JPH03226572A - Sputtering device - Google Patents

Sputtering device

Info

Publication number
JPH03226572A
JPH03226572A JP2265090A JP2265090A JPH03226572A JP H03226572 A JPH03226572 A JP H03226572A JP 2265090 A JP2265090 A JP 2265090A JP 2265090 A JP2265090 A JP 2265090A JP H03226572 A JPH03226572 A JP H03226572A
Authority
JP
Japan
Prior art keywords
target
substrate
processed
shielding plate
holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2265090A
Other languages
Japanese (ja)
Inventor
Hideaki Takano
英明 高野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP2265090A priority Critical patent/JPH03226572A/en
Publication of JPH03226572A publication Critical patent/JPH03226572A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To form a film on the bottom of a recess on a substrate, etc., in uniform thickness by providing a funneled shielding plate, etc., between a target and a substrate holder and using the metal atom flown out perpendicularly to a substrate to form a thin film. CONSTITUTION:The sputtering device is formed with the target 1, the holder 5 for a substrate 2 to be treated, a stage 4 and a shielding plate 3. The stage 4 is used to hold the holder 5, and the substrate 2 is moved in parallel with the target 1. The shielding plate 3 is funneled, set between the target 1 and the holder 5 and furnished with an opening 6 at its center.

Description

【発明の詳細な説明】 3産業上の利用分野〕 本発明は薄膜形成工程で用いられるスパッタリング装置
に関する。
DETAILED DESCRIPTION OF THE INVENTION 3. Industrial Application Fields The present invention relates to a sputtering apparatus used in a thin film forming process.

〔従来の技術〕[Conventional technology]

従来、この種のスパッタリング装置は、真空槽に取り付
けられたスパッタリング用のターゲットに対向するよう
に配設された保持板に被処理基板を配し、アルゴンガス
を導入して放電させ、アルゴンイオンをターゲットに衝
突させ、ターゲット表面より、金属原子を被処理基板上
に堆積させ、薄膜作成、を行うように構成されていた。
Conventionally, this type of sputtering equipment places the substrate to be processed on a holding plate placed to face a sputtering target attached to a vacuum chamber, and introduces and discharges argon gas to generate argon ions. It was configured to collide with a target and deposit metal atoms from the target surface onto the substrate to be processed, thereby creating a thin film.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来のスパッタリング装置は、ターゲット表面
にアルゴンイオンが多方向に衝突し、金属原子が多方向
に飛び出し、被処理基板上に堆積するため、被処理基板
上に形成される膜の膜厚の制御が難しいという問題点が
あった。
In the conventional sputtering apparatus described above, argon ions collide with the target surface in multiple directions, and metal atoms fly out in multiple directions and are deposited on the substrate to be processed. The problem was that it was difficult to control.

また、被処理基板表面は、小さな凹凸(幅1μm、深さ
1μm程度)があり、凹部の底や側面に均一な厚さの膜
を付けることができないという問題点があった。
Further, the surface of the substrate to be processed has small irregularities (about 1 μm in width and 1 μm in depth), and there is a problem in that it is impossible to apply a film of uniform thickness to the bottom and side surfaces of the recesses.

〔課題を解決するための手段〕[Means to solve the problem]

本発明のスパッタリング装置は、ターゲットと、このタ
ーゲットに対向して設けられ被処理基板を保持する保持
板と、この保持板を保持し前記被処理基板を前記ターゲ
ットに平行に移動させるためのステージと、前記ターゲ
ットと前記保持板との間に設けられ中心に開口部を有す
るロート状の遮へい板とを含んで構成される。
The sputtering apparatus of the present invention includes a target, a holding plate provided opposite to the target and holding a substrate to be processed, and a stage for holding the holding plate and moving the substrate to be processed parallel to the target. , a funnel-shaped shielding plate provided between the target and the holding plate and having an opening in the center.

〔実施例〕〔Example〕

次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の第1の実施例のターゲット近傍の構成
図である。
FIG. 1 is a block diagram of the vicinity of a target in a first embodiment of the present invention.

ターゲット1と被処理基板2を保持する保持板5は平行
に配置されている。そしてこの保持板5はステージ4上
に取り付けられ、ターゲットに平行に移動可能となって
いる。そして特に、ターゲット1と保持板2の間には中
心に開口部6を有するロート状の遮へい板3が設けられ
ている。以下その動作について説明する。
A holding plate 5 that holds the target 1 and the substrate to be processed 2 are arranged in parallel. This holding plate 5 is mounted on the stage 4 and is movable parallel to the target. In particular, a funnel-shaped shielding plate 3 having an opening 6 in the center is provided between the target 1 and the holding plate 2. The operation will be explained below.

まず、アルゴンイオンがターゲット1の表面に多方向よ
り衝突し、ターゲット1表面より多方向に金属原子が飛
び出す、しかし、ターゲ、ント1と被処理基板2の間に
ロート状の遮へい板3があるために、斜め方向に飛び出
した金属原子は遮へい板に付着し、被処理基板2に垂直
な方向に飛び出した金属原子のみが開口部6を通って被
処理基板2に堆積する。このスパッタリング中に、被処
理基板2はステージ4により、ターゲット1に対して平
行面内を移動し、被処理基板2の全面に薄膜を均一に形
成させることができる。
First, argon ions collide with the surface of the target 1 from multiple directions, and metal atoms fly out from the surface of the target 1 in multiple directions.However, there is a funnel-shaped shielding plate 3 between the target 1 and the substrate 2 to be processed. Therefore, the metal atoms that jumped out in the diagonal direction adhere to the shielding plate, and only the metal atoms that jumped out in the direction perpendicular to the substrate 2 to be processed pass through the opening 6 and are deposited on the substrate 2 to be processed. During this sputtering, the substrate 2 to be processed is moved by the stage 4 in a plane parallel to the target 1, so that a thin film can be uniformly formed over the entire surface of the substrate 2 to be processed.

第2図は本発明の第2の実施例のターゲット近傍の構成
図である。
FIG. 2 is a block diagram of the vicinity of a target in a second embodiment of the present invention.

ロート状の遮へい板3Aが第1の実施例と逆向きに被処
理基板3の近くに位置しており、中央部の板厚が厚くな
っている。
A funnel-shaped shielding plate 3A is located near the substrate 3 to be processed in the opposite direction from the first embodiment, and the thickness of the plate is thicker at the center.

この様に構成された第2の実施例では、ターゲット1か
ら無差別方向に飛び出した金属原子は、遮へい板3Aの
中央の開口部6を通して、被処理基板2の垂直方向のみ
の金属原子が被処理基板2上に堆積する。
In the second embodiment configured in this manner, the metal atoms flying out from the target 1 in indiscriminate directions pass through the central opening 6 of the shielding plate 3A, and metal atoms only in the vertical direction of the substrate 2 to be processed are exposed. It is deposited on the processing substrate 2.

この実施例では、遮へい板3Aの外面がターゲット1の
外部に向いているため、遮へい板3Aの外面に付着し、
はげ落ちる金属がターゲット表面に再付着することがな
く、異物の少ない薄膜の形成が可能となるという利点が
ある。
In this embodiment, since the outer surface of the shielding plate 3A faces the outside of the target 1, it adheres to the outer surface of the shielding plate 3A,
This method has the advantage that the flaked metal does not re-adhere to the target surface, making it possible to form a thin film with less foreign matter.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、ターゲットと被処理基板
を保持する保持板間にロート状の遮へい板と、被処理基
板をターゲットに平行面内で移動させるステージを設け
ることにより、被処理基板に垂直な方向に飛び出した金
属原子を使用して薄膜を形成することができるため、被
処理基板上の凹部の底や側面に均一な厚さの膜を形成す
ることができる効果がある。
As explained above, the present invention provides a funnel-shaped shielding plate between the target and the holding plate that holds the substrate to be processed, and a stage that moves the substrate to be processed in a plane parallel to the target. Since a thin film can be formed using metal atoms ejected in a vertical direction, it is possible to form a film with a uniform thickness on the bottom and side surfaces of a recess on a substrate to be processed.

また、被処理基板をステージにより移動させることによ
り、被処理基板全体に均一な膜厚分布を得ることができ
る効果もある。
Furthermore, by moving the substrate to be processed using the stage, there is also the effect that a uniform film thickness distribution can be obtained over the entire substrate to be processed.

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図は本発明の第1及び第2の実施例のタ
ーゲット近傍の構成図である。 1・・・ターゲット、2・・・被処理基板、3.3A・
・・遮へい板、4・・・ステージ、5・・・保持板、6
・・・開口部。
FIGS. 1 and 2 are configuration diagrams of the vicinity of targets in first and second embodiments of the present invention. 1...Target, 2...Substrate to be processed, 3.3A・
... Shielding plate, 4... Stage, 5... Holding plate, 6
···Aperture.

Claims (1)

【特許請求の範囲】[Claims] ターゲットと、このターゲットに対向して設けられ被処
理基板を保持する保持板と、この保持板を保持し前記被
処理基板を前記ターゲットに平行に移動させるためのス
テージと、前記ターゲットと前記保持板との間に設けら
れ中心に開口部を有するロート状の遮へい板とを含むこ
とを特徴とするスパッタリング装置。
A target, a holding plate provided opposite to the target and holding the substrate to be processed, a stage for holding the holding plate and moving the substrate to be processed parallel to the target, the target and the holding plate. and a funnel-shaped shielding plate having an opening in the center.
JP2265090A 1990-01-31 1990-01-31 Sputtering device Pending JPH03226572A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2265090A JPH03226572A (en) 1990-01-31 1990-01-31 Sputtering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2265090A JPH03226572A (en) 1990-01-31 1990-01-31 Sputtering device

Publications (1)

Publication Number Publication Date
JPH03226572A true JPH03226572A (en) 1991-10-07

Family

ID=12088723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2265090A Pending JPH03226572A (en) 1990-01-31 1990-01-31 Sputtering device

Country Status (1)

Country Link
JP (1) JPH03226572A (en)

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