JPH03210405A - Probe holder - Google Patents
Probe holderInfo
- Publication number
- JPH03210405A JPH03210405A JP355290A JP355290A JPH03210405A JP H03210405 A JPH03210405 A JP H03210405A JP 355290 A JP355290 A JP 355290A JP 355290 A JP355290 A JP 355290A JP H03210405 A JPH03210405 A JP H03210405A
- Authority
- JP
- Japan
- Prior art keywords
- probe
- holder
- electrostrictive element
- cylindrical
- holder body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Description
【発明の詳細な説明】
[a業上の利用分野]
本発明は、走査型トンネル顕微鏡およびその応用された
装置に用いる探針ホルダー機構に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a probe holder mechanism used in a scanning tunneling microscope and an apparatus to which the same is applied.
[従来の技術]
近年、走査型トンネル顕微鏡(STM)の研究が盛んに
なっている。そのSTMでは試料と探針の距離をnmオ
ーダーまで接近させるため振動などの外因によって両者
が接触して破損してしまうことが多くその探針を交換す
ることが不可避である。このような探針交換を行うため
に探針をこれらのアクチュエーターに固定した第2図の
ような治具を利用して接続し、電歪素子3の先端に設け
た探針1のみを交換可能としている
[ F、Be5enbacher、E、Laegsga
ard、に、MortensenU、N1elsen、
and 1.Stensgaard:Rev、Sci、
Instruw:vol59(7)、July 19
88]。[Prior Art] In recent years, research on scanning tunneling microscopes (STM) has become active. In the STM, since the distance between the sample and the probe is brought close to the order of nanometers, external factors such as vibration often cause the two to come into contact and be damaged, making it unavoidable to replace the probe. In order to exchange such probes, the probes are fixed to these actuators using a jig as shown in Figure 2 to connect them, and only the probe 1 provided at the tip of the electrostrictive element 3 can be replaced. [F, Bebenbacher, E, Laegsga]
ard, ni, Mortensen U, N1elsen,
and 1. Stensgaard: Rev, Sci.
Instruw: vol59(7), July 19
88].
[発明が解決しようとする課題〕
しかしながら、前記従来の方法では円筒型の電歪素子3
の先端部に重量の重い部材が取り付けられるために電歪
素子と探針1を組み合せた系(走査ヘッドと称する)の
慣性モーメントが増し共振周波数が低くなるため高速の
走査が困難であり、また針状の探針をビンセットなどを
使用して直接取り替えねばならないことから、扱いにく
く取り付はミスなどにより探針が損傷することが多かっ
た。[Problems to be Solved by the Invention] However, in the conventional method, the cylindrical electrostrictive element 3
Because a heavy member is attached to the tip of the probe 1, the moment of inertia of the system (referred to as the scanning head) that combines the electrostrictive element and probe 1 increases, and the resonance frequency decreases, making high-speed scanning difficult. Since the needle-shaped probe must be replaced directly using a bottle set, it is difficult to handle and the probe is often damaged due to installation mistakes.
本発明は上記従来技術の欠点に鑑みなされたものであっ
て、簡単な構造で軽量化を図り、高速走査および高信頼
性走査を可能とする探針ホルダーの提供を目的とする。The present invention has been made in view of the above-mentioned drawbacks of the prior art, and an object of the present invention is to provide a probe holder that has a simple structure, is lightweight, and enables high-speed scanning and highly reliable scanning.
[課題を解決するための手段]
本発明では前記目的を達成するため樹脂を用いて探針ホ
ルダーを作成しバネ機構もしくは凹凸部を探針ホルダー
のみ、または探針ホルダーと円筒型電歪素子の内部の両
方に設けている。[Means for Solving the Problems] In order to achieve the above-mentioned object, the present invention creates a probe holder using resin, and the spring mechanism or the uneven portion is formed by combining only the probe holder or the probe holder and a cylindrical electrostrictive element. Both are installed inside.
[作用]
本発明構成により素子重量が減少し、またバネ式もしく
は凹凸による接続の補強方法を採用したため、共振周波
数が素子単体の共振周波数に近付き、高速の走査が可能
となる。そしてホルダーとと探針を交換する機構にした
ため取扱が容易になり、操作性が向上し簡便な試料観察
が実現する。[Function] The structure of the present invention reduces the element weight, and since a spring type or uneven connection reinforcement method is adopted, the resonant frequency approaches the resonant frequency of the element itself, and high-speed scanning becomes possible. The mechanism allows the holder and probe to be exchanged, making it easier to handle, improving operability and making sample observation easier.
[実施例]
第1図(a)〜(d)は本発明による実施例の探針ホル
ダーの各別の例を示す概略図である。各側において、ホ
ルダー本体6は樹脂材料で形成し、このホルダー本体6
の上部に探針1が装着される。(a)、(b)は切り欠
き4を設けて圧入を補助し、これにより生じたバネ力で
固定するタイプである。(C)、(d)は凸部5をホル
ダー本体6側に設けて固定するタイプである。該凸部5
に嵌合する凹部を円筒型電歪素子に設けてもよい。図中
の斜線部分2は電極取り出し用の金属部材である。本実
施例では樹脂材料としてポリカーボネイトを用いて図の
ような形状を形成する。そして、このホルダー本体6を
円筒型電歪素子(図示しない)に圧入して固定する。そ
の形成過程において樹脂が硬化する前に、探針材料であ
るタングステン(W)の線材と電極引出し用の金属2を
挿入し固める。探針部の先端形状の形成は電解研摩法や
機械研摩によって行う、また探針ホルダーの表面を探針
材料とは接続しないように金属皮膜を施しグランド電位
にしておき円筒型電歪素子の内部電極をグランド電位と
して用いることでガードリングとしての効果を持たせア
クチュエーターの駆動信号や外来ノイズなどによる測定
信号のSZN比の低下を防ぐことができる。なお本実施
例では樹脂材料にポリカーボネイトを使用したが本発明
はこれに限定するものでなく、ABS (アクリルニト
リルブタジェンスチレン共重合樹脂)、ふっ素樹脂、ポ
リプロピレン、メタクリル樹脂など種々の物が使用でき
る。[Example] FIGS. 1(a) to 1(d) are schematic diagrams showing different examples of probe holders according to embodiments of the present invention. On each side, the holder body 6 is formed of a resin material;
A probe 1 is attached to the upper part of the probe. (a) and (b) are types in which a notch 4 is provided to assist press-fitting, and the resulting spring force is used to fix the product. (C) and (d) are types in which the convex portion 5 is provided on the holder main body 6 side and fixed. The convex portion 5
The cylindrical electrostrictive element may be provided with a recess that fits into the cylindrical electrostrictive element. The shaded area 2 in the figure is a metal member for taking out the electrode. In this embodiment, polycarbonate is used as the resin material to form the shape shown in the figure. Then, this holder main body 6 is press-fitted into a cylindrical electrostrictive element (not shown) and fixed. In the formation process, before the resin hardens, a tungsten (W) wire rod as a probe material and a metal 2 for leading out the electrode are inserted and hardened. The shape of the tip of the probe is formed by electrolytic polishing or mechanical polishing.Also, a metal coating is applied to the surface of the probe holder so that it does not connect with the probe material, and the surface of the probe holder is kept at ground potential.The inside of the cylindrical electrostrictive element is By using the electrode as a ground potential, it has an effect as a guard ring and can prevent the SZN ratio of the measurement signal from decreasing due to the drive signal of the actuator or external noise. Although polycarbonate was used as the resin material in this example, the present invention is not limited to this, and various materials such as ABS (acrylonitrile butadiene styrene copolymer resin), fluororesin, polypropylene, and methacrylic resin can be used. .
第3図(a)、(b)は円筒型電歪素子の内側にも探針
ホルダーとの嵌合用の凹凸を設けた場合の実施例の概略
図である。第3図(a)は側面断面図、(b)は斜視図
である。FIGS. 3(a) and 3(b) are schematic diagrams of an embodiment in which unevenness for fitting with a probe holder is provided also on the inside of the cylindrical electrostrictive element. FIG. 3(a) is a side sectional view, and FIG. 3(b) is a perspective view.
探針ホルダー6側に設けられた凹部7と円筒型電歪素子
3に設けられた凸部8が噛み合い固定を強固なものとし
探針ホルダー側の切り欠き4によるバネ機構が交換時の
着脱を容易にしている。ホルダー6の樹脂材料には塩化
ビニルを使用し、円筒型電歪素子3にはPZT:チタン
酸ジルコン酸鉛<Pb(Zr4i)Os >製の物を用
いた。The concave part 7 provided on the probe holder 6 side and the convex part 8 provided on the cylindrical electrostrictive element 3 mesh to ensure firm fixation, and a spring mechanism with a notch 4 on the probe holder side facilitates attachment and detachment during replacement. It's easy. Vinyl chloride was used as the resin material of the holder 6, and the cylindrical electrostrictive element 3 was made of PZT: lead zirconate titanate (Pb(Zr4i)Os).
第4図に本発明を用いた走査型トンネル顕微鏡の側面図
を示す0円筒型電歪素子3の先端に探針1が取り付けら
れる。9は測定すべき試料である。(A)は探針部の拡
大図である。10はZ軸粗動マイクロメータ、11はI
−Vアンプ、12はZ軸ロックネジ、13は2軸徹動マ
イクロメータ、14はスタック型除振台を示す。FIG. 4 shows a side view of a scanning tunneling microscope using the present invention. A probe 1 is attached to the tip of a cylindrical electrostrictive element 3. 9 is a sample to be measured. (A) is an enlarged view of the probe section. 10 is a Z-axis coarse movement micrometer, 11 is an I
-V amplifier, 12 is a Z-axis lock screw, 13 is a two-axis transverse micrometer, and 14 is a stack type vibration isolation table.
[発明の効果]
樹脂材料を用いることで非常に軽量であり、圧入方式に
よる接続が可能で探針取り付は取り外しが、非常に簡便
な探針ホルダーが実現する。[Effects of the Invention] By using a resin material, it is possible to realize a probe holder that is extremely lightweight, can be connected by press-fitting, and can be attached and removed easily.
STMのアクチュエーター系の慣性モーメントが減少し
共振周波数が高くなり高速の走査に適した走査ヘッドが
実現する。The moment of inertia of the STM actuator system is reduced, the resonant frequency is increased, and a scanning head suitable for high-speed scanning is realized.
高速走査の可能な走査ヘッドを用いたためデータの取得
時間が短縮されたため熱ドリフトによる位置誤差および
試料の経時変化による表面の劣化に起因した解像度の低
下などが減少し安定性の高い走査型トンネル顕微鏡が実
現する。A highly stable scanning tunneling microscope that uses a scanning head capable of high-speed scanning to shorten data acquisition time, reducing positional errors caused by thermal drift and decreases in resolution caused by surface deterioration due to changes in the sample over time. will be realized.
第1図(a)〜(d)は本発明の各別の実施例の構成説
明図、
第2図は従来の探針保持機構の概略図、第3図(a)、
(b)は本発明の別の実施例の側面図および斜視図、
第4図は本発明を用いたSTMの側面図である。
1:探針、
2:電極引出し用金属、
3;円筒型電歪素子。
第2図
第
図
(0)
(b)
第3図FIGS. 1(a) to (d) are configuration explanatory diagrams of different embodiments of the present invention, FIG. 2 is a schematic diagram of a conventional probe holding mechanism, FIG. 3(a),
(b) is a side view and a perspective view of another embodiment of the present invention, and FIG. 4 is a side view of an STM using the present invention. 1: Probe, 2: Metal for electrode extraction, 3: Cylindrical electrostrictive element. Figure 2 Figure (0) (b) Figure 3
Claims (3)
材料からなるホルダー本体に前記円筒型電歪素子に対す
る固定手段を設けたことを特徴とする探針ホルダー。(1) A probe holder characterized in that a cylindrical holder body made of an insulating resin material that fits into a cylindrical electrostrictive element is provided with means for fixing the cylindrical electrostrictive element.
設けた軸方向の切欠からなり、該ホルダー本体を円筒型
電歪素子に圧入することによりその弾性により、該ホル
ダー本体を電歪内に固定保持するように構成したことを
特徴とする特許請求の範囲第1項記載の探針ホルダー。(2) The fixing means consists of an axial notch provided in the cylindrical holder body, and by press-fitting the holder body into the cylindrical electrostrictive element, its elasticity allows the holder body to be inserted into the electrostrictive element. The probe holder according to claim 1, wherein the probe holder is configured to be fixedly held.
電歪素子の一方に設けた凸部および他方に設けた該凸部
と嵌合する凹部からなることを特徴とする特許請求の範
囲第1項記載の探針ホルダ(4)前記ホルダー本体表面
を導電性材料でコーティングし、該導電性材料をアース
したことを特徴とする特許請求の範囲第1項記載の探針
ホルダー。(3) The fixing means comprises a convex portion provided on one of the holder main body and the cylindrical electrostrictive element, and a concave portion provided on the other side that fits into the convex portion. Probe holder according to claim 1 (4) The probe holder according to claim 1, characterized in that the surface of the holder body is coated with a conductive material, and the conductive material is grounded.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP355290A JPH03210405A (en) | 1990-01-12 | 1990-01-12 | Probe holder |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP355290A JPH03210405A (en) | 1990-01-12 | 1990-01-12 | Probe holder |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03210405A true JPH03210405A (en) | 1991-09-13 |
Family
ID=11560588
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP355290A Pending JPH03210405A (en) | 1990-01-12 | 1990-01-12 | Probe holder |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03210405A (en) |
-
1990
- 1990-01-12 JP JP355290A patent/JPH03210405A/en active Pending
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