JPH03252143A - Semiconductor processing equipment - Google Patents
Semiconductor processing equipmentInfo
- Publication number
- JPH03252143A JPH03252143A JP4983590A JP4983590A JPH03252143A JP H03252143 A JPH03252143 A JP H03252143A JP 4983590 A JP4983590 A JP 4983590A JP 4983590 A JP4983590 A JP 4983590A JP H03252143 A JPH03252143 A JP H03252143A
- Authority
- JP
- Japan
- Prior art keywords
- electrolyte
- substrate
- tank
- semiconductor substrate
- bumps
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electroplating Methods And Accessories (AREA)
Abstract
Description
【発明の詳細な説明】
〔概要〕
本発明は、金属ハンプを形成する際に用いる電解液槽の
構造に関し。DETAILED DESCRIPTION OF THE INVENTION [Summary] The present invention relates to the structure of an electrolyte bath used when forming a metal hump.
半導体基板上のバンプが均一に形成されることを目的と
し。The purpose is to uniformly form bumps on a semiconductor substrate.
基板ホルダーと電解液槽とを有し、該基板ホルダーはそ
の上にハンプを電解めっきにより形成する半導体基板を
セットして、カソードの働きをするものであり。It has a substrate holder and an electrolytic solution tank, and the substrate holder functions as a cathode by setting a semiconductor substrate on which a hump is formed by electrolytic plating.
該電解液槽は、電解液を下部より供給し、上部周縁より
溢流させて、電解液が満たされ、該半導体基板を下側に
保持した該基板ホルダーが電解液面に接触され、槽の底
部にアノード板が設けられ。The electrolyte tank is filled with electrolyte by supplying the electrolyte from the lower part and overflowing from the upper periphery, and the substrate holder holding the semiconductor substrate on the lower side is brought into contact with the electrolyte surface and the tank is filled with electrolyte. An anode plate is provided at the bottom.
且つ、槽の上部外側周縁に受け皿が設けられているよう
に構成する。In addition, a receiving tray is provided on the upper outer periphery of the tank.
本発明は、金属バンプを形成する際に用いる電解液槽の
構造に関する。The present invention relates to the structure of an electrolyte bath used when forming metal bumps.
半導体装置の結線方法として、従来、ワイヤーボンディ
ングが広く使われている。Wire bonding has conventionally been widely used as a wiring method for semiconductor devices.
しかし、半導体装置の高集積化に伴い、ボンディングス
ペースも縮小させることが必要となり。However, as semiconductor devices become more highly integrated, it becomes necessary to reduce the bonding space.
同方法では高密度な結線に対応できなくなりつつある。This method is becoming incapable of handling high-density connections.
第3図は従来例の説明図である。 FIG. 3 is an explanatory diagram of a conventional example.
図において、1は基板ホルダー、2は電解液槽。In the figure, 1 is a substrate holder, and 2 is an electrolyte tank.
3はハンプ、4は半導体基板、6は電解液、7はアノー
ド板、9はレジストである。3 is a hump, 4 is a semiconductor substrate, 6 is an electrolytic solution, 7 is an anode plate, and 9 is a resist.
従来のワイヤボンディングに変わって、最近。Recently, it has replaced traditional wire bonding.
多く用いられるようになった方法として、バンプ法があ
る。A bump method is a method that has become widely used.
これは、ICチップ上に微小な金属のバンプを形成し、
このハンプと結線する対抗基板のバンプ或いは電極とを
互いに圧着して結合する方法である。This forms tiny metal bumps on the IC chip,
This is a method in which the hump and the bump or electrode of the opposing substrate to be connected are bonded to each other by pressure bonding.
この方法によれば、結線間隔は形成するバンプのピッチ
で決まり、ワイヤーボンディング法に比べて高密度な結
線が可能となる。According to this method, the wire connection interval is determined by the pitch of the bumps to be formed, and higher density wire connection is possible than with the wire bonding method.
第3図に従来のIC基板上へのバンプ形成法を示す。FIG. 3 shows a conventional method of forming bumps on an IC substrate.
第3図(b)に示すように、あらかじめレジスト9でバ
ンプ形成領域を高密度にパターニングした半導体基板4
を使用する。As shown in FIG. 3(b), a semiconductor substrate 4 is patterned with a resist 9 in advance to form bump formation regions with high density.
use.
この半導体基板4をカソードとなる基板ホルダーにセッ
トして、半導体基板4のめっきする面を電解液槽2の電
解液6の溢流面に向けて、基板4と電解液6とを接触さ
せる。This semiconductor substrate 4 is set in a substrate holder that serves as a cathode, and the surface of the semiconductor substrate 4 to be plated is directed toward the overflow surface of the electrolytic solution 6 of the electrolytic solution tank 2, so that the substrate 4 and the electrolytic solution 6 are brought into contact with each other.
そして、鉛・錫(Pb−5n)を含む電解液6をオーバ
ーフローさせながら、半導体基板4に接続したカソード
の電極に電圧を印加することによって。Then, by applying a voltage to the cathode electrode connected to the semiconductor substrate 4 while overflowing the electrolytic solution 6 containing lead and tin (Pb-5n).
半導体基板4上のレジスト9で覆われていない領域に、
鉛・錫はんだがバンプ状に形成される。In the area not covered with the resist 9 on the semiconductor substrate 4,
Lead/tin solder is formed into a bump shape.
基板全面には、均一な形状のバンプを多数形成させるた
めには、基板全面が均一に電解液と接触すると共に、電
解液が絶えず新しい電解液と置換される必要がある。In order to form a large number of uniformly shaped bumps on the entire surface of the substrate, it is necessary that the entire surface of the substrate comes into uniform contact with the electrolytic solution and that the electrolytic solution is constantly replaced with new electrolytic solution.
これに対して、従来の方法では、電解液槽の上端部で電
解液が急激に槽外に落下するために、基板の周辺部にお
いて、基板と電解液との均一な接触が得られに<<、こ
の結果、基板周辺部に形成されるハンプの形状が著しく
損なわれていた。On the other hand, in the conventional method, the electrolyte suddenly falls out of the tank at the upper end of the tank, making it difficult to achieve uniform contact between the substrate and the electrolyte around the substrate. As a result, the shape of the hump formed at the periphery of the substrate was significantly impaired.
例えは、ハンプの高さについては、基板の周辺部と中央
部とでは、約5%の違いが生じている。For example, regarding the height of the hump, there is a difference of about 5% between the peripheral part and the central part of the board.
本発明は、基板上のバンプが均一に形成されることを目
的として提供されるものである。The present invention is provided for the purpose of uniformly forming bumps on a substrate.
第1図は本発明の原理説明図である。 FIG. 1 is a diagram explaining the principle of the present invention.
図において、1は基板ホルダー、2は電解液槽3はパン
1.4は半導体基板、6は電解液、7はアノード板、8
は受け皿である。In the figure, 1 is a substrate holder, 2 is an electrolyte tank 3 is a pan, 4 is a semiconductor substrate, 6 is an electrolyte, 7 is an anode plate, 8
is a saucer.
上述のようなバンプの高さの不均一を是正するためには
、第1図(a)に示す従来の電解液槽2の上部周縁に、
第1図(b)に示すような受け皿8を設けるとよい。In order to correct the non-uniformity of the height of the bumps as described above, the upper periphery of the conventional electrolyte tank 2 shown in FIG.
It is preferable to provide a tray 8 as shown in FIG. 1(b).
即ち1本発明のように、基板ホルダー1と電解液槽2と
を有し、該基板ホルダー1はその上にバンプ3を電解め
っきにより形成する半導体基板4をセットして、カソー
ドの働きをするものであり。Specifically, as in the present invention, the substrate holder 1 has a substrate holder 1 and an electrolyte tank 2, and the substrate holder 1 functions as a cathode by setting a semiconductor substrate 4 on which bumps 3 are formed by electrolytic plating. It is a thing.
該電解液槽2は、電解液6を下部より供給し、上部周縁
より溢流させて、電解液6が満たされ、該半導体基板4
を下側に保持した該基板ホルダー1が電解液面に接触さ
れ、槽2の底部にアノード板7が設けられ、且つ、槽2
の上部外側周縁に受け皿8が設けられていることにより
、従来の問題点が解決される。The electrolytic solution tank 2 is supplied with an electrolytic solution 6 from the lower part and overflows from the upper periphery to be filled with the electrolytic solution 6, and the semiconductor substrate 4 is filled with the electrolytic solution 6.
The substrate holder 1 holding the substrate on the lower side is brought into contact with the electrolyte surface, an anode plate 7 is provided at the bottom of the tank 2, and
The conventional problem is solved by providing the receiving tray 8 on the upper outer periphery of the holder.
このような受け皿を電解液槽の外側の上端部に設けるこ
とにより、電解液槽上部での電解液の流れと基板との関
係は第1図のように改善され、電解液槽の上部では、半
導体基板4のめっき面金面が絶えず、下から噴流する新
しい電解液6に接触することとなる。By providing such a saucer at the upper end of the outside of the electrolyte tank, the relationship between the flow of the electrolyte and the substrate at the top of the electrolyte tank is improved as shown in Figure 1, and at the top of the electrolyte tank, The plated metal surface of the semiconductor substrate 4 constantly comes into contact with the new electrolyte 6 jetting from below.
即ち、従来方法では、槽の上端部から槽外に向かって急
激に電解液が落下するのに対して2本発明の方法により
、受け皿内の電解液がバッファとして作用し、受け皿の
外側へは急激に落下するものの、槽の外側での落下を防
ぐことができる。That is, in the conventional method, the electrolyte suddenly falls from the upper end of the tank toward the outside of the tank, but in the method of the present invention, the electrolyte in the tray acts as a buffer, and the electrolyte drops to the outside of the tray. Although it falls suddenly, it is possible to prevent it from falling outside the tank.
この結果、槽の上部の電解液の液面を基板の周辺部まで
平坦化することが可能となり、基板周辺部と電解液との
接触も安定し、基板周辺部にも均一な形状のバンプの形
成が可能となる。As a result, the surface of the electrolyte at the top of the tank can be flattened to the periphery of the substrate, and the contact between the periphery of the substrate and the electrolyte is stable, and uniformly shaped bumps can be formed on the periphery of the substrate. Formation becomes possible.
もちろん、基板に比べて槽を巨大にすることによっても
同様な効果が得られると予想されるが。Of course, it is expected that a similar effect can be obtained by making the tank larger than the substrate.
その場合には電解液の使用量が数倍にも増大し実用的で
はない。In that case, the amount of electrolyte used increases several times, making it impractical.
第2図は本発明の一実施例の説明図である。 FIG. 2 is an explanatory diagram of one embodiment of the present invention.
図において、2は電解液槽、4は半導体基板。In the figure, 2 is an electrolytic solution tank, and 4 is a semiconductor substrate.
8は受け皿である。8 is a saucer.
第2図(a)は本発明の電解液槽の斜視図である。FIG. 2(a) is a perspective view of the electrolyte tank of the present invention.
第2図(b)に模式断面図で示すように、受け皿8の部
分の高さhlが基板面までの高さり、に比べて高いと、
電解液が基板の裏面にまで回り込み、裏面もめっきされ
てしまうので好ましくない。As shown in the schematic cross-sectional view in FIG. 2(b), if the height hl of the receiving tray 8 is higher than the height to the substrate surface,
This is undesirable because the electrolyte gets to the back side of the substrate and the back side is also plated.
又、第2図で、h、<h、の場合には、液面の平坦化効
果が小さくなってしまう。Furthermore, in FIG. 2, when h<h, the effect of flattening the liquid level becomes small.
従って。Therefore.
h、;hl <h2 となるように受け皿を設計する必要がある。h, ;hl <h2 It is necessary to design the saucer so that
この電解液槽を用いて、半導体基板4にはんだバンプの
形成を行った。第1図(b)に示すように、半導体基板
4はめっきする面を下にして3個の爪を備える基板ホル
ダー1に取り付け、外径がほぼ同じ内径で周縁上部に受
け皿8を設けた本発明の電解液槽2の上に被せるように
置く。Using this electrolyte bath, solder bumps were formed on the semiconductor substrate 4. As shown in FIG. 1(b), the semiconductor substrate 4 is mounted with the surface to be plated facing down in a substrate holder 1 equipped with three claws, and a book having an outer diameter of approximately the same inner diameter and a receiving tray 8 provided on the upper edge of the periphery is attached. Place it over the electrolyte tank 2 of the invention.
基板ホルダー1はカソードとして、端子を電源につなぐ
。The substrate holder 1 serves as a cathode and connects the terminal to a power source.
電解液槽2の底部に近い位置に槽2の内径よりやや小さ
い径の小孔の開いたアノード板7を置く。An anode plate 7 having a small hole with a diameter slightly smaller than the inner diameter of the tank 2 is placed near the bottom of the electrolyte tank 2.
アノード板7はTi板にptめっきしたものを使用する
。The anode plate 7 is a Ti plate plated with PT.
電解液6は電解液槽2の下部より噴流状に送られ、アノ
ード板7の小孔を通して、半導体基板4のめっき面に噴
出させる。The electrolytic solution 6 is sent in a jet form from the lower part of the electrolytic solution tank 2, and is ejected onto the plating surface of the semiconductor substrate 4 through the small holes of the anode plate 7.
そして、電解液6は、電解液槽2の周縁の半導体基板4
との隙間から溢れ出して、受け皿8に入り、受け皿8か
ら溢流して、電解液槽2の外に流下する。Then, the electrolytic solution 6 is applied to the semiconductor substrate 4 at the periphery of the electrolytic solution tank 2.
It overflows from the gap between the electrolyte tank 2, enters the tray 8, overflows from the tray 8, and flows down to the outside of the electrolyte tank 2.
第1図(b)に示すように、半導体基板4の周縁に取り
付けた基板ホルダー1をカソードとし。As shown in FIG. 1(b), the substrate holder 1 attached to the periphery of the semiconductor substrate 4 is used as a cathode.
アノード板7との間に直流電圧1■を印加し、半導体基
板4の1枚に10mA/cm!の電流を流して。A DC voltage of 1 cm is applied between the anode plate 7 and one of the semiconductor substrates 4 at 10 mA/cm! Flow the current.
約40μmの厚さの鉛・錫系のはんだのバンプ電極を形
成する。A lead/tin solder bump electrode with a thickness of approximately 40 μm is formed.
■従って、基板周辺部も中央部と同様に電解液と均一に
接触する。(2) Therefore, the periphery of the substrate also comes into uniform contact with the electrolyte like the center.
■この結果、基板周辺部にも均一な形状のバンプが形成
される。(2) As a result, uniformly shaped bumps are formed also on the periphery of the substrate.
第1図は本発明の原理説明図。
第2図は本発明の一実施例の説明図。
第3図は従来例の説明図である。
図において。
1は基板ホルダー、 2
3はバンプ、 4
6は電解液、 7
8は受け皿、 9
は電解液槽。
は半導体基板。
はアノード板。
はレジスト
〔発明の効果〕
本発明によれば、従来の電解液槽の外部に受け皿を設け
ることにより9次のような効果が得られる。
■基板と接触する電解液の液面が平坦化される。
芹理説明図
第
図
(α)
(し)
木発朋の
突た例の説明図
従来例の説明図
第3回FIG. 1 is a diagram explaining the principle of the present invention. FIG. 2 is an explanatory diagram of one embodiment of the present invention. FIG. 3 is an explanatory diagram of a conventional example. In fig. 1 is a substrate holder, 2 3 is a bump, 4 6 is an electrolyte, 7 8 is a saucer, and 9 is an electrolyte tank. is a semiconductor substrate. is the anode plate. [Effects of the Invention] According to the present invention, the following effects can be obtained by providing a receiving tray outside the conventional electrolytic solution tank. ■The surface of the electrolyte in contact with the substrate is flattened. Seri explanatory diagram Diagram (α) (shi) Explanatory diagram of Kibatsu Tomo's striking example Explanatory diagram of conventional example Part 3
Claims (1)
ホルダー(1)はその上にバンプ(3)を電解めっきに
より形成する半導体基板(4)をセットして、カソード
の働きをするものであり、 該電解液槽(2)は、電解液(6)を下部より供給し、
上部周縁より溢流させて、電解液(6)が満たされ、該
半導体基板(4)を下側に保持した該基板ホルダー(1
)が電解液面に接触され、槽(2)の底部にアノード板
(7)が設けられ、且つ、槽(2)の上部外側周縁に受
け皿(8)が設けられていることを特徴とする半導体製
造装置。[Claims] It has a substrate holder (1) and an electrolyte tank (2), and the substrate holder (1) has a semiconductor substrate (4) on which bumps (3) are formed by electroplating. The electrolytic solution tank (2) supplies an electrolytic solution (6) from the bottom, and functions as a cathode.
The substrate holder (1) is filled with electrolytic solution (6) by overflowing from the upper periphery, and holds the semiconductor substrate (4) on the lower side.
) is in contact with the electrolyte surface, an anode plate (7) is provided at the bottom of the tank (2), and a saucer (8) is provided at the upper outer periphery of the tank (2). Semiconductor manufacturing equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4983590A JPH03252143A (en) | 1990-03-01 | 1990-03-01 | Semiconductor processing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4983590A JPH03252143A (en) | 1990-03-01 | 1990-03-01 | Semiconductor processing equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03252143A true JPH03252143A (en) | 1991-11-11 |
Family
ID=12842143
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4983590A Pending JPH03252143A (en) | 1990-03-01 | 1990-03-01 | Semiconductor processing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03252143A (en) |
-
1990
- 1990-03-01 JP JP4983590A patent/JPH03252143A/en active Pending
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