JPH0318007A - Manufacture of soft magnetic thin film - Google Patents
Manufacture of soft magnetic thin filmInfo
- Publication number
- JPH0318007A JPH0318007A JP15039089A JP15039089A JPH0318007A JP H0318007 A JPH0318007 A JP H0318007A JP 15039089 A JP15039089 A JP 15039089A JP 15039089 A JP15039089 A JP 15039089A JP H0318007 A JPH0318007 A JP H0318007A
- Authority
- JP
- Japan
- Prior art keywords
- soft magnetic
- target
- thin film
- sputtering
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/12—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys
- H01F10/13—Amorphous metallic alloys, e.g. glassy metals
- H01F10/132—Amorphous metallic alloys, e.g. glassy metals containing cobalt
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physical Vapour Deposition (AREA)
- Thin Magnetic Films (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は,例えば磁気ヘッドなどに用いられる軟磁性薄
膜の製造方法に係り、特にコバルトを主体とする合金の
軟磁性薄膜の製造方法に関するものである.
[従来技術コ
磁気ヘッド、高周波リアクトル用コアあるいは磁気シー
ルド材などに適用される軟磁性薄膜材料として、パーマ
ロイ、コバルト基アモルファス合金、センダストなどが
中心に検討されている.特にCo−Nb−Zr合金をは
じめとするコバルト基アモルファス合金は、高い飽和磁
束密度,低い磁歪定数,そして良好な軟磁性特性を有す
ることから有望視されている.
しかし、この軟磁性材料においても実用上問題がない訳
ではなく、特に熱的安定性の面では各種磁気素子の製造
プロセス上に様々な制約を生じる.すなわち,例えば磁
気ヘッドを製造する場合、磁気コアの間にガラスを介在
させ、加熱によりそのガラスを溶融させてコアどうしを
接合する工程、あるいは磁気特性を向上させるため磁気
コアを磁界中で熱処理する工程は、例えば600℃程度
の比較的高温で行われる,そのためこれらの熱処理によ
り前記軟磁性薄膜の結晶化が進み、軟磁気特性が著しく
劣化するという問題がある.さらにこのコバルト基アモ
ルファス合金は,飽和磁束密度を高くするためにコバル
トリッチにすると、軟磁性薄膜の結晶化温度が著しく下
がり、そのために熱処理の温度が制限され、プロセスの
マージンが狭められるという問題がある.そこでプロセ
スのマージンならびに磁気特性の両面から、高い飽和磁
束密度を保持し,かつ結晶化温度の高い材料の開発が強
く期待されている。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method of manufacturing a soft magnetic thin film used in, for example, a magnetic head, and particularly relates to a method of manufacturing a soft magnetic thin film of an alloy mainly composed of cobalt. It is. [Prior Art] Permalloy, cobalt-based amorphous alloys, Sendust, etc. are mainly being studied as soft magnetic thin film materials to be applied to magnetic heads, high-frequency reactor cores, magnetic shielding materials, etc. In particular, cobalt-based amorphous alloys such as Co-Nb-Zr alloys are considered promising because they have high saturation magnetic flux density, low magnetostriction constant, and good soft magnetic properties. However, this soft magnetic material is not without practical problems, and there are various constraints on the manufacturing process of various magnetic elements, especially in terms of thermal stability. For example, when manufacturing a magnetic head, there is a process in which glass is interposed between the magnetic cores and the glass is melted by heating to join the cores together, or the magnetic cores are heat-treated in a magnetic field to improve their magnetic properties. The process is carried out at a relatively high temperature of, for example, about 600° C. Therefore, there is a problem in that these heat treatments promote crystallization of the soft magnetic thin film and significantly deteriorate the soft magnetic properties. Furthermore, when this cobalt-based amorphous alloy is made cobalt-rich to increase the saturation magnetic flux density, the crystallization temperature of the soft magnetic thin film drops significantly, which limits the heat treatment temperature and narrows the process margin. be. Therefore, there are strong expectations for the development of materials that maintain a high saturation magnetic flux density and have a high crystallization temperature, both from the perspective of process margins and magnetic properties.
このような期待に応える一つの方法として;既にコバル
ト基アモルファス合金の窒化膜が提案されている(電子
通信学会技術研究報告 MR86−4,P25〜32r
N,混合ガス中でスパツタしたアモルファス合金膜の磁
性」).
その結果、室化により結晶化温度が高くなり,膜硬度も
増し、さらに飽和磁束密度が増加する.[発明が解決し
ようとする課題コ
しかしながらその反面、この膜では膜厚を300A以上
にすると著しく軟磁気特性が劣化することから、応用分
野への適用が困難視されている.
この対策として、非常に薄い窒化膜と非窒化膜とを交互
に積層し、磁気特性の劣化を防止することが試みられた
.この方法により軟磁気特性の劣化は防止できたが、極
めて薄い膜を多層に形成して所定の膜厚にすることが必
要である.前記窒化膜ならびに非窒化膜の膜厚が200
λの場合、例えば10.000人の軟磁性薄膜を形成す
るためには,窒化膜ならびに非窒化膜を50回繰り返し
て形成する必要である.そのため、製造工程が非常に煩
雑で生産性ならびにコストの点で問題がある.本発明は
,このような欠点を解消し、厚手め単層膜でも優れた軟
磁気特性を有する軟磁性膜の製造方法を提供することに
ある.
C課題を解決するための手段コ
前記目的を達成するため、本発明は、窒素原子を含む例
えばC○−NbあるいはGo−Nb−Zrなどからなる
コバルト基合金をターゲットとして、イオンスパッタリ
ングなどのスパッタリングにより、基板上に窒素原子を
含む例えばCo−Nbアモルファス合金あるいはCo−
Nb−Zrアモルファス合金などからなる,コバルト基
合金薄膜を所定の厚みに堆積したことを特徴とするもの
である.
[実施例コ
本発明において使用される軟磁性材料は、コバルト(C
o)を主体とし、ニオブ(Nb).ジルコニウム(Zr
).タンタル(Ta).チタン(Ti).ハフニウム(
Hf).イットリウム(Y)などの金属元素を少なくと
もl種を含むC o−Metal系アモルファス合金で
、特に少なくともNb.Zrのいずれか一方を含む合金
が賞用される.さらにまた、下記の合金組成式を有する
合金が好適である.
合金組成式
(T−M) z−X (Ml , MJ x式中の(T
− M)は、Coを主体とし,Coの一部をFaまた
はNiの少なくとも1種の金属元素で10%以下置換す
ることができる.これ以上の置換は、軟磁気特性を劣化
するため好ましくない.
M1は、Zr,Hf,Yの少なくとも1種の金属元素で
ある.
M2 は、Nb,Ta,Mo,V/の少なくとも1種の
金属元素である.
8は. 0.05〜0.3の範囲の数値である.前記M
エはガラス化を促進させるための添加元素であり、前記
M2は磁歪を負にする添加元素であり、M./ (M,
+M.’) =0.3〜0.9の範囲が好適である.
本発明で用いられるスパッタリング法には、例えばイオ
ンビームスパッタリング法,高周波スパッタリング法、
直流スパッタリング法などがあり,中でも特にイオンビ
ームスパッタリング法が好適である.
次に本発明の実施例を図面とともに説明する.(実施例
1)
第11は、本発明の実施例に用いるイオンビームスパッ
タリング装置の概略構威図である.同図において1は排
気管,2は二一ドルパルブ、3はイオン銃、4はターゲ
ット,5は基板、6は真空槽である.焼結したNbNペ
レットをCO板上に配列した複合ターゲット4,ならび
に耐熱性ガラスからなる基板5をそれぞれ真空槽6内に
セットした後、この真空槽6内をI X I O−’ト
ール以下の高真空状態にし,二一ドルバルブ2よりアル
ゴンガスを槽内圧力が15半角スペースXIO−’トー
ルとなるように導入する.
次にイオン銃3より0.7 KVに加速したアルゴンイ
オンを,前記ターゲット4に照射し、そ扛によって生じ
たスパッタリング微粒子を基板S上に膜厚5000〜8
000人となるように堆積させる.なお,薄膜形或にお
けるアルゴンイオン照射電流は20mAとし,膜の堆積
速度は20〜30人/分とした.
このようにして作製したサンプルの組成はオージエ電子
分光法、結晶構造はCuKαを用いたX線回折、磁気特
性はB−Hループトレーサによって測定した.また磁気
特性の高温安定性は、熱処理温度を室温から600℃ま
で変化させ、4000eの磁場中で熱処理したときの磁
気特性(H c )の変化により評価した.
また、窒化効果を調べるため、比較用として非窒化のサ
ンプルも作製した.このサンプルを製作する際には、G
o板上にNbペレットを配置したものをターゲットとし
て用いた,なお、各サンプルとも.Nb/ (Co+N
b)X100=16原子%となるように.Co板上に配
置するNbNペレットまたはNbペレットの数を調整し
た.第2図ならびに第3図は,本発明の実施例ば係るC
o−NbNターゲットを用いてイオンスパッタリングし
たサンプルの、或膜直扱ならびに400 0gの磁界
中において600℃で30分間熱処理した後のX線回折
バタ
ーンを示す図である.
第4図ならびに第5図は、比較のためGo −Nbのタ
ーゲットを用いてイオンスパッタリングしたサンプルの
或膜直後ならびに600℃で30分間熱処理した後のX
m.回折パターンを示す図である.
第2図ならびに第4図から明らかなように、両方のサン
プルとも製膜直後(熱処理前)は,アモルファス状態で
あり,ブロードなハローパターンを示している.
窒素を含まないCo−Nbターゲットを用いて形成した
軟磁性薄膜を高温で熱処理した場合は第5図に示すよう
に、回折ピークの強度が大きく、著しく結晶化が進んで
いることがわかる,これに対して窒素を含んだCo−N
bNターゲットを用いて形威した軟磁性薄膜を高温で熱
処理すると第3図に示すように、若干の結晶化は観測さ
れるが,それほど顕著に結晶化していないことがわかる
.第6図は、前記2つのサンプルにおける保磁力の熱処
理温度依存性を示す特性図である.図中の実!!Aは本
発明の実施例に係るGo−NbNターゲットを用いたも
のの特性曲線,一点!mBは比較例に係るCo−Nbタ
ーゲットを用いたものの特性曲線である.
この図から明らかなように,曲tABの場合は約450
℃(M晶化開始温度)を越えると,急速に結晶化が起こ
り、それに伴なって保磁力も急増する5これに対して曲
線Bの場合は,600℃という高温状態においても比較
的保磁力が低く,良好な軟磁気特性を有している.
(実施例2)
Co−NbN (Co : Nb=87 : 1 3)
からなる複合ターゲット(各金属の組成は、CO板上に
配置するNbNのペレソトの数によって調整した.)を
用い.Ar雰囲気中において.Arイオン照射電流20
mA、膜堆積速度20〜30入/分で、基板上に窒素を
含んだCo−Nbアモルファス合金からなる膜厚500
0λの軟磁性薄膜をイオンビームスパッタリング法によ
って形成した.(実施例3)
Co−NbN (Co :Nb=87 :13)からな
る複合ターゲットを高周波2極スパツタ装置にセットし
、Ar雰囲気中において、高周波スパッタリング法によ
り基板上に窒素を含んだGo−Nbアモルファス合金か
らなる膜厚5000大の軟磁性薄膜を形成した.
これら実施例2、3によって得られた各サンプルの成膜
直後(I)および400 0sの磁界中において60
0℃で30分間熱処理したのち(n)のHcieそれぞ
れ測定し、その結果を次の表に示す.
表
この表から明らかなように、斎周波スパッタリング法に
よっても窒素を含むGo基合金をターゲットとして用い
ることにより、600℃などの高温状態においても,膜
組成は若干異なるが例えば第6図の曲線Bに比べて保磁
力を低く維持することができる.さらに、実施例2のよ
うに.イオンビームスパッタリング法により成膜すれば
、成膜直後においても高温状態に晒されても常に低いH
aを維持しており、熱安定性に優れている.このように
同じターゲットを用いてもイオンスパッタリング法によ
って成膜した方が何故Heが常に低いのか理論的な根拠
は明らかでないが、次のようなことが考えられる.
すなわち,高周波スパッタリング法の場合,ターゲット
中に窒素元素が存在していると,それがアルゴンプラズ
マ中でイオン化し、膜表面が窒素イオンに晒され,その
ために膜中に柱状組織のようなものが成長して、垂直磁
気異方性が生じ、そのために軟磁気特性が多少劣化する
と考えられる.これに対して前記実施例のようにイオン
スパッタリング法を採用すれば、プラズマはイオン銃の
中にあり,膜はこれらのイオンに晒されないから、イオ
ンピームスパッタリング法で威膜した軟磁性膜は単層膜
であっても、熱処理の有無に拘らず優れた軟磁気特性を
有している.
なお、前記熱処理は磁界中で行ったが、磁界をかけない
で熱処理を行っても,同様の優れた軟磁気特性が得られ
ることが実験で確認されている.なお、前記実施例では
Co−Nb系組成の場合について説明したが、本発明は
これに限定されるものではなく,例えばCo−Nb−Z
r系など他の組成,のものにも適用できる.
[発明の効果]
本発明は前述のように、窒素原子を含むコバルト基合金
をターゲットとしてスパッタリングを行い、基板上にコ
バルト基合金薄膜を所定の厚みに形成することにより、
高温でも優れた磁気特性を有する軟磁性薄膜を製造する
ことができる.また従来提案されたように窒化膜と非窒
化膜とを多層に積層する必要がないため、生産性の向上
ならびにコストの低減を図ることができる.As one method to meet these expectations, a nitride film of cobalt-based amorphous alloy has already been proposed (IEICE Technical Research Report MR86-4, P25-32r)
Magnetism of amorphous alloy film sputtered in N, mixed gas"). As a result, chambering increases the crystallization temperature, increases the film hardness, and further increases the saturation magnetic flux density. [Problems to be Solved by the Invention] However, on the other hand, the soft magnetic properties of this film deteriorate significantly when the film thickness exceeds 300 Å, making it difficult to apply it to the field of application. As a countermeasure to this problem, an attempt was made to alternately stack extremely thin nitride films and non-nitride films to prevent deterioration of the magnetic properties. Although this method was able to prevent deterioration of the soft magnetic properties, it is necessary to form multiple extremely thin films to a desired thickness. The thickness of the nitride film and non-nitride film is 200 mm.
In the case of λ, for example, in order to form 10,000 soft magnetic thin films, it is necessary to repeatedly form nitride films and non-nitride films 50 times. As a result, the manufacturing process is extremely complicated and poses problems in terms of productivity and cost. The object of the present invention is to provide a method for manufacturing a soft magnetic film that overcomes these drawbacks and has excellent soft magnetic properties even when it is a thick single layer film. Means for Solving the Problems C. To achieve the above objects, the present invention provides sputtering such as ion sputtering using a cobalt-based alloy containing nitrogen atoms, such as C○-Nb or Go-Nb-Zr, as a target. For example, a Co-Nb amorphous alloy containing nitrogen atoms or a Co-
It is characterized by depositing a thin film of cobalt-based alloy, such as Nb-Zr amorphous alloy, to a predetermined thickness. [Example 2] The soft magnetic material used in the present invention is cobalt (C
o) as the main component, and niobium (Nb). Zirconium (Zr
). Tantalum (Ta). Titanium (Ti). hafnium(
Hf). A Co-Metal amorphous alloy containing at least l types of metal elements such as yttrium (Y), particularly at least Nb. Alloys containing either Zr are preferred. Furthermore, alloys having the following alloy composition formula are suitable. Alloy composition formula (T-M) z-X (Ml, MJ
- M) is mainly composed of Co, and a portion of the Co can be replaced by 10% or less with at least one metal element of Fa or Ni. Substitution beyond this level is undesirable because it deteriorates the soft magnetic properties. M1 is at least one metal element of Zr, Hf, and Y. M2 is at least one metal element selected from Nb, Ta, Mo, and V/. 8 is. It is a numerical value in the range of 0.05 to 0.3. Said M
E is an additive element for promoting vitrification, M2 is an additive element that makes magnetostriction negative, and M. / (M,
+M. ') is preferably in the range of 0.3 to 0.9. The sputtering method used in the present invention includes, for example, ion beam sputtering method, high frequency sputtering method,
There are direct current sputtering methods, among which ion beam sputtering method is particularly suitable. Next, embodiments of the present invention will be explained with reference to the drawings. (Example 1) No. 11 is a schematic diagram of an ion beam sputtering apparatus used in an example of the present invention. In the figure, 1 is an exhaust pipe, 2 is a 21 dollar valve, 3 is an ion gun, 4 is a target, 5 is a substrate, and 6 is a vacuum chamber. After setting a composite target 4 in which sintered NbN pellets are arranged on a CO plate and a substrate 5 made of heat-resistant glass in a vacuum chamber 6, the inside of the vacuum chamber 6 is heated to a temperature below I A high vacuum condition is established, and argon gas is introduced from the 21 dollar valve 2 so that the pressure inside the chamber becomes 15 half-width space XIO-' Torr. Next, the target 4 is irradiated with argon ions accelerated to 0.7 KV from the ion gun 3, and the sputtered fine particles generated by the ion gun 3 are deposited on the substrate S to a thickness of 5,000 to 8 KV.
Deposit so that there are 000 people. In addition, the argon ion irradiation current in the thin film type was 20 mA, and the film deposition rate was 20 to 30 people/min. The composition of the thus prepared sample was measured by Auger electron spectroscopy, the crystal structure by X-ray diffraction using CuKα, and the magnetic properties by B-H loop tracer. The high-temperature stability of the magnetic properties was evaluated by varying the heat treatment temperature from room temperature to 600°C and by the change in magnetic properties (H c ) when heat treated in a magnetic field of 4000e. In addition, in order to investigate the nitriding effect, a non-nitriding sample was also prepared for comparison. When making this sample, G
A Nb pellet placed on an O plate was used as a target. Nb/ (Co+N
b) So that X100 = 16 atom%. The number of NbN pellets or Nb pellets placed on the Co plate was adjusted. FIG. 2 and FIG. 3 show examples of the present invention.
FIG. 3 is a diagram showing the X-ray diffraction pattern of a sample subjected to ion sputtering using an o-NbN target after being directly treated as a film and heat-treated at 600° C. for 30 minutes in a 4000 g magnetic field. For comparison, Figures 4 and 5 show the results of X-rays immediately after ion sputtering of a sample using a Go-Nb target and after heat treatment at 600°C for 30 minutes.
m. It is a diagram showing a diffraction pattern. As is clear from Figures 2 and 4, both samples are in an amorphous state immediately after film formation (before heat treatment) and exhibit a broad halo pattern. When a soft magnetic thin film formed using a Co-Nb target that does not contain nitrogen is heat-treated at high temperature, the intensity of the diffraction peak is large, as shown in Figure 5, indicating that crystallization has progressed significantly. Co-N containing nitrogen
When a soft magnetic thin film formed using a bN target is heat-treated at high temperature, some crystallization is observed, as shown in Figure 3, but it is clear that the crystallization is not that pronounced. FIG. 6 is a characteristic diagram showing the dependence of coercive force on heat treatment temperature for the two samples. The fruit in the picture! ! A is a characteristic curve using a Go-NbN target according to an embodiment of the present invention, one point! mB is a characteristic curve of a comparative example using a Co-Nb target. As is clear from this figure, in the case of song tAB, approximately 450
℃ (M crystallization start temperature), crystallization occurs rapidly and the coercive force increases rapidly5.On the other hand, in the case of curve B, the coercive force is relatively high even at a high temperature of 600℃. It has low magnetic properties and good soft magnetic properties. (Example 2) Co-NbN (Co:Nb=87:13)
(The composition of each metal was adjusted by the number of NbN plates placed on the CO plate.) In an Ar atmosphere. Ar ion irradiation current 20
A film of Co-Nb amorphous alloy containing nitrogen was deposited on the substrate with a thickness of 500 mA and a film deposition rate of 20 to 30 in/min.
A soft magnetic thin film of 0λ was formed by ion beam sputtering. (Example 3) A composite target consisting of Co-NbN (Co:Nb=87:13) was set in a high-frequency two-pole sputtering device, and Go-Nb containing nitrogen was deposited on the substrate by high-frequency sputtering in an Ar atmosphere. A soft magnetic thin film with a thickness of 5000 mm was formed from an amorphous alloy. Immediately after film formation (I) of each sample obtained in Examples 2 and 3 and in a magnetic field of 4000 s,
After heat treatment at 0°C for 30 minutes, the Hcie of (n) was measured, and the results are shown in the following table. Table As is clear from this table, by using a Go-based alloy containing nitrogen as a target in the sub-frequency sputtering method, even at high temperatures such as 600°C, the film composition may differ slightly, but for example, curve B in Figure 6 It is possible to maintain a lower coercive force compared to . Furthermore, as in Example 2. If the film is formed using the ion beam sputtering method, the H will always be low even when exposed to high temperatures immediately after film formation.
It maintains a and has excellent thermal stability. Although the theoretical basis for why He is always lower when forming a film by ion sputtering even when the same target is used is not clear, the following may be considered. In other words, in the case of high-frequency sputtering, if nitrogen exists in the target, it will be ionized in the argon plasma and the film surface will be exposed to the nitrogen ions, resulting in the formation of columnar structures in the film. As it grows, perpendicular magnetic anisotropy occurs, which is thought to cause some deterioration of the soft magnetic properties. On the other hand, if the ion sputtering method is adopted as in the above embodiment, the plasma is inside the ion gun and the film is not exposed to these ions, so the soft magnetic film formed by the ion beam sputtering method is simply Even if it is a layered film, it has excellent soft magnetic properties regardless of whether it is heat-treated or not. Although the above heat treatment was performed in a magnetic field, it has been experimentally confirmed that similar excellent soft magnetic properties can be obtained even if heat treatment is performed without applying a magnetic field. In addition, although the case of Co-Nb based composition was explained in the above-mentioned example, the present invention is not limited to this, and for example, Co-Nb-Z
It can also be applied to other compositions such as r-based. [Effects of the Invention] As described above, the present invention performs sputtering using a cobalt-based alloy containing nitrogen atoms as a target to form a cobalt-based alloy thin film to a predetermined thickness on a substrate.
It is possible to produce soft magnetic thin films with excellent magnetic properties even at high temperatures. Furthermore, since there is no need to laminate multiple layers of nitride and non-nitride films as previously proposed, it is possible to improve productivity and reduce costs.
第l図は,本発明で用いられるイオンビームスバッタリ
ング装置の概略構或図、
第2図ならびに第3図は、Co−NbNの複合ターゲッ
トを用いてイオンビームスパッタリング法によって或膜
したCo−Nb−N膜の熱処理前ならびに熱処理後のX
I!回折パターン図,第4図ならびに第5図は、Co−
Nbの複合ターゲットを用いてイオンビームスパッタリ
ング法によって成膜したCo−Nb膜の熱処理前ならび
に熱処理後のX線回折パターン図、
第6図は、各サンプルにおけるTaとHeの関係を示す
特性図である.
l・・・・・・排気管、 2・・・・・・二一
ドルバルブ、3・・・・・・イオン銃,
4・・・・・・ターゲット,
5・・・・・・基板,
6・・・・・・真空槽.
第
1
図
弔
4
図
2e
(deg.)
第5図
30
35 40 45
2e (deg.)
50
第
2
図
30
35
40
45
50
20
(deg.)
第 3 図
30
35
40
45
50
20
( deg.)
第6
図
Ta
(ご)Fig. 1 is a schematic diagram of the ion beam sputtering device used in the present invention, and Figs. 2 and 3 show a Co-Nb film formed by the ion beam sputtering method using a Co-NbN composite target. -X before and after heat treatment of N film
I! The diffraction pattern diagrams, Figures 4 and 5 are Co-
Figure 6 shows the X-ray diffraction patterns before and after heat treatment of a Co-Nb film formed by ion beam sputtering using a Nb composite target. be. l...Exhaust pipe, 2...21 dollar valve, 3...Ion gun, 4...Target, 5...Board, 6・・・・・・Vacuum tank. 1st Figure 4 Figure 2e (deg.) 5th Figure 30 35 40 45 2e (deg.) 50 2nd Figure 30 35 40 45 50 20 (deg.) 3rd Figure 30 35 40 45 50 20 (deg.) Figure 6 Ta (go)
Claims (3)
てスパツタリングを行い、基板上に窒素を含むコバルト
基合金薄膜を所定の厚みに堆積したことを特徴とする軟
磁性薄膜の製造方法。(1) A method for producing a soft magnetic thin film, which comprises depositing a nitrogen-containing cobalt-based alloy thin film to a predetermined thickness on a substrate by sputtering using a cobalt-based alloy containing nitrogen atoms as a target.
バルトを主体とし、ニオブならびにジルコニウムの少な
くともいずれか一方の金属元素と窒素を含むことを特徴
とする軟磁性薄膜の製造方法。(2) A method for manufacturing a soft magnetic thin film according to claim (1), wherein the target is mainly composed of cobalt and contains nitrogen and at least one of the metal elements niobium and zirconium.
前記スパツタリングが、前記ターゲツトに加速されたイ
オンビームを照射するイオンビームスパツタリングであ
ることを特徴とする軟磁性薄膜の製造方法。(3) In claim (1) or claim (2),
A method for manufacturing a soft magnetic thin film, characterized in that the sputtering is ion beam sputtering in which the target is irradiated with an accelerated ion beam.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15039089A JPH0318007A (en) | 1989-06-15 | 1989-06-15 | Manufacture of soft magnetic thin film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15039089A JPH0318007A (en) | 1989-06-15 | 1989-06-15 | Manufacture of soft magnetic thin film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0318007A true JPH0318007A (en) | 1991-01-25 |
Family
ID=15495946
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15039089A Pending JPH0318007A (en) | 1989-06-15 | 1989-06-15 | Manufacture of soft magnetic thin film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0318007A (en) |
-
1989
- 1989-06-15 JP JP15039089A patent/JPH0318007A/en active Pending
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