JPH03255362A - Analyzing method for sample by heating - Google Patents

Analyzing method for sample by heating

Info

Publication number
JPH03255362A
JPH03255362A JP5201890A JP5201890A JPH03255362A JP H03255362 A JPH03255362 A JP H03255362A JP 5201890 A JP5201890 A JP 5201890A JP 5201890 A JP5201890 A JP 5201890A JP H03255362 A JPH03255362 A JP H03255362A
Authority
JP
Japan
Prior art keywords
analysis
temperature
blank
sample
holding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5201890A
Other languages
Japanese (ja)
Other versions
JP2745122B2 (en
Inventor
Akihiro Hirano
彰弘 平野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP2052018A priority Critical patent/JP2745122B2/en
Publication of JPH03255362A publication Critical patent/JPH03255362A/en
Application granted granted Critical
Publication of JP2745122B2 publication Critical patent/JP2745122B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)

Abstract

PURPOSE:To perform blank correction accurately and to improve quantitative property by storing the holding contents of the holding state in temperature rising analysis, reproducing the holding state in accordance with the contents of the memory, and performing the blank analysis. CONSTITUTION:A sample is inputted into a crucible 2 and heated, and temperature rising analysis is performed. When gas is extracted by the temperature rising in an extracting furnace 1, temperature holding is started by the signal from a control part 14, and the starting time is stored. Therefore, when a peak is judged, the temperature holding is finished, and the finished time is stored. In this way, the signal curve of the extracted gas and the change curve of the temperature in the extracting furnace are obtained. At the same time, the time data with respect to the temperature holding is obtained. Then, the same holding state as in the temperature rising analysis is reproduced without inputting the sample in the crucible 2, and the blank analysis is performed. The extracted-gas signal curve is corrected with the blank signal curve. In this way, the blank correction can be performed accurately, and the quantitative property is improved.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、昇温分析時に分析対象成分の抽出ピークに基
づいて温度をホールドするようにした加熱による試料分
析方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for analyzing a sample by heating, in which the temperature is held based on the extracted peak of an analyte component during temperature raising analysis.

〔従来の技術〕[Conventional technology]

試料を収容したるつぼに直接通電を行ってこれを加熱し
、抽出されたガスを分析する場合、抽出ガスは試料中に
含まれる成分(元素)の種類によって独特の抽出特性(
抽出カーブとも云う)を示すため、昇温分析を行う場合
には、分析対象成分の抽出ピークに基づいて温度をホー
ルドするようにしている。
When analyzing the extracted gas by applying electricity directly to the crucible containing the sample to heat it, the extracted gas has unique extraction characteristics (
In order to show the extraction curve (also referred to as an extraction curve), when temperature-rising analysis is performed, the temperature is held based on the extraction peak of the component to be analyzed.

ところで、この種の加熱による試料分析方法においては
、試料をるつぼに収容しないでるつぼを加熱してそのと
き発生するガスを分析する所謂ブランク分析を併せて行
い、ブランク値の補正を行う必要があり、従来、つぎの
ようにしてブランク補正を行うようにしていた。
By the way, in this type of sample analysis method using heating, it is necessary to perform a so-called blank analysis in which the crucible is heated without placing the sample in the crucible and the gas generated at that time is analyzed, and the blank value must be corrected. Conventionally, blank correction has been performed as follows.

すなわち、例えば自動ホールド機能を有する試料分析装
置によって試料を収容したるつぼをホールドをかけなか
ら昇温分析すると、第3図において曲線Aで示すような
抽出ガス信号曲線が得られる。なお、この図において、
曲線Bは抽出炉温度の変化を示し、また、H,、H,、
H,はホールドをかけた部分を示す。
That is, for example, when a crucible containing a sample is subjected to temperature raising analysis without being held using a sample analyzer having an automatic hold function, an extracted gas signal curve as shown by curve A in FIG. 3 is obtained. In addition, in this figure,
Curve B shows the change in extraction furnace temperature, and also shows the change in extraction furnace temperature, and
H, indicates the part to which hold is applied.

そして、上記昇温分析によって得られた抽出ガス信号を
積算して所定の元素の含有量を定量する場合、ブランク
値を把握する必要があるので、前記試料分析装置によっ
て、ガス抽出状態に基づいてホールドをかけるようにし
てブランク分析すると、第4図において曲線Cで示すよ
うなブランク信号曲線が得られる。なお、この図におい
て、曲線りは抽出炉温度の変化を示し、H4はホールド
をかけた部分を示す。
When quantifying the content of a predetermined element by integrating the extracted gas signals obtained by the temperature-programmed analysis, it is necessary to know the blank value. When blank analysis is performed while applying a hold, a blank signal curve as shown by curve C in FIG. 4 is obtained. In this figure, the curved line indicates the change in the temperature of the extraction furnace, and H4 indicates the part where the hold was applied.

そして、前記昇温分析における抽出ガス信号の積算値か
らブランク分析におけるブランク信号の積算値を減算す
れば、所定の元素の含有量を定量することができる。
Then, by subtracting the integrated value of the blank signal in the blank analysis from the integrated value of the extracted gas signal in the temperature-rise analysis, the content of the predetermined element can be determined.

〔発明が解決しようとする課題] しかしながら、上記従来の方法においては、第3図にお
ける曲lsBおよび第4図における曲線りからも判るよ
うに、ブランク分析において昇温分析と同一のホールド
状態を再現しておらず、昇温分析とブランク分析とでは
、抽出炉における時間の推移による温度変化が同一では
なく、従って、昇温分析において発生したピーク(第3
図における点pH,Pg、P、)が試料に基づいて発生
したのか、ブランクとして発生したのかを判定すること
が困難であり、また、ブランク分析におけるホールド状
態を再現できないため、ブランク補正を正確に行うこと
ができないといった問題点があった。
[Problems to be Solved by the Invention] However, in the conventional method described above, as can be seen from the curve lsB in FIG. 3 and the curve in FIG. The temperature change over time in the extraction furnace is not the same in the temperature-rise analysis and the blank analysis, and therefore the peak (third peak) that occurred in the temperature-rise analysis is not the same.
It is difficult to determine whether the points (pH, Pg, P,) in the figure are generated based on the sample or as a blank, and the hold condition in blank analysis cannot be reproduced, so blank correction cannot be performed accurately. The problem was that it could not be done.

本発明は、上述の事柄に留意してなされたもので、その
目的とするところは、ブランク分析において昇温分析と
同一のホールド状態を再現させることにより、ブランク
補正を正確に行い、昇温分析における定量性を向上させ
ることができる加熱による試料分析方法を提供すること
にある。
The present invention has been made with the above-mentioned considerations in mind, and its purpose is to accurately perform blank correction by reproducing the same hold state as temperature-programmed analysis in blank analysis, and to perform temperature-programmed analysis. An object of the present invention is to provide a method for analyzing a sample by heating, which can improve quantitative performance.

〔課題を解決するための手段〕[Means to solve the problem]

上述の目的を達成するため、本発明に係る加熱による試
料分析方法は、昇温分析におけるホールド状態の内容を
メモリし、次いで、前記メモリ内容に従ってホールド状
態を再現しながらブランク分析を行うようにした点に特
徴がある。
In order to achieve the above object, the sample analysis method by heating according to the present invention memorizes the contents of the hold state in the temperature-programmed analysis, and then performs a blank analysis while reproducing the hold state according to the memory contents. The points are distinctive.

〔作用〕[Effect]

上記構成によれば、ブランク分析において昇温分析と同
一のホールド状態を再現させることができ、ブランク補
正を正確に行うことができる。
According to the above configuration, it is possible to reproduce the same hold state as in the temperature raising analysis in the blank analysis, and it is possible to accurately perform the blank correction.

〔実施例〕〔Example〕

以下、本発明の一実施例を、図面を参照しながら説明す
る。
An embodiment of the present invention will be described below with reference to the drawings.

第1図は本発明方法が適用される試料分析装置の要部の
構成を概略的に示し、この図において、1は直接通電方
式の抽出炉で、その内部には、試料を収容するるつぼ2
を挟持してこれを通電加熱するための上部電極、下部電
極3.4が設けられている。5は交流電源で、その一端
は電流計6を介して上部電極3に接続してあり、他端は
下部電極4に接続しである。7は画電極3.4間の電圧
を測定するための電圧計である。
FIG. 1 schematically shows the configuration of the main parts of a sample analysis apparatus to which the method of the present invention is applied.
An upper electrode 3.4 and a lower electrode 3.4 are provided for sandwiching and heating the electrode with electricity. 5 is an AC power source, one end of which is connected to the upper electrode 3 via an ammeter 6, and the other end connected to the lower electrode 4. 7 is a voltmeter for measuring the voltage between the picture electrodes 3.4.

8は抽出炉lに接続されるガス流路で、このガス流路に
は、抽出炉1からのガスの流量を調整する流量制御器9
、ガス中のCOを選択的に酸化してC08に変換する常
温酸化器10、この常温酸化器lOで生成されたCo8
のみを選択的に除去するC01除去器11、ガス中のH
,Oを選択的除去するHgO除去器12を介して熱伝導
型分析計(以下、TCDと云う)13が接続してあり、
試料中の水素を分析するように構成されている。
Reference numeral 8 denotes a gas flow path connected to the extraction furnace 1, and a flow rate controller 9 for adjusting the flow rate of gas from the extraction furnace 1 is installed in this gas flow path.
, a room-temperature oxidizer 10 that selectively oxidizes CO in the gas and converts it into CO8, a CO8 produced in this room-temperature oxidizer lO.
CO1 remover 11 that selectively removes only H in gas
, a thermal conductivity analyzer (hereinafter referred to as TCD) 13 is connected via an HgO remover 12 that selectively removes O.
Configured to analyze hydrogen in a sample.

14はマイクロコンピュータなどの演算制御部で、TC
D13からの抽出ガス信号を演算処理して、自動的にホ
ールドをかけるように制御すると共に、そのホールド状
況をメモリ部(図外)に記憶することができるように構
成されている。
14 is an arithmetic control unit such as a microcomputer;
It is configured to perform arithmetic processing on the extracted gas signal from D13 to automatically hold the signal, and to store the hold status in a memory section (not shown).

而して、上記構成の試料分析装置において、先ず、第2
図(A)に示すフローチャートのように、昇温分析を行
う。すなわち、各種の条件設定を行った(ステップSl
)後、るつぼ2に試料を入れた状態でるつぼ2を通電加
熱して昇温分析を開始する(ステップS2)と、抽出炉
lの温度上昇に伴ってガスが抽出される(ステップS3
)、そして、演算制御部14から所定の制御信号が出力
されて温度ホールドが開始され(ステップS4)、その
開始時間り。(第3図参照)が記憶される(ステップS
5)。
In the sample analyzer having the above configuration, first, the second
A temperature increase analysis is performed as shown in the flowchart shown in Figure (A). That is, various conditions were set (step Sl
) After that, when the sample is placed in the crucible 2 and the crucible 2 is heated with electricity to start temperature-raising analysis (step S2), gas is extracted as the temperature of the extraction furnace 1 rises (step S3).
), a predetermined control signal is output from the arithmetic control section 14 to start temperature hold (step S4), and the start time elapses. (see Figure 3) is stored (step S
5).

その後、ピークが判断された(ステップS6)後、演算
制御部14から所定の制御信号が出力されて温度ホール
ドが終了しくステップS7)、その終了時間t1.(第
3図参照)が記憶される(ステップS8)。
Thereafter, after the peak is determined (step S6), a predetermined control signal is output from the calculation control section 14 to end the temperature hold (step S7), and the end time t1. (see FIG. 3) is stored (step S8).

これによって、演算制御部14のメモリ部内には、温度
ホールドの開始時間tbsと終了時間Lbaとが対(t
b、、  the)になった時間データが記憶される。
As a result, the temperature hold start time tbs and end time Lba are stored as a pair (t
b,, the) time data is stored.

そして、分析が終了したか否かが判断されて(ステップ
S9)、分析が終了していればエンドになり、また、分
析が終了していなければステップS4に戻り、ステップ
S4以下の動作が繰り返される。従って、この場合、第
3図に示すような抽出ガス信号曲線Aおよび抽出炉温度
の変化曲線Bが得られると共に、温度ホールドに関する
時間データが複数対得られる。
Then, it is determined whether or not the analysis has ended (step S9). If the analysis has ended, the process ends; if the analysis has not ended, the process returns to step S4, and the operations from step S4 onwards are repeated. It will be done. Therefore, in this case, an extraction gas signal curve A and an extraction furnace temperature change curve B as shown in FIG. 3 are obtained, and a plurality of pairs of time data regarding temperature hold are obtained.

次に、るつぼ4に試料を入れない状態で、第2図(B)
に示すフローチャートのようにブランク分析を行う、こ
のとき、前記メモリ内容に従ってホールド状態を再現し
ながら(ステップ511)ブランク分析を行うのである
。従って、抽出炉1の温度は第5図において曲線Fで示
すように変化し、この変化状態は上記昇温分析における
それと全く同一であるから、このときのブランク信号曲
線Eによって、昇温分析において得られる抽出ガス信号
曲線Aを補正すれば、正確なブランク補正を行うことが
でき、形態別の定量を正確に行うことができる。
Next, without putting the sample into the crucible 4, as shown in Fig. 2 (B).
Blank analysis is performed as shown in the flowchart shown in FIG. 2. At this time, blank analysis is performed while reproducing the hold state according to the memory contents (step 511). Therefore, the temperature of the extraction furnace 1 changes as shown by the curve F in FIG. By correcting the obtained extracted gas signal curve A, accurate blank correction can be performed, and quantification by form can be performed accurately.

本発明は上記実施例に限られるものでなく、例えば手動
で昇温分析を行う場合にも適用できる。
The present invention is not limited to the above-mentioned embodiments, but can also be applied, for example, to cases in which temperature elevation analysis is performed manually.

また、水素分析以外の分析にも広く適用できることは云
うまでもない。
It goes without saying that this method can also be widely applied to analyzes other than hydrogen analysis.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明においては、ブランク分析
において昇温分析と同一のホールド状態を再現させるこ
とができるので、ブランク補正を正確に行うことができ
、この種の試料分析装置の定量性を大幅に向上させるこ
とができる。
As explained above, in the present invention, since it is possible to reproduce the same hold state as in temperature-programmed analysis in blank analysis, blank correction can be performed accurately and the quantitative performance of this type of sample analyzer can be improved. can be significantly improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明方法が通用される試料分析装置を概略的
に示す構成図である。 第2図は本発明方法による分析方法の一例を示すフロー
チャートで、同図(A)は昇温分析のものを、また、同
図(B)はブランク分析のものをそれぞれ示す。 第3図〜第5図は試料分析を行ったときの信号および抽
出炉の温度変化を示す図で、第3図は昇温分析のものを
、第4図は従来方法によるブランク分析のものを、また
、第5図は本発明方法によるブランク分析のものをそれ
ぞれ示す。 第3図
FIG. 1 is a block diagram schematically showing a sample analyzer to which the method of the present invention is applied. FIG. 2 is a flow chart showing an example of an analysis method according to the method of the present invention, in which (A) shows a temperature-rising analysis, and (B) shows a blank analysis. Figures 3 to 5 are diagrams showing the signals and temperature changes in the extraction furnace when performing sample analysis. Figure 3 shows the temperature rise analysis, and Figure 4 shows the blank analysis using the conventional method. , and FIG. 5 show blank analysis according to the method of the present invention. Figure 3

Claims (1)

【特許請求の範囲】[Claims] 昇温分析時に分析対象成分の抽出ピークに基づいて温度
をホールドするようにした加熱による試料分析方法にお
いて、昇温分析におけるホールド状態の内容をメモリし
、次いで、前記メモリ内容に従ってホールド状態を再現
しながらブランク分析を行うようにしたことを特徴とす
る加熱による試料分析方法。
In a sample analysis method by heating in which the temperature is held based on the extracted peak of the target component during temperature programmed analysis, the contents of the hold state in the temperature programmed analysis are memorized, and then the hold state is reproduced according to the memory contents. A method for analyzing a sample by heating, characterized in that a blank analysis is performed while the sample is being heated.
JP2052018A 1990-03-03 1990-03-03 Sample analysis method by heating Expired - Fee Related JP2745122B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2052018A JP2745122B2 (en) 1990-03-03 1990-03-03 Sample analysis method by heating

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2052018A JP2745122B2 (en) 1990-03-03 1990-03-03 Sample analysis method by heating

Publications (2)

Publication Number Publication Date
JPH03255362A true JPH03255362A (en) 1991-11-14
JP2745122B2 JP2745122B2 (en) 1998-04-28

Family

ID=12903076

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2052018A Expired - Fee Related JP2745122B2 (en) 1990-03-03 1990-03-03 Sample analysis method by heating

Country Status (1)

Country Link
JP (1) JP2745122B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115667916A (en) * 2020-11-02 2023-01-31 株式会社堀场制作所 Elemental analysis method, elemental analysis device and program for elemental analysis device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022065206A (en) * 2018-12-26 2022-04-27 株式会社堀場製作所 Element analyzer, element analyzer program, and element analysis method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01124765A (en) * 1986-11-25 1989-05-17 Inst Fr Petrole Method and apparatus for measuring content of at least two elements selected from among at least two fractions of carbon, hydrogen, sulfur and nitrogen of organic substance sample

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01124765A (en) * 1986-11-25 1989-05-17 Inst Fr Petrole Method and apparatus for measuring content of at least two elements selected from among at least two fractions of carbon, hydrogen, sulfur and nitrogen of organic substance sample

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115667916A (en) * 2020-11-02 2023-01-31 株式会社堀场制作所 Elemental analysis method, elemental analysis device and program for elemental analysis device
EP4145126A4 (en) * 2020-11-02 2024-06-05 HORIBA, Ltd. ELEMENT ANALYSIS METHOD, ELEMENT ANALYSIS DEVICE, AND PROGRAM FOR ELEMENT ANALYSIS DEVICE
US12467912B2 (en) 2020-11-02 2025-11-11 Horiba, Ltd. Element analysis method, element analysis device, and non-transitory computer readable medium storing program for element analysis device

Also Published As

Publication number Publication date
JP2745122B2 (en) 1998-04-28

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