を用いて測定を行なう場合に
ついて説明する。 Next, a case in which measurement is performed using the measuring device will be described.
先ず、第４図は入射Ｘ線の強度を測定する時の
例を示したもので、Ｘ線源としてのＸ線管１６、
アルミフイルタ１７、ヘツド本体７、天板１８、
I.I.１９、光学系２０、TVカメラ２１を同一線上
に配置している。前記TVカメラ２１はTVモニ
タ２２に接続され、ヘツド本体７はメータ本体８
に接続されている。尚、図中２３はＸ線グリツド
である。そして、前記ヘツド本体７にシンチレー
タ１０を取り付け、所定の位置（この例ではI.I.
１９もしくは天板１８上の照射野中心位置）に固
定し、所定のＸ線照射条件（Ｘ線管の管電圧、管
電流、アルミフイルタ１７、Ｘ線管１６焦点から
シンチレータ１０までの距離D2、Ｘ線絞り等）
で、この発明の装置のメータ本体８の指示値を読
取る。次に、I.I.出力光の強度を測定する時は、
第５図に示す例のように、Ｘ線管１６、アルミフ
イルタ１７、天板１８、I.I.１９及び光学系２４
を同一線上に配置している。尚、図中２３はＸ線
グリツドである。そして、ヘツド本体７に取り付
けられてあるシンチレータ１０を取り外し、代わ
りにNDフイルタ１１を取り付け、所定の位置
（この例では、光学系２４のTVカメラ取り付け
面に、光線軸の中心とヘツド本体７入射面の中心
が一致するように、専用のヘツド取付用器具２５
を作り、この器具２５とともに取付けてある）に
固定し、入射Ｘ線強度を測定した時と同じ所定の
Ｘ線照射条件でヘツド本体７に接続されＸ線遮蔽
室内に配置されたメータ本体８の指示値を読取
る。 First, FIG. 4 shows an example of measuring the intensity of incident X-rays, in which an X-ray tube 16 as an X-ray source,
Aluminum filter 17, head body 7 , top plate 18,
II 19, optical system 20, and TV camera 21 are arranged on the same line. The TV camera 21 is connected to a TV monitor 22, and the head body 7 is connected to a meter body 8.
It is connected to the. Note that 23 in the figure is an X-ray grid. Then, the scintillator 10 is attached to the head body 7 and placed at a predetermined position (II in this example).
19 or the center position of the irradiation field on the top plate 18), and set the predetermined X-ray irradiation conditions (tube voltage of the X-ray tube, tube current, aluminum filter 17, distance D 2 from the focal point of the X-ray tube 16 to the scintillator 10). , X-ray aperture, etc.)
Then, read the indicated value on the meter body 8 of the device of the present invention. Next, when measuring the intensity of II output light,
As in the example shown in FIG. 5, the X-ray tube 16, aluminum filter 17, top plate 18, II 19 and optical system
are placed on the same line. Note that 23 in the figure is an X-ray grid. Then, remove the scintillator 10 attached to the head body 7 , attach the ND filter 11 in its place, and place it at a predetermined position (in this example, on the TV camera mounting surface of the optical system 24, between the center of the beam axis and the incidence of the head body 7) . Use a special head mounting tool 25 so that the centers of the surfaces match.
The meter body 8 is connected to the head body 7 and placed in the X-ray shielding chamber under the same predetermined X-ray irradiation conditions as when measuring the incident X-ray intensity . Read the indicated value.
次に、測定したＸ線強度Ｄは、Ｘ線の線量率に
比例、又、I.I.出力光強度ＢはI.I.の輝度に比例
（実験により確認済み）するのでこの測定値を使
い、相対変換係数を求める。 Next, the measured X-ray intensity D is proportional to the X-ray dose rate, and the II output light intensity B is proportional to the II brightness (confirmed by experiment), so using these measured values, calculate the relative conversion coefficient. demand.
その計算は次のとおりである。 The calculation is as follows.
RGx＝Ｂ／Ｄ
このようにして求めた相対変換係数Gxは、Ｘ
線強度Ｄ及びI.I.出力光強度Ｂを測定する時のヘ
ツド本体７の取付位置が、測定開始の基準点よ
り、その後追跡する時々にわたつて不変であれ
ば、被測定I.I.の輝度変化度に比例するので、基
準時点の輝度値に対して、変化度を定量的に求め
ることができる。 RGx=B/D The relative conversion coefficient Gx obtained in this way is
If the mounting position of the head body 7 when measuring the linear intensity D and the II output light intensity B remains unchanged from the reference point at the start of the measurement and from time to time during subsequent tracking, it will be proportional to the degree of change in the brightness of the object II to be measured. Therefore, the degree of change can be quantitatively determined with respect to the luminance value at the reference time.
尚、シンチレータ１０としてはＸ線のエネルギ
ーによつて発光される光の変換効率が高く、且
つ、そのスペクトルが光電変換素子１３の分光感
度に合つていれば良い。 The scintillator 10 only needs to have a high conversion efficiency of light emitted by X-ray energy and whose spectrum matches the spectral sensitivity of the photoelectric conversion element 13.
シンチレータ１０の種類としては沃化ナトリウ
ム、沃化セシウムに代表されるアルカリハライド
系のほか、硫化物系、タングステン酸塩系及び希
土類系蛍光体などで良い結果が得られた。 As for the types of scintillator 10, good results were obtained with alkali halide type typified by sodium iodide and cesium iodide, as well as sulfide type, tungstate type and rare earth type phosphors.
［発明の効果］
この発明によれば、取扱いが容易にして人体に
有害なＸ線を被爆することなく、安全に一般の病
院等で使用中のI.I.の輝度変化を容易に測定、追
跡することができる。[Effects of the Invention] According to this invention, it is easy to handle, and it is possible to safely measure and track changes in the brightness of II during use in general hospitals, etc., without exposing the human body to harmful X-rays. Can be done.
第１図ａ，ｂは従来のＸ線線量率とI.I.の輝度
測定法を示した説明図、第２図はこの発明の一実
施例に係るＸ線イメージインテンシフアイアの相
対輝度測定装置を示す構成図、第３図は第２図の
要部（ヘツド本体）を示す断面図、第４図はこの
発明の測定装置を用いて入射Ｘ線の強度を測定す
る例を示す構成図、第５図は同じくI.I.出力光の
強度を測定する例を示す構成図である。
７…ヘツド本体、８…メータ本体、９…ケー
ス、１０…シンチレータ、１１…NDフイルタ、
１２…鉛ガラス、１３…光電変換素子、１４…
DC増幅器、１５…デジタルパネルメータ。
Figures 1a and b are explanatory diagrams showing the conventional X-ray dose rate and II brightness measurement method, and Figure 2 shows a relative brightness measuring device for an X-ray image intensifier according to an embodiment of the present invention. 3 is a sectional view showing the main part (head main body) of FIG. 2, FIG. 4 is a configuration diagram showing an example of measuring the intensity of incident X-rays using the measuring device of the present invention, and FIG. The figure is also a configuration diagram showing an example of measuring the intensity of II output light. 7 ...Head body, 8 ...Meter body, 9...Case, 10...Scintillator, 11...ND filter,
12... Lead glass, 13... Photoelectric conversion element, 14...
DC amplifier, 15...Digital panel meter.
Claims (1)
と、このシンチレータからの蛍光を受光して電気
信号に変換する光電変換素子と、前記光電変換素
子でＸ線イメージインテンシフアイアの出力光を
測定するとき光量を減衰させるフイルタと、前記
光電変換素子の出力信号を増幅する増幅器と、こ
の増幅器の出力信号により入射Ｘ線強度及びＸ線
イメージインテンシフアイア出力光強度を表示で
きるメータとを具備することを特徴とするＸ線イ
メージインテンシフアイアの相対輝度測定装置。 ２ シンチレータはアルカリハライド系、硫化物
系、タングステン酸塩系、希土類系のいずれかま
たはこれらの複合された蛍光物質からなることを
特徴とする特許請求の範囲第１項記載のＸ線イメ
ージインテンシフアイアの相対輝度測定装置。[Scope of Claims] 1. A scintillator that emits fluorescence when irradiated with X-rays, a photoelectric conversion element that receives the fluorescence from the scintillator and converts it into an electrical signal, and an output of an X-ray image intensifier using the photoelectric conversion element. A filter that attenuates the amount of light when measuring light, an amplifier that amplifies the output signal of the photoelectric conversion element, and a meter that can display the incident X-ray intensity and the X-ray image intensifier output light intensity based on the output signal of the amplifier. An apparatus for measuring relative brightness of an X-ray image intensifier, comprising: 2. The X-ray image intensity according to claim 1, wherein the scintillator is made of an alkali halide-based, sulfide-based, tungstate-based, rare earth-based fluorescent material, or a combination thereof. Fire relative brightness measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26292589A JPH02139839A (en) | 1989-10-11 | 1989-10-11 | Relative brightness measuring device for x-ray image intensifier |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26292589A JPH02139839A (en) | 1989-10-11 | 1989-10-11 | Relative brightness measuring device for x-ray image intensifier |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02139839A JPH02139839A (en) | 1990-05-29 |
| JPH031773B2 true JPH031773B2 (en) | 1991-01-11 |
Family
ID=17382497
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP26292589A Granted JPH02139839A (en) | 1989-10-11 | 1989-10-11 | Relative brightness measuring device for x-ray image intensifier |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02139839A (en) |
-
1989
- 1989-10-11 JP JP26292589A patent/JPH02139839A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02139839A (en) | 1990-05-29 |
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