JPH032548A - Method for inspecting circuit pattern - Google Patents

Method for inspecting circuit pattern

Info

Publication number
JPH032548A
JPH032548A JP13693989A JP13693989A JPH032548A JP H032548 A JPH032548 A JP H032548A JP 13693989 A JP13693989 A JP 13693989A JP 13693989 A JP13693989 A JP 13693989A JP H032548 A JPH032548 A JP H032548A
Authority
JP
Japan
Prior art keywords
circuit patterns
fluorescence
insulating substrate
weight
circuit pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13693989A
Other languages
Japanese (ja)
Other versions
JPH0676972B2 (en
Inventor
Nobukimi Hosoki
細木 伸仁
Shigeaki Kojima
小島 甚昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP1136939A priority Critical patent/JPH0676972B2/en
Publication of JPH032548A publication Critical patent/JPH032548A/en
Publication of JPH0676972B2 publication Critical patent/JPH0676972B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/03—Use of materials for the substrate
    • H05K1/0313—Organic insulating material
    • H05K1/032—Organic insulating material consisting of one material
    • H05K1/0326—Organic insulating material consisting of one material containing O

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Epoxy Resins (AREA)

Abstract

PURPOSE:To accurately inspect circuit patterns with high efficiency by integrally coupling the high fluorescence imparted to an insulating layer and the specific stimulating light to strongly stimulate this fluorescence. CONSTITUTION:A wiring board consisting of an insulating substrate formed by perfecting of the curing of a resin compsn. contg. an epoxy resin, the orthocresol novolak compounded at the ratio ranging 10 to 25 pts.wt. per 100 pts.wt. this epoxy resin, and a curing accelerator in the base material and the circuit patterns formed on this insulating substrate is irradiated with 350 to 500nm stimulating light. The abnormality of the circuit patterns is decided in comparison with the normal circuit patterns by utilizing the property that while the insulating patterns formed between the circuits of the circuit patterns exhibit the extremely high fluorescence to 350 to 500nm stimulating light the circuit patterns do not exhibit the fluorescence. The circuit patterns are accurately inspected with the high efficiency by the fluorescence emitted by this stimulating light.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、絶縁基材中でエポキシ樹脂の硬化が完結した
絶縁基板とこの絶縁基板の上に形成された回路パターン
とから成るプリント配線板などの配線板の回路パターン
の検査法に関するものであス 〔従来の技術] 従来よりエポキシ樹脂は、積層板用などの樹脂として多
用されている。かかる積層板から作られるプリント配線
板の回路パターンの検査方法として、従来はプローブに
よる直接導通法、金属顕微鏡を応用した金属導体回路パ
ターンの反射光による方法、あるいは軟X線による方法
などが知られているが、最近−面精度良く、高能率に検
査できる方法として、励起光に感応して蛍光を発光する
蛍光性を絶縁層に付与することにより、プリント配線板
を励起光に対して発光しない導体回路バタンの部分と、
導体回路パターンの回路間に露出し、励起光に対して発
光する絶縁パターンの部分とに分け、これらの部分の発
光性の差異を利用して励起光を照射することにより回路
バクーンの異常を正常な回路パターンとの比較で検査す
る回路パターンの検査方法が試行されつつある。この検
査法の成否は当然のことながら絶縁層に付与する高い発
光性と、発光を強く励起する励起光の一体的な結合に依
存する。特に絶縁層に付与する発光性は、絶縁層の層厚
が薄いほど低く、また黒化処理した絶縁層を含むと低下
する性質があるのでこのような配線板では、絶縁層に強
烈な発光性を付与する必要がある。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a printed wiring board comprising an insulating substrate in which an epoxy resin has been completely cured in an insulating base material, and a circuit pattern formed on the insulating substrate. [Prior Art] Epoxy resins have been widely used as resins for laminated boards and the like. Conventionally known methods for inspecting circuit patterns on printed wiring boards made from such laminates include a direct conduction method using a probe, a method using reflected light from a metal conductor circuit pattern using a metallurgical microscope, and a method using soft X-rays. However, recently, as a method for highly efficient inspection with good surface accuracy, the printed wiring board does not emit light in response to excitation light by imparting fluorescence to the insulating layer, which emits fluorescence in response to excitation light. The conductor circuit button part,
The conductor circuit pattern is divided into parts of the insulating pattern that are exposed between the circuits and emit light in response to excitation light, and abnormalities in the circuit can be corrected by irradiating the excitation light using the difference in luminescence between these parts. A method of inspecting a circuit pattern by comparing it with a similar circuit pattern is being tried. The success or failure of this testing method naturally depends on the high luminescence imparted to the insulating layer and the integral combination of excitation light that strongly excites luminescence. In particular, the luminescence imparted to the insulating layer decreases as the thickness of the insulating layer becomes thinner, and also decreases when the insulating layer includes a blackened insulating layer. need to be granted.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

したがって、この発明は、精度よく高効率に回路パター
ンの検査を励起光により発光する蛍光でもって行うこと
のできる新規な回路パターンの検査法に関し、具体的に
は絶縁層に付与した高い蛍光性とこの蛍光性を強く励起
する特定の励起光の一体的な結合によって解決する点に
ある。
Therefore, the present invention relates to a novel circuit pattern inspection method that can accurately and efficiently inspect circuit patterns using fluorescence emitted by excitation light. The problem is solved by integral combination of specific excitation light that strongly excites this fluorescence.

〔課題を解決するための手段〕[Means to solve the problem]

本発明に係る回路板の上に形成された回路パターンの検
査法は、 (イ)エポキシ樹脂、 (ロ)前記エポキシ樹脂100重量部に対して10〜2
5重量部の範囲となる量で配合されるオルソクレゾール
ノボラック、 (ハ)および、硬化促進剤を含有する樹脂組成物が基材
中で硬化が完結した絶縁基板とこの絶縁基板に形成され
た回路パターンとからなる配線板に350〜500 n
mの励起光を照射することを特徴とするものである。
The method for inspecting a circuit pattern formed on a circuit board according to the present invention includes: (a) epoxy resin; (b) 10 to 2 parts by weight per 100 parts by weight of the epoxy resin;
An insulating substrate in which a resin composition containing an orthocresol novolak (c) and a curing accelerator, which is blended in an amount within the range of 5 parts by weight, is completely cured in a base material, and a circuit formed on this insulating substrate. 350~500n on a wiring board consisting of a pattern
It is characterized by irradiating m excitation light.

以下に、本発明を詳説する。本発明の回路パターンの検
査法に適用される配線板を構成する絶縁基板は、エポキ
シ樹脂とこのエポキシ樹脂100重量部に対して10〜
25重量部の範囲となる量で配合されたオルソクレゾー
ルノボラックと硬化促進剤を含む樹脂組成物が基材中で
硬化が完結した絶縁基板に限定される。ここでエポキシ
樹脂としては、ビスフェノールA型エポキシ樹脂および
これに難燃性を付与したハロゲン化ビスフェノルA型エ
ポキシ樹脂、あるいは耐熱性を向上させるために混合さ
せて用いられるノボランク型エポキシ樹脂およびこれに
難燃性を付与したハロゲン化ノボラック型エポキシ樹脂
などが例示される。
The present invention will be explained in detail below. The insulating substrate constituting the wiring board applied to the circuit pattern inspection method of the present invention contains epoxy resin and 10 to 10 parts by weight of this epoxy resin.
The resin composition containing orthocresol novolac and a curing accelerator blended in an amount within the range of 25 parts by weight is limited to an insulating substrate in which curing is completed in the base material. Here, the epoxy resins include bisphenol A epoxy resins and halogenated bisphenol A epoxy resins that have flame retardancy, or novolanc epoxy resins that are used in combination to improve heat resistance, and epoxy resins that are resistant to these. Examples include halogenated novolac type epoxy resins that have been imparted with flammability.

そしてこようなエポキシ樹脂100重量部に対して配合
されるオルソクレゾールノボラックを10〜25重量部
に制限した理由は、下限の10重量部未満の配合量では
、励起光に対する蛍光性か弱く、上限の25重量部を越
えるとエポキシ樹脂の硬化速度が早く樹脂ワニスでの使
用が困難となるからである。このオルソクレゾールノボ
ラックは、この発明においては、エポキシ樹脂の硬化剤
としてら選択的に採用された硬化剤であって、かつ特定
の波長に属する光に対して蛍光を発する蛍光剤としての
新規な作用を同時に有するものである。
The reason why orthocresol novolak is limited to 10 to 25 parts by weight per 100 parts by weight of such epoxy resin is that if the amount is less than the lower limit of 10 parts by weight, the fluorescence against excitation light will be weak, and the upper limit of This is because if the amount exceeds 25 parts by weight, the curing speed of the epoxy resin will be fast, making it difficult to use it in a resin varnish. This orthocresol novolak is a curing agent selectively employed as a curing agent for epoxy resins in this invention, and has a novel action as a fluorescent agent that emits fluorescence in response to light belonging to a specific wavelength. It has at the same time.

硬化促進剤としては、ベンジルジメチルアミンのような
第3級アミン、2エチル4メチルイミダヅール(2E4
MZ)のようなイミダゾール類が用いられ、その配合割
合は前記エポキシ樹脂の100重量部に対して0.05
〜1重量部が適当である。以上の成分が基材中で架橋反
応の促進にともなって硬化した樹脂の固形分を与えるま
でのプロセスに沿って説明すると、上記成分は溶媒中に
溶解された樹脂ワニスに含有される。ここで溶媒として
はジメチルホルムアミド(DMF)、メチルエチルケト
ン(’MEK)、アセトン、メチルセロソルブ、ジメチ
ルアセトアミド、ジオキサンなどの単独又は、混合した
ものをエポキシ樹脂の含有率40〜80重量%、好まし
くは55〜70重量%となる量で用いることができる。
As curing accelerators, tertiary amines such as benzyldimethylamine, 2ethyl4methylimidazur (2E4
An imidazole such as MZ) is used, and its blending ratio is 0.05 parts by weight per 100 parts by weight of the epoxy resin.
~1 part by weight is appropriate. Explaining the process by which the above-mentioned components promote the crosslinking reaction in the base material and give a solid content of the cured resin, the above-mentioned components are contained in a resin varnish dissolved in a solvent. Here, as a solvent, dimethylformamide (DMF), methyl ethyl ketone ('MEK), acetone, methyl cellosolve, dimethyl acetamide, dioxane, etc., alone or in combination, are used with an epoxy resin content of 40 to 80% by weight, preferably 55 to 80% by weight. It can be used in an amount of 70% by weight.

そしてこのように調製された樹脂ワニスを例えば、ガラ
スクロスの基材に含浸させた後、乾燥によって溶媒を蒸
発させつつエポキシ樹脂の反応を進行させ基材中の樹脂
組成物を半硬化させてプリプレグとする。
After impregnating a base material such as glass cloth with the resin varnish prepared in this way, the reaction of the epoxy resin is progressed while the solvent is evaporated by drying, and the resin composition in the base material is semi-cured to form a prepreg. shall be.

上記基材の種類は特に限定されない。通常はガラスクロ
ス等が用いられる。この他、石英繊維布等の無機繊維布
、ポリイミド樹脂繊維布等の高耐熱性有機繊維布等でも
よい。半硬化させる時の温度は140〜170°Cで行
うのが好ましい。170°Cを越えるとエポキシ樹脂の
反応が進み過ぎ、得られるプリプレグの層間接着力が低
下し、絶縁基板として吸水率などの性能低下の原因とな
る。このようにして得られたプリプレグを数枚重ねた上
に銅、ニッケル、アルミニウムなどの金属箔を重ねてこ
れを常用される条件で熱圧成形することにより回路パタ
ーンを形成できる金属箔張りの絶縁基板とし、次に回路
形成法として一般に行われているサブトラクティブ法に
よって、この金属箔にエッチングを施すと絶縁基板上に
回路パターンが形成された配線板が得られる。従って絶
縁基板上は1回路パターンとこの回路パターンの回路間
に露出する絶縁基板によって形成される絶縁パターンと
に分けられる。なお、絶縁基板上にアディティブ法によ
る方法で回路パターンを形成した配線板もこの発明にお
ける配線板として適用できる。
The type of the base material is not particularly limited. Usually, glass cloth or the like is used. In addition, inorganic fiber cloth such as quartz fiber cloth, highly heat-resistant organic fiber cloth such as polyimide resin fiber cloth, etc. may be used. The temperature during semi-curing is preferably 140 to 170°C. If the temperature exceeds 170°C, the reaction of the epoxy resin will proceed too much, and the interlayer adhesive strength of the obtained prepreg will decrease, causing a decrease in performance as an insulating substrate, such as water absorption rate. A metal foil-covered insulation that can form a circuit pattern by stacking several sheets of prepreg obtained in this way and then layering a metal foil such as copper, nickel, or aluminum, and then hot-pressing this under commonly used conditions. This metal foil is then etched using a subtractive method, which is a commonly used circuit forming method, to obtain a wiring board with a circuit pattern formed on the insulating substrate. Therefore, the insulating substrate is divided into one circuit pattern and an insulating pattern formed by the insulating substrate exposed between the circuits of this circuit pattern. Note that a wiring board in which a circuit pattern is formed on an insulating substrate by an additive method can also be used as the wiring board in the present invention.

本発明における以上の絶縁基板とこの絶縁基板の上に形
成された回路パターンからなる配線板は波長が350〜
500nmの光に対して特に蛍光を発する性質を利用す
るものである。すなわち回路パターンの回路間に形成さ
れる絶縁パターンが350〜500 nmの励起光に対
して著しい蛍光性を示す反面、回路パターンは蛍光性を
示さない性質を利用して回路パターンの異常を正常な回
路バタンとの比較において判別できるものである。特に
絶縁層の蛍光性は、絶縁層の層厚が薄いほど低く、また
黒化処理した絶縁層を含むと低下する性質があるので、
例えば0.2mm以下の絶縁基板あるいは黒化処理した
絶縁基板を有する配線板の回路パターンの検査において
、絶縁層の蛍光強度を高めることは極めて有用である。
A wiring board according to the present invention comprising the above insulating substrate and a circuit pattern formed on the insulating substrate has a wavelength of 350 to 350.
It utilizes the property of emitting fluorescence especially when exposed to light of 500 nm. In other words, while the insulating pattern formed between the circuits of a circuit pattern exhibits significant fluorescence in response to excitation light of 350 to 500 nm, the circuit pattern does not exhibit fluorescence, which can be used to detect abnormalities in the circuit pattern. This can be determined by comparing it with the circuit button. In particular, the fluorescence of the insulating layer decreases as the thickness of the insulating layer becomes thinner, and it also decreases when the insulating layer includes a blackened insulating layer.
For example, in inspecting a circuit pattern of a wiring board having an insulating substrate of 0.2 mm or less or a blackened insulating substrate, it is extremely useful to increase the fluorescence intensity of the insulating layer.

以下、具体的な実施例を挙げる。Specific examples will be given below.

〔実施例] 実施例 1 エポキシ樹脂として、ブロム化エポキシ樹脂(東部化我
社、Y D B−500、エポキシ当量500)を10
0重量部、下記の構造式に示したオルソクレゾールノボ
ラ・ツタでn=7のもの(東部化我社、D−5、水酸基
当量121.8  軟化点96°C)を25重量部、硬
化促進剤として2E4MZを0,1重量部、そして溶媒
としてMEKとDMFの等景況合液を上記の樹脂含有率
が65重量%となるように添加して樹脂ワニスとし、こ
の樹脂ワニスを0゜1mmのガラスクロスに含浸乾燥し
てプリプレグを得た。
[Example] Example 1 As an epoxy resin, 10% of brominated epoxy resin (Tobu Kagasha, YD B-500, epoxy equivalent 500) was used as an epoxy resin.
0 parts by weight, 25 parts by weight of orthocresol Novola ivy with n=7 shown in the structural formula below (Tobu Kagasha, D-5, hydroxyl equivalent 121.8, softening point 96°C), hardened. A resin varnish was prepared by adding 0.1 parts by weight of 2E4MZ as an accelerator and a mixture of MEK and DMF as a solvent so that the resin content was 65% by weight. A prepreg was obtained by impregnating and drying the glass cloth.

そしてこのプリプレグの両面に厚さ18μmの銅箔を配
し、これを金属プレートに挟んで成形圧50 kg/c
Ifl、 温度170 ’Cで100分間熱圧成形し、
この銅箔にエツチングを施して絶縁基板上に回路パター
ンとこの回路パターンの回路間に絶縁基板が露出した絶
縁パターンを有する配線板とした。この配線板に分光蛍
光光度計を使い350〜500 nmの励起光を照射し
、その時現れた蛍光強度の最大値を蛍光強度として第1
表に示した。また、300mmX500m+nのこの配
線板に442r+mの励起光による蛍光式パターン検査
装置を適用し、回路パターンの導体幅、導体間隔、断線
、ショト、ピンホール、銅残り、銅欠けについて検査し
た結果、蛍光式パターン検査装置で異常箇所と検出した
回路パターンを再度、顕微鏡で観察し、その結果、回路
バク−ンに異常なしと確認できた個数、すなわち、蛍光
式パターン検査装置が誤って検出した個数を検査精度と
してその結果も第1表に示した。
Then, copper foil with a thickness of 18 μm was placed on both sides of this prepreg, and this was sandwiched between metal plates and a molding pressure of 50 kg/c was applied.
Ifl, hot pressing at a temperature of 170'C for 100 minutes,
This copper foil was etched to obtain a wiring board having a circuit pattern on an insulating substrate and an insulating pattern in which the insulating substrate was exposed between the circuits of the circuit pattern. This wiring board was irradiated with excitation light of 350 to 500 nm using a spectrofluorometer, and the maximum value of the fluorescence intensity that appeared at that time was taken as the first fluorescence intensity.
Shown in the table. In addition, we applied a fluorescent pattern inspection device using excitation light of 442r+m to this 300mm x 500m+n wiring board, and inspected the circuit pattern for conductor width, conductor spacing, breaks, shorts, pinholes, copper residue, and copper chips. The circuit patterns detected as abnormal by the pattern inspection device are observed again using a microscope, and as a result, the number of circuit patterns that are confirmed to have no abnormality, that is, the number of circuit patterns detected incorrectly by the fluorescent pattern inspection device, is inspected. The accuracy results are also shown in Table 1.

実施例 2 実施例1で用いたオルソクレゾールノボラックn=7の
もの(東部化我社、D−5、水酸基当量121.8  
軟化点96°C)を17重量部とし、ジシアンジアミド
0.6重量部を配合した以外は実施例1と同様に実施し
第1表の結果を得た。
Example 2 Orthocresol novolak used in Example 1 with n=7 (Tobu Kagasha, D-5, hydroxyl equivalent: 121.8
Example 1 was carried out in the same manner as in Example 1, except that 17 parts by weight (softening point: 96°C) and 0.6 parts by weight of dicyandiamide were added, and the results shown in Table 1 were obtained.

実施例 3 実施例1で用いたオルソクレゾールノボラックn−7(
東部化我社、D−5、水酸基当量121.8軟化点96
°C)を10重量部とし、ジシアンジアミド1重量部を
配合した以外は実施例1と同様に実施し第1表の結果を
得た。
Example 3 Orthocresol novolak n-7 used in Example 1 (
Tobu Kagasha, D-5, hydroxyl equivalent: 121.8 Softening point: 96
Example 1 was carried out in the same manner as in Example 1, except that 10 parts by weight of dicyandiamide (10 parts by weight) and 1 part by weight of dicyandiamide were added, and the results shown in Table 1 were obtained.

比較例1 実施例1で用いたオルソクレゾールノボラックn=7の
もの(東部化我社、D−5、水酸基当量121.8  
軟化点96°C)を配合せず、ジシアンジアミド2゜5
重量部を配合した以外は実施例1と同様に実施し第1表
の結果を得た。
Comparative Example 1 Orthocresol novolak n=7 used in Example 1 (Tobu Kagasha, D-5, hydroxyl equivalent: 121.8
Softening point: 96°C) is not added, dicyandiamide 2°5
The same procedure as in Example 1 was carried out except that the parts by weight were added, and the results shown in Table 1 were obtained.

第1表から明らかな通り、実施例1乃至3による本発明
の実施例によると、蛍光強度が増大し、その結果、具体
的には絶縁層に付与した高い蛍光性を強く励起すること
ができ、この性質を利用した検査の精度も向」二できる
のである。
As is clear from Table 1, according to Examples 1 to 3 of the present invention, the fluorescence intensity increases, and as a result, specifically, the high fluorescence imparted to the insulating layer can be strongly excited. The accuracy of inspection using this property can also be improved.

第1表 ※1 配線板1枚当たりの誤って検出した個数O・・・
0〜5個 ×・・・50〜200個 実施例 4 実施例1におけるプリプレグを硬化した絶縁基板とこの
絶縁基板」二に回路形成された回路パタンとを、黒化処
理した0、5mmの内層プリント配線板の両面に実施例
1で得たプリプレグを配し、さらにその外側両面に18
μmの銅箔を配してこれを金属プレートに挟んで実施例
1の熱圧条件で積層成形し、さらにエンチングを施して
絶縁基板上に回路パターンを得、実施例1と同様に蛍光
強度と回路パターンの検査を行った。これらの結果を第
2表に示した。
Table 1 *1 Number of incorrectly detected pieces per wiring board O...
0 to 5 pieces x 50 to 200 pieces Example 4 An insulating substrate obtained by hardening the prepreg in Example 1 and a circuit pattern formed on this insulating substrate were combined into a 0.5 mm inner layer that was blackened. The prepreg obtained in Example 1 was placed on both sides of the printed wiring board, and 18
μm copper foil was arranged, sandwiched between metal plates, laminated and molded under the heat and pressure conditions of Example 1, and further etched to obtain a circuit pattern on the insulating substrate. The circuit pattern was inspected. These results are shown in Table 2.

実施例5 実施例4で使用した実施例1の内層プリント配線板とプ
リプレグを実施例2の内層プリント配線板とプリプレグ
に変えた以外は実施例4と同様に実施し、これらの結果
を第2表に示した。
Example 5 The same procedure as in Example 4 was carried out except that the inner layer printed wiring board and prepreg of Example 1 used in Example 4 were changed to the inner layer printed wiring board and prepreg of Example 2. Shown in the table.

実施例6 実施例4で使用した実施例1の内層プリント配線板とプ
リプレグを実施例3の内層プリント配線板とプリプレグ
に変えた以外は実施例4と同様に実施し、これらの結果
を第2表に示した。
Example 6 The same procedure as in Example 4 was carried out except that the inner layer printed wiring board and prepreg of Example 1 used in Example 4 were changed to the inner layer printed wiring board and prepreg of Example 3, and these results were compared to the second example. Shown in the table.

比較例2 実施例4で使用した実施例】の内層プリント配線板とプ
リプレグを比較例1の内層プリント配線板とプリプレグ
に変えた以外は実施例4と同様に実施し、これらの結果
を第2表に示した第2表から明らかな通り、実施例4乃
至6による本発明の実施例によると、蛍光強度が増大し
その結果、具体的には絶縁層に付与した高い蛍光性を強
く励起することができ、この性質を利用した検査の精度
も向上できるのである。
Comparative Example 2 The procedure was carried out in the same manner as in Example 4, except that the inner layer printed wiring board and prepreg of Example 4 used in Example 4 were changed to the inner layer printed wiring board and prepreg of Comparative Example 1, and these results were compared to Example 2. As is clear from Table 2, according to the examples of the present invention according to Examples 4 to 6, the fluorescence intensity increases, and as a result, specifically, the high fluorescence imparted to the insulating layer is strongly excited. This property can be used to improve the accuracy of inspections.

率に行うことのできるのである。This can be done at a reasonable rate.

Claims (1)

【特許請求の範囲】[Claims] (1)(イ)エポキシ樹脂、 (ロ)前記エポキシ樹脂100重量部に対して10〜2
5重量部の範囲となる量で配合されるオルソクレゾール
ノボラック、 (ハ)および、硬化促進剤を含有する樹脂組成物が基材
中で硬化が完結した絶縁基板とこの絶縁基板に形成され
た回路パターンとからなる配線板に350〜500nm
の励起光を照射することを特徴とする回路パターンの検
査法。
(1) (A) Epoxy resin, (B) 10 to 2 parts by weight per 100 parts by weight of the epoxy resin.
An insulating substrate in which a resin composition containing an orthocresol novolak (c) and a curing accelerator, which is blended in an amount within the range of 5 parts by weight, is completely cured in a base material, and a circuit formed on this insulating substrate. 350 to 500 nm on a wiring board consisting of a pattern
A circuit pattern inspection method characterized by irradiating with excitation light.
JP1136939A 1989-05-30 1989-05-30 Circuit pattern inspection method Expired - Fee Related JPH0676972B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1136939A JPH0676972B2 (en) 1989-05-30 1989-05-30 Circuit pattern inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1136939A JPH0676972B2 (en) 1989-05-30 1989-05-30 Circuit pattern inspection method

Publications (2)

Publication Number Publication Date
JPH032548A true JPH032548A (en) 1991-01-08
JPH0676972B2 JPH0676972B2 (en) 1994-09-28

Family

ID=15187073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1136939A Expired - Fee Related JPH0676972B2 (en) 1989-05-30 1989-05-30 Circuit pattern inspection method

Country Status (1)

Country Link
JP (1) JPH0676972B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010026732A (en) * 1999-09-08 2001-04-06 김순택 Cathode assembly of electron gun

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5741953A (en) * 1980-08-26 1982-03-09 Shin Kobe Electric Machinery Manufacture of laminated board
JPS59232344A (en) * 1983-06-16 1984-12-27 Hitachi Ltd Detector for wiring pattern

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5741953A (en) * 1980-08-26 1982-03-09 Shin Kobe Electric Machinery Manufacture of laminated board
JPS59232344A (en) * 1983-06-16 1984-12-27 Hitachi Ltd Detector for wiring pattern

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010026732A (en) * 1999-09-08 2001-04-06 김순택 Cathode assembly of electron gun

Also Published As

Publication number Publication date
JPH0676972B2 (en) 1994-09-28

Similar Documents

Publication Publication Date Title
JP5625422B2 (en) Thermosetting insulating resin composition, and insulating film with support, prepreg, laminate and multilayer printed wiring board using the same
CN102822228B (en) Epoxy resin composition for prepreg, prepreg and multilayer printed circuit wiring board
JP4697144B2 (en) Epoxy resin composition for prepreg, prepreg, multilayer printed wiring board
KR101141305B1 (en) Phosphorus containing phenol novolac resin, hardener comprising the same and epoxy resin composition
CN1068349C (en) Epoxy resin mixtures for prepregs and composites
KR101456769B1 (en) Epoxy resin composition, prepreg, metal-clad laminate, and printed wiring board
KR101477304B1 (en) Method for producing curing agent having acidic substituent and unsaturated maleimide group thermosetting resin composition prepreg and laminate
JP2011241279A (en) Epoxy resin composition and prepreg, laminated board, and wiring board
CN1157628A (en) Epoxy resin mixtures for prepregs and composites
WO2014040262A1 (en) Epoxy resin composition, and, prepreg and copper clad laminate manufactured using the composition
CN111212877A (en) Thermosetting resin composition, prepreg, metal-clad laminate, printed wiring board, film with resin, and metal foil with resin
JP2017531059A (en) Low thermal expansion halogen-free flame retardant composition for high density printed circuit boards
EP0530036B1 (en) Base board for printed circuit board
JP2001254001A (en) Flame-retardant resin composition, and prepreg and laminated board using the same
JP5540611B2 (en) Thermosetting insulating resin composition, and insulating film with support, prepreg, laminate and printed wiring board using the same
JP3963344B2 (en) Flame retardant resin composition, prepreg and laminate using the same
JPH032547A (en) Method for inspecting circuit pattern
JPH032549A (en) Method for inspecting circuit pattern
JP4244975B2 (en) Epoxy resin composition for prepreg, prepreg, multilayer printed wiring board
JPH0676972B2 (en) Circuit pattern inspection method
JPH032258A (en) Resin composition, prepreg and laminated board
JP4479079B2 (en) Prepreg and laminate
JP2975349B1 (en) Resin composition for glass epoxy copper clad laminate
JP4534344B2 (en) Flame retardant resin composition, prepreg and laminate using the same
JPH0912677A (en) Epoxy resin composition for use in printed wiring board

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees