JPH03225883A - Semiconductor laser - Google Patents

Semiconductor laser

Info

Publication number
JPH03225883A
JPH03225883A JP2008590A JP2008590A JPH03225883A JP H03225883 A JPH03225883 A JP H03225883A JP 2008590 A JP2008590 A JP 2008590A JP 2008590 A JP2008590 A JP 2008590A JP H03225883 A JPH03225883 A JP H03225883A
Authority
JP
Japan
Prior art keywords
layer
conductivity type
striped
epitaxial growth
cladding layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2008590A
Other languages
Japanese (ja)
Inventor
Shoji Hirata
照二 平田
Hironobu Narui
啓修 成井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP2008590A priority Critical patent/JPH03225883A/en
Publication of JPH03225883A publication Critical patent/JPH03225883A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/227Buried mesa structure ; Striped active layer

Landscapes

  • Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 以下の順序で本発明を説明する。[Detailed description of the invention] The present invention will be explained in the following order.

A 産業上の利用分野 B 発明の概要 C従来の技術 D 発明が解決しようとする課題 E 課題を解決するための手段 F 作用 G 実施例 [I 発明の効果 A 産業上の利用分野 本発明は、半導体レーザ特に例えばAiG a A s
系等の化合物半導体による埋込みへテロ接合型(BH型
)半導体レーザに係わる。
A. Industrial field of application B. Overview of the invention C. Prior art D. Problem to be solved by the invention E. Means for solving the problem F. Effect G. Example [I. Effect of the invention A. Industrial field of application The present invention has Semiconductor lasers, especially AiGaAs
It relates to a buried heterojunction type (BH type) semiconductor laser made of a compound semiconductor such as a semiconductor laser.

B 発明の概要 本発明は、半導体レーザに係わり、第1導電型の化合物
半導体の100結晶面による主面に011結晶軸方向に
延びるストライプ状のメサ突起が形成され、主面側に第
1導電型のクラッド層と、活性層と、第2導電型の第1
のクラッド層と、第1導電型の中間層と、第2導電型の
中間層と、第1導電型の電流ブロック層と、第2導電型
の第2のクラッド層とが順次エピタキシャル成長され、
ストライプ状のメサ突起上に対して他と分断して第1導
電型のクラッド層と、活性層と、第2導電型の第1のク
ラッド層とが積層されたストライプ状エピタキシャル成
長層が形成され、メサ突起の両側のメサ溝上にエピタキ
シャル成長された第1導電型のクラッド層と、活性層と
、第2導電型の第1のクラッド層と、第1導電型の中間
層と、第2導電型の中間層と、電流ブロック層とがメサ
突起及びストライプ状エピタキシャル成長層によってそ
の両側にそれぞれ分断して形成され、第2導電型の第2
のクラッド層はストライプ状エピタキシャル成長層上を
横切って全面的に形成され、ストライプ状エピタキシャ
ル成長層における活性層の両側端面が電流ブロック層の
端面内に衝合するようになされ、ストライプ状エピタキ
シャル成長層におけるストライプ状活性層が発光動作領
域とされて成り、しきい値電流Iいの低減化及び出力特
性の飽和の改善をはかる。
B. Summary of the Invention The present invention relates to a semiconductor laser, in which a striped mesa protrusion extending in the direction of the 011 crystal axis is formed on the main surface of the 100 crystal plane of a compound semiconductor of the first conductivity type, and a first conductive layer is formed on the main surface side. a cladding layer of a type, an active layer, and a first layer of a second conductivity type.
a cladding layer of a first conductivity type, an intermediate layer of a second conductivity type, a current blocking layer of a first conductivity type, and a second cladding layer of a second conductivity type are sequentially grown epitaxially,
A striped epitaxial growth layer is formed on the striped mesa protrusion in which a first conductivity type cladding layer, an active layer, and a second conductivity type first cladding layer are laminated separately from each other; A cladding layer of a first conductivity type, an active layer, a first cladding layer of a second conductivity type, an intermediate layer of a first conductivity type, and an intermediate layer of a second conductivity type epitaxially grown on the mesa groove on both sides of the mesa protrusion. An intermediate layer and a current blocking layer are separated on both sides by a mesa protrusion and a striped epitaxial growth layer, and a second current blocking layer of a second conductivity type is formed.
The cladding layer is formed entirely across the striped epitaxial growth layer so that both end faces of the active layer in the striped epitaxial growth layer abut within the end faces of the current blocking layer. The active layer serves as a light emitting operation region, and aims to reduce threshold current I and improve saturation of output characteristics.

C従来の技術 低いしきい値電流Iいを有する半導体レーザを作製する
には、活性層の横方向にすなわち活性層の面方向と直交
する両側に屈折率差を形成するBH型構成をとり、しか
も電流狭窄を行うブロック手段を設けることが望まれる
。この種のBH型半導体レーザでは、通常2回以上に互
いに独立したエピタキシャル成長すなわち第1回のエピ
タキシャル成長後にエツチング作業を施し、次に第2回
のエピタキシャル成長作業を行うという手順が一般にと
られる。ところが、この場合箱1と第2のエピタキシャ
ル成長作業間において、表面酸化等の問題が生し、これ
が信顛性の低下、特性の低下を来す。
C. Prior Art In order to fabricate a semiconductor laser having a low threshold current, a BH type structure is adopted in which a refractive index difference is formed in the lateral direction of the active layer, that is, on both sides perpendicular to the plane direction of the active layer. Moreover, it is desirable to provide blocking means for current confinement. In this type of BH type semiconductor laser, a procedure is generally adopted in which two or more independent epitaxial growth operations are performed, that is, an etching operation is performed after the first epitaxial growth operation, and then a second epitaxial growth operation is performed. However, in this case, problems such as surface oxidation occur between the box 1 and second epitaxial growth operations, which leads to a decrease in reliability and properties.

このような信頼性の問題、さらに作業性の煩雑さを回避
する目的をもって本出願人は、先に例えば特開昭61−
183987号において1回のエピタキシャル成長にお
いて全層を形成することができるようにしたS D H
(Separate Double )Ietero 
JuncLion)型の半導体レーザを提案した。
With the purpose of avoiding such reliability problems and further complicating workability, the present applicant previously proposed, for example, Japanese Patent Application Laid-Open No.
No. 183987, S D H made it possible to form all layers in one epitaxial growth.
(Separate Double) Ietero
proposed a JuncLion type semiconductor laser.

D 発明が解決しようとする課題D Problems to be solved by the invention

Claims (1)

【特許請求の範囲】 第1導電型の化合物半導体の100結晶面による主面の
011結晶軸方向に延びるストライブ状のメサ突起が形
成され、 上記化合物半導体の主面側に第1導電型のクラッド層と
、活性層と、第2導電型の第1のクラッド層と、第1導
電型の中間層と、第2導電型の中間層と、第1導電型の
電流ブロック層と、第2導電型の第2のクラッド層とが
順次エピタキシャル成長され、 上記ストライプ状のメサ突起上に対して他と分断して上
記第1導電型のクラッド層と、上記活性層と、上記第2
導電型の第1のクラッド層とが積層されたストライプ状
エピタキシャル成長層が形成され、上記メサ突起の両側
のメサ溝上にエピタキシャル成長された上記第1導電型
のクラッド層と、上記活性層と、上記第2導電型の第1
のクラッド層と、上記第1導電型の中間層と、上記第2
導電型の中間層と、上記電流ブロック層とが上記メサ突
起及びストライプ状エピタキシャル成長層によってその
両側にそれぞれ分断して形成され、上記第2導電型の第
2のクラッド層は上記ストライプ状エピタキシャル成長
層上を横切って全面的に形成され、 上記ストライプ状エピタキシャル成長層における活性層
の両側端面が上記電流ブロック層の端面内に衝合するよ
うになされ、 上記ストライプ状エピタキシャル成長層におけるストラ
イプ状活性層が発光動作領域とされた半導体レーザ。
[Claims] A strip-shaped mesa protrusion extending in the direction of the 011 crystal axis of the main surface of the 100 crystal plane of the compound semiconductor of the first conductivity type is formed on the main surface side of the compound semiconductor of the first conductivity type. a cladding layer, an active layer, a first cladding layer of a second conductivity type, an intermediate layer of a first conductivity type, an intermediate layer of a second conductivity type, a current blocking layer of a first conductivity type, and a second conductivity type. A second conductivity type cladding layer is sequentially epitaxially grown on the striped mesa protrusion, and is separated from the others to form the first conductivity type cladding layer, the active layer, and the second conductivity type cladding layer.
A stripe-shaped epitaxial growth layer is formed in which a first cladding layer of a conductivity type is laminated, and the cladding layer of the first conductivity type epitaxially grown on the mesa groove on both sides of the mesa protrusion, the active layer, and the first cladding layer of the first conductivity type are formed. 2nd conductivity type 1st
cladding layer, the intermediate layer of the first conductivity type, and the second conductivity type intermediate layer.
A conductive type intermediate layer and the current blocking layer are formed on both sides of the mesa protrusion and the striped epitaxial growth layer, and the second conductive type second cladding layer is formed on the striped epitaxial growth layer. The striped epitaxial growth layer is formed entirely across the striped epitaxial growth layer so that both side end faces of the active layer in the striped epitaxial growth layer abut within the end faces of the current blocking layer, and the striped active layer in the striped epitaxial growth layer is formed in a light emitting operation region. semiconductor laser.
JP2008590A 1990-01-30 1990-01-30 Semiconductor laser Pending JPH03225883A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008590A JPH03225883A (en) 1990-01-30 1990-01-30 Semiconductor laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008590A JPH03225883A (en) 1990-01-30 1990-01-30 Semiconductor laser

Publications (1)

Publication Number Publication Date
JPH03225883A true JPH03225883A (en) 1991-10-04

Family

ID=12017269

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008590A Pending JPH03225883A (en) 1990-01-30 1990-01-30 Semiconductor laser

Country Status (1)

Country Link
JP (1) JPH03225883A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002314200A (en) * 2001-04-19 2002-10-25 Sony Corp Semiconductor laser device and manufacturing method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002314200A (en) * 2001-04-19 2002-10-25 Sony Corp Semiconductor laser device and manufacturing method thereof

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