JPH03250724A - Manufacture of organic semiconductor solid electrolytic capacitor - Google Patents

Manufacture of organic semiconductor solid electrolytic capacitor

Info

Publication number
JPH03250724A
JPH03250724A JP4791390A JP4791390A JPH03250724A JP H03250724 A JPH03250724 A JP H03250724A JP 4791390 A JP4791390 A JP 4791390A JP 4791390 A JP4791390 A JP 4791390A JP H03250724 A JPH03250724 A JP H03250724A
Authority
JP
Japan
Prior art keywords
metal salt
capacitor
solid electrolytic
organic semiconductor
chemical conversion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4791390A
Other languages
Japanese (ja)
Other versions
JP2755767B2 (en
Inventor
Katsunori Minatomi
水富 勝則
Shinichi Niwa
丹羽 信一
Kenji Kaguma
健二 鹿熊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP4791390A priority Critical patent/JP2755767B2/en
Publication of JPH03250724A publication Critical patent/JPH03250724A/en
Application granted granted Critical
Publication of JP2755767B2 publication Critical patent/JP2755767B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Chemical Treatment Of Metals (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

PURPOSE:To stabilize an oxide film on an aluminum foil and reduce leakage current by conversion heat treating an anode foil using solution which includes at least either the alkaline metal salt or the alkaline earth metal salt of phosphoric acid after forming a winding up element. CONSTITUTION:After a capacitor element is formed, an anode foil 1 is formed by solution containing at least either the alkaline metal salt or the alkaline earth metal salt of phosphoric acid. Then, through heat treatment, chemical conversion coating is performed on the chemical conversion coating of a metal which has been present since before the capacitor element is formed by using the forming liquid containing at least either the alkaline metal salt or the alkaline earth metal salt of the phosphoric acid. Thus, an oxide film which is remarkably stable mechanically, thermally and chemically is obtained and leakage current is reduced.

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明は有機半導体固体電解コンデンサの製造方法に関
するものである。更に詳説すると、本発明は電解質とし
てTCNQ錯塩を使用する有機半導体固体電解コンデン
サにおける漏?L電流を抑制できるコンデンサの製造方
法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application The present invention relates to a method for manufacturing an organic semiconductor solid electrolytic capacitor. More specifically, the present invention solves leakage problems in organic semiconductor solid electrolytic capacitors using TCNQ complex salt as an electrolyte. The present invention relates to a method of manufacturing a capacitor that can suppress L current.

(ロ)従来の技術 電解質としてTCNQ錯塩を使用する有機半導体固体電
解コンデンサに関しては、本頼出頼人より既に種々提案
している。即ち、特開昭58−〕991414号HOI
 G9102)等に開示されているN位をアルキル基で
置換したイソキノリンとのTCNQ錯塩を用いた固体電
解コンデンサは、特に優れた高周波特性をもっているた
め、スイッチング電源用などに広く採用されている。
(b) Prior Art Regarding organic semiconductor solid electrolytic capacitors using TCNQ complex salt as an electrolyte, various proposals have already been made by Yorito Motoyori. That is, JP-A-58-]991414 HOI
A solid electrolytic capacitor using a TCNQ complex salt with an isoquinoline substituted with an alkyl group at the N-position, which is disclosed in Japanese Patent Application No. G9102), has particularly excellent high frequency characteristics and is therefore widely used in switching power supplies.

次にコンデンサ素子について説明する。第1図は従来使
用されているコンデンサ素子を示す。まず、高純度(9
9,99%以上)のアルミニウム箔を科学的処理により
粗面化し、実効表面積を増加させるためのいわゆる工・
/チング処理を行なう。次に電解液中にて、電気化学的
にアルミニウム箔表面に酸化皮膜(酸化アルミニウムの
薄膜)を形成する(化成処理)。次にエツチング処理、
化成処理を行なったアルミニウム箔を陽極箔(1)とし
、対向陰極箔(2)との間にセパレータ(3)としてマ
ニラ紙を挟み、第1図に示すように円筒状に巻き取る。
Next, the capacitor element will be explained. FIG. 1 shows a conventionally used capacitor element. First, high purity (9
9.99% or more) aluminum foil is chemically treated to roughen it and increase its effective surface area.
/Perform the chiming process. Next, an oxide film (thin film of aluminum oxide) is electrochemically formed on the surface of the aluminum foil in an electrolytic solution (chemical conversion treatment). Next, etching treatment,
An aluminum foil subjected to chemical conversion treatment is used as an anode foil (1), manila paper is sandwiched between it and a counter cathode foil (2) as a separator (3), and the aluminum foil is rolled up into a cylindrical shape as shown in FIG.

こうしてアルミニウム箔に酸化皮膜を形成した陽極箔(
1)及び陰極箔(2)と両電極箔間に介挿されたセパレ
ータ(3)とを持回してコンデンサ素子(6)が形成さ
れる。なお(4)(4’)はアルミリード、(5)(5
’)はリード線である。
Anode foil with an oxide film formed on aluminum foil (
A capacitor element (6) is formed by rotating the cathode foil (2) and the separator (3) inserted between the two electrode foils. Note that (4) (4') is aluminum lead, (5) (5
') is the lead wire.

さらにコンデンサ素子(6)に熱処理を施し、セパレー
タ(3)を構成するマニラ紙を炭化して繊維の細径化に
よる密度の低下を計る。
Further, the capacitor element (6) is subjected to heat treatment, and the manila paper forming the separator (3) is carbonized to reduce the density by reducing the diameter of the fibers.

第2図はこのコンデンサ素子(6)をアルミケース(7
)内に収納した状態の断面図である。即ち、所定量の各
種TCNQCN上8)をケース(7)内に入れ、加熱し
た熱板上にアルミケース(7)を載置し、本実施例では
310〜315℃にてケース(7)中の粉末状TCNQ
錯塩を加熱融解させる。
Figure 2 shows this capacitor element (6) in an aluminum case (7).
) FIG. That is, a predetermined amount of various TCNQCN (8) is placed in the case (7), and the aluminum case (7) is placed on a heated hot plate. Powdered TCNQ
Heat and melt the complex salt.

一方、予め加熱しであるコンデンサ素子(6)をアルミ
ケース(7)内に挿入して、融解したTCNQCN上混
合液をコンデンサ素子(6)に含浸させ、すぐに冷却固
化させる。その後、TCNQCN上は反応し難い樹脂(
9)を封入し、さらにエポキシ樹脂等(10)で成形す
る。(11)はリード線用溝である。前述の如き従来技
術においては化成したエツチドアルミニウム箔(1)と
陰極箔(2)をセパレータ(3)を介して巻回したコン
デンサ素子(6)を素子形成時に損傷した陽極箔の化成
皮膜修復のため再度アジピン酸アンモニウムの水溶液に
て再化成並びに熱処理していた。そして該コンデンサ素
子に融解液化したTCNQ塩(8)を含浸し、樹脂(9
)又はゴムで封口、電圧処理(エージング)等の工程を
経て目的とする有機半導体固体電解コンデンサを完成さ
せていた。
On the other hand, the preheated capacitor element (6) is inserted into the aluminum case (7), and the capacitor element (6) is impregnated with the molten TCNQCN mixture, which is immediately cooled and solidified. After that, a resin that is difficult to react on TCNQCN (
9) is sealed and further molded with epoxy resin or the like (10). (11) is a lead wire groove. In the prior art as described above, a capacitor element (6) in which a chemically etched aluminum foil (1) and a cathode foil (2) are wound with a separator (3) interposed therebetween is repaired with a chemical conversion coating on an anode foil that is damaged during element formation. Therefore, it was re-formed using an aqueous solution of ammonium adipate and heat treated. Then, the capacitor element was impregnated with melted and liquefied TCNQ salt (8), and the resin (9) was impregnated with the melted and liquefied TCNQ salt (8).
) or rubber sealing, voltage treatment (aging), and other processes to complete the desired organic semiconductor solid electrolytic capacitor.

しかし、有機半導体固体電解コンデンサは一般の電解液
を用いたコンデンサに比べ酸化皮膜の修復性が若干弱く
、アジピン酸アンモニウムの再度の化成により形成させ
た皮膜についてもTCNQ塩含浸時の機械的ストレス、
熱的ストレス或いは化学的なストレスにより化成皮膜に
は弱体部が存在することになる。これらの要因により高
電圧印加時においては上記弱体部が破壊し、漏れ電流が
増大する。
However, the repairability of the oxide film in organic semiconductor solid electrolytic capacitors is slightly weaker than that of capacitors using general electrolytes, and the film formed by reconstitution of ammonium adipate also suffers from mechanical stress during impregnation with TCNQ salt.
A weak portion exists in the chemical conversion coating due to thermal stress or chemical stress. Due to these factors, the weakened portion breaks down when high voltage is applied, increasing leakage current.

(ハ)発明が解決しようとする課題 本発明は、TCNQ塩を固体電解質に用いた有機半導体
固体電解コンデンサにおいて高電圧印加時に漏れ電流の
増大する点を解決するものて゛ある。
(c) Problems to be Solved by the Invention The present invention is intended to solve the problem of an increase in leakage current when a high voltage is applied in an organic semiconductor solid electrolytic capacitor using a TCNQ salt as a solid electrolyte.

(ニ)課題を解決するための手段 本発明は巻き取り素子形成後、陽極箔をリン酸のアルカ
リ金属塩或はアルカリ土類金属塩の少なくともいずれか
一方を含む溶液にて化成熟処理することにより巻き取り
素子(コンデンサ素子)形成前から存在しているアルミ
ニウム箔の化成皮膜上にリン酸のアルカリ金属塩、アル
カリ土類金属塩の少なくともいずれか一方を含む化成液
にて化成された新たな化成皮膜を形成させるものである
(d) Means for Solving the Problems The present invention provides that after forming the winding element, the anode foil is subjected to a chemical maturation treatment in a solution containing at least one of an alkali metal salt and an alkaline earth metal salt of phosphoric acid. A new chemical conversion film containing at least one of an alkali metal salt of phosphoric acid and an alkaline earth metal salt is applied to the chemical conversion film of the aluminum foil that existed before the formation of the winding element (capacitor element). It forms a chemical conversion film.

(ホ)作 用 巻き取り素子形成前から存在している化成皮膜の上にリ
ン酸のアルカリ金属塩、アルカリ土類金属塩の少なくと
もいずれか1つを含む化成液にて化成された化成皮膜を
形成することにより機械的、熱的、化学的に非常に安定
した酸化皮膜が得られる。
(E) Operation A chemical conversion film formed with a chemical liquid containing at least one of an alkali metal salt of phosphoric acid and an alkaline earth metal salt is applied onto the chemical conversion film existing before the formation of the winding element. By forming this, a mechanically, thermally and chemically very stable oxide film can be obtained.

(へ)実施例 第1表に本発明の実施例及び従来例として用いた再化成
(巻き取り素子形成後の化成)の化成液を示す。
(f) Examples Table 1 shows chemical conversion liquids used for re-chemical conversion (chemical conversion after formation of the winding element) used in the examples of the present invention and conventional examples.

以下余白 第 1 表 第2表に第1表に示した化成液により処理した定格35
V、容量0.68uFの素子を用いて試作した有機半導
体固体電解コンデンサの電圧処理(エージング)後のも
れ電流の歩留りを記載する。(条件=125℃、35V
で1時間)第2表においてり、C1は漏れ電流のデータ
であり、試料100個中の不良数と歩留りを示している
が、LC規格は35 ■、0.68μFの場合は0 、
5 (IIA/10 sec、 )以下である。尚、測
定条件は125℃、印加電圧35v、1時間後の結果で
ある。
Margin below Table 1 Rating 35 treated with the chemical liquid shown in Table 1
The yield of leakage current after voltage treatment (aging) of an organic semiconductor solid electrolytic capacitor prototyped using an element with a capacitance of 0.68 uF and a capacitance of 0.68 uF will be described. (Condition = 125℃, 35V
1 hour) In Table 2, C1 is the leakage current data, indicating the number of defects in 100 samples and the yield.
5 (IIA/10 sec, ) or less. The measurement conditions were 125° C., an applied voltage of 35 V, and the results were obtained after 1 hour.

第2表から本発明が従来に比べ漏れ電流の増大化の防止
に著しい効果のあることが判かる。又高温負荷の寿命試
験においても従来のアジピン酸アンモニウムやリン酸ア
ンモニウムを用いた場合に較べ、本発明のリン酸のアル
カリ金属塩、アルカリ土類金属塩を用いた場合は極めて
ショート率が減少する。この事実からも理解できるよう
に本発明により形成した酸化皮膜は非常に安定した酸化
皮膜であり、もれ電流の低減下に大いに役立つことがわ
かる。
It can be seen from Table 2 that the present invention is significantly more effective in preventing an increase in leakage current than the conventional method. Also, in a life test under high temperature load, the short circuit rate is significantly reduced when the alkali metal salt or alkaline earth metal salt of phosphoric acid of the present invention is used, compared to when conventional ammonium adipate or ammonium phosphate is used. . As can be understood from this fact, the oxide film formed according to the present invention is a very stable oxide film, and is found to be very useful in reducing leakage current.

第3表(a)に105℃、35Vの寿命試験における5
00時間までのショート数測定結果を示す。
Table 3 (a) shows 5 in the life test at 105°C and 35V.
The results of measuring the number of short circuits up to 00 hours are shown.

以下余白 第 表 (a) 尚上記ショート数はエージング後、LC良品の試料10
0個に対する結果である。
Below is a blank table (a).The number of shorts shown above is for 10 good LC samples after aging.
This is the result for 0 pieces.

(ト)発明の効果 このように本発明によれば、TCNQ塩を使用する有機
半導体固体電解コンデンサにおいてアルミニウム箔上の
酸化皮膜が極めて安定したものとなり、漏れ電流が著し
く低減する。
(G) Effects of the Invention As described above, according to the present invention, in an organic semiconductor solid electrolytic capacitor using TCNQ salt, the oxide film on the aluminum foil becomes extremely stable, and leakage current is significantly reduced.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はコンデンサ素子の斜視図、第2図は固体電解コ
ンデンサの断面図である。 (1)(2)・・・陽、 陰極箔、 (3)・・・セパレータ、 (6)・・・コンデンサ素子、 (7)・・・アルミケース、 (8)・・・TCNQ錯塩。
FIG. 1 is a perspective view of a capacitor element, and FIG. 2 is a sectional view of a solid electrolytic capacitor. (1) (2)...Positive, cathode foil, (3)...Separator, (6)...Capacitor element, (7)...Aluminum case, (8)...TCNQ complex salt.

Claims (1)

【特許請求の範囲】[Claims] (1)アルミニウム、タンタル、ニオブ等の弁作用を有
する金属を化成しエッチングした箔よりなる陽極箔と該
金属の薄箔よりなる陰極箔との間にセパレータ紙を介し
て巻回して形成したコンデンサ素子に、加熱融解可能で
且つ冷却固化後コンデンサ用電解質として使用し得る電
導度を有するTCNQ塩を加熱して含浸させ、冷却固化
させてなる有機半導体固体電解コンデンサにおいて、前
記コンデンサ素子の形成後、前記陽極箔を、リン酸のア
ルカリ金属塩、アルカリ土類金属塩のうちの少なくとも
いずれか一方を含む溶液にて化成し、その後、熱処理す
ることにより前記コンデンサ素子の形成前から存在して
いる前記金属の化成皮膜上にリン酸のアルカリ金属塩、
アルカリ土類金属塩の少なくともいずれか一方を含む化
成液にて化成皮膜を施すことを特徴とする有機半導体固
体電解コンデンサの製造方法。
(1) A capacitor formed by winding a separator paper between an anode foil made of a chemically etched foil of a metal with a valve action such as aluminum, tantalum, or niobium, and a cathode foil made of a thin foil of the metal. In an organic semiconductor solid electrolytic capacitor in which the element is heated and impregnated with TCNQ salt that can be heated and melted and has a conductivity that can be used as an electrolyte for a capacitor after cooling and solidifying, and cooling and solidifying, after forming the capacitor element, The anode foil is chemically formed with a solution containing at least one of an alkali metal salt and an alkaline earth metal salt of phosphoric acid, and then heat-treated to remove the anode that is present before the formation of the capacitor element. Alkali metal salt of phosphoric acid on chemical conversion coating of metal,
A method for manufacturing an organic semiconductor solid electrolytic capacitor, comprising applying a chemical conversion film using a chemical liquid containing at least one of alkaline earth metal salts.
JP4791390A 1990-02-28 1990-02-28 Manufacturing method of organic semiconductor solid electrolytic capacitor Expired - Fee Related JP2755767B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4791390A JP2755767B2 (en) 1990-02-28 1990-02-28 Manufacturing method of organic semiconductor solid electrolytic capacitor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4791390A JP2755767B2 (en) 1990-02-28 1990-02-28 Manufacturing method of organic semiconductor solid electrolytic capacitor

Publications (2)

Publication Number Publication Date
JPH03250724A true JPH03250724A (en) 1991-11-08
JP2755767B2 JP2755767B2 (en) 1998-05-25

Family

ID=12788609

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4791390A Expired - Fee Related JP2755767B2 (en) 1990-02-28 1990-02-28 Manufacturing method of organic semiconductor solid electrolytic capacitor

Country Status (1)

Country Link
JP (1) JP2755767B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011040326A1 (en) 2009-09-29 2011-04-07 電気化学工業株式会社 Rod for electron source, electron source, and electronic appliance

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011040326A1 (en) 2009-09-29 2011-04-07 電気化学工業株式会社 Rod for electron source, electron source, and electronic appliance

Also Published As

Publication number Publication date
JP2755767B2 (en) 1998-05-25

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