JPH03220738A - Manufacturing equipment for resin-encapsulated semiconductor devices - Google Patents

Manufacturing equipment for resin-encapsulated semiconductor devices

Info

Publication number
JPH03220738A
JPH03220738A JP1487390A JP1487390A JPH03220738A JP H03220738 A JPH03220738 A JP H03220738A JP 1487390 A JP1487390 A JP 1487390A JP 1487390 A JP1487390 A JP 1487390A JP H03220738 A JPH03220738 A JP H03220738A
Authority
JP
Japan
Prior art keywords
die pad
resin
mold
lower mold
semiconductor element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1487390A
Other languages
Japanese (ja)
Inventor
Tatsuhiko Akiyama
龍彦 秋山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP1487390A priority Critical patent/JPH03220738A/en
Publication of JPH03220738A publication Critical patent/JPH03220738A/en
Pending legal-status Critical Current

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Landscapes

  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

PURPOSE:To control the position of a die pad by installing a die pad position control means, which controls the position of the die pad, located below the die pad and inside a mold. CONSTITUTION:An attempt is made to install a die pad 2 on which a semicon ductor element 1 to be resin-sealed is placed, a lead frame 5 obtained by electri cally connecting the semiconductor element 1 and a lead by wire bonding by way of a gold wire 3, and an upper mold 6. A further attempt is made to install a lower mold 4 installed in conformity with the upper mold 6 and designed to place the die pad 2 and the lead frame 5 thereon and die pad position control means 10 and 11, which are located below the die pad 2 within the lower mold 4 and designed to control the position of the die pad as well. This construction makes it possible to control the position of the die pad and embody stable manufacturing of the die pad whose thickness is 1.27mm and below.

Description

【発明の詳細な説明】 [産業上の技術] この発明は、樹脂封止型半導体装置の製造装置に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Technology] The present invention relates to an apparatus for manufacturing a resin-sealed semiconductor device.

[従来の技術] 第3図は従来の樹脂封止型半導体装置を示す断面図であ
る。図において(1)は半導体素子、(2)はこの半導
体素子(1)が載置されるダイパッド、(3)は半導体
素子(1)とリード(図示しない)を接続する金線、(
4)はダイパッド(2)が載置される下金型、(5)は
半導体素子(1)とリードを金線(3)を介してワイヤ
ポンディングにより電気的に接続して得られたリードフ
レーム、(6)は下金型(4)に対応して設けられた上
金型、(7)はこの上金型(6)に設けられて後述のモ
ールド樹脂を注入する通路となるゲート、(8)はこの
モールド樹脂、(9)は上金型(6)と下金型(4)を
一定圧力でクランプした後それらの間に形成されるモー
ルド樹脂(8)の鋳型としてのキャビティである。
[Prior Art] FIG. 3 is a sectional view showing a conventional resin-sealed semiconductor device. In the figure, (1) is a semiconductor element, (2) is a die pad on which this semiconductor element (1) is placed, (3) is a gold wire connecting the semiconductor element (1) and a lead (not shown), (
4) is the lower mold on which the die pad (2) is placed, and (5) is the lead obtained by electrically connecting the semiconductor element (1) and the lead via the gold wire (3) by wire bonding. frame, (6) is an upper mold provided corresponding to the lower mold (4), (7) is a gate provided in this upper mold (6) and serves as a passage for injecting molding resin, which will be described later; (8) is this mold resin, and (9) is a cavity as a mold for the mold resin (8) formed between the upper mold (6) and lower mold (4) after they are clamped at a constant pressure. be.

従来の樹脂封止型半導体装置の製造装置は上述したよう
に構成され、半導体素子(1)が載置されたダイパッド
(2)、および半導体素子(1)とリードを金線(3)
で電気的に接続した、ワイヤボンディング完了済のリー
ドフレーム(5)を下金型(4)上に載置する。次に、
この下金型(4)と上金型(6)とを一定圧力でクラン
プする。これにより、モールド樹脂(8)の鋳型となる
キャビティ(9)、およびこのキャビティ(9)へモー
ルド樹脂(8)を注入する通路となるゲート(7)が成
形される。ここで、組立完了後の樹脂封止型半導体装置
の全体の厚みが1.27mm以下になるようにキャビテ
ィ(9)の厚みも、1.27mm以下に設計されている
。次に、溶融されて低粘度になったモールド樹脂(8)
をゲト(7)を通してキャビティ(9)に注入する。こ
のモールド樹脂(8)は半導体素子(1)、ダイパッド
(2)を中心として上下に分れて注入され、最終的にキ
ャビティ(9)がモールド樹脂(8)により完全に充填
された段階で注入は完了する。
A conventional manufacturing apparatus for a resin-sealed semiconductor device is configured as described above, and includes a die pad (2) on which a semiconductor element (1) is placed, and a gold wire (3) that connects the semiconductor element (1) and leads.
The lead frame (5), which has been electrically connected and has undergone wire bonding, is placed on the lower mold (4). next,
The lower mold (4) and upper mold (6) are clamped under constant pressure. As a result, a cavity (9) that serves as a mold for the mold resin (8) and a gate (7) that serves as a passage for injecting the mold resin (8) into the cavity (9) are formed. Here, the thickness of the cavity (9) is also designed to be 1.27 mm or less so that the overall thickness of the resin-sealed semiconductor device after assembly is 1.27 mm or less. Next, mold resin (8) that has been melted and has a low viscosity
is injected into the cavity (9) through the gate (7). This mold resin (8) is injected in upper and lower parts around the semiconductor element (1) and die pad (2), and is finally injected when the cavity (9) is completely filled with the mold resin (8). is completed.

[発明が解決しようとする課題] 上記のような従来の樹脂封止型半導体装置の製造装置で
は、モールド樹脂(8)の、キャビティ(9)内での流
動挙動は流路の厚みに依存して変化し、この厚みが小さ
い程モールド樹脂(8)は流れ難くなる。今、ダイパッ
ド(2)の変位がモールド樹脂(8)注入前に0.1m
mあった場合、キャビティ厚を1.0mm、半導体素子
厚を0.4mn+、ダイパッド厚を0.10mmとする
と、上下キャビティ(9)の流路厚比は、 2 となり、またキャビティ厚を2.6mm、半導体素子厚
を0.4mm、タイパノド厚を0.2mmとすると、流
路厚比は、 2 となる。従って、キャビティ厚か小さい程モールド前の
ダイパッド変動の影響を受は易く、モールド樹脂(8)
の注入バランスが崩れ易い。このように注入バランスが
崩れると、ボイドが発生したり、或いはダイパッド(2
)そのものがモールド樹脂(8)の流動圧力により大き
く変位するなとの問題点があった。
[Problems to be Solved by the Invention] In the conventional resin-encapsulated semiconductor device manufacturing apparatus as described above, the flow behavior of the mold resin (8) within the cavity (9) depends on the thickness of the flow path. The smaller the thickness, the more difficult it becomes for the mold resin (8) to flow. Now, the displacement of die pad (2) is 0.1m before injection of mold resin (8).
m, the cavity thickness is 1.0 mm, the semiconductor element thickness is 0.4 mm+, and the die pad thickness is 0.10 mm, then the channel thickness ratio of the upper and lower cavities (9) is 2, and the cavity thickness is 2. 6 mm, the semiconductor element thickness is 0.4 mm, and the type plate thickness is 0.2 mm, the channel thickness ratio is 2. Therefore, the smaller the cavity thickness, the more susceptible it is to die pad fluctuations before molding, and the mold resin (8)
The injection balance is easily disrupted. If the injection balance is disrupted in this way, voids may occur or die pads (2
) itself was subject to large displacement due to the flow pressure of the mold resin (8).

この発明は、このような問題点を解決するためになされ
たもので、ダイパッド位置を制御できると共に、全体の
厚みが1.27mm以下の樹脂封止型半導体装置を安定
して製造てきる装置を得ることを目的とする。
This invention was made to solve these problems, and provides an apparatus that can control the die pad position and stably manufacture resin-sealed semiconductor devices with an overall thickness of 1.27 mm or less. The purpose is to obtain.

[課題を解決するための手段] この発明に係る樹脂封止型半導体装置の製造装置は、ダ
イパッドの下方で下金型内に設けられ、前記ダイパッド
の位置を検出するダイパッド位置検出手段を設け、また
このダイパッド位置検出手段に加えて、前記ダイパッド
の位置を検出してその検出信号をダイパッド位置制御手
段へ供給するダイパッド位置検出手段を設けたものであ
る。
[Means for Solving the Problems] A manufacturing apparatus for a resin-sealed semiconductor device according to the present invention includes die pad position detection means provided in a lower mold below the die pad and detecting the position of the die pad, In addition to the die pad position detection means, a die pad position detection means is provided for detecting the position of the die pad and supplying a detection signal thereof to the die pad position control means.

[作 用] この発明においては、上下金型内のダイパッド位置は、
ダイパッドの下方に設けられたダイパッド位置制御手段
により、モールド樹脂注入前および注入中に任意に変位
制御され得る。また同様に下金型内に設けられたダイパ
ッド位置検出手段によりモールド樹脂注入前または注入
中のダイパッド位置の変化を実時間で検出でき、その情
報をダイパッド位置制御手段に供給することによりダイ
パッド位置を常時最適に設定できる。
[Function] In this invention, the die pad positions in the upper and lower molds are
The die pad position control means provided below the die pad can arbitrarily control the displacement before and during injection of the mold resin. Similarly, the die pad position detection means provided in the lower mold can detect changes in the die pad position in real time before or during mold resin injection, and by supplying this information to the die pad position control means, the die pad position can be detected. Optimal settings can be made at all times.

[実施例] 第1図および第2図はこの発明の各実施例を示す断面図
であり、(1)〜(9)は上記従来装置におけるものと
全く同じものである。(10)はダイパッド(2)の下
方で下金型(4)内に設けられ、ダイパッド(2)の位
置を制御する可動ピン、(11)はこの可動ピン(10
)を制御する。可動ピン制御部であり、これら可動ピン
(10)および可動ピン制御部(11)はダイパッド位
置制御手段になる。(12)は下金型(4)内に設けら
れ、タイパノド(2)の位置を検出する位置検出センサ
、(13)はこの位置検出センサ(12)と可動ピン制
御部(11)に接続され、位置検出センサ(12)から
のダイパッド位置検出信号を受け、これを可動ピン制御
部(11)にフィードバックして可動ピン00)の制御
に供するフィードバック制御部てあり、これら位置検出
センサ(12)およびフィトバック制御部(13)はダ
イパッド位置検出手段になる。
[Embodiments] FIGS. 1 and 2 are cross-sectional views showing each embodiment of the present invention, and (1) to (9) are exactly the same as those in the conventional device described above. (10) is a movable pin provided in the lower mold (4) below the die pad (2) and controls the position of the die pad (2); (11) is this movable pin (10);
). This is a movable pin control section, and these movable pins (10) and movable pin control section (11) serve as die pad position control means. (12) is a position detection sensor provided in the lower mold (4) and detects the position of the tiepan nod (2), and (13) is connected to this position detection sensor (12) and the movable pin control section (11). , a feedback control section receives the die pad position detection signal from the position detection sensor (12) and feeds it back to the movable pin control section (11) to control the movable pin 00), and these position detection sensors (12) The phytoback control section (13) serves as die pad position detection means.

上記のように構成された樹脂封止型半導体装置の製造装
置においては、ダイパッド(2)およびリドフレーム(
5)を下金型(4)に載置した後、この下金型(4)を
」二金型(6)と合わせてクランプする。この時点でダ
イパッド(2)がキャビティ(9)の中点よりも少し上
になるように予めダイパソドク2)の戊め量を制御して
おく。上金型(6)と下金型(4)をクランプした後、
可動ピン(10)を突き上げてダイパッド(2)に接触
させ、ダイパッド(2)が中点になるように制御し、そ
の後モールド樹脂(8)を注入する。モールド樹脂(8
)の注入が完了し、モールド樹脂(8)か硬化する前で
且つ粘度が上昇した時点て可動ピン(10)を後退させ
る。一方、下金型(4)内に設けられたダイパッド位置
検出センサ(12)により、モールド樹脂(8)の注入
前、注入中のダイパッド(2)の位置が常時モニタされ
、検出される。位置検出センサ(12)とダイパッド(
2)の距離が設定値になるように検出信号をフィトバッ
ク制御部(13)、可動ピン制御部(11)を介して可
動ピン(10)にフィードバックし、タイパ、。
In the resin-sealed semiconductor device manufacturing apparatus configured as described above, a die pad (2) and a lid frame (
5) is placed on the lower mold (4), and then the lower mold (4) is clamped together with the second mold (6). At this point, the amount of retraction of the die pad (2) is controlled in advance so that the die pad (2) is slightly above the midpoint of the cavity (9). After clamping the upper mold (6) and lower mold (4),
The movable pin (10) is pushed up and brought into contact with the die pad (2), controlled so that the die pad (2) is at the midpoint, and then the mold resin (8) is injected. Mold resin (8
) is completed, the movable pin (10) is moved back before the mold resin (8) has hardened and its viscosity has increased. On the other hand, a die pad position detection sensor (12) provided in the lower mold (4) constantly monitors and detects the position of the die pad (2) before and during injection of the mold resin (8). Position detection sensor (12) and die pad (
2) The detection signal is fed back to the movable pin (10) via the phytoback control unit (13) and the movable pin control unit (11) so that the distance becomes the set value, and the typer.

ド(2)の位置が最適になるように制御する。control so that the position of the door (2) is optimal.

[発明の効果] この発明は、以上説明したとおり、ダイパッド位置を制
御するダイパッド位置制御手段をダイパッドの下方で下
金型内に設けに、またこのダイパッド位置制御手段に加
えて、タイパットの位置を検出するダイパッド位置検出
手段を下金型内に設けることにより、タイパットの変位
を小さくできると共に、タイパット位置を実時間で検出
してダイパッドの位置を更にフィードバック制御できる
ので、1.27mm厚以下の樹脂封止型半導体装置を高
歩留りで安定に且つ高精度で製造できる効果を奏する。
[Effects of the Invention] As explained above, the present invention provides die pad position control means for controlling the die pad position in the lower mold below the die pad, and in addition to this die pad position control means, it controls the position of the tie pad. By providing a die pad position detection means in the lower mold, displacement of the tie pad can be reduced, and the position of the die pad can be further feedback controlled by detecting the tie pad position in real time. This has the effect of allowing sealed semiconductor devices to be manufactured stably and with high precision at a high yield.

【図面の簡単な説明】[Brief explanation of drawings]

第1図および第2図はこの発明の各実施例の断面図、第
3図は従来の樹脂封止型半導体装置の製造装置を示す断
面図である。 図において、(1)は半導体素子、(2)はダイパッド
、(3)は金線、(4)は下金型、(5)はり−ドフレ
〜ム、(6)は上金型、(8)はモールド樹脂、(lO
)は可動ピン、(11)は可動ピン制御部、(12)は
位置検出センサ、(13)はフィートバンク制御部であ
る。 一 なお、 各図中、 同一符号は同一または相当部分 を示す。 代 理 人 曾 我 道 照 3−金線 6−上金型 1o−・可動ビン
1 and 2 are cross-sectional views of each embodiment of the present invention, and FIG. 3 is a cross-sectional view showing a conventional resin-sealed semiconductor device manufacturing apparatus. In the figure, (1) is a semiconductor element, (2) is a die pad, (3) is a gold wire, (4) is a lower mold, (5) a beam dome, (6) is an upper mold, and (8) is a lower mold. ) is mold resin, (lO
) is a movable pin, (11) is a movable pin control section, (12) is a position detection sensor, and (13) is a foot bank control section. In each figure, the same reference numerals indicate the same or corresponding parts. Agent Dosho Soga 3 - Gold wire 6 - Upper mold 1o - Movable bottle

Claims (1)

【特許請求の範囲】[Claims] (1)樹脂封止すべき半導体素子が載置されるダイパッ
ドと、前記半導体素子とリードを金線を介してワイヤボ
ンディングにより電気的に接続して得られたリードフレ
ームと、上金型と、この上金型に対応して設けられかつ
前記ダイパッドおよび前記リードフレームが載置される
下金型と、前記ダイパッドの下方で前記下金型内に設け
られ、前記ダイパッドの位置を制御するダイパッド位置
制御手段とを備えたことを特徴とする樹脂封止型半導体
装置の製造装置。
(1) A die pad on which a semiconductor element to be resin-sealed is mounted, a lead frame obtained by electrically connecting the semiconductor element and leads by wire bonding via a gold wire, and an upper mold; a lower mold provided corresponding to the upper mold and on which the die pad and the lead frame are placed; and a die pad position provided in the lower mold below the die pad and controlling the position of the die pad. 1. A manufacturing apparatus for a resin-sealed semiconductor device, comprising: a control means.
JP1487390A 1990-01-26 1990-01-26 Manufacturing equipment for resin-encapsulated semiconductor devices Pending JPH03220738A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1487390A JPH03220738A (en) 1990-01-26 1990-01-26 Manufacturing equipment for resin-encapsulated semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1487390A JPH03220738A (en) 1990-01-26 1990-01-26 Manufacturing equipment for resin-encapsulated semiconductor devices

Publications (1)

Publication Number Publication Date
JPH03220738A true JPH03220738A (en) 1991-09-27

Family

ID=11873137

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1487390A Pending JPH03220738A (en) 1990-01-26 1990-01-26 Manufacturing equipment for resin-encapsulated semiconductor devices

Country Status (1)

Country Link
JP (1) JPH03220738A (en)

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