JPH03181845A - Atomic absorption spectrometer - Google Patents
Atomic absorption spectrometerInfo
- Publication number
- JPH03181845A JPH03181845A JP32294089A JP32294089A JPH03181845A JP H03181845 A JPH03181845 A JP H03181845A JP 32294089 A JP32294089 A JP 32294089A JP 32294089 A JP32294089 A JP 32294089A JP H03181845 A JPH03181845 A JP H03181845A
- Authority
- JP
- Japan
- Prior art keywords
- light
- photometric
- zero point
- measurement
- photomultiplier tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010521 absorption reaction Methods 0.000 title claims description 7
- 238000005259 measurement Methods 0.000 claims abstract description 47
- 230000010354 integration Effects 0.000 claims abstract description 22
- 238000005375 photometry Methods 0.000 claims abstract description 16
- 230000031700 light absorption Effects 0.000 claims description 8
- 238000000889 atomisation Methods 0.000 claims description 6
- 238000001228 spectrum Methods 0.000 claims description 5
- 238000005070 sampling Methods 0.000 abstract description 6
- 239000006185 dispersion Substances 0.000 abstract 1
- 238000012545 processing Methods 0.000 description 23
- 238000000034 method Methods 0.000 description 11
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 8
- 229910052805 deuterium Inorganic materials 0.000 description 8
- 238000002835 absorbance Methods 0.000 description 3
- 238000012937 correction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- XLYOFNOQVPJJNP-ZSJDYOACSA-N Heavy water Chemical compound [2H]O[2H] XLYOFNOQVPJJNP-ZSJDYOACSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 238000001479 atomic absorption spectroscopy Methods 0.000 description 1
- FFBHFFJDDLITSX-UHFFFAOYSA-N benzyl N-[2-hydroxy-4-(3-oxomorpholin-4-yl)phenyl]carbamate Chemical compound OC1=C(NC(=O)OCC2=CC=CC=C2)C=CC(=C1)N1CCOCC1=O FFBHFFJDDLITSX-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、原子吸光度計に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to an atomic absorption spectrometer.
(発明の機要〕
試料による吸光がない状態で、1.2度の試行的測定で
得られた測光量を用い、光電子増倍管の印加電圧と電流
増倍関係式により適当な印加電圧値を算出して決定し、
光源の状態を変えることなく、演算処理により両光源の
測光量がほぼ同しくなるように測光期間を決定してバラ
ンスを取り、ゼロ点の測定では再測定の必要性の有無を
演算により判定し、再測定が必要な場合は、光電子増倍
管の印加電圧値によりゼロ点測定時間を自動的に決定す
ることを特徴とする原子吸光光度計。(Mechanism of the invention) Using the photometric amount obtained in 1.2 trial measurements in the absence of light absorption by the sample, an appropriate applied voltage value is determined by the applied voltage of the photomultiplier tube and the current multiplication relational expression. Calculate and determine
Without changing the state of the light source, the photometry period is determined and balanced so that the photometric amounts of both light sources are approximately the same through calculation processing, and the need for re-measurement is determined by calculation when measuring the zero point. , an atomic absorption spectrophotometer characterized in that, if re-measurement is necessary, the zero point measurement time is automatically determined based on the applied voltage value of the photomultiplier tube.
原子吸光分析では、水溶液試料中の測定目的元素を原子
化部にて原子化し、この原子化ガス中に、測定目的元素
固有の波長の光を透過して測定目的元素による吸光量を
検出する。検出された吸光度から検1mを用いて最終的
に元素の濃度を同定する。吸光量の測定では吸光量の中
に測定元素の吸収によらないバンクグランド吸光も含ま
れるのでこれを取り除く補正が必要である。このため通
常は、ホロカソードランプのような輝線スペクトル光源
と重水寒ランプのような連続スペクトル光源の光を交互
に試料原子下部を13ii4して、それぞれの吸光量を
検出する。ホロカソードランプの吸光量には、元素によ
る吸光とバックグランドによる吸光の両方が含まれる。In atomic absorption spectrometry, an element to be measured in an aqueous solution sample is atomized in an atomization section, and light having a wavelength specific to the element to be measured is transmitted through the atomized gas to detect the amount of light absorbed by the element to be measured. The concentration of the element is finally identified from the detected absorbance using a 1 m detector. In measuring the amount of light absorption, the amount of light absorption includes bank ground absorption that is not caused by absorption of the measured element, so correction is required to remove this. For this reason, normally, light from a bright-line spectrum light source such as a hollow cathode lamp and a continuous spectrum light source such as a heavy water cold lamp are alternately applied to the lower part of the sample atoms, and the amount of light absorbed by each is detected. The amount of light absorption of a hollow cathode lamp includes both elemental light absorption and background light absorption.
重水素ランプの吸光量はバックグランドによる吸光のみ
である。従って、ホロカソードランプの吸光量から重水
素ランプの吸光量分を取り除くことにより、測定目的元
素に起因する吸光量のみを正しく測定することができる
。The amount of light absorbed by a deuterium lamp is only that due to the background. Therefore, by removing the amount of light absorbed by the deuterium lamp from the amount of light absorbed by the hollow cathode lamp, only the amount of light absorbed due to the target element to be measured can be accurately measured.
しかし、ホロカソードランプの光量は元素により異なり
、ま゛た重水素ランプの検出できる光量は測定波長によ
り変わる0両光源の測光量が大きく異なるとバンクグラ
ンド吸光量を取り除く場合に、誤差が大きくなる。この
ために、試料が導入されていない時の両方の測光量がほ
ぼ等しく成るように、バランスさせる必要がある。また
吸光量の測定範囲をできるだけ広くとるために、試料が
導入されていない時の両方の測光量が、測光回路の最大
出力付近となるように感度調整をしなければならない。However, the amount of light from a hollow cathode lamp varies depending on the element, and the amount of light that can be detected from a deuterium lamp varies depending on the measurement wavelength.If the photometric amounts of the two light sources are significantly different, there will be a large error when removing the bank ground absorption amount. . For this reason, it is necessary to balance the two photometric quantities so that they are approximately equal when no sample is introduced. In addition, in order to widen the measurement range of absorbance as much as possible, the sensitivity must be adjusted so that both photometric quantities when no sample is introduced are near the maximum output of the photometric circuit.
これは、測光用の受光素子である光電子増倍管の印加電
圧を変更して行う。また、試料が導入された時の測光量
の減少量から吸光度を算出するために、試料による吸光
がない時の両光の測光量は、ゼロ点として記録されなけ
ればならない。This is done by changing the voltage applied to the photomultiplier tube, which is a light receiving element for photometry. Furthermore, in order to calculate the absorbance from the amount of decrease in the photometric amount when the sample is introduced, the photometric amounts of both lights when no light is absorbed by the sample must be recorded as a zero point.
上記の光電子増倍管の感度調整、両方の測光量のバラン
ス取り、ゼロ点の記録は、以下の手順で行っていた。ホ
ロカソードランプ光源光か、または重水素光源光かどち
らか、測光量が小さい方の光源の測光量の出力が、最大
出力の80から90%付近となるように、何度も光電子
増倍管印加電圧を順次微少量上げたり下げたりしながら
測光し、電圧調整をする。印加電圧が決まると、次に両
方の測光量がほぼ等しく威るように、測光量が大きい方
の光源の測光量が、測光回路の最大出力の80から90
%程度となるように光源自体の出力を下げる。The sensitivity adjustment of the photomultiplier tube, the balancing of both photometric quantities, and the recording of the zero point were performed in the following steps. The photomultiplier tube is repeatedly used so that the photometric output of the light source with the smaller photometric amount, either the hollow cathode lamp light source or the deuterium light source, is around 80 to 90% of the maximum output. Measure the light while gradually raising or lowering the applied voltage by small amounts and adjust the voltage. Once the applied voltage is determined, the photometric amount of the light source with the larger photometric amount is set to 80 to 90% of the maximum output of the photometric circuit so that both photometric amounts are approximately equally powerful.
Reduce the output of the light source itself to approximately %.
このためには、両光源がパルス点灯している場合ではパ
ルス点灯期間を短縮したり、あるいは光源の電流値を下
げたりしてバランスを取る0次に、ゼロ点を得るため1
0秒程度測定して、両光の測光値が記録される。For this purpose, if both light sources are lit in pulses, shorten the pulse lighting period or lower the current value of the light sources to balance the 0th order, and to obtain the zero point, the 1st
After measuring for about 0 seconds, the photometric values of both lights are recorded.
〔発明が解決しようとする!tillり従来の方法では
、以下の問題点があった。[Invention tries to solve it! The conventional method has the following problems.
fl、l 光電子増倍管の印加電圧を変えると、数l
Oミリ秒程度の安定化待ち時間が必要であり、また最適
な印加電圧を決定するためには、多数回の測光の試行が
必要であるため、10秒程度の処理時間が必要である。fl, l When the voltage applied to the photomultiplier tube is changed, several l
A stabilization wait time of about 0 milliseconds is required, and a large number of photometry trials are required to determine the optimum applied voltage, so a processing time of about 10 seconds is required.
(2) ホロカソードランプのパルス点灯期間や電流
値を変更することにより両光源の測光量のバランスを取
ると、ホロカソードランプの熱的平衡状態が崩れるため
発光強度が不安定となる。また、微少量だけ点灯期間や
電流値を変更して測光し、毎回目標測光量と比較して、
バランスを取るように再設定する試行を数多くする必要
があるために、処理時間がかかる。(2) If the photometric quantities of both light sources are balanced by changing the pulse lighting period or current value of the hollow cathode lamp, the thermal equilibrium state of the hollow cathode lamp will be disrupted, and the emission intensity will become unstable. In addition, we measure light by changing the lighting period and current value by a small amount, and compare it with the target light metering amount each time.
Processing time is required due to the large number of attempts to reconfigure the balance.
(3) ゼロ点の測定は一般に測定の正確さを期する
ために頻繁に行う。且つ測定時間は10秒程度が必要で
あり、処理に時間がかかる。(3) Zero point measurements are generally performed frequently to ensure measurement accuracy. Moreover, the measurement time requires about 10 seconds, and the processing takes time.
C課題を解決するための手段〕
本発明は、上記の問題点を解法するために、以下の手段
を行う。Means for Solving Problem C] The present invention implements the following means in order to solve the above problems.
+111.2度の試行的測定により得られた測光量を用
い、光電子増倍管の印加電圧と電流増倍関係式により適
当な印加電圧値を算出して決定する。Using the photometric quantity obtained from the trial measurement at +111.2 degrees, an appropriate applied voltage value is calculated and determined from the applied voltage of the photomultiplier tube and the current multiplication relational expression.
(2)光源の状態を変えることなく、測光期間を変える
ことにより測光量を調整する。また、演算処理により両
光源の測光量がほぼ等しくなるように測光期間を決定す
る。(2) Adjust the amount of photometry by changing the photometry period without changing the state of the light source. Further, the photometry period is determined by arithmetic processing so that the photometry amounts of both light sources are approximately equal.
(3)ゼロ点の測定では、新たなゼロ点の測光量を短期
間サンプリングして、再測定の必要性の有無を演算によ
り判定し、不必要な場合は測定を省略する。また、ゼロ
点の測定時間は光電子増倍管の印加電圧値により決定す
る。(3) In the measurement of the zero point, the photometric amount at the new zero point is sampled for a short period of time, and whether or not re-measurement is necessary is determined by calculation, and if unnecessary, the measurement is omitted. Further, the measurement time at the zero point is determined by the voltage value applied to the photomultiplier tube.
上記の手段により以下の作用がある。 The above means has the following effects.
il+ 光電子増倍管の最適印加電圧値の決定が極く
短期間で行える。The optimum applied voltage value for the il+ photomultiplier tube can be determined in a very short period of time.
(2)光源光量が安定したままで、且つ短期間で両光源
の測光量が等しくできる。(2) The photometric amounts of both light sources can be made equal in a short period of time while the light source light amount remains stable.
(3)ゼロ点の不必要な測定自体や測定時間を省略でき
、測定のスループットを向上できる。(3) Unnecessary zero point measurement itself and measurement time can be omitted, and measurement throughput can be improved.
本発明自体の実施例の説明を始める前に、説明を容易に
するために測光系の構成を先に説明する。Before starting the description of the embodiments of the present invention itself, the configuration of the photometry system will be described first for ease of explanation.
第2図は本発明を実行する測光系の構成を示すブロック
図である。12はホロカソードランプであり、13は重
水素ランプであり、I4は半透過ミラーであり、I5は
試料原子化部であり、16は分光器であり、17は光電
子増倍管であり、18は前置増幅器であり、19は受光
補正器であり、20は積分器であり、21はアナログデ
ジタル変換器であり、22はパルス点灯制御器であり、
23は高圧制御器であり、24は積分時間制御器であり
、25は制御用コンピュータである。ホロカソードラン
プ12と重水素ランプ13は、パルス点灯制御器22の
制御により一定の周期で交互に点灯を繰り返す、■測定
周期は、ホロカソードランプ点灯期間、バンクグランド
補正用光源点灯期間、受光補正用期間の3期間からなり
、2ミリ秒間隔で繰り返される。両光導光は半透過ミラ
ー14を経由して、試料原子化部15で吸光され、分光
器16にて測定目的元素固有の波長に分光され、光電子
増倍管17にて受光され電気信号に変換される。その後
、電気信号は前置増幅器18にて増幅され、受光補正器
I9にて受光による誤差分の補正をされた後に、積分器
20に蓄積され、アナログデジタル変換器21でデジタ
ル信号に変換されて、制御用コンピュータ25に取り込
まれる。制御用コンピュータ25は、デジタル化された
各周期毎の測光値を読み込み、高圧制御器23を介して
光電子増倍管17の印加電圧を制御し、積分時間制御器
24を介して積分器20の積分期間を制御し、ゼロ点の
値を記憶する。また、本発明の処理を実行する。積分時
間制御器24はホロカソードランプ12と重水素ランプ
13の両方の積分期間を独立に設定でき、パルス点灯制
御器22と連動して動作する。FIG. 2 is a block diagram showing the configuration of a photometric system implementing the present invention. 12 is a holocathode lamp, 13 is a deuterium lamp, I4 is a semi-transparent mirror, I5 is a sample atomization section, 16 is a spectrometer, 17 is a photomultiplier tube, 18 is a preamplifier, 19 is a light receiving corrector, 20 is an integrator, 21 is an analog-to-digital converter, 22 is a pulse lighting controller,
23 is a high pressure controller, 24 is an integral time controller, and 25 is a control computer. The hollow cathode lamp 12 and the deuterium lamp 13 are alternately turned on at regular intervals under the control of the pulse lighting controller 22. ■Measurement cycles include the hollow cathode lamp lighting period, the light source lighting period for bank ground correction, and the light receiving correction. It consists of three periods of time, and is repeated at 2 millisecond intervals. Both light guides pass through a semi-transparent mirror 14, are absorbed by a sample atomization unit 15, are separated into wavelengths specific to the target element to be measured by a spectrometer 16, are received by a photomultiplier tube 17, and are converted into electrical signals. be done. Thereafter, the electrical signal is amplified by the preamplifier 18, corrected for errors caused by light reception by the light receiving corrector I9, stored in the integrator 20, and converted into a digital signal by the analog-to-digital converter 21. , and are taken into the control computer 25. The control computer 25 reads the digitized photometric values for each cycle, controls the voltage applied to the photomultiplier tube 17 via the high voltage controller 23, and controls the voltage applied to the integrator 20 via the integration time controller 24. Controls the integration period and stores the zero point value. It also executes the processing of the present invention. The integral time controller 24 can independently set the integral periods of both the hollow cathode lamp 12 and the deuterium lamp 13, and operates in conjunction with the pulse lighting controller 22.
以下に本発明の詳細な説明する。第1図は、この発明の
処理手順を説明するフローチャートである。前記のよう
に以下の処理は試料による吸光がない状態で行われ、光
電子増倍管17の最適な印加電圧の決定、両光源の測光
値のバランス取り、ゼ・0点の測定を一括して行う。The present invention will be explained in detail below. FIG. 1 is a flowchart illustrating the processing procedure of the present invention. As mentioned above, the following processing is performed in the absence of light absorption by the sample, and the determination of the optimal voltage applied to the photomultiplier tube 17, the balancing of the photometric values of both light sources, and the measurement of the 0 and 0 points are all carried out at once. conduct.
処理lでは、試行的な500ミリ秒間のサンプリング測
光を行う、現在の測光系の状態を知るために測光値の抜
き取り検査的な意味合いで測定を行う。制御用コンピュ
ータ25は、前記のように2ξす秒周期毎に測光値を読
み込むが、このままの測光値では値のバラツキが大きい
ため、50回程度加算して測光値の平滑化を行い、1測
定点としている。1測定点を得るためには、1004す
秒掛けることになる。従って、500ミリ秒間では、5
点の平清化後のデータが得られる。この5点のデータは
更に平均され、平均値が以降の判断処理で用いられる。In process 1, a trial sampling photometry is performed for 500 milliseconds, and measurement is performed in the sense of sampling photometric values in order to know the current state of the photometry system. The control computer 25 reads the photometric values every 2ξ seconds as described above, but since the photometric values as they are will have large variations, the photometric values are smoothed by adding them about 50 times, resulting in one measurement. It is marked as a point. To obtain one measurement point, it will take 1004 seconds. Therefore, in 500 milliseconds, 5
Data after point clearing is obtained. The data of these five points are further averaged, and the average value is used in subsequent judgment processing.
次に、判断2では両光源の前記の測光平均値が共に、ア
ナログデジタル変換器21の最大出力の80から90%
の範囲に入っている場合では、光電子増倍管17の最適
な印加電圧の再設定と両光源の測光値の再バランス取り
の必要がないと判断して、分岐を実行して以下の処理を
バイパスする。Next, in judgment 2, the photometric average values of both light sources are 80 to 90% of the maximum output of the analog-to-digital converter 21.
If the value falls within the range of Bypass.
次に、処理3では積分時間制御器24を介して積分器2
0の積分期間を取り得る限り長く設定する。Next, in process 3, the integrator 2
Set the zero integration period as long as possible.
本実行例では、通常は660マイクロ秒程度に設定する
。その後、1点測定を行い、以降の処理での測光平均値
とする。In this execution example, it is normally set to about 660 microseconds. After that, one-point measurement is performed and used as the photometric average value in subsequent processing.
次に、判断4では両光源の前記の測光平均値のどちらか
一方が、アナログデジタル変換器21の最大出力値に等
しいかどうかを検査する0両方とも最大出力値末端であ
れば、処理5は不要であるので分岐を行う。Next, in judgment 4, it is checked whether one of the photometric average values of both light sources is equal to the maximum output value of the analog-to-digital converter 21. If both are at the end of the maximum output value, processing 5 is performed. Since it is not necessary, branch it.
次に、処理5では高圧制御器23を介して光電子増倍管
17の印加電圧を、充分低く200ボルト程度に設定す
る。その後50ミリ秒程度光電子増倍管17が安定する
のを待ち、1点測定を行い、以降の処理での測光平均値
とする。Next, in process 5, the voltage applied to the photomultiplier tube 17 is set to a sufficiently low level of about 200 volts via the high voltage controller 23. Thereafter, wait for about 50 milliseconds for the photomultiplier tube 17 to stabilize, perform one point measurement, and use the photometric average value in subsequent processing.
次に、処理6では上記測光平均値を用いて、光電子増倍
管の印加と電圧電流増倍率の関係式により光電子増倍管
17の適当な印加電圧の算出を行う。Next, in process 6, using the photometric average value, an appropriate applied voltage to the photomultiplier tube 17 is calculated based on a relational expression between the voltage applied to the photomultiplier tube and the voltage/current multiplication factor.
光電子増倍管の印加と電圧電流増倍率には、以下の関係
があることが知られている。It is known that the following relationship exists between the voltage applied by a photomultiplier tube and the voltage/current multiplication factor.
G=K −V” ’。G=K-V"'.
ここで、Gは光電子増倍管全体の増幅率であり、Kは定
数であり、■は光電子増倍管の陽極−陰極間に印加され
た電圧であり、αはダイノード形や材質により0.7〜
0.8の間を取る係数であり、n光電子増倍管のダイノ
ード段数である。上記式により、同一の受光量の元では
光電子増倍管17の出力電気信号量と印加電圧の間で以
下の関係式が威り立つ。Here, G is the amplification factor of the entire photomultiplier tube, K is a constant, ■ is the voltage applied between the anode and the cathode of the photomultiplier tube, and α is 0.5 depending on the dynode shape and material. 7~
It is a coefficient between 0.8 and the number of dynode stages of an n photomultiplier tube. According to the above equation, under the same amount of received light, the following relational expression is established between the output electrical signal amount of the photomultiplier tube 17 and the applied voltage.
ここで、電気13号IAは印加電圧Aを光電子増倍管1
7に印加したときの電気信号量であり、電気信号量Bは
印加電圧Bを光電子増倍管17に印加したときの電気信
号量である。nは本実施例では9であり、αは実測の結
果0.7が適当と判断して採用した。光源の平均測光量
の内、どちらか小さい値の方が測光量を電気信号IAに
代入して、この時の光電子増倍管17の印加電圧を印加
電圧へに代入して、アナログデジタル変換器21に最大
出力値の85%相当の測光値を電気信号NBに代入して
印加電圧Bを算出する。この電圧値が最適な光電子増倍
管I7の印加電圧値であり、高圧制御器23を介して光
電子増倍管17に印加し、前記同様に光電子増倍管17
が安定するのを待つ。Here, electricity No. 13 IA applies the applied voltage A to the photomultiplier tube 1
The electrical signal amount B is the electrical signal amount when the applied voltage B is applied to the photomultiplier tube 17. In this example, n is 9, and α was determined to be 0.7 as a result of actual measurements, and was therefore adopted. Of the average photometric amounts of the light source, whichever is the smaller photometric amount is substituted into the electric signal IA, and the applied voltage of the photomultiplier tube 17 at this time is substituted into the applied voltage, and the analog-to-digital converter In step 21, a photometric value equivalent to 85% of the maximum output value is substituted into the electrical signal NB to calculate the applied voltage B. This voltage value is the optimum voltage value to be applied to the photomultiplier tube I7, and is applied to the photomultiplier tube 17 via the high voltage controller 23.
wait until it stabilizes.
次に、処理7では1点測定を行い、再度光電子増倍管1
7の印加電圧が最適であることを確認し、この測定値を
以降の処理での平均測定値として用いる。万が一1両光
源の平均測光量の内、どちらか小さい方の測光量がアナ
ログデジタル変換2g21の最大出力の80から90%
の範囲に入っていない場合は、印加電圧の微少な調整を
行う。印加電圧が確定した時点で以降の処理で用いる平
均測光量の1点再測定を行う。Next, in process 7, one point measurement is performed and the photomultiplier tube 1 is again
It is confirmed that the applied voltage of step 7 is optimal, and this measured value is used as the average measured value in subsequent processing. In the unlikely event that the smaller of the average photometric amounts of both light sources is 80 to 90% of the maximum output of the analog-to-digital conversion 2g21.
If it is not within this range, make slight adjustments to the applied voltage. Once the applied voltage is determined, the average photometric amount used in subsequent processing is remeasured at one point.
次に、処理8では両光源の平均測光量の内、どちらか大
きい値の方の測光量が、アナログデジタル変換器21の
最大出力の80から90%の範囲に入るような積分期間
を算出し、積分時間制御器24を介して積分器20の積
分期間を設定する。多くの場合、処理8の時点での測光
値の大きい値の方はアナログデジタル、変換器21の最
大出力値と等しく戒っている。最大出力値と等しい場合
では、現在の積分期間を半分にして再測定をjテい、大
きい方の測光値が最大出力値末端になるまで、積分期間
を更にその半分にして、1点測定を繰り返す、最大出力
値末端の測光値が得られれば、以下の式により最適な積
分期間を算出する。Next, in process 8, an integration period is calculated such that the larger value of the average photometric amounts of both light sources falls within the range of 80 to 90% of the maximum output of the analog-to-digital converter 21. , sets the integration period of the integrator 20 via the integration time controller 24. In many cases, the larger value of the photometric value at the time of processing 8 is equal to the maximum output value of the analog/digital converter 21. If it is equal to the maximum output value, halve the current integration period and re-measure, then reduce the integration period to half again and perform one-point measurements until the larger photometric value reaches the end of the maximum output value. Once the photometric value at the end of the maximum output value is obtained, the optimum integration period is calculated using the following formula.
積分期間A=積分期間B×測光(aA+測光値Bここで
、積分期間Aは求める最適な積分期間であり、積分期間
Bは現在の積分期間である。測光値Aはアナログデジタ
ル変換器21の最大出力値の85%相当の測光値であり
、測光値Bは積分期間Bの条件で測光した測光値である
。積分時間制御器24を介して積分器20に算出された
積分期間Aを設定して、処理Iと同様のサンプリングを
再度行う。Integration period A = Integration period B x Photometry (aA + Photometry value B Here, integration period A is the optimal integration period to be found, and integration period B is the current integration period. Photometry value A is the value of the analog-to-digital converter 21. The photometric value is equivalent to 85% of the maximum output value, and the photometric value B is the photometric value measured under the conditions of the integration period B. The calculated integration period A is set in the integrator 20 via the integration time controller 24. Then, sampling similar to Process I is performed again.
次に、判断9ではゼロ点の再測定が必要かどうかを判断
する。各図でのゼロ点測定では、ゼロ点測光値の平均と
分散の両方を算出して記録する。Next, in decision 9, it is determined whether re-measurement of the zero point is necessary. In the zero point measurement in each figure, both the average and variance of the zero point photometric values are calculated and recorded.
次に、ゼロ点の平均値に分散の定倍分を加算してゼロ点
上限値を作り、ゼロ点の平均値から分散の定倍分を減算
してゼロ点下限値を作り、今回サンプリング測定で得ら
れた測光値と前回の上下限値を比較する。サンプリング
測定で得られた測光値が上下限の範囲以内であればゼロ
点の再測定は不必要であると判断して分岐を行い、以下
の処理をバイパスする。なお、上記の上下限値に用いる
定倍値は安全率からの検討も必要であるが、本実施例で
は2を用いている。Next, add the constant times the variance to the average value of the zero point to create the upper limit of the zero point, and subtract the constant times the variance from the average value of the zero point to create the lower limit of the zero point. Compare the photometric value obtained with the previous upper and lower limit values. If the photometric value obtained by sampling measurement is within the upper and lower limits, it is determined that re-measurement of the zero point is unnecessary, branching is performed, and the following processing is bypassed. Note that the constant multiplication value used for the above upper and lower limit values requires consideration from the safety factor, but in this embodiment, 2 is used.
次に、処理IOでは光電子増倍管17の印加電圧値から
ゼロ点の測定時間を決めている。測定目的元素を、ホロ
カソードランプ12が明るいグループ、普通のグループ
、暗いグループの3つに分類する。Next, in the processing IO, the zero point measurement time is determined from the applied voltage value of the photomultiplier tube 17. The elements to be measured are classified into three groups: a group where the hollow cathode lamp 12 is bright, a normal group, and a dark group.
この分類尺度には、光電子増倍管17への印加電圧値を
用い、電圧が350ボルト以下、450ボルト以下、そ
れ以外に分け、それぞれの測定時間を2秒、5秒、10
秒とした0次に、処理11でこの条件に従いゼロ点を測
定し、新たなゼロ点の平均11、分散を算出して記録す
る。This classification scale uses the voltage value applied to the photomultiplier tube 17, dividing the voltage into 350 volts or less, 450 volts or less, and other voltages, and measuring time for each of 2 seconds, 5 seconds, and 10 seconds.
Next, in step 11, the zero point is measured according to this condition, and the new average 11 and variance of the zero point are calculated and recorded.
本発明により光電子増倍管の印加電圧の決定と両光導光
の測光値のバランス取りが1〜2秒程程度完了するよう
になった。また、ゼロ点の実行を一定時間間隔で行うよ
うなスケジュールを組んでも、測定が不要と判断すれば
自動的に省略してくれるため全測定のスルーブツトが低
下せずに且つ、信頼性の高い測定を実行できるようにな
った。According to the present invention, the determination of the voltage applied to the photomultiplier tube and the balancing of the photometric values of both light guides can be completed in about 1 to 2 seconds. In addition, even if you set a schedule to perform zero point execution at fixed time intervals, if it is determined that the measurement is unnecessary, it will be automatically omitted, so the throughput of all measurements will not decrease and you can achieve highly reliable measurements. can now be executed.
第1図は本発明の処理手順の実施例を示すフローチャー
トであり、第2図は本発明の実施例で使用した測光系の
ブロック図である。
】・・・サンプリング測定(処理1)
2・・・バランスの判定 (判断2)
3・・・再測定 (処理3)
4・・・最大値の判断 (判断4)
5・・・再測定 (処理5)
6・・・最適印加電圧算出(処理6)
7 ・ ・
8 ・ ・
9 ・ ・
10・ ・
11 ・ ・
12・ ・
13・ ・
14・
15・ ・
16・ ・
17・ ・
18・ ・
19・
20・ ・
21・ ・
22・ ・
23・ ・
24・ ・
25・ ・
・再測定 (処理7)
・バランス取り (処理8)
・ゼロ点判断 (判断9)
・測定時間決定 (処理10)
・ゼロ点測定 (処理11)
・ホロカソードランプ
・重水素ランプ
・半透過ミラー
・試料原子化部
・分光器
・光電子増倍管
・前置増幅器
・炎光補正器
・積分器
アナログデジタル変換器
・パルス点灯制御器
・高圧制御器
・積分時間制御器
・制御用コンピュータ
フロー+〒−ト
裏1図
清“1光系フ゛口、・、7図
第2図FIG. 1 is a flowchart showing an embodiment of the processing procedure of the present invention, and FIG. 2 is a block diagram of a photometry system used in the embodiment of the present invention. ]... Sampling measurement (processing 1) 2... Judgment of balance (judgment 2) 3... Re-measurement (processing 3) 4... Judgment of maximum value (judgment 4) 5... Re-measurement ( Process 5) 6...Optimum applied voltage calculation (Process 6) 7 ・ ・ 8 ・ ・ 9 ・ ・ 10 ・ ・ 11 ・ 12 ・ 13 ・ 14 ・ 15 ・ 16 ・ 17 ・ 18 ・19・ 20・ ・ 21・ ・ 22・ ・ 23・ ・ 24・ ・ 25・ ・Re-measurement (Processing 7) ・Balancing (Processing 8) ・Zero point judgment (Judgment 9) ・Measurement time determination (Processing 10)・Zero point measurement (Process 11) ・Holo cathode lamp ・Deuterium lamp ・Semi-transparent mirror ・Sample atomization section ・Spectrometer ・Photomultiplier tube ・Preamplifier ・Flame light corrector ・Integrator analog-to-digital converter ・Pulse lighting controller, high voltage controller, integral time controller, control computer flow + 1 light system on the back of the page, Figure 7, Figure 2
Claims (1)
トル光を出す光源の光を交互に試料原子化部中に透過さ
せ、原子化部透過後の両スペクトル光を測光する構成を
有し、原子化部における試料による吸光がない状態での
両光源光の測光値の大きさが測光回路の最大出力付近と
なるように、光電子増倍管の印加電圧と電流増倍関係式
を用いる演算により印加電圧を決定する手段を有し、両
光源光の測光値の大きさがほぼ等しくなるように積分期
間を演算により決定する手段を有し、ゼロ点測定の必要
性の有無を自動的に判断して測光時間を決定する手段を
有することを特徴とする原子吸光光度計。It has a configuration in which the light from a light source that emits an emission line spectrum of the target element and the light from a light source that emits continuous spectrum light are transmitted alternately into the sample atomization section, and the light from both spectra after passing through the atomization section is photometered. The applied voltage is adjusted by calculating the applied voltage of the photomultiplier tube and the current multiplication relational expression so that the magnitude of the photometric value of the light from both light sources in the absence of light absorption by the sample in the section is near the maximum output of the photometric circuit. and a means for determining the integration period by calculation so that the photometric values of both light sources are approximately equal, and automatically determining whether or not zero point measurement is necessary. An atomic absorption spectrophotometer, characterized in that it has means for determining photometry time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32294089A JPH03181845A (en) | 1989-12-12 | 1989-12-12 | Atomic absorption spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32294089A JPH03181845A (en) | 1989-12-12 | 1989-12-12 | Atomic absorption spectrometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03181845A true JPH03181845A (en) | 1991-08-07 |
Family
ID=18149333
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP32294089A Pending JPH03181845A (en) | 1989-12-12 | 1989-12-12 | Atomic absorption spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03181845A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107003236A (en) * | 2014-11-23 | 2017-08-01 | 株式会社富士金 | Optical type gas method for measurement of concentration and the gas concentration monitoring method based on this method |
-
1989
- 1989-12-12 JP JP32294089A patent/JPH03181845A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107003236A (en) * | 2014-11-23 | 2017-08-01 | 株式会社富士金 | Optical type gas method for measurement of concentration and the gas concentration monitoring method based on this method |
| JPWO2016080532A1 (en) * | 2014-11-23 | 2017-08-31 | 株式会社フジキン | Optical gas concentration measuring method and gas concentration monitoring method using the method |
| US10408742B2 (en) | 2014-11-23 | 2019-09-10 | Fujikin Incorporated | Optical gas concentration measuring method by forming a differential signal using lights with different absorbabilities to a raw material in a gas flow path using a time-sharing method |
| CN107003236B (en) * | 2014-11-23 | 2020-08-11 | 株式会社富士金 | Optical gas concentration measuring method and gas concentration monitoring method based on the same |
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