JPH03191876A - Method for detecting filament breakage of lamp - Google Patents

Method for detecting filament breakage of lamp

Info

Publication number
JPH03191876A
JPH03191876A JP1332439A JP33243989A JPH03191876A JP H03191876 A JPH03191876 A JP H03191876A JP 1332439 A JP1332439 A JP 1332439A JP 33243989 A JP33243989 A JP 33243989A JP H03191876 A JPH03191876 A JP H03191876A
Authority
JP
Japan
Prior art keywords
detection
voltage
bulb
current
detection resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1332439A
Other languages
Japanese (ja)
Other versions
JP2617804B2 (en
Inventor
Hideji Matsui
秀次 松井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZENIRAITO V KK
Zeni Lite Buoy Co Ltd
Original Assignee
ZENIRAITO V KK
Zeni Lite Buoy Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ZENIRAITO V KK, Zeni Lite Buoy Co Ltd filed Critical ZENIRAITO V KK
Priority to JP1332439A priority Critical patent/JP2617804B2/en
Publication of JPH03191876A publication Critical patent/JPH03191876A/en
Application granted granted Critical
Publication of JP2617804B2 publication Critical patent/JP2617804B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (イ)産業上の利用分野 この発明は例えば灯浮標の照明用等の電球断芯検出方法
に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application This invention relates to a method for detecting breakage of a light bulb for lighting a light buoy, for example.

(σ)従来の技術 従来灯浮標等において、照明用の電球の断芯を検出する
方法として、第3図に示すように、電球(1)の回路に
、検出抵抗(2)を直列に挿入し、この抵抗の両端に発
生する電圧をコンパレータ(3)を介して、電流信号と
して取り出す、即ち、検出抵抗の両端に発生する電圧の
有無によって、断芯の検出を行う方法がとられていた。
(σ) Conventional technology A detection resistor (2) is inserted in series in the circuit of a light bulb (1) as shown in Fig. 3 as a method for detecting the breakage of a lighting bulb in a conventional light buoy, etc. However, the voltage generated at both ends of this resistor is extracted as a current signal via a comparator (3), that is, the breakage is detected by the presence or absence of voltage generated at both ends of the detection resistor. .

(八)発明が解決しようとする問題点 このような従来の方法は、検出抵抗での電圧降下ロスを
少なくするためには、抵抗値をできるだけ下げる必要が
あるが、抵抗値があまり低いと、小電流の電球を使用し
た場合、検出抵抗での発生電圧が低く、検出が困難であ
り、また、逆に検出抵抗を大きくすると、小電流の場合
でも検出できる反面大電流の電球を使用したときの電圧
ロスが大きくなるという欠点がある。
(8) Problems to be solved by the invention In such conventional methods, in order to reduce the voltage drop loss in the detection resistor, it is necessary to lower the resistance value as much as possible, but if the resistance value is too low, When using a light bulb with a small current, the voltage generated at the detection resistor is low and detection is difficult.On the other hand, if the detection resistor is increased, even a small current can be detected, but when a light bulb with a large current is used. The disadvantage is that the voltage loss increases.

例えば、検出抵抗値 0.1Ω、使用電球電圧12vと
すると、電球電流0.25 Aのときの検出(ロス)電
圧は0.025Vであるが、電球電流8Aのときの検出
(ロス)電圧は0.8■となる。
For example, if the detection resistance value is 0.1Ω and the bulb voltage used is 12V, the detection (loss) voltage when the bulb current is 0.25 A is 0.025V, but the detection (loss) voltage when the bulb current is 8A is It becomes 0.8■.

即ち、0.25A電球では、電球電圧の低下は2゜1%
と低いが、検出電圧としては低い値であり検出困難とな
る。逆に8A電球では0.8Vと検出には充分な電圧が
発生するが、電球電圧の低下も6゜7%と大きくなる。
In other words, for a 0.25A light bulb, the drop in light bulb voltage is 2.1%.
However, as a detection voltage, it is a low value and difficult to detect. Conversely, an 8A light bulb generates a voltage of 0.8V, which is sufficient for detection, but the drop in light bulb voltage is also large, at 6.7%.

(ニ)問題点を解決するための手段 この発明は、断芯検出は、常時連続して行う必要はない
ことに着目し、検出抵抗は適宜な抵抗値のものを用い、
検出抵抗回路に自動制御装置を備えた(図示せず)FE
Tを並設することによって、例えば、1m5ec位の短
時間の間に、検出動作を行わせな後、100m5ec位
の時間は検出動作を停止させるという間欠的に検出する
方法である。
(d) Means for solving the problem This invention focuses on the fact that core breakage detection does not need to be performed continuously all the time, and uses a detection resistor with an appropriate resistance value.
FE equipped with an automatic control device (not shown) in the detection resistor circuit
By arranging T in parallel, this is an intermittent detection method in which the detection operation is not performed for a short period of time, for example, about 1 m5 ec, and then the detection operation is stopped for about 100 m5 ec.

(ネ)作用 このようにすれば、例えば、1m5ec位のごく短時間
、FETのゲートをLレベルとし、FETをOFFの状
態とする。これにより電球電流は全て検出抵抗に流れ、
検出抵抗の両端に電圧を発生する。この間に検出動作を
行わせる。続いて、100m5ec位の時間FETのゲ
ートを1ルベルとじFETをONの状態とすれば、電球
電流は殆どFETに流れ検出抵抗での電圧ロスは最小限
のものとなる。この間は検出動作は停止する。
(f) Function By doing this, the gate of the FET is brought to the L level for a very short period of time, for example, about 1 m5 ec, and the FET is turned off. As a result, all the bulb current flows to the detection resistor,
Generates a voltage across the detection resistor. During this time, a detection operation is performed. Next, if the gate of the FET is closed by 1 level for about 100 m5ec and the FET is turned on, most of the bulb current flows through the FET and the voltage loss at the detection resistor is minimized. During this time, the detection operation is stopped.

従って小Il流電球でも充分な検出電圧が得られまた、
大電流でもロス電圧は低い。
Therefore, a sufficient detection voltage can be obtained even with a small Il flow lamp, and
Loss voltage is low even at large currents.

(へ)実施例 この発明を第1図に示す回路図に従って説明すると、電
球(1)の回路に直列に挿入された検出抵抗(2)の両
端間に接続きれたコンパレータ(3)と並列に、F E
 T (5)をそのソースSとドレインDを接続するこ
とで設ける。
(F) Embodiment To explain this invention according to the circuit diagram shown in FIG. , F E
T (5) is provided by connecting its source S and drain D.

第2図は波形図で上からF E T (5)のゲートG
1検出抵抗(2)の電圧およびコンノ(レータ(3)の
出力波形図である。本例ではF E T (5)のゲー
トGのHレベルを100m5ec間隔で1m5ecLレ
ベルとする。このLレベルの時電球電流は全て検出抵抗
(2)に流れ検出抵抗の両端に電圧を発生し、コンパレ
ータ(3)の電流検出出力が現れる。この間に断芯検出
動作を行わせる。
Figure 2 is a waveform diagram showing the gate G of FET (5) from the top.
1 detection resistor (2) and the output waveform of the controller (3). In this example, the H level of the gate G of FET (5) is set to the 1 m5ecL level at 100m5ec intervals. At this time, all of the lamp current flows through the detection resistor (2), generating a voltage across the detection resistor, and the current detection output of the comparator (3) appears.During this time, the disconnection detection operation is performed.

即ち、検出動作時間は、100 m5ec毎に1回1m
 see時行うという間欠検出となる。
In other words, the detection operation time is 1m every 100m5ec.
This is an intermittent detection that is performed at the time of "see".

これにより、平均ロス電圧は、非検出時のものに近くな
る。これを更に具体的に説明すれば、例えば、検出抵抗
(2)の抵抗値を0.5Ω、F E T (5)のON
時の抵抗を0.05Ω、使用電球電圧を12■とした時
、 検出動作時は、 電球電流0.25Aのとき、検出(ロス)電圧0゜25
v 電球電流8Aのとき、検出(ロス)電圧、4vであり、
また、検出休止時は、 電球電流0.25Aのとき、検出(ロス)電圧0゜11
v 電球電流8Aのとき、検出(ロス)電圧0.36Vとな
り、0.25A電球でも、検出に充分な電圧が得られ、
8 A i! fltでも、ロス電圧は3%と低くおき
えることができる。
As a result, the average loss voltage becomes close to that during non-detection. To explain this more specifically, for example, if the resistance value of the detection resistor (2) is 0.5Ω, and the ON value of FET (5) is
When the current resistance is 0.05Ω and the bulb voltage used is 12μ, the detection (loss) voltage is 0°25 when the bulb current is 0.25A.
v When the bulb current is 8A, the detection (loss) voltage is 4V,
In addition, when the detection is stopped, the detection (loss) voltage is 0°11 when the bulb current is 0.25A.
v When the bulb current is 8A, the detection (loss) voltage is 0.36V, and even with a 0.25A bulb, sufficient voltage for detection can be obtained.
8 Ai! Even with flt, the loss voltage can be kept as low as 3%.

なお、FET(5)のゲートGに間欠的に信号を供給し
、コンパレータ(3)の出力より電球の断芯を検出する
方法は、例えば次のようにすればよい。第4図は検出部
のブロック図、第5図は断芯検出タイムチャートである
Note that a method of intermittently supplying a signal to the gate G of the FET (5) and detecting a break in the light bulb from the output of the comparator (3) may be performed as follows, for example. FIG. 4 is a block diagram of the detection section, and FIG. 5 is a core breakage detection time chart.

発振N(6)の出力をバイナリ−カウンター(7)でカ
ウントし、その出力をROM (8)のアドレスに入力
し、あらかじめ書き込んであるR OM (8)データ
をO番地から順次読み出す事でタイミング信号(信号A
、48号B)を得る。
The output of oscillation N (6) is counted by a binary counter (7), the output is input to the address of ROM (8), and the timing is determined by sequentially reading out the ROM (8) data written in advance from address O. Signal (Signal A
, No. 48B) is obtained.

信号Aは、100 m5ecに1回1m5ecの間、L
レベルとなる様ROM (8)にデータを入れである。
Signal A is L for 1m5ec once every 100m5ec.
Insert data into the ROM (8) so that the level is met.

又、信号Bは、信号AがLレベルの中間でHレベルパル
スを1回出力する様、ROMにデータを入れである。
Further, signal B has data stored in the ROM so that an H level pulse is output once when signal A is at L level.

信号Aは、FETのゲートに入力し、信号Bはう・ンチ
回路(9)に入力する事で、18号A h(Lレベルに
なり、FETがOFFしたために、電球電流が電流検出
抵抗に全て流れている時のコンパレータ出力を、信号B
の立上りによりラッチ回路で、断芯検出タイミング時の
コンパレータ出力状態を保持する。
Signal A is input to the gate of the FET, and signal B is input to the input circuit (9), so that No. 18A h (becomes L level and the FET is turned off, so the bulb current flows to the current detection resistor. The comparator output when all flows are signal B.
At the rising edge of , the latch circuit holds the comparator output state at the core breakage detection timing.

電球正常時は、信号AがLレベルの時、検出抵抗電圧が
高くなるため、コンパレータ出力がHレベルとなりラッ
チ回路及び、信号Bにより、この状態(Hレベル)を保
持する。又、電球断芯時は、電流がゼロのため、信号A
がLレベルになっても、検出抵抗電圧はゼロとなり、こ
れをラッチ回路及び、(g号Bで保持するため、断芯信
号(Lレベル)として取り出せる。
When the bulb is normal, when the signal A is at L level, the detection resistor voltage becomes high, so the comparator output becomes H level, and this state (H level) is maintained by the latch circuit and signal B. Also, when the bulb is broken, the current is zero, so the signal A
Even if it becomes L level, the detection resistance voltage becomes zero, and since this is held by the latch circuit and (g-B), it can be taken out as a core break signal (L level).

(ト)効果 このように、簡単な方式により、小電流電球から大電流
電球までの広範囲の電流負荷に対して、無調整で対応で
き、電球の光力低下も少ない。また、検出抵抗での消費
電力も小ざくて済み、発熱が少ないため小型化できる特
徴がある。
(g) Effects As described above, the simple method can handle a wide range of current loads from small current bulbs to large current bulbs without any adjustment, and there is little reduction in the luminous power of the bulb. In addition, the power consumption of the detection resistor is small, and because it generates little heat, it can be made smaller.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の構成を示す回路図、第2図はその動作
を示す波形図、第3図は従来の構成を示す回路図である
。第4図はFETのゲートに間欠信号を供給しコンパレ
ータよりの出力より電球の断芯を検出する検出部のブロ
ック図、第5図はその断芯検出のタイムチャートである
。 (1)・・・・ 電球、(2)・・・・ 検出抵抗、(
3)・・・・コンパレータ、(4)・・・・ コンパレ
ータ用基準電源、(5)・・・ FET。 フイζ−Z
FIG. 1 is a circuit diagram showing the configuration of the present invention, FIG. 2 is a waveform diagram showing its operation, and FIG. 3 is a circuit diagram showing the conventional configuration. FIG. 4 is a block diagram of a detection section that supplies an intermittent signal to the gate of the FET and detects a break in the light bulb from the output from the comparator, and FIG. 5 is a time chart of the break detection. (1)... Light bulb, (2)... Detection resistor, (
3)... Comparator, (4)... Reference power supply for comparator, (5)... FET. F ζ−Z

Claims (1)

【特許請求の範囲】[Claims] 電球回路に直列に検出抵抗を挿入し、この検出抵抗の両
端子間の電圧の有無により電球の断芯検出を行うように
した電球断芯検出方法において、検出抵抗の両端子間に
FET(電界効果トランジスタ)を並設し、検出抵抗の
両端子間の電圧検出を、間欠的に行うようにしたことを
特徴とする電球断芯検出方法。
In a light bulb breakage detection method, a detection resistor is inserted in series in the light bulb circuit, and a light bulb breakage is detected based on the presence or absence of voltage between both terminals of the detection resistor. 1. A method for detecting a broken core in a light bulb, characterized in that the voltage between both terminals of a detection resistor is detected intermittently by arranging a plurality of transistors (effect transistors) in parallel.
JP1332439A 1989-12-21 1989-12-21 Bulb decentering detection device for light buoys Expired - Fee Related JP2617804B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1332439A JP2617804B2 (en) 1989-12-21 1989-12-21 Bulb decentering detection device for light buoys

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1332439A JP2617804B2 (en) 1989-12-21 1989-12-21 Bulb decentering detection device for light buoys

Publications (2)

Publication Number Publication Date
JPH03191876A true JPH03191876A (en) 1991-08-21
JP2617804B2 JP2617804B2 (en) 1997-06-04

Family

ID=18254990

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1332439A Expired - Fee Related JP2617804B2 (en) 1989-12-21 1989-12-21 Bulb decentering detection device for light buoys

Country Status (1)

Country Link
JP (1) JP2617804B2 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6180794A (en) * 1984-09-27 1986-04-24 富士通株式会社 Lamp disconnection detecting circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6180794A (en) * 1984-09-27 1986-04-24 富士通株式会社 Lamp disconnection detecting circuit

Also Published As

Publication number Publication date
JP2617804B2 (en) 1997-06-04

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