JPH03220718A - Manufacturing apparatus for semiconductor - Google Patents
Manufacturing apparatus for semiconductorInfo
- Publication number
- JPH03220718A JPH03220718A JP1586190A JP1586190A JPH03220718A JP H03220718 A JPH03220718 A JP H03220718A JP 1586190 A JP1586190 A JP 1586190A JP 1586190 A JP1586190 A JP 1586190A JP H03220718 A JPH03220718 A JP H03220718A
- Authority
- JP
- Japan
- Prior art keywords
- plate
- heater
- shaped
- substrate
- grooves
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 12
- 239000004065 semiconductor Substances 0.000 title claims abstract description 11
- 238000010438 heat treatment Methods 0.000 claims abstract description 33
- 238000006243 chemical reaction Methods 0.000 claims abstract description 14
- 239000010453 quartz Substances 0.000 claims abstract description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 10
- 238000004544 sputter deposition Methods 0.000 claims abstract description 4
- 239000010409 thin film Substances 0.000 claims abstract description 4
- 230000005540 biological transmission Effects 0.000 claims abstract description 3
- 239000000758 substrate Substances 0.000 claims description 18
- 239000000463 material Substances 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Landscapes
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、反応室の面状発熱体上の基板上で導入された
ガスの化学反応を行わせ、基板上に薄膜を形成するCV
D、スパッタ等の半導体製造装置。Detailed Description of the Invention [Industrial Application Field] The present invention is a CV method for forming a thin film on a substrate by causing a chemical reaction of a gas introduced on a substrate on a planar heating element in a reaction chamber.
D. Semiconductor manufacturing equipment such as sputtering.
とくに面状発熱体に関する。In particular, it relates to sheet heating elements.
一般に、半導体製造装置は、第5図に示すように1反応
室(1)に面状発熱板(2)を設け、この発熱板(2)
上に基板(3)を載置し、基板(3)を発熱板(2)に
より高温に加熱し、膜にしようとする拐料のガス(4)
を反応室(1)に導入し、基板(3)上で分解、還元、
酸化。In general, semiconductor manufacturing equipment includes a planar heating plate (2) provided in one reaction chamber (1) as shown in FIG.
A substrate (3) is placed on top, and the substrate (3) is heated to a high temperature by a heat generating plate (2) to form a film with the gas (4).
is introduced into the reaction chamber (1) and decomposed, reduced, and
oxidation.
置換などの化学反応を行わせ、基板(3)上に所望の博
腺を形成する。A chemical reaction such as substitution is performed to form a desired complex on the substrate (3).
なお、同図において、(5)はヒータ、(6)は電極で
ある。In addition, in the figure, (5) is a heater, and (6) is an electrode.
そして、従来の前記面状発熱体(2)は、第6図ないし
第8図に示すように、焼結型の赤外線の透過が良くない
セラミックスからなる円板状の熱板(7)の上面に、渦
巻状の溝(8)を形成し、その溝(8)に断面円形のヒ
ータ(9)を埋設し、熱板(7)の上下面を熱板(7)
と同材質の押え板αF、(11,1によりはさんで構成
し、上側の押え板aQの上面にSTJ’S、Mo等から
なる金属プレートを設け、そのプレート上に基板を載置
している。As shown in FIGS. 6 to 8, the conventional planar heating element (2) has an upper surface of a disc-shaped heating plate (7) made of a sintered ceramic that does not transmit well infrared rays. A spiral groove (8) is formed in the groove (8), a heater (9) with a circular cross section is embedded in the groove (8), and the upper and lower surfaces of the hot plate (7) are connected to the hot plate (7).
A metal plate made of STJ'S, Mo, etc. is provided on the upper surface of the upper presser plate aQ, and the substrate is placed on the plate. There is.
なか、溝(8)の断面は一辺が約1間の正方形で半径方
向の溝(8)の間隔は約1問弱であり、ヒータ(9)の
直径は1 am弱である。The cross section of the grooves (8) is a square with a side of about 1 mm, the interval between the grooves (8) in the radial direction is about 1 mm, and the diameter of the heater (9) is about 1 mm.
従来の前記発熱体(2)の場合、溝(8ン技びヒータ(
9)が渦巻状であるため1通電時ヒータ(9)が伸張し
て拡大し、熱板(7)の上面部汝び上側の押え板OO1
を破損する。In the case of the conventional heating element (2), the groove (8-inch heater (
Since heater (9) is spiral-shaped, the heater (9) expands and expands when energized once, and the upper surface of the heating plate (7) is pressed against the upper presser plate OO1.
damage.
さらに、ヒータ(9)からの熱は、上側の押え根囲及び
金属プレートが赤外線を透過しないため、伝導によシ基
板(3)に到達し、基板(3)を急速加熱することがで
きない。Furthermore, the heat from the heater (9) reaches the substrate (3) by conduction because the upper presser base and metal plate do not transmit infrared rays, and the substrate (3) cannot be heated rapidly.
本発明は、前記の点に留意し、熱板及び押え板の破損を
防止し、急速加熱を司能にした半導体製造装置を提供す
ることを目的とする。The present invention has been made with the above-mentioned points in mind, and an object of the present invention is to provide a semiconductor manufacturing apparatus capable of rapid heating while preventing damage to the heating plate and the holding plate.
前記課題を解決するために1本発明の半導体製造装置は
、反応室の面状発熱体上に基板を設け、前記基板上で導
入されたガスの化学反応を行わせ。In order to solve the above-mentioned problems, one aspect of the semiconductor manufacturing apparatus of the present invention is to provide a substrate on a planar heating element in a reaction chamber, and to cause a chemical reaction of the introduced gas to occur on the substrate.
前記基板上に薄膜を形成するCVD、スパッタ等の半導
体製造装置に釦いて、
前記面状発熱体を、上面を複数個の扇形の区画に等分割
した円板状の熱板と、前記各区画毎に中心部側から周縁
部側へと1周縁部側から中心部側へと、同心円状に折返
して形成された溝と、前記前に埋設された横方向に長寸
の断面矩形状のヒータと、別記熱板上に重合され赤外線
の透過の良好な石英からなる円板状の押え板とにより構
成したものである。A semiconductor manufacturing apparatus such as CVD or sputtering that forms a thin film on the substrate is equipped with a disk-shaped heating plate whose upper surface is equally divided into a plurality of fan-shaped sections, and a disk-shaped heating plate whose upper surface is equally divided into a plurality of sector-shaped sections; a groove formed by folding concentrically from the center side to the peripheral side and from the peripheral side to the center side, and a heater having a horizontally long rectangular cross section buried in the front. and a disk-shaped holding plate made of quartz that is polymerized on a heating plate and has good transmission of infrared rays.
前記のように構成された本発明の半導体製造装置は、円
板状の熱板の上面を複数個の扇形の区画に尋分割し、各
区画毎に同心円状に折返した溝を形成し、その溝に横方
向に長寸の断面矩形状のヒータを埋設し、熱板に赤外線
の透過の良好な石英からなる円板状の押え板を重合した
ため、ヒータの円周方向の伸張が折返しにより相殺され
て極めて小さく、熱板の上面部を破損しなく、玄た、ヒ
ータの断面が横方向に長くて扁平であυ、上側の押え板
を破損することもなく、均一に加熱できる。In the semiconductor manufacturing apparatus of the present invention configured as described above, the upper surface of the disc-shaped hot plate is divided into a plurality of fan-shaped sections, and a concentrically folded groove is formed in each section. A heater with a rectangular cross section that is long in the horizontal direction is buried in the groove, and a disc-shaped press plate made of quartz that transmits infrared rays is superimposed on the heating plate, so that the expansion of the heater in the circumferential direction is offset by folding. The heating plate is extremely small and does not damage the upper surface of the heating plate, and the cross section of the heater is long and flat in the horizontal direction, allowing for uniform heating without damaging the upper holding plate.
さらに、上側の押え板が赤外線の透過の良好な石英から
なるため、伝導でなく輻射によりサセプタを加熱でき、
急速加熱が可能であシ、消費電力も大幅に削減できる。Furthermore, since the upper holding plate is made of quartz that transmits infrared rays well, the susceptor can be heated by radiation rather than conduction.
Rapid heating is possible, and power consumption can be significantly reduced.
1実施例について、第1図ないし第4図を参照して説明
する。One embodiment will be described with reference to FIGS. 1 to 4.
それらの図面において、0は面状発熱体(2)の円板状
の熱板であり、赤外線の透過の良好な溶解型の透明な石
英からなる。αのは熱板(2)の上面を複数個の扇形に
等分割して形成された区画であう、図示は4分割を示す
。In those drawings, 0 is a disc-shaped heating plate of the planar heating element (2), which is made of fused transparent quartz that transmits infrared rays well. α is a section formed by equally dividing the upper surface of the hot plate (2) into a plurality of sector shapes; the illustration shows four divisions.
a<は各区画0毎に同心円状に折返して形成された溝で
あシ、中心部側から周縁部側へと1周縁部側から中心部
側へと)唄次に形成され、各区画α4毎のkQΦは中心
部側又は周縁部側で隣接の区画a3の#)αゆに連通し
ている。a< is a groove formed by concentrically folding back for each section 0, and is formed from the center side to the periphery side (from the periphery side to the center side), and each section α4 Each kQΦ communicates with #)α of the adjacent section a3 on the center side or the peripheral side.
曲は溝αΦに埋設されたヒータであう、横方向に長寸の
断面短形状であり、板体から打抜きによジ形成され、幅
が4〜5朋、厚みが約1朋である。The curve is a heater embedded in the groove αΦ, and has a rectangular cross-sectional shape that is long in the horizontal direction, and is formed by punching from a plate, and has a width of 4 to 5 mm and a thickness of about 1 mm.
(IQは熱板(2)の上面に重合された上側の押え板で
あり、熱板(2)と同材質からなり、下面の一部が溝σ
4)の上側に嵌合している。α力は熱板(2)の下面に
重合された下側の押え板であシ、熱板(2)と同材質か
らなる。(IQ is the upper presser plate superimposed on the upper surface of the hot plate (2), made of the same material as the hot plate (2), and a part of the lower surface has grooves σ
4) is fitted on the upper side. The α force is a lower pressing plate superimposed on the lower surface of the hot plate (2), and is made of the same material as the hot plate (2).
(縛は面状発熱体(2)のハウジングであり、5us8
04からなる。α鐘は上側の押え板QQ上のサセプタで
あシ、熱板(2)と同材質からなう、基板(3)が載置
宮れる。(The binding is the housing of the planar heating element (2), 5us8
Consists of 04. The α bell is a susceptor on the upper holding plate QQ, on which a substrate (3) made of the same material as the heating plate (2) is placed.
そして、前記のように、サセプタQすが赤外線の透過の
良好な石英からなる場合、ヒータα旬からの熱が上側の
押え板αQ及びサセプタ0つを透過し、輻射熱として基
板(3)に伝達されるため、基板(3)をより急速に加
熱することができる。As mentioned above, when the susceptor Q is made of quartz that transmits infrared rays well, the heat from the heater α passes through the upper holding plate αQ and the susceptors, and is transferred to the substrate (3) as radiant heat. Therefore, the substrate (3) can be heated more rapidly.
なか、サセプタα轡にカーボンを用いる場合は。Among them, when carbon is used for the susceptor.
サセプタ09)の上面での温度の均一性をよう向上する
ことができる。The temperature uniformity on the upper surface of the susceptor 09) can thus be improved.
筐た、反応室(1)の雰囲気にH2、ハロゲンガス等が
ある場合は、サセプクqツとして金属又はコーテ4
ィングを行ったカーホンを用いてもよい。If the atmosphere in the reaction chamber (1) contains H2, halogen gas, etc., a metal or coated carphone may be used as the susceptor.
本@用は、以上説明したように構成されているので、以
下に記載する効果を奏する。Since this @ version is configured as explained above, it produces the effects described below.
熱板q力の上面が複数個の扉形の区画α東に等分割され
、各区画α1毎に同心円状に折返した溝σ→が形成され
、その溝αΦに横方向に長寸の断面矩形状のヒータQ■
が埋設され、熱板亜に赤外線の透過の良好な石英からな
る押え板σQが重合されているため。The upper surface of the hot plate q-force is equally divided into a plurality of door-shaped sections α east, and a concentrically folded groove σ→ is formed in each section α1, and a long cross-sectional rectangle in the horizontal direction is formed in the groove αΦ. Shape heater Q■
is buried, and a holding plate σQ made of quartz that transmits infrared rays is polymerized on the heating plate.
ヒータQ51の円周方向の伸張が折返しによう相殺され
て極めて小埒<、熱板(2)の上面部、即ち半径方向の
溝(14)間の突部を破損することが防止され、かつ、
ヒータQ51が扁平であるため、上側の押え板α呻を破
損することもなく、均一に加熱することができる。The expansion of the heater Q51 in the circumferential direction is canceled out by the bending, so that the upper surface of the hot plate (2), that is, the protrusion between the radial grooves (14), is prevented from being damaged. ,
Since the heater Q51 is flat, it can heat the upper presser plate α uniformly without damaging it.
その上、上側の押え板QOが赤外線の適過の良好な石英
からなるため、ヒータα■が輻射によシサセプク0りを
加熱でき、急速加熱を可能とすることができ、消費電力
を大幅に削減することができる。In addition, since the upper presser plate QO is made of quartz, which has a good infrared rays tolerance, the heater α can heat the heat sink by radiation, making rapid heating possible and greatly reducing power consumption. can be reduced.
第1図ないし第4図は本発明の半導体製造装置の1実施
例の要部を示し、第1図は面状発熱体の一部破断乎面図
、第2図は第1図の破断正面図。
集3図は第2図の一部の拡大図、第4図は面状発熱体を
組込んだ状態の一部の切断正面図、第5図は反応室の概
略正面図、第6図ないし第8図は従゛来例を示し、第6
図は面状発熱体の一部破断乎面図、第7図は第6図の破
断正面図、第8図は第7図の一部の拡大図である。
(1)・・・反応室、(2)・・・面状発熱体、(3)
・・・基板、αの・・・熱板、σ1・・・区画、0勺・
・・溝、05)・・・ヒータ、αQ・・・押え板。1 to 4 show essential parts of an embodiment of the semiconductor manufacturing apparatus of the present invention, FIG. 1 is a partially cutaway view of a planar heating element, and FIG. 2 is a cutaway front view of FIG. 1. figure. Fig. 3 is an enlarged view of a part of Fig. 2, Fig. 4 is a partially cutaway front view with the planar heating element installed, Fig. 5 is a schematic front view of the reaction chamber, and Figs. Figure 8 shows a conventional example;
The figure is a partially cutaway view of the planar heating element, FIG. 7 is a cutaway front view of FIG. 6, and FIG. 8 is a partially enlarged view of FIG. 7. (1)...Reaction chamber, (2)...Planar heating element, (3)
...Substrate, α...hot plate, σ1...section, 0x.
...Groove, 05)...Heater, αQ...Press plate.
Claims (1)
導入されたガスの化学反応を行わせ、前記基板上に薄膜
を形成するCVD、スパッタ等の半導体製造装置におい
て、 前記面状発熱体を、上面を複数個の扇形の区画に等分割
した円板状の熱板と、前記各区画毎に中心部側から周縁
部側へと、周縁部側から中心部側へと、同心円状に折返
して形成された溝と、前記溝に埋設された横方向に長寸
の断面矩形状のヒータと、前記熱板上に重合され赤外線
の透過の良好な石英からなる円板状の押え板とにより構
成した半導体製造装置。[Scope of Claims] 1. Semiconductor manufacturing using CVD, sputtering, etc., in which a substrate is provided on a planar heating element in a reaction chamber, and a chemical reaction of gas introduced on the substrate is performed to form a thin film on the substrate. In the device, the planar heating element includes a disk-shaped heating plate whose upper surface is equally divided into a plurality of fan-shaped sections, and a circular heating plate for each section from the center side to the periphery side, and from the periphery side to the center. A groove formed by folding back concentrically toward the bottom side, a heater with a rectangular cross section that is long in the horizontal direction and buried in the groove, and a heater made of quartz that is superimposed on the hot plate and has good transmission of infrared rays. A semiconductor manufacturing device configured with a disk-shaped presser plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015861A JP2551182B2 (en) | 1990-01-25 | 1990-01-25 | Semiconductor manufacturing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015861A JP2551182B2 (en) | 1990-01-25 | 1990-01-25 | Semiconductor manufacturing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03220718A true JPH03220718A (en) | 1991-09-27 |
| JP2551182B2 JP2551182B2 (en) | 1996-11-06 |
Family
ID=11900584
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015861A Expired - Fee Related JP2551182B2 (en) | 1990-01-25 | 1990-01-25 | Semiconductor manufacturing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2551182B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6626236B1 (en) * | 1999-03-24 | 2003-09-30 | Komatsu Ltd. | Substrate temperature control plate and substrate temperature control apparatus comprising same |
| JP2006080491A (en) * | 2004-07-16 | 2006-03-23 | Applied Materials Inc | Heated substrate support for chemical vapor deposition |
| US7718930B2 (en) | 2003-04-07 | 2010-05-18 | Tokyo Electron Limited | Loading table and heat treating apparatus having the loading table |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63278322A (en) * | 1987-05-11 | 1988-11-16 | Fujitsu Ltd | Vapor growth device |
-
1990
- 1990-01-25 JP JP2015861A patent/JP2551182B2/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63278322A (en) * | 1987-05-11 | 1988-11-16 | Fujitsu Ltd | Vapor growth device |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6626236B1 (en) * | 1999-03-24 | 2003-09-30 | Komatsu Ltd. | Substrate temperature control plate and substrate temperature control apparatus comprising same |
| US7718930B2 (en) | 2003-04-07 | 2010-05-18 | Tokyo Electron Limited | Loading table and heat treating apparatus having the loading table |
| JP2006080491A (en) * | 2004-07-16 | 2006-03-23 | Applied Materials Inc | Heated substrate support for chemical vapor deposition |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2551182B2 (en) | 1996-11-06 |
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