JPH03230452A - Defective base pin detecting method - Google Patents

Defective base pin detecting method

Info

Publication number
JPH03230452A
JPH03230452A JP2021968A JP2196890A JPH03230452A JP H03230452 A JPH03230452 A JP H03230452A JP 2021968 A JP2021968 A JP 2021968A JP 2196890 A JP2196890 A JP 2196890A JP H03230452 A JPH03230452 A JP H03230452A
Authority
JP
Japan
Prior art keywords
pin
camera
conducting wires
pins
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2021968A
Other languages
Japanese (ja)
Inventor
Toshio Sasamoto
笹本 敏雄
Akio Funakoshi
舟越 明夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2021968A priority Critical patent/JPH03230452A/en
Publication of JPH03230452A publication Critical patent/JPH03230452A/en
Pending legal-status Critical Current

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  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)

Abstract

PURPOSE:To easily detect conducting wires with a camera by detecting the ends of the conducting wires protruded from pin tips with an image processing scanning beam, applying masking at positions backward to the pin side by a preset quantity, and performing binary judgment. CONSTITUTION:A camera 9a is installed on an axis beta line perpendicular to a straight line alpha connecting base pins a, a' to detect conducting wires protruded from the pins a, a'. Conducting wires protruded from bases b, b' are detected by a camera 9b. A scanning beam is run on an image processed by image processors 10a, 10b to find a point where there is no black point, and a mask is formed from a point backward from the line by several wires. The mask can be formed at the tip of the base pins 4, the black portion in the mask is measured, and this area value is judged in binary values. The conducting wires protruded from the tip of the pins 4 can easily be detected by the cameras 9a, 9b two by two.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は環形蛍光ランプの口金取付装置における口金ピ
ン導通線の突出不良検出方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for detecting a protrusion failure of a cap pin conducting wire in a cap mounting device for an annular fluorescent lamp.

〔従来の技術〕[Conventional technology]

従来、蛍光ランプの電極リード線と口金ピンとの方法は
、特開昭60−39786に示される様に、リード線を
口金ピンに挿通し、このリード線における口金ピンの先
端より突出する部分を微小寸法Qだけ残してカッターに
より切断し、この寸法Qの部分を口金ピンの内部に押し
込んでリード線を口金ピン内でたるませておき、ポンチ
によって口金ピン2の側壁を押圧し該押圧箇所でリード
線を挟着するようにしたものである。このような従来技
術においては、口金ピンの先端からリード線が突出した
ままの不良を発生しやすい。
Conventionally, the method of connecting an electrode lead wire and a cap pin for a fluorescent lamp is as shown in Japanese Patent Laid-Open No. 60-39786, in which the lead wire is inserted into the cap pin, and the portion of the lead wire that protrudes from the tip of the cap pin is minutely cut. Cut with a cutter leaving only the dimension Q, push this dimension Q into the inside of the cap pin, leave the lead wire slack within the cap pin, press the side wall of the cap pin 2 with a punch, and remove the lead at the pressed point. It is designed to sandwich the wire. In such a conventional technique, a defect is likely to occur in which the lead wire remains protruding from the tip of the base pin.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

ところで、従来の様に口金ピン端面より突出した導通線
を4本同時にかつ、時間当り1000本以上の環形蛍光
ランプの口金ピン端面を目視検査する事は相当な熟練を
要し、かつ、過酷な検査作業であった。
By the way, visually inspecting the cap pin end surface of annular fluorescent lamps with four conductive wires protruding from the cap pin end surface at the same time and more than 1000 per hour as in the past requires considerable skill and is a harsh process. It was inspection work.

本発明は、この目視検査作業の信頼性の向上を図り、合
せて検査員の省力を図る事を目的としてなされたもので
ある。
The present invention has been made to improve the reliability of this visual inspection work and to save the labor of the inspector.

〔課題を解決するための手段〕[Means to solve the problem]

上記目的を達成するために本発明においては、口金ピン
を取付ける工程の後に口金ピン先端を撮影するためのカ
メラを配置しその画像処理装置により口金ピン先端より
突出した導通線を検出する。
In order to achieve the above object, in the present invention, a camera is arranged to photograph the tip of the cap pin after the process of attaching the cap pin, and the conductive wire protruding from the tip of the cap pin is detected by the image processing device.

〔作用〕[Effect]

画像処理用カメラの取付位置は4本の口金ピンの対向す
る線と直交する位置に設置する事により撮影する。2本
の口金ピンは他の2本のピンに遮へいされることなく同
時に撮影できる。
The image processing camera is installed at a position perpendicular to the opposing lines of the four cap pins to take pictures. The two cap pins can be photographed at the same time without being blocked by the other two pins.

〔実施例〕〔Example〕

以下、本発明の一実施例を説明する。 An embodiment of the present invention will be described below.

第1図(a)は環形蛍光ランプの口金部のみを断面図で
示したランプの平面図である。また、同図(b)は上記
ランプの口金部の正面図である。
FIG. 1(a) is a plan view of the annular fluorescent lamp, showing only the base portion in cross section. Further, FIG. 2B is a front view of the base portion of the lamp.

環形蛍光ランプのフィラメント6はガラスバルブ1の端
面封止部8より導出した導通線7を樹脂口金2に直立し
た4本の中空ピン4に挿入した後、先端部5の突出導通
線を切断後、溶接又はカシメにより導通が図られる。
The filament 6 of the annular fluorescent lamp is made by inserting the conductive wire 7 led out from the end face sealing part 8 of the glass bulb 1 into the four hollow pins 4 that stand upright in the resin base 2, and after cutting the protruding conductive wire from the tip part 5. , conduction is achieved by welding or caulking.

本発明はこの突出した導通線5を画像処理カメラにより
検出する方法である。
The present invention is a method of detecting this protruding conductive line 5 using an image processing camera.

第2図にカメラと口金ピンとの相関位置の側面図、第3
図に第2図B−B矢視拡犬平面図を示す。
Figure 2 is a side view of the relative position of the camera and the base pin, Figure 3
The figure shows an enlarged plan view taken along the line B--B in FIG.

両図において、ガラスバルブ1を45°傾斜方向よりカ
メラ9a、9bより撮影し、処理装置10a。
In both figures, the glass bulb 1 is photographed by cameras 9a and 9b from an angle of 45 degrees, and the processing device 10a.

10bにより検出する。10b.

この時口金ピンaa’ はaa’ を結ぶ直線αと直交
する軸β線上にカメラ9aを設置する事により容易に口
金ピンaa’ より突出した導通線を検出できる。また
、口金ピンbb’ より突出した導通線はbb′を結ぶ
直線βと直交する軸α線上にカメラ9bを設置する事に
より口金ピンbb’ より突出した導通線を検出できる
。この時、β±aa’  α±bb′の相関にてカメラ
9a、9bは設置しである。
At this time, the conductive wire protruding from the cap pin aa' can be easily detected by installing the camera 9a on the axis β line which is perpendicular to the straight line α connecting the cap pin aa'. Further, the conductive wire protruding from the base pin bb' can be detected by installing the camera 9b on the axis α line which is perpendicular to the straight line β connecting bb'. At this time, the cameras 9a and 9b are installed with a correlation of β±aa'α±bb'.

カメラによる突出導通線5の検出原理を第4図に示す。FIG. 4 shows the principle of detection of the protruding conductive line 5 by a camera.

第4図は、画像処理装置による2値化した画像を示した
ものであり、図でハツチングを施した部分が黒の部分で
ある。検出方法は、第4図の上より走査線を走らせ、黒
点がなくなる点を見つけ、その線より数本戻った所から
、マスク1]−を作る。この方法により口金ピン4の先
端にマスク11を作ることが出来、マスク11内の黒い
部分の面積を測定する。この面積値により、突出導通線
5の有無を判定する。
FIG. 4 shows an image that has been binarized by the image processing device, and the hatched areas in the figure are black. The detection method is to run a scanning line from the top of FIG. 4, find a point where there are no black dots, and create a mask 1] from a few lines back from that line. By this method, a mask 11 can be made at the tip of the cap pin 4, and the area of the black part within the mask 11 is measured. Based on this area value, the presence or absence of the protruding conductive line 5 is determined.

第5図は、装置の構成図を示す。口金ピン4の映像をエ
ンコーダ21より出された検知タイミングによりとり込
み、画像処理装置22で良品、不良品の判定を行いプロ
グラマブルコントローラ23によりジエクト信号を出す
式である。
FIG. 5 shows a configuration diagram of the device. The image of the cap pin 4 is taken in at the detection timing output from the encoder 21, the image processing device 22 determines whether the product is good or defective, and the programmable controller 23 outputs a select signal.

〔発明の効果〕〔Effect of the invention〕

本発明によれば環形蛍光ランプ口金ピン先端より突出し
た導通線を画像処理カメラにて容易かつ高速に、2本ず
つ同時に検査できる。
According to the present invention, the conductive wires protruding from the tip of the annular fluorescent lamp cap pin can be easily and quickly inspected two at a time using an image processing camera.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)は、環形蛍光ランプの一部断面と全体構造
を示す平面図、第1図(b)はランプの口金部の側面図
、第2図は本発明の実施例における突出部検出方法を説
明するための側面図、第3図は第2図のB−B矢視拡大
図、第4図はカメラ撮像された口金ピン部の2値化した
画像を示す図、第5図は本発明の方法を実施するための
装置構成を示すブロック図である。 1・・ガラスバルブ、2・・口金、4・・口金ピン、5
突出部通線、9a、9b・・・カメラ、10a。 10b・・・画像処理装置、α ロ金ピンaa’中心線
、β・・ロ金ピンbb’中心線。
FIG. 1(a) is a plan view showing a partial cross section and the overall structure of an annular fluorescent lamp, FIG. 1(b) is a side view of the base of the lamp, and FIG. 2 is a protrusion in an embodiment of the present invention. A side view for explaining the detection method, FIG. 3 is an enlarged view taken along the line B-B in FIG. FIG. 1 is a block diagram showing the configuration of an apparatus for implementing the method of the present invention. 1. Glass bulb, 2. Cap, 4. Cap pin, 5
Protruding portion wiring, 9a, 9b... camera, 10a. 10b... Image processing device, α Gold pin aa' center line, β... Gold pin bb' center line.

Claims (1)

【特許請求の範囲】[Claims] 1、環形蛍光ランプの口金ピン取付装置と取付後に4本
の口金ピンの対向するピンを結ぶ線と直交する線上に画
像処理カメラを設け、ピン先端より突出した導通線端を
画像処理走査線により検出しその検出位置より所定量ピ
ン側に戻つた所にマスキングを行ない2値化判定し、リ
ード線突出を検出することを特徴とする口金ピン不良検
出方法。
1. After installation, an image processing camera is installed on a line perpendicular to the line connecting the four cap pins facing each other with the ring-shaped fluorescent lamp cap pin mounting device, and the end of the conductive wire protruding from the tip of the pin is detected using an image processing scanning line. A method for detecting a defective pin pin, which comprises detecting a protrusion of a lead wire by masking a portion returned to the pin side by a predetermined amount from the detected position, and performing a binary judgment to detect lead wire protrusion.
JP2021968A 1990-02-02 1990-02-02 Defective base pin detecting method Pending JPH03230452A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2021968A JPH03230452A (en) 1990-02-02 1990-02-02 Defective base pin detecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2021968A JPH03230452A (en) 1990-02-02 1990-02-02 Defective base pin detecting method

Publications (1)

Publication Number Publication Date
JPH03230452A true JPH03230452A (en) 1991-10-14

Family

ID=12069854

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021968A Pending JPH03230452A (en) 1990-02-02 1990-02-02 Defective base pin detecting method

Country Status (1)

Country Link
JP (1) JPH03230452A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005079033A (en) * 2003-09-03 2005-03-24 Osram-Melco Ltd Use of fluorescent lamps and colorants and use of colored protrusions
JP2010097955A (en) * 2010-02-01 2010-04-30 Osram-Melco Ltd Fluorescent lamp

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005079033A (en) * 2003-09-03 2005-03-24 Osram-Melco Ltd Use of fluorescent lamps and colorants and use of colored protrusions
JP2010097955A (en) * 2010-02-01 2010-04-30 Osram-Melco Ltd Fluorescent lamp

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