JPH03212949A - Burn-in system - Google Patents

Abstract

PURPOSE:To automatically execute an additional burn-in operation and to prevent dead time and failure of an operator from taking place by a method wherein an additional burn-in time selection part and a timer part are installed and the additional burn-in time is set according to the fraction defective of ICs under test. CONSTITUTION:A signal which is output from each IC 1 under test is judged at a judgment part 2. A judged result is stored in a storage part 3. Then, the fraction defective of the IC is computed at an additional burn-in time selection part 5. A signal which instructs the additional burn-in time is sent to a timer part 6. The burn-in time is changed automatically according to the fraction defective of the IC 1. A function which automatically sets an impressed voltage to the IC 1 and the input timing instead of the time may be installed. By the constitution that the additional burn-in time is set automatically by the fraction defective of the IC 1, a sure burn-in operation to obtain the IC of a prescribed quality level can be executed easily and quickly.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a burn-in apparatus for accelerating the occurrence of initial defects in semiconductor devices.

[Prior Art] FIG. 2 is a block diagram showing the configuration of a conventional burn-in device. In the figure, (1) is an IC under test (2) is a judgment unit that judges the output signal sent from the IC under test (1), (3) is a storage unit that stores the judgment results, and (4) is a judgment unit. This is a display section that displays the results.

Next, I will explain @saku. The output signal of each IC under test (1) is judged by the judgment part (2) K, and the judgment result is stored in the storage part (
3). Next, the determination result after the burn-in is completed is displayed on the display section (4).

[Problem to be solved by the invention]

Since the conventional burn-in apparatus is configured as described above, after the burn-in is completed, the operator must determine the additional burn-in time based on the determination result, which results in wasted time until the additional burn-in is started. There were problems such as making it easy to make mistakes in setting the additional burn-in time.

This invention was made to solve the problems of the first generation, and can automatically perform additional burn-in and eliminate wasted time and operator mistakes.

[Means to solve the problem]

The burn-in device according to the present invention automatically calculates the defective rate of the IC to be measured, automatically selects an additional burn-in time, and sets a timer.

[Effect]

In the present invention, the additional burn-in time selection section selects an appropriate additional burn-in time from a preset correspondence table between failure rate and additional burn-in time, depending on the magnitude of the failure rate of the IC to be measured.

〔Example〕

Hereinafter, one embodiment of the present invention will be explained with reference to the drawings.
The figure is a block diagram showing the configuration of a burn-in device. In the figure, (1) to (4) are the same as those shown in the conventional example of FIG. 2, so their explanation will be omitted.

(5) is an additional burn-in time selection unit that calculates the defective rate and selects an additional burn-in time, and (6) is a timer part that sets the burn-in time.

Next, the operation will be explained. The signal output from each IC to be measured (1) is judged by a judging section Q), and the judgment result is stored in a storage section (3). Next, the additional burn-in time selection unit (5) calculates the defective rate of the IC under test (1), and sends a signal instructing the additional burn-in time to the timer part (6).
) to measure the burn-in time of the IC under test (1).
Automatically change according to the defective rate.

In addition, in the above embodiment, the function to automatically set the additional burn-in time was shown, but instead of the time,
A function may be provided to automatically set the voltage applied to the IC under test (1) and the input timing.

[Effects of the Invention j As described above, according to the present invention, since the additional burn-in time is automatically set based on the defective rate of the IC to be measured, it is possible to ensure the burn-in time to obtain rc of a predetermined quality level. can be carried out easily and quickly.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing a burn-in device according to an embodiment of the present invention, and FIG. 2 is a block diagram showing a conventional burn-in device. In the figure, (1) is the IC to be measured, (2) is the determination section,
(3) is a storage section, (4) is a display section, (5) is an additional burn-in time selection section, and (6) is a part of a timer. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

[Claims] A burn-in device having a function of determining the output of a device, characterized in that the burn-in device has a function of automatically changing burn-in conditions based on the determination result.