JPH03257308A - Checking apparatus of outer appearance - Google Patents

Checking apparatus of outer appearance

Info

Publication number
JPH03257308A
JPH03257308A JP5686090A JP5686090A JPH03257308A JP H03257308 A JPH03257308 A JP H03257308A JP 5686090 A JP5686090 A JP 5686090A JP 5686090 A JP5686090 A JP 5686090A JP H03257308 A JPH03257308 A JP H03257308A
Authority
JP
Japan
Prior art keywords
image
line
insulator
fold
area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5686090A
Other languages
Japanese (ja)
Inventor
Shinjiro Kawato
慎二郎 川戸
Yasushi Yagi
康史 八木
Miwako Hirooka
広岡 美和子
Toshio Takenaka
俊夫 竹中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP5686090A priority Critical patent/JPH03257308A/en
Publication of JPH03257308A publication Critical patent/JPH03257308A/en
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Alarm Systems (AREA)
  • Insulators (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To inspect an insulator outdoors by detecting a part where a straight part of the photographed line image of the insulator is shifted from a straight line. CONSTITUTION:An image input means 7 stores image of an insulator 7 into an input memory 21. An area setting means 31 indicates a checking area 50 of the input image to an image processing part 24 which in turn extracts a part of a large difference of the concentration in the indicated area, and forms and stores a line image into an image memory 25. A periodic evaluating means 51 provides sampling lines 81-85 in a longitudinal direction with a suitable distance within the area 50, with measuring the relative distance of crossing points between each sampling line and a straight line corresponding to each fold of the insulator 7 and, feeding the data to an abnormality judging means 6. A continuity evaluating means 52 traces the line straight corresponding to each fold, thereby feeding the data of interruption and divergence to the means 6. An inclination change evaluating means 53 obtains an inclination of the straight line corresponding to each fold at each point on the sampling line, and further obtains the difference of the inclinations of the adjacent two points. The difference is fed to the means 6. In this manner, the means 6 can detect the presence or absence of abnormality of each fold of the insulator from the data.

Description

【発明の詳細な説明】 [産業上の利用分野コ この発明は、例えば変電所などで碍子の外観異常などを
検出するための外観検査装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a visual inspection device for detecting abnormalities in the visual appearance of insulators in, for example, substations.

[従来の技術] 現在、変電所では作業者が定期的に巡視して、碍子に割
れや欠は等の外観異常が発生していないかを、目視によ
り点検している。
[Prior Art] Currently, workers at substations regularly patrol and visually inspect insulators for appearance abnormalities such as cracks and chips.

この作業を自動化している例はまだないが、被検査物の
外観異常を監視する装置としては、例えば第5図の特開
昭82−222393号公報に示されるように、正常時
と検査時の画像を比較するものが従来知られている。
Although there is no example of automating this work yet, as a device for monitoring abnormalities in the appearance of the inspected object, for example, as shown in Japanese Patent Application Laid-open No. 82-222393 shown in Fig. It is conventionally known to compare images of

第5図において、(1)は被検査物の画像信号を量f化
する画像人力手段、(2)は画像処理手段で、人力画像
を逐次記憶する人力画像メモリ(21)と、被検査物に
異常が存在しない時の画像を予め記憶する参照画像メモ
リ(22)と、人力画像メモリ(21)及び参照画像メ
モリ(22)の記憶内容を比較して変化分画像を取り出
す画像処理部(23)から構成されている。(3)は画
像処理手段(2)からの情報を元に異常の有無を判定す
る異常判定手段、(4)は異常判定結果を出力する出力
手段、(31)は監視したい領域を設定する領域設定手
段、(321)〜(32,)は設定された検知領域を記
憶する複数の検知領域メモリである。
In FIG. 5, (1) is an image processing means that converts the image signal of the object to be inspected into a quantity f, and (2) is an image processing means, which includes a human image memory (21) that sequentially stores the human images, and A reference image memory (22) that stores in advance an image when no abnormality exists in the image, and an image processing unit (23) that compares the stored contents of the human image memory (21) and the reference image memory (22) and extracts a changed image. ). (3) is an abnormality determination means for determining the presence or absence of an abnormality based on the information from the image processing means (2), (4) is an output means for outputting the abnormality determination result, and (31) is an area for setting the area to be monitored. The setting means (321) to (32,) are a plurality of detection area memories that store set detection areas.

次に動作について説明する。山像人カド段(1)により
得られた監視領域の画像は、画像処理(1) (2) 手段(2)における人力画像メモリ(21)に逐次人力
される。参照画像メモリ(22)には監視領域に異常が
存在しない時の画像が予め記憶されている。画像処理部
(23)では人力画像メモリ(21)と参照画像メモリ
(22)との記憶内容を比較して変化部分画像を取り出
す。異常判定手段(3)は、検知領域メモリ(3L)が
示す領域に輝度変化があった場合には、出力手段(4)
によって警報を発する。検知領域メモリが複数個設けで
あるのは、複数箇所を検知領域とするためである。
Next, the operation will be explained. The images of the monitoring area obtained by the image processing (1) are sequentially input to the image memory (21) in the image processing (1) (2) means (2). The reference image memory (22) stores in advance an image when no abnormality exists in the monitoring area. The image processing section (23) compares the stored contents of the human image memory (21) and the reference image memory (22) and extracts a changed partial image. The abnormality determination means (3) outputs an output means (4) when there is a brightness change in the area indicated by the detection area memory (3L).
to issue an alarm. The reason why a plurality of detection area memories are provided is to set a plurality of locations as detection areas.

[発明が解決しようとする課題] 従来の外観検査装置は以上のように構成されているので
、屋外環境にある碍子では、時間的に女化する光の照度
や方向によって画像か変化するため、参照画像との比較
によって外観異常を検出することが難しいという問題点
があった。
[Problem to be Solved by the Invention] Since the conventional appearance inspection device is configured as described above, the image of an insulator in an outdoor environment changes depending on the illuminance and direction of the light, which becomes feminine over time. There is a problem in that it is difficult to detect abnormalities in appearance by comparison with a reference image.

この発明は上記のような課題を解決するためになされた
もので、屋外環境において光の照度や方1^Jなどの影
響を受けることなく、4!) Y−の点検がてきる外観
検査装置を得ることを目的とする。
This invention was made in order to solve the above-mentioned problems, and it can be used in an outdoor environment without being affected by the illuminance or direction of the light. ) The purpose is to obtain an appearance inspection device that can inspect Y-.

[課題を解決するための手段] この発明に係る外観検査装置は、襞を有する碍子を撮像
して得られた画像の白黒濃度差の大きい部分を抽出して
線画像化する画像処理手段と、上記線画像中上記襞をエ
ツジに対応する直線部が直線から外れた箇所を欠陥とし
て検出する画像欠陥検出手段を備えたものである。
[Means for Solving the Problems] The appearance inspection apparatus according to the present invention includes an image processing means for extracting a portion with a large black-and-white density difference from an image obtained by imaging an insulator having folds and converting it into a line image; The apparatus is equipped with an image defect detection means for detecting, as a defect, a portion in the line image in which a straight line portion corresponding to an edge of the fold deviates from a straight line.

[作用] この発明における外観検査装置の画像処理手段は、碍子
を撮像した線画像中の直線部が直線から外れた箇所を検
出1−る。
[Operation] The image processing means of the appearance inspection apparatus according to the present invention detects a location where a straight line part in a line image taken of an insulator deviates from a straight line.

[発明の実施例] 以下、この発明の実施例を図について説明する。第1図
はこの発明の装置を示す構成図である。図において、(
2)は画像処理手段で、人力画像メモリ(21)、画像
人力手段(1)で得られた画像の白黒濃度差の大きい部
分を抽出して線画像化する画像処理部(24)及び画像
処理部(24)による画像処理結果を格納する画像メモ
リ(25)から構成される。(5)は画像欠陥検出手段
で、それぞれ線画像(3) (4) 中の周期性を評価する周期性評価手段(51)、連続性
を評価する連続性評価手段(52)及び傾きの変化を評
価する傾き変化評価手段(53〉から成っている。(6
)は画像欠陥検出手段(5)からの情報を元に%常の打
無を判定する異常判定手段である。他の部分は第5図の
従来装置の相当部分と同じである。
[Embodiments of the Invention] Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a block diagram showing the apparatus of the present invention. In the figure, (
2) is an image processing means, which includes a human image memory (21), an image processing unit (24) that extracts a portion with a large black-and-white density difference of the image obtained by the image human power means (1) and converts it into a line image, and an image processing unit. It is composed of an image memory (25) that stores the image processing results by the section (24). (5) is an image defect detection means, which includes a periodicity evaluation means (51) for evaluating periodicity in line images (3) and (4), a continuity evaluation means (52) for evaluating continuity, and a change in slope, respectively. It consists of a slope change evaluation means (53) for evaluating (6
) is an abnormality determining means that determines whether or not the image is defective based on the information from the image defect detecting means (5). The other parts are the same as the corresponding parts of the conventional device shown in FIG.

第2図は被監査物である碍子の画像を示す図、第3図は
その線画像を示す図及び第4図は周期性評価の説明図で
ある。図において、(7)は碍子、(50)は検査領域
、(71)は襞の欠は部、(81)〜(85)はそれぞ
れ第3図の線画像中縦方向に設けたサンプリング線であ
る。
FIG. 2 is a diagram showing an image of an insulator that is an object to be inspected, FIG. 3 is a diagram showing its line image, and FIG. 4 is an explanatory diagram of periodicity evaluation. In the figure, (7) is the insulator, (50) is the inspection area, (71) is the missing part of the fold, and (81) to (85) are the sampling lines provided vertically in the line image in Figure 3, respectively. be.

次に動作について説明する。先ず、被検査物である襞を
有する碍子(7)の画像が画像人力手段(1)により第
2図のように画像化されて人力画像メモリ(21)に格
納される。撮像の位置と方向が予め定められているので
、領域設定手段(31)により人力画像の検査領域(5
0)を画像処理部(24)に指示する。画像処理部(2
4)は指示された領域のみ、微分処理、2値化処理、細
線化処理を順次施して第3区のように線画像化し、画像
メモリ(25)に格納する。碍子(7)の襞のエツジに
対応する部分は直線になっているが、欠は部(71)は
その線が他に比べて形が変形したり余分な線か生じたり
、或いは欠は具合と日照条件の組合せによっては−・部
の線が泪失したりする。周期性評価手段(51)は、第
3図の線画像に対して領域設定手段(31)で指示され
る検査領域(50)内に、第4図に示されるように適当
な間隔で縦方向にサンプリング線(81)〜(85)を
設け、各サンプリング線(旧)〜(85)七で碍F(7
)の襞に対応する直線と交わる点の間の距離を計測し、
異常判定手段(6)にそのデータを引き渡す。第4図に
おいて、サンプリング線(84)と(85)の上でLか
ら5木目と6木目の襞の間てその間隔が他に比較して短
くなっている。
Next, the operation will be explained. First, an image of an insulator (7) having folds, which is an object to be inspected, is converted into an image by the human image means (1) as shown in FIG. 2, and is stored in the human image memory (21). Since the position and direction of imaging are determined in advance, the area setting means (31) sets the inspection area (5) of the manual image.
0) to the image processing unit (24). Image processing section (2
4) sequentially performs differential processing, binarization processing, and thinning processing only on the designated area to convert it into a line image as shown in the third section, and stores it in the image memory (25). The part corresponding to the edge of the folds of the insulator (7) is a straight line, but the chipped part (71) has a deformed shape compared to the other lines, an extra line, or a chipped part (71). Depending on the combination of and sunlight conditions, the line in the - section may fade. The periodicity evaluation means (51) is configured to measure the line image of FIG. 3 at appropriate intervals in the inspection area (50) indicated by the area setting means (31) in the vertical direction. Sampling lines (81) to (85) are provided to
), measure the distance between the points that intersect with the straight line corresponding to the folds,
The data is delivered to the abnormality determining means (6). In FIG. 4, the interval between the folds of the fifth and sixth wood grains from L on the sampling lines (84) and (85) is shorter than the other folds.

連続性評価手段(52)は、第3図の線画像に対して、
領域設定手段(31)で指示される検査領域(50)の
左端から、各襞のエツジに対応する直線を右方向へ検査
領域(50)の右端に到達するまで追跡(5) (6) し、途切れない一本の線であったか、途中で途切れたか
、或いは分岐したかを調べ、そのデータを異常判定手段
(6)に引き渡す。第3図では、上から6番目の線が途
中に分岐している。
The continuity evaluation means (52) performs the following on the line image of FIG.
From the left edge of the inspection area (50) indicated by the area setting means (31), trace straight lines corresponding to the edges of each fold to the right until reaching the right edge of the inspection area (50) (5) (6). , it is checked whether the line is a single uninterrupted line, there is a break in the middle, or there is a branch, and the data is delivered to the abnormality determining means (6). In FIG. 3, the sixth line from the top branches in the middle.

傾き変化評価手段(53)は、第3図の線画像に対して
各襞に対応する直線毎に、サンプリング線(81)〜(
85)上の各点で襞に対比・する線の傾きを求め、更に
隣接する2点での傾きの差を求めて、その差の絶対値が
最大になる位置とその傾きの差の値を異常判定手段(6
)に引き渡す。これは各襞に対応する直線の角度が最も
大きく変化している点を探したことになる。襞の線の各
点における傾きは、例えばその点の3画素右側の装線上
の点のY座標と、3画素左側の装線上の点のY座標の差
を6で割ることで得られる。また、第3図にある上から
6木目の襞の線のように途中で分岐しているものは、分
岐した線についても上記の評価を行う。
The inclination change evaluation means (53) calculates sampling lines (81) to (81) for each straight line corresponding to each fold with respect to the line image in FIG.
85) Find the slope of the line that contrasts with the fold at each point above, then find the difference in slope between two adjacent points, and find the position where the absolute value of the difference is maximum and the value of the difference in slope. Abnormality determination means (6
). This means finding the point where the angle of the straight line corresponding to each fold changes the most. The slope at each point of the fold line can be obtained, for example, by dividing by 6 the difference between the Y coordinate of a point on the line 3 pixels to the right of that point and the Y coordinate of a point on the line 3 pixels to the left of that point. In addition, for lines that branch in the middle, such as the fold line of the sixth grain from the top in FIG. 3, the above evaluation is also performed for the branched line.

異常判定手段(6)は、画像欠陥検出手段(5)からの
出力データを受けて、碍子(7)の各襞に異常があるか
否かを判定する。第2図の画像のように、襞の一部が欠
りていてそれか検査領域(50)に入っていれば、抽出
される襞の線は第3図のようになるので、例えば、襞の
間隔が周期性評価手段(51)で計測した値の平均値よ
り、−窓以上大きい或いは小さい部分があれば異常とす
る。また、襞の線が途中で途切れていたり、分岐してい
れば異常とする。史に襞の線が所定値以上に大きな角度
でI由っていれば異常と判定する。
The abnormality determining means (6) receives the output data from the image defect detecting means (5) and determines whether or not there is an abnormality in each fold of the insulator (7). As shown in the image in Figure 2, if a part of the fold is missing and falls within the inspection area (50), the extracted line of the fold will be as shown in Figure 3. If there is a part where the interval is larger or smaller than the average value of the values measured by the periodicity evaluation means (51) by -window or more, it is considered abnormal. In addition, if the fold line is interrupted or branched in the middle, it is considered abnormal. If the fold line deviates at an angle greater than a predetermined value, it is determined to be abnormal.

異常判定手段(6)で異常と判定された場合は、出力手
段(0により警報を発する。
If the abnormality determination means (6) determines that there is an abnormality, an alarm is issued by the output means (0).

なお、上記実施例では、碍子(7)の襞が欠けている場
合について説明したが、異物が飛来し碍子(7)に付着
した場合の異常も同様に検出できる。
In the above embodiment, the case where the folds of the insulator (7) are missing has been described, but an abnormality when a foreign object flies and adheres to the insulator (7) can be similarly detected.

また、L記失施例では、検査領域(50)のみを評価し
たが、碍f(7)の周囲で撮像位置を変えて上記実施例
と同様の検査を行って、碍子(7)の全周を検査する。
In addition, in the L-notation example, only the inspection area (50) was evaluated, but the same inspection as in the above example was performed by changing the imaging position around the insulator f (7), and the entire insulator (7) was evaluated. Inspect the circumference.

[発明の効果] 以上のように、この発明によれば外観検査装置(7) (8) を、襞を有する碍子を撮像して得られた画像の白黒濃疫
差の大きい部分を抽出して線画像化する画像処理手段と
、上記線画像中上記襞のエツジに対応する直線部が直線
から外れた箇所を欠陥として検出する画像欠陥検出手段
を備えるように構成したので、屋外環境において光の照
度や方向などの影響を受けることなく、碍子の点検がで
きる外観検査装置が得られる効果がある。
[Effects of the Invention] As described above, according to the present invention, the appearance inspection device (7) (8) can be used to extract a portion with a large black-and-white concentration difference in an image obtained by imaging an insulator having folds. The structure is equipped with an image processing means for converting into a line image, and an image defect detection means for detecting as a defect a part of the line image in which the straight line portion corresponding to the edge of the fold deviates from the straight line. This has the effect of providing a visual inspection device that can inspect insulators without being affected by illuminance or direction.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例による外観検査装置を示す
構成図、第2図は被検査物である碍子の画像を示す図、
第3図はその線画像を示す図、第4図は周期性評価の説
明図、第5図は従来の外観検査装置を示す構成図である
。図において、(2)は画像処理手段、(5)は画像欠
陥検出手段、(7)は碍子である。 なお、図中、同一符号は同一 又は相当部分を示す。
FIG. 1 is a configuration diagram showing an appearance inspection apparatus according to an embodiment of the present invention, FIG. 2 is a diagram showing an image of an insulator that is an object to be inspected,
FIG. 3 is a diagram showing the line image, FIG. 4 is an explanatory diagram of periodicity evaluation, and FIG. 5 is a configuration diagram showing a conventional appearance inspection device. In the figure, (2) is an image processing means, (5) is an image defect detection means, and (7) is an insulator. In addition, the same symbols in the figures indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】[Claims] 襞を有する碍子を撮像して得られた画像の白黒濃度差の
大きい部分を抽出して線画像化する画像処理手段と、上
記線画像中上記襞のエッジに対応する直線部が直線から
外れた箇所を欠陥として検出する画像欠陥検出手段を備
え、上記碍子の外観の異常を検出するようにしたことを
特徴とする外観検査装置。
an image processing means for extracting a portion with a large black-and-white density difference from an image obtained by imaging an insulator having pleats and converting it into a line image; 1. An appearance inspection apparatus, comprising: an image defect detection means for detecting a location as a defect, and detecting an abnormality in the appearance of the insulator.
JP5686090A 1990-03-07 1990-03-07 Checking apparatus of outer appearance Pending JPH03257308A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5686090A JPH03257308A (en) 1990-03-07 1990-03-07 Checking apparatus of outer appearance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5686090A JPH03257308A (en) 1990-03-07 1990-03-07 Checking apparatus of outer appearance

Publications (1)

Publication Number Publication Date
JPH03257308A true JPH03257308A (en) 1991-11-15

Family

ID=13039170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5686090A Pending JPH03257308A (en) 1990-03-07 1990-03-07 Checking apparatus of outer appearance

Country Status (1)

Country Link
JP (1) JPH03257308A (en)

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* Cited by examiner, † Cited by third party
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CN109405771A (en) * 2018-12-29 2019-03-01 西南交通大学 A kind of contactless hierarchical detection method of top insulation sublist surface roughness

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108332713A (en) * 2018-01-16 2018-07-27 安徽慧视金瞳科技有限公司 A kind of inclined detection method of insulator pin
CN109405771A (en) * 2018-12-29 2019-03-01 西南交通大学 A kind of contactless hierarchical detection method of top insulation sublist surface roughness

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