JPH03189832A - Testing system for device - Google Patents

Abstract

PURPOSE:To eliminate the need of development of a test program of every device, and also, to facilitate the management by executing a test corresponding to a standard or changed function by referring to a change information table with regard to the device whose function is different partially, based on the standardized and developed test program as a standard. CONSTITUTION:A change information table 3-1 stores change information to a standard test of a function by a test program 2 so as to correspond to the device. At the time of executing a test of the device by a standardized and developed test program 2, a matching program 3 executes the test of the device, based on the change information stored in the change information table 3-1. Accordingly, based on the standardized and developed test program 2 as a standard, with regard to the device whose function is different partially, the test corresponding to a standard or changed function is executed by referring to the change information table 3-1. In such a way, the test of the device whose function is different partially can be executed easily by the same hardware, etc., and also, development of the test program of every device becomes unnecessary due to a different function test, and moreover, the management can be facilitated.

Description

[Detailed Description of the Invention] [Summary] Regarding a test method that tests the functionality of a device using a test program, a test program that has been developed as a standard is used as a standard, and a change information table is referred to for devices with partially different functions. This makes it easy to test devices with partially different functions using the same hardware, and eliminates the need to develop test programs for each device to test different functions. For the purpose of easy management, there is a test program that tests the functionality of equipment, and a change information table that stores in advance change information for equipment that has a function that is partially different from the functionality of the equipment being tested by this test program. When testing a device using the above test program, if change information for the device to be tested is stored in the change information table, it is necessary to perform a test on the device based on this change information. program, and is configured to use this matching program to test a device having Il capabilities that are partially different from the functions of the device being tested by the test program.

[Industrial application field]

The present invention relates to a device test method for testing 81 capabilities of the device using a test program.

[Prior art and problems to be solved by the invention] Conventionally, when performing a functional test of devices such as input/output devices in a computer system, as shown in FIG. -1, device (B), 23-2, etc., test program for device (A) for each device (^) 231, device (B) 23-2, etc. that matches the specifications of the functions desired by the user. 22-1. A test program 22-2 for device (B) and the like were created to perform functional tests on these devices. Therefore, if there is a change in the specifications of a common part of a large number of devices with slightly different specifications, it becomes necessary to change the test programs created for each of these many devices, making management complicated. Additionally, there is a problem in that the user of the test program has to perform the test while being aware of the relationship between the device name and the test program.

The present invention uses a normally developed test program as a standard, refers to a change information table for devices with partially different functions, and performs tests corresponding to the standard or changed functions. The purpose of this invention is to easily test functional devices, eliminate the need to develop test programs for each device for different functional tests, and facilitate management.

[Means to solve problems]

FIG. 1 shows a basic configuration diagram of the present invention.

In FIG. 1, test program 2 is a standardly developed test program that tests the functionality of the device.

The matching program 3 is a program that tests the device based on change information when the change information for the standard test is stored in the change information table 31 when testing the device using the test program 2. It is.

The change information table 3-1 is a table that stores change information for standard tests of functions by the test program 2 in association with devices.

[Effect]

As shown in FIG. 1, in the present invention, when testing a device using a test program 2, a matching program 3 stores change information of the device to be tested in a change information table 3-1. Sometimes, equipment tests are performed based on this change information.

Therefore, by referring to the change information table 3-1 for devices with partially different functions using the test program 2 developed as a standard and conducting tests corresponding to the standard or changed functions, it is possible to use the same hardware, etc. It becomes possible to easily test devices with partially different functions, and it becomes unnecessary to develop test programs 2 for each device for different function tests, making management easier.

〔Example〕

Next, the configuration and operation of one embodiment of the present invention will be explained in detail using FIGS. 1 to 3.

In FIG. 1, test program 2 is a test program developed as a standard for testing the functions of the device. This test program 2 is a test program (1), (2), (3) that has been developed as a standard for each function that tests a channel device, etc., which has the same hardware and has the specifications of the function desired by the user. ), (4), etc.

The matching program 3 is used when testing the device (A) 4-1, device (B) 4-2, etc. that has the same software with the specifications desired by the user using the test program 2. , is a program for testing the functions of the device based on the change information for standard tests when the change information table 31 stores the change information.

The change information table 3-1 shows the device (A) 41 and the device (B) whose functions are to be tested by the test program 2.
4-2, etc., when the test program 2 partially differs from the standard function test, this table stores change information in association with the device.

Device (A) 4-1 and devices (B) 4-2 are devices (for example, channel devices) that have the same hardware and are provided with functions desired by the user. In the figure, the part marked with a dotted line in the device (B) as "Device 1. Parts with different functions from (A)" is a part that is different from the standard device (A) 4-1 according to the user's wishes. This is a part whose function has been partially changed.

When the function is partially changed in this way, the change information table 3-1 is updated so that the function of the changed part can be tested in the test program of the standardly developed device (A) 4-1. 1, change information is registered in advance in association with the device (B) 4-1. As a result, the matching program 3, which was given control by the test program 2 during the test, implements the test (functional test) corresponding to this change information W(B)4-
It becomes possible to do this for 2.

Next, the operation of the configuration of one embodiment of the present invention will be explained in detail using FIG.

In Figure 2, ■ indicates that test program 2 is running a functional test (
11, (2), (3), and (4) are started to be executed in sequence, and control is passed to the matching program 3. This starts the sequential execution of the functional tests (IJ, (2), (3), and (4)) of the test program 2 developed as a standard that runs on the host computer 1, and passes control to the matching program 3. .

■ is one of the devices that the matching program 3, which was given control in ■, refers to the change information table 3-1 and attempts to test.
1. It is determined whether or not the fact that the ability is different has been registered in advance. If NO (for standard functions, test program 2
If the device can be tested as is by the function tests (1), (2), (3), and (4), use the test program 2 function tests (1), C), (3), Using (4), test the device (A) 4-1, etc. as it is. YES
In this case, refer to the change information table 3-1 for the different functions with ■, and change the function test of test program 2 +1 with ■.
1, (2), (3), and (4) are changed to test the functions of the device (B) 4-2, etc.

As described above, by preparing the test program 2 developed in a standard manner, and performing a function test on the device whose function has been partially changed by referring to the change information table 3-1 by the matching program 3 according to the change information. In order to test devices with the same hardware but partially different functions, the device can be tested by a simple operation of storing change information in the change information table 3-1.

Next, a specific example will be explained using FIG.

In FIG. 3, ■ indicates that the unload test program (test program 201 test program) developed to perform a standard functional test on the device (A) 4-1 has status information l1l (device (A) The test is started based on the program 3'i, and the control 3'i right is passed to the matching program 3.

[phase] is system? When the matching program 3, which has acquired the 11 rights, refers to the status information in the change information table 3-1 for the unload test, it shows that the information for device (B) is registered, and the information for device (B) is registered. Since it was found that the functions were different, tests were conducted on the device (B) according to (1) and (2). In this case, since the functions are not different for device (A) 4-1, the answer is NO, and test program 3 is selected with ■.
Test the functions of W(A) 4-1 as is.

(2) refers to the status information for the 7 load test for device (B).

■ is the device (B) using the status information referenced in ■.
Perform the function test in 4-2.

In the same manner, tests for other functions are also performed.

〔Effect of the invention〕

As explained above, according to the present invention, a test program corresponding to standard or changed functions is performed by referring to the change information table 3-1 for devices with partially different functions using the test program 2 developed as a standard. Because it uses a configuration that performs the It can make management easier. Further, during testing, there is no need to be aware of the relationship between the test program 2 and the functions of the device to be tested, and it is possible to efficiently test devices with partially different functions.

[Brief explanation of drawings]

FIG. 1 is a diagram illustrating the principle of the present invention, FIG. 2 is a diagram illustrating an embodiment of the present invention, FIG. 3 is a detailed explanatory diagram of the present invention, and FIG. 4 is an explanatory diagram of the prior art. In the figure, ■ represents a host computer, 2 represents a test program, 3 represents a matching program, 3-1 represents a change information table, and 2 represents a device to be subjected to a functional test.

Claims (1)

[Claims] In a test method that tests the functionality of a device using a test program, there is provided a test program (2) that tests the functionality of the device, and a test program (2) that tests the functionality of the device using this test program (2). A change information table (3-1) that stores change information for devices with partially different functions; and a change information table (3-1) that stores change information in advance for devices with partially different functions. When the change information of the device for which the test is to be performed is stored, the harmonized program (3) that tests the device based on this change information is
), and this harmonized program (3) allows the test program (2
) is characterized in that it is configured to test a device whose function is partially different from that of the device being tested.